[go: up one dir, main page]

Lamperez et al., 1994 - Google Patents

Software testing and sequential sampling

Lamperez et al., 1994

Document ID
8651422257561512120
Author
Lamperez A
Huang S
Publication year
Publication venue
IEEE Journal on Selected Areas in Communications

External Links

Snippet

The paper briefly describes sequential sampling and explains how such sampling procedures can be integrated into a software testing strategy to provide benefit. Using first- pass failure rate,(a simple software testing metric), as a quality indicator, the authors show …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06Q—DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management, e.g. organising, planning, scheduling or allocating time, human or machine resources; Enterprise planning; Organisational models

Similar Documents

Publication Publication Date Title
US6613590B2 (en) Yield based, in-line defect sampling method
US7613591B2 (en) Remote test facility with wireless interface to local facilities
JP2009532695A (en) Semiconductor test method and system using test scenario language
KR20150140358A (en) System and method for the automatic determination of critical parametric electrical test parameters for inline yield monitoring
US9134997B2 (en) Methods for assessing deliverable product quality and devices thereof
CN110287104A (en) Method for generating test case, device, terminal and computer readable storage medium
CN113725112A (en) Wafer detection method, system and detection machine
JP7205644B2 (en) Determination method, determination program and information processing device
JPH07167911A (en) Intelligent test line system
CN107203464A (en) The localization method and device of traffic issues
US6424881B1 (en) Computer generated recipe selector utilizing defect file information
Lamperez et al. Software testing and sequential sampling
US6165805A (en) Scan tool recipe server
US20100332932A1 (en) Test method, test control program and semiconductor device
US7225039B2 (en) Control system for semiconductor processing apparatus
Weber et al. Quantifying the value of ownership of yield analysis technologies
CN109919415A (en) Supervision processing method, device, device and storage medium based on unmanned vehicle
US20080147343A1 (en) Method and Apparatus for Metrology Sampling Using Combination Sampling Rules
Runeson et al. Statistical usage testing for software reliability certification and control
JP2007048158A (en) Process management apparatus, process management program, recording medium with process management program recorded, and process management method
KR100597595B1 (en) Sample Wafer Processing Method in Photographic Process for Semiconductor Manufacturing
US6847855B2 (en) Method for fault analysis in wafer production
De Backer et al. Taking the next leap forward in semiconductor yield improvement
CN117214186B (en) Sample failure analysis method, device and medium
JP3748823B2 (en) Electrical inspection system and inspection method for semiconductor device