[go: up one dir, main page]

Hanbali, 2001 - Google Patents

Development of Atlas Based Simulation Capability for Automated Testing

Hanbali, 2001

View PDF
Document ID
7213314485657702536
Author
Hanbali R
Publication year

External Links

Snippet

Computer software is emerging as a powerful tool for controlling a large number of instruments and for the testing of these instruments. The main aim of this work is to provide a software program capable of controlling a large number of engineering instruments at the …
Continue reading at digitalcommons.odu.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3664—Environments for testing or debugging software
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/30—Creation or generation of source code
    • G06F8/36—Software reuse
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/30—Creation or generation of source code
    • G06F8/34—Graphical or visual programming
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/70—Software maintenance or management
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems

Similar Documents

Publication Publication Date Title
CN109406916B (en) Test platform for semiconductor memory aging test device
US6681351B1 (en) Easy to program automatic test equipment
US6449741B1 (en) Single platform electronic tester
US8402438B1 (en) Method and system for generating verification information and tests for software
US7809520B2 (en) Test equipment, method for loading test plan and program product
US8489381B1 (en) Method and system for simulating test instruments and instrument functions
CN107562969A (en) The integrated approach and device of aeroengine control system software
US20120117537A1 (en) Flow Chart Programming Platform for Testers and Simulators
Wahler et al. CAST: Automating software tests for embedded systems
Shin et al. Model-based automatic test case generation for automotive embedded software testing
RU2678717C1 (en) Method for building a software system for automating and visualizing testing of embedded software for electronic devices
Guduvan et al. A Meta-model for Tests of Avionics Embedded Systems.
Ichii et al. A rule-based automated approach for extracting models from source code
CN112162921A (en) Industrial automation test and control system
Carey Introduction to Automated Test Systems—Back to Basics
Hanbali Development of Atlas Based Simulation Capability for Automated Testing
Dahlweid et al. Model-based testing: automatic generation of test cases, test data and test procedures from SysML models
Blackburn et al. Interface-driven, model-based test automation
Schott et al. Closed-Loop Approach on Formal Specification for Semiconductor Test
Holibaugh et al. Phase I Testbed Description: Requirements and Selection Guifdelines
Homan Accelerate instrument control and automation
Coons et al. High-Speed Digital Bus Testing using Automatic Test-Markup Language (ATML)
Lankinen Automatic testing software for a modular circuit board assembly test system
Gooding et al. Evaluation of three ATE test environments
Vock et al. Test software generation productivity and code quality improvement by applying software engineering techniques