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TWI910605B - Laser processing apparatus - Google Patents

Laser processing apparatus

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Publication number
TWI910605B
TWI910605B TW113114643A TW113114643A TWI910605B TW I910605 B TWI910605 B TW I910605B TW 113114643 A TW113114643 A TW 113114643A TW 113114643 A TW113114643 A TW 113114643A TW I910605 B TWI910605 B TW I910605B
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Taiwan
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optical system
lens
laser
laser light
lens group
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TW113114643A
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Chinese (zh)
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TW202541942A (en
Inventor
洪錫重
金炳吾
申星權
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南韓商Eo科技股份有限公司
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Abstract

揭示一種雷射加工裝置。所揭示的雷射加工裝置包括:雷射光源,產生雷射光;空間光調變器,對自雷射光源提供的雷射光進行調變以形成處理調變圖案;聚光光學系統,使在空間光調變器中調變的雷射光在處理對象聚光;中繼透鏡光學系統,位於空間光調變器與聚光光學系統之間;以及控制部,對空間光調變器進行控制,以按照處理調變圖案對雷射光進行調變。中繼透鏡光學系統配備成使藉由空間光調變器形成的處理調變圖案的像傳遞至聚光光學系統的入射瞳,且包括第一透鏡組、第二透鏡組、位於第一透鏡組與第二透鏡組之間的場透鏡。 A laser processing apparatus is disclosed. The disclosed laser processing apparatus includes: a laser source for generating laser light; a spatial light modulator for modulating the laser light provided from the laser source to form a processing modulation pattern; a focusing optical system for focusing the laser light modulated in the spatial light modulator onto a processing object; a relay lens optical system located between the spatial light modulator and the focusing optical system; and a control unit for controlling the spatial light modulator to modulate the laser light according to the processing modulation pattern. The relay lens optical system is configured to transmit an image of the processing modulation pattern formed by the spatial light modulator to the entrance pupil of the focusing optical system, and includes a first lens group, a second lens group, and a field lens located between the first lens group and the second lens group.

Description

雷射加工裝置 Laser processing equipment

本發明是有關於一種包括中繼透鏡(relay lens)光學系統的雷射加工裝置。This invention relates to a laser processing apparatus that includes a relay lens optical system.

雷射處理製程是指對對象體的表面照射雷射光以對對象體表面的形狀或物理性質等進行處理的製程。為了進行雷射處理製程,使自雷射光源發射的雷射光聚焦於處理對象的規定部位。Laser processing refers to the process of irradiating the surface of an object with laser light to treat the shape or physical properties of the object's surface. In order to perform laser processing, the laser light emitted from the laser source is focused on a specified area of the object to be processed.

雷射加工裝置可以非接觸式進行高精密度的處理而與處理對象的材質無關。由於是利用形成斑點(spot)的聚焦雷射光進行處理,因此確保處理對象的熱穩定性,且可不受處理區域的大小的限制而執行超精密處理。Laser processing equipment can perform high-precision processing in a non-contact manner, regardless of the material of the object being processed. Because it uses focused laser light to form spots for processing, the thermal stability of the object being processed is ensured, and ultra-precision processing can be performed without being limited by the size of the processing area.

此種雷射加工裝置可由用於進行雷射處理的光學系統來決定大小。因此,需要一種用於實現雷射加工裝置的小型化的光學系統設計。The size of such a laser processing apparatus can be determined by the optical system used to perform the laser processing. Therefore, a miniaturized optical system design is needed to realize the laser processing apparatus.

技術課題Technical issues

提供一種包括以可縮小大小的方式設計的中繼透鏡光學系統的雷射加工裝置。A laser processing apparatus is provided, comprising a relay lens optical system designed in a resizable manner.

解決課題之手段Methods for solving problems

根據一類型的雷射加工裝置包括:雷射光源,產生雷射光;空間光調變器,對自所述雷射光源提供的雷射光進行調變以形成處理調變圖案;聚光光學系統,使在所述空間光調變器中調變的雷射光在處理對象聚光;中繼透鏡光學系統,位於所述空間光調變器與所述聚光光學系統之間,配備成使藉由所述空間光調變器形成的處理調變圖案的像傳遞至所述聚光光學系統的入射瞳,且包括第一透鏡組、第二透鏡組、位於第一透鏡組與第二透鏡組之間的場透鏡;以及控制部,對所述空間光調變器進行控制,以按照所述處理調變圖案對雷射光進行調變。A laser processing apparatus of one type includes: a laser light source for generating laser light; a spatial light modulator for modulating the laser light provided from the laser light source to form a processing modulation pattern; a focusing optical system for focusing the laser light modulated in the spatial light modulator onto a processing object; a relay lens optical system located between the spatial light modulator and the focusing optical system, configured to transmit an image of the processing modulation pattern formed by the spatial light modulator to the entrance pupil of the focusing optical system, and including a first lens group, a second lens group, and a field lens located between the first lens group and the second lens group; and a control unit for controlling the spatial light modulator to modulate the laser light according to the processing modulation pattern.

