Signorato et al., 1999 - Google Patents
Performance of the ESRF ID26 beamline reflective opticsSignorato et al., 1999
View PDF- Document ID
- 7890496820528233735
- Author
- Signorato R
- Solé V
- Gauthier C
- Publication year
- Publication venue
- Synchrotron Radiation
External Links
Snippet
This paper presents the experimental results obtained during the commissioning of the X-ray mirrors installed on the ESRF beamline ID26. The ID26 spectrometer is dedicated to XAFS studies on ultra-diluted samples in the energy range 2.3-25 KeV using the excitation of X-ray …
- 241001507928 Aria 0 abstract description 8
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9448190B2 (en) | High brightness X-ray absorption spectroscopy system | |
| EP2075569B1 (en) | X-ray beam device | |
| CN106605140B (en) | X-ray Absorption Measurement System | |
| Polikarpov et al. | Set-up and experimental parameters of the protein crystallography beamline at the Brazilian National Synchrotron Laboratory | |
| WO2015187219A1 (en) | X-ray absorption measurement system | |
| Hunter et al. | A grating/crystal monochromator for the spectral range 5 eV to 5 keV | |
| US12209977B2 (en) | X-ray detector system with at least two stacked flat Bragg diffractors | |
| Yang et al. | GeoCARS microfocusing Kirkpatrick–Baez mirror bender development | |
| Schulze et al. | Microfocusing of hard X-rays with cylindrically bent crystal monochromators | |
| Signorato et al. | Performance of the ESRF ID26 beamline reflective optics | |
| Rarback et al. | Coherent radiation for x-ray imaging—the soft x-ray undulator and the X1A beamline at the NSLS | |
| Senba et al. | Stable sub-micrometre high-flux probe for soft X-ray ARPES using a monolithic Wolter mirror | |
| Erko et al. | Elliptical multilayer Bragg-Fresnel lenses with submicron spatial resolution for X-rays | |
| Falkenberg et al. | Upgrade of the x‐ray fluorescence beamline at HASYLAB/DESY | |
| US20250146960A1 (en) | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes | |
| Cai et al. | Performance of a high-resolution x-ray microprobe at the Advanced Photon Source | |
| US6233096B1 (en) | Pseudo-spherical stepped diffractor constructed under constant step width conditions (multi-stepped monochromator) | |
| Schriever et al. | Narrowband laser produced extreme ultraviolet sources adapted to silicon/molybdenum multilayer optics | |
| US20040066894A1 (en) | Device for x-ray analytical applications | |
| Imazono et al. | Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV | |
| RU2158918C2 (en) | Device for x-ray and fluorescent analysis | |
| Yun et al. | Design of a dedicated beamline for x‐ray microfocusing‐and coherence‐based techniques at the Advanced Photon Source | |
| Kolesnikov et al. | Broadband High-Resolution Stigmatic Spectral Imaging in the XUV Range | |
| Falkenberg et al. | X-ray Optics for the Microfocus Beamline L | |
| Muramatsu et al. | A 2‐m grazing incidence monochromator with a silicon‐carbide‐based master grating for undulator radiation |