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TWM675394U - Double-sided printed circuit board with trace offset check mark - Google Patents

Double-sided printed circuit board with trace offset check mark

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Publication number
TWM675394U
TWM675394U TW114205939U TW114205939U TWM675394U TW M675394 U TWM675394 U TW M675394U TW 114205939 U TW114205939 U TW 114205939U TW 114205939 U TW114205939 U TW 114205939U TW M675394 U TWM675394 U TW M675394U
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TW
Taiwan
Prior art keywords
offset
identification marks
double
circuit board
printed circuit
Prior art date
Application number
TW114205939U
Other languages
Chinese (zh)
Inventor
蔡金保
黃信揚
Original Assignee
易華電子股份有限公司
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Publication date
Application filed by 易華電子股份有限公司 filed Critical 易華電子股份有限公司
Priority to TW114205939U priority Critical patent/TWM675394U/en
Publication of TWM675394U publication Critical patent/TWM675394U/en

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Abstract

一種具有線路偏移檢查記號之雙面印刷電路板,用以解決習知雙面印刷電路板對於上、下線路偏移檢查困難的問題。係包含:一基板;數個偏移識別記號,分別位於該基板的上、下表面,其中四個該偏移識別記號為一組,每一組偏移識別記號在該基板另一側表面具有位置相對的另一組偏移識別記號;及一穿孔對位記號,貫穿該基板之上、下表面,且同時位於上、下表面相對位置的二組該偏移識別記號之間,與各該偏移識別記號之間的偏移分量小於一第一誤差範圍,同方向偏移分量合計小於一第二誤差範圍。藉此可以達成提高檢驗效率及提升產品良率的功效。A double-sided printed circuit board (PCB) with circuit offset inspection marks is used to solve the problem of difficulty in inspecting upper and lower circuit offsets on conventional double-sided PCBs. The system comprises: a substrate; a plurality of offset identification marks, located on the upper and lower surfaces of the substrate, respectively; four of the offset identification marks forming a group, each group of offset identification marks having another group of offset identification marks positioned oppositely on the other surface of the substrate; and a perforated alignment mark, which penetrates the upper and lower surfaces of the substrate and is located between two groups of offset identification marks positioned oppositely on the upper and lower surfaces. The offset components between the offset identification marks and each offset identification mark are less than a first error range, and the total offset components in the same direction are less than a second error range. This improves inspection efficiency and increases product yield.

Description

具有線路偏移檢查記號之雙面印刷電路板 Double-sided printed circuit board with circuit offset check marks

本創作係關於一種電子元件及線路之雙面載板,尤其是一種簡化線路偏移缺陷檢測的具有線路偏移檢查記號之雙面印刷電路板。 This invention relates to a double-sided substrate for electronic components and circuits, and more particularly to a double-sided printed circuit board with circuit deviation inspection marks that simplifies circuit deviation defect detection.

習知的雙面印刷電路板係在基板的上、下表面皆設置導電線路,係可以組裝更多的電子元件,能夠節省成本及增加安裝空間,其中,分別位於基板上、下表面的線路需要導通連接時,係可以在基板上設置通孔,使上、下線路圖案能夠通過該通孔電連接,惟,上、下線路圖案在分次製造的過程中,若發生偏移誤差,則上、下線路可能無法順利導通,甚至在裁切電路板時損壞導電線路。 Conventional double-sided printed circuit boards (PCBs) feature conductive traces on both the top and bottom surfaces of the substrate, allowing for the assembly of more electronic components, saving costs and increasing mounting space. When interconnection between the traces on the top and bottom surfaces is required, through-holes are provided in the substrate to allow electrical connection between the upper and lower trace patterns. However, if offset errors occur during the sequential manufacturing process, the upper and lower traces may not be properly connected, and the conductive traces may even be damaged when the circuit board is cut.