所述第一透鏡組及所述第二透鏡組可分別包括兩片以上透鏡。The first lens group and the second lens group may each include two or more lenses.

所述第一透鏡組及所述第二透鏡組分別包括具有正折射力的第一透鏡及具有負折射力的第二透鏡,所述場透鏡可配備成具有正折射力。The first lens group and the second lens group respectively include a first lens with positive refractive power and a second lens with negative refractive power, and the field lens can be configured to have positive refractive power.

所述中繼透鏡光學系統可以形成3f透鏡單元的方式配備。The relay lens optical system can be configured in the form of 3F lens units.

所述空間光調變器可根據所述控制部的控制形成所述處理調變圖案,以使按照所述處理調變圖案調變的雷射光藉由所述聚光光學系統而在所述處理對象內部在彼此不同深度的多個聚光點聚光。The spatial light modulator can form the processing modulation pattern under the control of the control unit, so that the laser light modulated according to the processing modulation pattern is focused by the focusing optical system at multiple focusing points at different depths within the processed object.

按照所述處理調變圖案調變的雷射光可包含相對於基本光成分折射力不同的光成分。Laser light modulated according to the modulation pattern described above may contain light components with different refractive intensities relative to the basic light components.

所述空間光調變器可包括反射型空間光調變器。The spatial light modulator may include a reflective spatial light modulator.

更包括光學部件,在將自所述雷射光源側入射至所述光學部件的所述雷射光的行進方向稱為第一行進方向時,所述光學部件可為稜鏡結構,所述稜鏡結構配備成使所述雷射光傾斜地入射至所述空間光調變器且使在所述空間光調變器中調變並反射的雷射光沿著與所述第一行進方向平行的方向行進,且內部反射面與所述空間光調變器平行。It further includes optical components. When the direction of travel of the laser light incident on the optical component from the laser light source side is referred to as the first direction of travel, the optical component may be a prism structure. The prism structure is configured to cause the laser light to be incident obliquely on the spatial light modulator and to cause the laser light modulated and reflected in the spatial light modulator to travel in a direction parallel to the first direction of travel, and the internal reflecting surface is parallel to the spatial light modulator.

所述聚光光學系統可包括:物鏡,使入射的所述雷射光在處理對象聚光。The focusing optical system may include an objective lens that focuses the incident laser light onto the object being processed.

所述聚光光學系統可更包括:光束擴展器(beam expander),配備於所述中繼透鏡光學系統與所述物鏡之間,以將所述雷射光的束寬擴大。The focusing optical system may further include a beam expander, configured between the relay lens optical system and the objective lens, to expand the beamwidth of the laser light.

更包括位於所述中繼透鏡光學系統與所述物鏡之間的反射鏡,且所述光束擴展器可佈置於所述中繼透鏡光學系統與反射鏡之間或所述反射鏡與物鏡之間。It further includes a reflector located between the relay lens optical system and the objective lens, and the beam expander can be disposed between the relay lens optical system and the reflector or between the reflector and the objective lens.

可更包括:台(stage),以可進行二維平面移動的方式構成;以及台位置控制部,對所述台的二維平面移動進行控制。It may further include: a stage, configured to be capable of two-dimensional planar movement; and a stage position control unit for controlling the two-dimensional planar movement of the stage.

根據一類型的雷射加工裝置可包括:雷射光源,產生雷射光;反射型空間光調變器,對自所述雷射光源提供的雷射光進行調變以形成處理調變圖案;聚光光學系統,使在所述反射型空間光調變器中調變的雷射光在處理對象聚光,且包括物鏡;中繼透鏡光學系統,位於所述反射型空間光調變器與所述聚光光學系統之間,配備成使藉由所述反射型空間光調變器形成的處理調變圖案的像傳遞至所述聚光光學系統的入射瞳,且包括第一透鏡組、第二透鏡組、位於第一透鏡組與第二透鏡組之間的場透鏡;台,以可進行二維平面移動的方式構成;台位置控制部,對所述台的二維平面移動進行控制;以及控制部,對所述空間光調變器進行控制,以按照所述處理調變圖案對雷射光進行調變。A laser processing apparatus of one type may include: a laser source for generating laser light; a reflective spatial light modulator for modulating the laser light provided from the laser source to form a processing modulation pattern; a focusing optical system for focusing the laser light modulated in the reflective spatial light modulator onto a processing object, and including an objective lens; and a relay lens optical system located between the reflective spatial light modulator and the focusing optical system, configured to allow the laser light modulated in the reflective spatial light modulator to pass through the processing object. The image of the processed modulation pattern formed by the spatial light modulator is transmitted to the entrance pupil of the focusing optical system, and includes a first lens group, a second lens group, and a field lens located between the first lens group and the second lens group; a stage configured to be movable in a two-dimensional plane; a stage position control unit for controlling the two-dimensional plane movement of the stage; and a control unit for controlling the spatial light modulator to modulate the laser light according to the processed modulation pattern.

