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Rocchini et al., 2021 - Google Patents

Onset of triaxial deformation in Zn 66 and properties of its first excited 0+ state studied by means of Coulomb excitation

Rocchini et al., 2021

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Document ID
4028467100818870185
Author
Rocchini M
Hadyńska-Klȩk K
Nannini A
Goasduff A
Zielińska M
Testov D
Rodríguez T
Gargano A
Nowacki F
De Gregorio G
Naïdja H
Sona P
Valiente-Dobón J
Mengoni D
John P
Bazzacco D
Benzoni G
Boso A
Cocconi P
Chiari M
Doherty D
Galtarossa F
Jaworski G
Komorowska M
Marchini N
Matejska-Minda M
Melon B
Menegazzo R
Napiorkowski P
Napoli D
Ottanelli M
Perego A
Ramina L
Rampazzo M
Recchia F
Riccetto S
Rosso D
Siciliano M
Publication year
Publication venue
Physical Review C

External Links

Snippet

The electromagnetic structure of Zn 66 at low excitation energy was investigated via low- energy Coulomb excitation at INFN Legnaro National Laboratories, using the Gamma Array of Legnaro Infn Laboratories for nuclEar spectrOscopy (GALILEO) γ-ray spectrometer …
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS
    • G01V5/00—Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • G01V5/0008—Detecting hidden objects, e.g. weapons, explosives
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/026—Semiconductor dose-rate meters

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