習知的印刷電路板在後段製程中,會透過自動光學檢查(Automated Optical Inspection,AOI)確認線路圖案是否正確,以排除斷路、短路、尺寸異常及異物等缺陷,而上述習知的雙面印刷電路板在單面檢測完畢後,還需要翻面再進行一次檢測,惟,上、下線路圖案的偏移錯位缺陷,即使進行二次檢測仍無法有效確認,可能導致缺陷電路板在後續安裝元件過程中,才被發現上、下表面的線路無法導通,而造成浪費製造成本及降低生產效率。 Conventional printed circuit board (PCB) manufacturing processes typically use automated optical inspection (AOI) to verify the correctness of circuit patterns to eliminate defects such as open circuits, short circuits, dimensional anomalies, and foreign objects. However, the conventional double-sided PCBs mentioned above require flipping over and performing another inspection after completing one-sided inspection. However, even this second inspection cannot effectively identify misaligned circuit patterns on the top and bottom surfaces. This can lead to faulty circuits not being detected until later during component assembly, resulting in wasted manufacturing costs and reduced production efficiency.

有鑑於此,習知的雙面印刷電路板及其檢測方式確實仍有加以改善之必要。 In view of this, conventional double-sided printed circuit boards and their testing methods still need to be improved.

為解決上述問題,本創作的目的是提供一種具有線路偏移檢查記號之雙面印刷電路板,係可以快速檢查上、下層線路圖案的偏移情形。 To address the aforementioned issues, this invention aims to provide a double-sided printed circuit board with trace offset detection markings, allowing for rapid inspection of trace offsets on both upper and lower layers.

本創作的次一目的是提供一種具有線路偏移檢查記號之雙面印刷電路板,係可以提升製程效率。 A secondary purpose of this invention is to provide a double-sided printed circuit board with a trace offset detection mark to improve process efficiency.

本創作的又一目的是提供一種具有線路偏移檢查記號之雙面印刷電路板,係可以提升產品良率。 Another purpose of this invention is to provide a double-sided printed circuit board with a trace offset inspection mark to improve product yield.

本創作全文所述方向性或其近似用語,例如「左」、「右」、「上(頂)」、「下(底)」、「側」等,主要係參考附加圖式的方向,各方向性或其近似用語僅用以輔助說明及理解本創作的各實施例,非用以限制本創作。 Throughout this document, directional terms or similar terms, such as "left," "right," "upper (top)," "lower (bottom)," and "side," are primarily used with reference to the directions in the accompanying drawings. These directional terms or similar terms are intended solely to facilitate the description and understanding of the various embodiments of this document and are not intended to limit this document.

本創作全文所記載的元件及構件使用「一」或「一個」之量詞,僅是為了方便使用且提供本創作範圍的通常意義;於本創作中應被解讀為包括一個或至少一個,且單一的概念也包括複數的情況,除非其明顯意指其他意思。 The use of the quantifiers "a" or "an" in the elements and components described throughout this work is merely for convenience and to provide a general understanding of the scope of this work. In this work, they should be interpreted as including one or at least one, and the singular concept also includes the plural, unless it is obvious that it means otherwise.

本創作全文所述的「第一」、「第二」、...及「第N」等用語,主要是用以區別不同要件或特徵(可以例如是元件、方向或步驟...等特徵)之描述,並無表示一對應主體或方法所具有之該等要件或特徵的最大或最小數量,亦無限定先後順序之意思。 Throughout this work, terms such as "first," "second," ..., and "Nth" are primarily used to distinguish between different elements or features (such as components, directions, or steps). They do not indicate a maximum or minimum number of such elements or features that a corresponding subject or method may possess, nor do they limit the order of precedence.

本創作的具有線路偏移檢查記號之雙面印刷電路板,包含:一 基板,該基板的上、下表面分別具有一線路層;數個偏移識別記號,分別位於該基板的上、下表面,該數個偏移識別記號位於該線路層兩側且與該線路層一起形成,其中四個該偏移識別記號為一組,每一組偏移識別記號在該基板另一側表面具有位置相對的另一組偏移識別記號;及一穿孔對位記號,貫穿該基板之上、下表面,且同時位於上、下表面相對位置的二組該偏移識別記號之間,該穿孔對位記號與周遭位於上、下表面的各該偏移識別記號之間的偏移分量小於一第一誤差範圍,在上、下表面各自的同方向偏移分量合計小於一第二誤差範圍。 The double-sided printed circuit board with circuit offset detection marks of this invention comprises: a substrate having a circuit layer on its upper and lower surfaces; a plurality of offset identification marks located on the upper and lower surfaces of the substrate, respectively. The offset identification marks are located on both sides of the circuit layer and formed together with the circuit layer, wherein four offset identification marks form a group, and each group of offset identification marks has a plurality of offset identification marks on the other side of the substrate. There is another set of offset identification marks positioned opposite each other; and a perforated alignment mark that penetrates the upper and lower surfaces of the substrate and is located between the two sets of offset identification marks at opposite positions on the upper and lower surfaces. The offset component between the perforated alignment mark and the surrounding offset identification marks on the upper and lower surfaces is less than a first error range, and the total offset component in the same direction on each of the upper and lower surfaces is less than a second error range.