所述第一透鏡組及第二透鏡組可分別包括兩片以上透鏡。The first lens group and the second lens group may each include two or more lenses.

所述第一透鏡組及第二透鏡組可分別包括具有正折射力的第一透鏡及具有負折射力的第二透鏡,所述場透鏡可配備成具有正折射力。The first lens group and the second lens group may respectively include a first lens with positive refractive power and a second lens with negative refractive power, and the field lens may be configured to have positive refractive power.

所述中繼透鏡光學系統可以形成3f透鏡單元的方式配備。The relay lens optical system can be configured in the form of 3F lens units.

所述空間光調變器可根據所述控制部的控制形成所述處理調變圖案,以使按照所述處理調變圖案調變的雷射光藉由所述聚光光學系統而在所述處理對象內部在彼此不同深度的多個聚光點聚光。The spatial light modulator can form the processing modulation pattern under the control of the control unit, so that the laser light modulated according to the processing modulation pattern is focused by the focusing optical system at multiple focusing points at different depths within the processed object.

按照所述處理調變圖案調變的雷射光可包含相對於基本光成分折射力不同的光成分。Laser light modulated according to the modulation pattern described above may contain light components with different refractive intensities relative to the basic light components.

更包括位於所述中繼透鏡光學系統與所述物鏡之間的反射鏡,所述聚光光學系統可更包括光束擴展器,所述光束擴展器配備於所述中繼透鏡光學系統與反射鏡之間或所述反射鏡與物鏡之間,以將所述雷射光的束寬擴大。It further includes a reflector located between the relay lens optical system and the objective lens, and the focusing optical system may further include a beam expander configured between the relay lens optical system and the reflector or between the reflector and the objective lens to amplify the beamwidth of the laser light.

更包括光學部件,所述光學部件可為以下稜鏡結構:在將自所述雷射光源側入射至所述光學部件的所述雷射光的行進方向稱為第一行進方向時,配備成使所述雷射光傾斜地入射至所述空間光調變器且使在所述空間光調變器中調變並反射的雷射光沿著與所述第一行進方向平行的方向行進,且內部反射面與所述空間光調變器平行。It further includes an optical component, which may be a prism structure in which, when the direction of travel of the laser light incident on the optical component from the laser light source side is referred to as the first direction of travel, it is configured to cause the laser light to be incident obliquely on the spatial light modulator and to cause the laser light modulated and reflected in the spatial light modulator to travel in a direction parallel to the first direction of travel, and the internal reflecting surface is parallel to the spatial light modulator.

發明的效果The effect of the invention

根據實施例的雷射加工裝置,由於可縮小用於在雷射光源與聚光光學系統之間進行光傳遞的中繼透鏡光學系統,因此可實現裝置的小型化。另外,亦可減少中繼透鏡光學系統的透鏡個數,從而可實現包括光學系統的長度減小及由更少個數的透鏡構成組成的光學系統的雷射加工裝置。According to the laser processing apparatus of the embodiment, miniaturization of the apparatus is achieved because the relay lens optical system used for light transmission between the laser light source and the focusing optical system can be reduced in size. In addition, the number of lenses in the relay lens optical system can also be reduced, thereby enabling a laser processing apparatus that includes a reduction in the length of the optical system and an optical system composed of fewer lenses.

以下,將參照附圖對例示性實施例詳細地進行說明。在以下圖式中,相同的參考符號是指相同的構成要素,且圖式中各構成要素的大小可能由於說明的明了性與便利性而誇大。另一方面,以下說明的實施例僅是例示性的,且可自此種實施例進行各種變形。The following description provides a detailed explanation of illustrative embodiments with reference to the accompanying drawings. In the following figures, the same reference numerals refer to the same constituent elements, and the sizes of the constituent elements in the figures may be exaggerated for clarity and convenience of explanation. On the other hand, the embodiments described below are merely illustrative and various modifications can be made from such embodiments.

