[go: up one dir, main page]

Zubek et al., 1982 - Google Patents

A hot ribbon detector for metastable atoms

Zubek et al., 1982

Document ID
5483116090783682765
Author
Zubek M
King G
Publication year
Publication venue
Journal of Physics E: Scientific Instruments

External Links

Snippet

A simple metastable atom detector is described consisting of a channel electron multiplier and a heated ribbon detection surface. The use of the heated surface extends the range of detection of the electron multiplier down to metastable excitation energies of approximately …
Continue reading at iopscience.iop.org (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes

Similar Documents

Publication Publication Date Title
Compton et al. Resonantly enhanced multiphoton ionization of xenon: photoelectron enrgy analysis
EP0103586B1 (en) Sputter initiated resonance ionization spectrometry
EP0970504B1 (en) Time of flight mass spectrometer and dual gain detector therefor
US4058724A (en) Ion Scattering spectrometer with two analyzers preferably in tandem
Long et al. Electron-Impact Ionization of He (2 s S 3)
Andreev et al. High-efficiency laser resonance photoionization of Sr atoms in a hot cavity
US3939344A (en) Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers
US4476392A (en) Photoelectron source for use in a gas chromatograph detector and mass spectrometer ion source
Shah et al. Ionisation and electron capture in collisions of H+ and He2+ ions with carbon monoxide
Gallagher et al. A photoionization source of monoenergetic electrons
Harrison et al. Pulsed glow discharge time-of-flight mass spectrometry. Invited lecture
US4845364A (en) Coaxial reentrant ion source for surface mass spectroscopy
Zubek et al. A hot ribbon detector for metastable atoms
Kaufman et al. Molecular beam analyzer for identifying transient intermediates in gaseous reactions
Sawatzky et al. Method for Studying Sputtered Particles by Emission Spectroscopy
Morioka et al. Dissociative photoionisation of N2 from threshold to 29 eV
Marrs Recent results from the EBIT and super EBIT at Lawrence Livermore National Laboratory
Hellblom et al. Extraction of volume produced H− ions from a mirror electron cyclotron resonance source
Tyutikov Electron multipliers of the open type
Lafyatis et al. Experimental apparatus for measurements of electron impact excitation
Church Lifetimes of metastable levels of atomic ions
Boumsellek et al. Pulsed, gridded electron reversal ionizer
Das et al. A technique for charge density measurement in laser-cluster interaction studies
Nakao Photon‐blind, high collection efficiency ion detector for a quadrupole mass spectrometer
Rocco et al. New and simple mass calibration procedure for time-of-flight studies of electron stimulated desorption of ions from solid samples