據此,本創作的具有線路偏移檢查記號之雙面印刷電路板,藉由在曝光線路圖案時形成該數個偏移識別記號,再以該穿孔對位記號為基準點測量上、下表面之該數個偏移識別記號的偏移量,係可以透過自動光學檢查快速判斷雙面印刷電路板的上、下層線路圖案是否符合產品規格,係可以提升產品良率及提高檢驗製程的效率。 Based on this, the double-sided printed circuit board (PCB) with circuit offset inspection marks, which are created during circuit pattern exposure, forms several offset identification marks. The offset of these marks on the top and bottom surfaces is then measured using the perforation alignment mark as a reference point. This allows automated optical inspection to quickly determine whether the top and bottom layers of the PCB meet product specifications, thereby improving product yield and enhancing the efficiency of the inspection process.

其中,該第一誤差範圍是20微米,該第二誤差範圍是25微米。如此,圖案偏移係可以控制在產品規格內,係具有提升電路板良率的功效。 The first error range is 20 microns, and the second error range is 25 microns. This allows pattern deviation to be controlled within product specifications, improving the yield rate of printed circuit boards.

其中,各該偏移識別記號為圓形圖案,各該偏移識別記號的直徑是0.1毫米~0.2毫米。如此,自動光學檢查設備能夠辨識該偏移識別記號,係具有自動化及提升檢驗效率的功效。 Each offset identification mark is a circular pattern with a diameter of 0.1 mm to 0.2 mm. This allows automated optical inspection equipment to identify the offset identification marks, automating and improving inspection efficiency.

其中,該四個偏移識別記號按照一十字線排列,該十字線的交叉點與各該偏移識別記號的距離相等。如此,沿該十字線測量係可以取得上、下、左、右四個方向的偏移量,係具有輔助檢測圖案位置的功效。 The four offset identification marks are arranged along a crosshair, with the intersection of the crosshairs equidistant from each offset identification mark. This allows measurement along the crosshairs to determine the offset in four directions: up, down, left, and right, effectively assisting in detecting the position of the pattern.

其中,上、下之二該偏移識別記號之間及左、右之二該偏移識別記號之間各具有一辨識寬度,該辨識寬度是該二偏移識別記號的中心點之間的距離,該辨識寬度是0.8毫米~2毫米。如此,該辨識寬度係可以設置雷 射穿孔及其偏移空間,係具有設置基準點及測量偏移量的功效。 The upper and lower offset identification marks, as well as the left and right offset identification marks, each have an identification width. This distance is the distance between the center points of the two offset identification marks and is between 0.8 mm and 2 mm. This identification width allows for the placement of the laser perforation and its offset, facilitating the establishment of a reference point and the measurement of offset.

其中,該穿孔對位記號的圓心與該十字線的交叉點之間的距離為一總偏移量,該總偏移量包括在上、下方向及左、右方向的二該偏移分量。如此,係可以分別檢驗不同方位的偏移量,係具有檢驗準確度的功效。 The distance between the center of the perforated alignment mark and the intersection of the crosshairs is a total offset, which includes two offset components in the up and down directions and the left and right directions. This allows for separate verification of offset in different directions, effectively ensuring accuracy.

其中,該穿孔對位記號的圓心與該十字線的交叉點重疊,該總偏移量及各該偏移分量為零。如此,係可以快速對位記號,係具有提升檢驗效率的功效。 The center of the perforated alignment mark overlaps with the intersection of the crosshairs, and the total offset and each offset component are zero. This allows for rapid alignment, improving inspection efficiency.