以下,記載為「上部」或「上」的表述可不僅包括接觸而直接位於上、下、左、右的情形,亦包括以非接觸方式位於上、下、左、右的情形。除非在上下文中明確不同地表示,否則單數的表述包括複數的表述。另外,當某一部分「包括」某一構成要素時,除非另有特別相反的記載,否則此意指可更包括其他構成要素而並非排除其他構成要素。Hereinafter, the expressions "upper" or "above" may include not only situations where the object is directly located in contact with the object above, below, left, or right, but also situations where the object is located in a non-contact manner above, below, left, or right. Unless the context clearly indicates otherwise, the singular expression includes the plural expression. Furthermore, when a part "includes" a constituent element, unless otherwise specifically stated to the contrary, this meaning may include other constituent elements rather than exclude them.

使用「所述」的用語及與其相似的指示用語可同時與單數及複數對應。對於構成方法的步驟,在沒有明確地記載順序或沒有相反的記載的情況下,該些步驟可按照適當的順序進行,並不一定限於記載的順序。The use of the term "described" and similar descriptive terms may correspond to both the singular and the plural. As for the steps constituting a method, in the absence of an explicit description of the order or a contrary description, the steps may be performed in an appropriate order, and are not necessarily limited to the order described.

另外,說明書中記載的「...部」、「模組」等用語意指對至少一個功能或動作進行處理的單位,其可藉由硬體或軟體實現或者藉由硬體與軟體的組合來實現。In addition, the terms "...part" and "module" used in the instruction manual refer to a unit that processes at least one function or action, which can be implemented by hardware or software or by a combination of hardware and software.

圖式所示的構成要素之間的線的連接或連接部件例示性地表示功能連接及/或實體連接或電路連接,且可在實際裝置中作為可替代或附加的各種功能連接、實體連接或電路連接進行表示。The lines connecting or connecting components between the constituent elements shown in the diagram illustratively represent functional and/or physical or electrical connections, and may be represented in an actual device as various alternative or additional functional, physical or electrical connections.

使用所有例子或者例示性用語僅是為了詳細說明技術思想,並非由未被申請專利範圍限定的以上此種例子或者例示性用語來限定範圍。All examples or illustrative terms are used only to illustrate the technical ideas in detail, and are not intended to limit the scope of the claims.

根據以下參照圖式說明的實施例的雷射加工裝置可應用於隱形劃切(stealth dicing)方式的雷射加工裝置,所述隱形劃切方式的雷射加工裝置例如在半導體後製程中包括的切割製程中使雷射光在半導體晶圓內部聚光來形成改質區域,且使半導體晶圓由於自改質區域產生的裂紋而被切割。The laser processing apparatus according to the embodiments described below with reference to the drawings can be applied to a stealth dicing laser processing apparatus, for example, in a dicing process included in semiconductor post-processing, where laser light is focused inside a semiconductor wafer to form a modified region, and the semiconductor wafer is diced due to cracks generated from the modified region.

圖1概略性地顯示根據實施例的雷射加工裝置100。圖2是簡要示出圖1的處理對象1的例示性構成的平面圖。Figure 1 schematically shows the laser processing apparatus 100 according to an embodiment. Figure 2 is a plan view that simply shows the exemplary configuration of the processing object 1 of Figure 1.

