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Wohl et al., 2002 - Google Patents

Effective diagnostics through interval unloads in a BIST environment

Wohl et al., 2002

View PDF
Document ID
7332293731142652695
Author
Wohl P
Waicukauski J
Patel S
Maston G
Publication year
Publication venue
Proceedings of the 39th annual Design Automation Conference

External Links

Snippet

Logic built-in self test (BIST) is increasingly being adopted to improve test quality and reduce test costs for rapidly growing designs. Compared to deterministic automated test pattern generation (ATPG), BIST presents inherent fault diagnostic challenges. Previous diagnostic …
Continue reading at websrv.cecs.uci.edu (PDF) (other versions)

Classifications

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