其中,該穿孔對位記號的直徑是0.5毫米~1毫米。如此,該穿孔對位記號係可以透過雷射穿孔設置,係具有簡化製程步驟的功效。 The diameter of the perforation alignment mark is 0.5 mm to 1 mm. This allows the perforation alignment mark to be set via laser perforation, simplifying the manufacturing process.

1:基板 1:Substrate

2:偏移識別記號 2: Offset identification mark

3:穿孔對位記號 3: Perforation alignment mark

E:線路層 E: Line layer

T:傳動孔 T: Transmission hole

C:十字線 C: Crosshairs

P:交叉點 P: Intersection

W:辨識寬度 W: Recognition width

d1,d2:直徑 d1,d2: diameter

〔第1圖〕本創作較佳實施例的電路板配置平面圖。 [Figure 1] A plan view of the circuit board layout of a preferred embodiment of this invention.

〔第2圖〕本創作較佳實施例的檢查記號局部放大剖面圖。 [Figure 2] A partially enlarged cross-sectional view of the inspection mark of a preferred embodiment of this invention.

〔第3圖〕本創作另一實施例的檢查記號局部放大剖面圖。 [Figure 3] A partially enlarged cross-sectional view of the inspection mark of another embodiment of this invention.

〔第4圖〕本創作較佳實施例的檢查記號局部放大平面圖。 [Figure 4] A partially enlarged plan view of the inspection mark of a preferred embodiment of this invention.

為讓本創作之上述及其他目的、特徵及優點能更明顯易懂,下文特舉本創作之較佳實施例,並配合所附圖式作詳細說明;此外,在不同圖式中標示相同符號者視為相同,會省略其說明。 To make the above and other purposes, features, and advantages of this invention more clearly understood, the following provides a preferred embodiment of this invention and a detailed description thereof with reference to the accompanying drawings. Furthermore, elements marked with the same symbols in different drawings are considered identical and their descriptions are omitted.

請參照第1及2圖所示,其係本創作具有線路偏移檢查記號之雙面印刷電路板的較佳實施例,係包含一基板1、數個偏移識別記號2及一穿孔 對位記號3,該數個偏移識別記號2分別位於該基板1之上、下表面的相對位置,該穿孔對位記號3係貫穿該基板1且位於該偏移識別記號2之間。 Please refer to Figures 1 and 2, which illustrate a preferred embodiment of a double-sided printed circuit board with circuit offset detection marks according to the present invention. The board comprises a substrate 1, several offset identification marks 2, and a through-hole alignment mark 3. The offset identification marks 2 are located at opposite positions on the upper and lower surfaces of the substrate 1, respectively. The through-hole alignment mark 3 penetrates the substrate 1 and is located between the offset identification marks 2.

該基板1的上、下表面可以分別具有一線路層E,該線路層E係可以透過曝光、顯影、蝕刻等製程在該基板1的表面形成導電材質的線路圖案,用於安裝及電連接電路板上的電子元件。又,在該基板1的板邊即該線路層E的兩側可以具有成列的數個傳動孔T,用於使該基板1能夠在各製程機台上輸送並接受加工,而在該數個傳動孔T之間的空隙還可以具有數個記號,用於在各製程中進行對位或電路板產品完成後用於品管檢查。 The upper and lower surfaces of the substrate 1 may each have a circuit layer E. This circuit layer E forms a conductive pattern on the surface of the substrate 1 through processes such as exposure, development, and etching. This pattern is used to mount and electrically connect electronic components on the circuit board. Furthermore, the edges of the substrate 1, i.e., on both sides of the circuit layer E, may have a plurality of transmission holes T arranged in a row to facilitate transport and processing of the substrate 1 between various process machines. The spaces between these transmission holes T may also contain markings for alignment during the various process steps and for quality control inspection of the completed circuit board.

請參照第2~4圖所示,該數個偏移識別記號2可以是四個為一組且分別位於上、下、左、右,使該四個偏移識別記號2按照一十字線C排列,該十字線C的交叉點P較佳與各該偏移識別記號2的距離相等。上、下(左、右)之二該偏移識別記號2之間具有一辨識寬度W,該辨識寬度W可以是該二偏移識別記號2的中心點之間的距離,該辨識寬度W可以是0.8毫米~2毫米。在本實施例中,各該偏移識別記號2為圓形圖案,且各該偏移識別記號2的直徑d1可以是0.1毫米~0.2毫米,即該辨識寬度W可以是該二偏移識別記號2的圓心之間的距離,各該偏移識別記號2之圓心到該交叉點P的距離可以是0.4毫米~1毫米。惟,本創作之各該偏移識別記號2也可以是十字、菱形、米字等容易識別中心點的圖案,本創作不以此為限。 Referring to Figures 2-4 , the offset identification marks 2 can be arranged in groups of four and located at the top, bottom, left, and right, respectively. The four offset identification marks 2 are arranged along a crosshair C, with the intersection point P of the crosshairs C preferably being equidistant from each offset identification mark 2. A recognition width W is defined between the top and bottom (left and right) offset identification marks 2. This recognition width W can be the distance between the center points of the two offset identification marks 2 and can range from 0.8 mm to 2 mm. In this embodiment, each offset identification mark 2 is a circular pattern, and the diameter d1 of each offset identification mark 2 can be 0.1 mm to 0.2 mm. That is, the identification width W can be the distance between the centers of the two offset identification marks 2, and the distance from the center of each offset identification mark 2 to the intersection point P can be 0.4 mm to 1 mm. However, each offset identification mark 2 in this invention can also be a pattern with an easily identifiable center point, such as a cross, diamond, or 'poz', and this invention is not limited to this.

該數個偏移識別記號2同樣可以透過曝光、顯影、蝕刻等製程與該線路層E一起形成於該基板1表面,且每一組偏移識別記號2在該基板1另一側表面具有位置相對的另一組偏移識別記號2。如第2圖所示,各該偏移識別記號2可以與該線路層E同一高度、凸出於該基板1表面;又,如第3圖所示, 各該偏移識別記號2還可以是該基板1表面、低於周圍之該線路層E,惟,本創作不以此為限。 The multiple offset identification marks 2 can also be formed on the surface of the substrate 1 along with the circuit layer E through processes such as exposure, development, and etching. Each set of offset identification marks 2 has another set of offset identification marks 2 positioned oppositely on the other side of the substrate 1. As shown in Figure 2, each offset identification mark 2 can be at the same height as the circuit layer E, protruding from the surface of the substrate 1. Alternatively, as shown in Figure 3, each offset identification mark 2 can be located on the surface of the substrate 1, lower than the surrounding circuit layer E. However, this invention is not limited to this.

該穿孔對位記號3可以在雷射鑽孔製程中與印刷電路板上的通孔一起鑿穿設置,該穿孔對位記號3位於一組該偏移識別記號2之間,如第2圖所示,由於該穿孔對位記號3係貫穿該基板1,因此該穿孔對位記號3也同時位於該基板1另一側表面的另一組偏移識別記號2之間,該穿孔對位記號3的直徑d2可以是0.5毫米~1毫米。以該穿孔對位記號3的位置為基準點,係可以透過測量周遭該數個偏移識別記號2的偏移量,判斷該基板1上、下表面所形成一線路層E是否發生偏移。 The perforation alignment mark 3 can be drilled together with the through-hole on the printed circuit board during the laser drilling process. It is located between a set of offset identification marks 2. As shown in Figure 2, since the perforation alignment mark 3 penetrates the substrate 1, it is also located between another set of offset identification marks 2 on the other side of the substrate 1. The diameter d2 of the perforation alignment mark 3 can be between 0.5 mm and 1 mm. Using the position of the perforation alignment mark 3 as a reference point, the offset of the surrounding offset identification marks 2 can be measured to determine whether a circuit layer E formed on the upper and lower surfaces of the substrate 1 has offset.

在印刷電路板的外觀檢查過程中,會透過自動光學檢查測量該穿孔對位記號3與周遭分別位於該基板1之上、下表面的該數個偏移識別記號2之間的相對距離,若該線路層E及該數個偏移識別記號2的曝光圖案未發生任何偏移,如第3圖所示,該穿孔對位記號3的圓心與該十字線C的交叉點P重疊。當該交叉點P與該穿孔對位記號3的圓心之間測量到一總偏移量,則該總偏移量在各方向(上、下表面的上、下、左、右方向)的偏移分量皆小於一第一誤差範圍,即可判定該印刷電路板為良品,否則為不良品,該第一誤差範圍可以是20微米。 During the visual inspection of printed circuit boards (PCBs), automated optical inspection measures the relative distances between the perforation alignment mark 3 and the surrounding offset identification marks 2 located on the upper and lower surfaces of the substrate 1. If the exposure pattern of the circuit layer E and the offset identification marks 2 is consistent, as shown in Figure 3, the center of the perforation alignment mark 3 overlaps with the intersection P of the crosshairs C. A total offset is measured between the intersection P and the center of the perforation alignment mark 3. If the offset components of this total offset in all directions (upward, downward, leftward, and rightward on both the upper and lower surfaces) are all less than a first error range, the PCB is considered acceptable. Otherwise, it is considered defective. This first error range can be 20 microns.

另外,在上、下表面各自的同方向偏移分量合計後必須小於一第二誤差範圍,該第二誤差範圍可以是25微米,舉例說明,在上表面的偏移量為向右15微米且下表面的偏移量為向右15微米,則上、下表面之該線路層E及該數個偏移識別記號2僅與該穿孔對位記號3發生偏移,彼此之間的偏移量剛好抵銷,各偏移分量皆在誤差範圍內,屬於良品;又,在上表面的偏移量 為向右15微米且下表面的偏移量為向左15微米(即向右-15微米),則雖然上、下表面之該線路層E及該數個偏移識別記號2各自與該穿孔對位記號3之間的偏移量在誤差範圍內,但是,上、下表面彼此之間的偏移量合計為30微米,已超出該第二誤差範圍,屬於不良品。 In addition, the sum of the offset components in the same direction on the upper and lower surfaces must be less than a second error range. The second error range can be 25 microns. For example, if the offset on the upper surface is 15 microns to the right and the offset on the lower surface is 15 microns to the right, then the circuit layer E and the offset identification marks 2 on the upper and lower surfaces are only offset from the perforation alignment mark 3. The offsets between them are exactly offset, and each offset component is within the error range. The deviation on the top surface is 15 microns to the right, and the deviation on the bottom surface is 15 microns to the left (i.e., -15 microns to the right). While the deviations between the circuit layer E and the offset identification marks 2 on both the top and bottom surfaces and the perforation alignment mark 3 are within the error range, the total deviation between the top and bottom surfaces is 30 microns, exceeding the second error range and thus being a defective product.

綜上所述,本創作的具有線路偏移檢查記號之雙面印刷電路板,藉由在曝光線路圖案時形成該數個偏移識別記號,再以該穿孔對位記號為基準點測量上、下表面之該數個偏移識別記號的偏移量,係可以透過自動光學檢查快速判斷雙面印刷電路板的上、下層線路圖案是否符合產品規格,係可以提升產品良率及提高檢驗製程的效率。 In summary, this invention's double-sided printed circuit board with circuit offset inspection marks forms several offset identification marks during circuit pattern exposure. The offset of these multiple offset identification marks on the top and bottom surfaces is then measured using the perforation alignment mark as a reference point. This allows automated optical inspection to quickly determine whether the top and bottom layers of a double-sided printed circuit board meet product specifications, thereby improving product yield and enhancing the efficiency of the inspection process.

雖然本創作已利用上述較佳實施例揭示,然其並非用以限定本創作,任何熟習此技藝者在不脫離本創作之精神和範圍之內,相對上述實施例進行各種更動與修改仍屬本創作所保護之技術範疇,因此本創作之保護範圍當包含後附之申請專利範圍所記載的文義及均等範圍內之所有變更。 Although this invention has been disclosed using the preferred embodiments described above, they are not intended to limit this invention. Any person skilled in the art may make various changes and modifications to the embodiments described above without departing from the spirit and scope of this invention. These changes and modifications are still within the scope of technology protected by this invention. Therefore, the scope of protection of this invention shall include all changes within the meaning and equivalent scope of the attached patent application.

1:基板 1:Substrate

2:偏移識別記號 2: Offset identification mark

3:穿孔對位記號 3: Perforation alignment mark

E:線路層 E: Line layer

T:傳動孔 T: Transmission hole

Claims (8)

一種具有線路偏移檢查記號之雙面印刷電路板,包含: 一基板,該基板的上、下表面分別具有一線路層; 數個偏移識別記號,分別位於該基板的上、下表面,該數個偏移識別記號位於該線路層兩側且與該線路層一起形成,其中四個該偏移識別記號為一組,每一組偏移識別記號在該基板另一側表面具有位置相對的另一組偏移識別記號;及 一穿孔對位記號,貫穿該基板之上、下表面,且同時位於上、下表面相對位置的二組該偏移識別記號之間,該穿孔對位記號與周遭位於上、下表面的各該偏移識別記號之間的偏移分量小於一第一誤差範圍,在上、下表面各自的同方向偏移分量合計小於一第二誤差範圍。A double-sided printed circuit board with circuit offset detection marks comprises: a substrate having a circuit layer on its upper and lower surfaces; a plurality of offset identification marks located on the upper and lower surfaces of the substrate, respectively, the offset identification marks being located on both sides of the circuit layer and formed together with the circuit layer, wherein four of the offset identification marks form a group, and each group of offset identification marks has another group of offset identification marks located oppositely on the other side of the substrate; and A perforated alignment mark passes through the upper and lower surfaces of the substrate and is simultaneously located between two sets of offset identification marks at relatively opposite positions on the upper and lower surfaces. The offset component between the perforated alignment mark and each of the surrounding offset identification marks located on the upper and lower surfaces is less than a first error range, and the total offset component in the same direction on each of the upper and lower surfaces is less than a second error range. 如請求項1之具有線路偏移檢查記號之雙面印刷電路板,其中,該第一誤差範圍是20微米,該第二誤差範圍是25微米。A double-sided printed circuit board with a line deviation check mark as claimed in claim 1, wherein the first error range is 20 microns and the second error range is 25 microns. 如請求項1之具有線路偏移檢查記號之雙面印刷電路板,其中,各該偏移識別記號為圓形圖案,各該偏移識別記號的直徑是0.1毫米〜0.2毫米。A double-sided printed circuit board with a line offset check mark as claimed in claim 1, wherein each of the offset identification marks is a circular pattern, and the diameter of each of the offset identification marks is 0.1 mm to 0.2 mm. 如請求項1之具有線路偏移檢查記號之雙面印刷電路板,其中,該四個偏移識別記號按照一十字線排列,該十字線的交叉點與各該偏移識別記號的距離相等。A double-sided printed circuit board with line offset check marks as claimed in claim 1, wherein the four offset identification marks are arranged according to a cross line, and the intersection of the cross line is equidistant from each of the offset identification marks. 如請求項4之具有線路偏移檢查記號之雙面印刷電路板,其中,上、下之二該偏移識別記號之間及左、右之二該偏移識別記號之間各具有一辨識寬度,該辨識寬度是該二偏移識別記號的中心點之間的距離,該辨識寬度是0.8毫米〜2毫米。As in claim 4, a double-sided printed circuit board with a line offset check mark, wherein there is an identification width between the two upper and lower offset identification marks and between the two left and right offset identification marks, and the identification width is the distance between the center points of the two offset identification marks, and the identification width is 0.8 mm to 2 mm. 如請求項4之具有線路偏移檢查記號之雙面印刷電路板,其中,該穿孔對位記號的圓心與該十字線的交叉點之間的距離為一總偏移量,該總偏移量包括在上、下方向及左、右方向的二該偏移分量。As in claim 4, a double-sided printed circuit board with a line offset check mark, wherein the distance between the center of the perforated alignment mark and the intersection of the cross line is a total offset, and the total offset includes two offset components in the upper and lower directions and the left and right directions. 如請求項6之具有線路偏移檢查記號之雙面印刷電路板,其中,該穿孔對位記號的圓心與該十字線的交叉點重疊,該總偏移量及各該偏移分量為零。A double-sided printed circuit board with a line offset check mark as claimed in claim 6, wherein the center of the perforated alignment mark overlaps with the intersection of the crosshairs, and the total offset and each of the offset components are zero. 如請求項1之具有線路偏移檢查記號之雙面印刷電路板,其中,該穿孔對位記號的直徑是0.5毫米〜1毫米。A double-sided printed circuit board with a line deviation check mark as claimed in claim 1, wherein the diameter of the perforation alignment mark is 0.5 mm to 1 mm.
TW114205939U 2025-06-10 2025-06-10 Double-sided printed circuit board with trace offset check mark TWM675394U (en)

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