參照圖1,雷射加工裝置100包括:雷射光源10,產生雷射光;空間光調變器30,對自雷射光源10提供的雷射光進行調變以形成處理調變圖案;聚光光學系統60,使在空間光調變器30中按照處理調變圖案調變的雷射光在處理對象1聚光;中繼透鏡光學系統50,使藉由空間光調變器30形成的處理調變圖案的像傳遞至聚光光學系統60的入射瞳;以及控制部20,對空間光調變器30進行控制,以按照處理調變圖案對雷射光進行調變。雷射加工裝置100配備成使控制部20不僅控制空間光調變器30亦控制雷射光源10,或者可配備成使雷射光源10由單獨的控制部控制。圖1中顯示配備成控制部20對空間光調變器30及雷射光源10進行控制的例子。另一方面,雷射加工裝置100可更包括:台3,用於使放置於支撐台5的安置面上的處理對象1移動;以及台位置控制部70,對台3的位置進行控制。另外,雷射加工裝置100可更包括光學系統位置控制部(未圖示),所述光學系統位置控制部對聚光光學系統60與處理對象1的相對距離進行調整,以調整在處理對象1內部雷射光的聚光點的位置。根據此種實施例的雷射加工裝置100可將藉由空間光調變器30按照處理調變圖案調變的雷射光照射至處理對象1來執行例如切割製程等處理製程。Referring to FIG1, the laser processing apparatus 100 includes: a laser light source 10 for generating laser light; a spatial light modulator 30 for modulating the laser light provided from the laser light source 10 to form a processing modulation pattern; a focusing optical system 60 for focusing the laser light modulated in the spatial light modulator 30 according to the processing modulation pattern on the processing object 1; a relay lens optical system 50 for transmitting the image of the processing modulation pattern formed by the spatial light modulator 30 to the entrance pupil of the focusing optical system 60; and a control unit 20 for controlling the spatial light modulator 30 to modulate the laser light according to the processing modulation pattern. The laser processing apparatus 100 is configured such that the control unit 20 controls not only the spatial light modulator 30 but also the laser light source 10, or it may be configured such that the laser light source 10 is controlled by a separate control unit. Figure 1 shows an example in which the control unit 20 controls both the spatial light modulator 30 and the laser light source 10. On the other hand, the laser processing apparatus 100 may further include: a stage 3 for moving the object 1 placed on the mounting surface of the support stage 5; and a stage position control unit 70 for controlling the position of the stage 3. In addition, the laser processing apparatus 100 may further include an optical system position control unit (not shown) that adjusts the relative distance between the focusing optical system 60 and the object 1 to adjust the position of the focusing point of the laser light inside the object 1. According to this embodiment, the laser processing apparatus 100 can irradiate the processing object 1 with laser light modulated by the spatial light modulator 30 according to the processing modulation pattern to perform processing processes such as cutting.

處理對象1可包括例如半導體晶圓。處理對象1可包括由矽半導體物質製成的半導體晶圓或其他材質的半導體晶圓。例如,參照圖2,處理對象1可包括在上部二維排列有多個功能元件2的半導體晶圓。但不限於此,在處理對象1包括的半導體晶圓上亦可不配備多個功能元件2。處理對象1不限於半導體晶圓,且可由各種材質製成。The object to be processed 1 may include, for example, a semiconductor wafer. The object to be processed 1 may include a semiconductor wafer made of silicon semiconductor material or a semiconductor wafer made of other materials. For example, referring to FIG2, the object to be processed 1 may include a semiconductor wafer with multiple functional elements 2 arranged in a two-dimensional arrangement on its upper part. However, it is not limited to this; the semiconductor wafer included in the object to be processed may not be equipped with multiple functional elements 2. The object to be processed 1 is not limited to a semiconductor wafer and may be made of various materials.

多個功能元件2可包括光電二極體等光接收元件、雷射二極體等發光元件、邏輯元件或記憶體元件等電路元件中的任一者。但並不限於此,多個功能元件2可包括除所述元件以外的各種種類的元件。藉由根據實施例的雷射加工裝置100,可沿著對配備有多個功能元件2的區域進行區分的切割預定線L對處理對象1進行切割。切割預定線L可包括在第一方向上延伸且在和第一方向垂直的第二方向上平行排列的多條第一線與在第二方向上延伸且在第一方向上平行排列的多條第二線彼此交叉的結構。在此情況下,第一方向與第二方向可彼此垂直。但不限於此,第一方向與第二方向亦可彼此不垂直。The multiple functional elements 2 may include any of the following: light-receiving elements such as photodiodes, light-emitting elements such as laserdiodes, circuit elements such as logic elements or memory elements. However, they are not limited to this; the multiple functional elements 2 may include various types of elements other than those described above. Using the laser processing apparatus 100 according to the embodiment, the object 1 can be cut along a predetermined cutting line L that divides the area equipped with the multiple functional elements 2. The predetermined cutting line L may include a structure in which multiple first lines extending in a first direction and arranged parallel to each other in a second direction perpendicular to the first direction, and multiple second lines extending in the second direction and arranged parallel to each other in the first direction intersect each other. In this case, the first direction and the second direction may be perpendicular to each other. However, they are not limited to this; the first direction and the second direction may also not be perpendicular to each other.

雷射光源10可發射對處理對象1具有透射性的脈波型雷射光。另外,當雷射光聚光於處理對象1內部時,雷射光源10可發射具有可在處理對象1內部發生多光子吸收(multiphoton absorption)條件的脈波型雷射光。關於可發生多光子吸收的條件,在隱形劃切技術領域中廣為人知,因此在此處省略對其的說明。The laser source 10 can emit pulsed laser light that is transmissive to the object being processed 1. Furthermore, when the laser light is focused inside the object being processed 1, the laser source 10 can emit pulsed laser light that exhibits conditions for multiphoton absorption within the object being processed 1. The conditions for multiphoton absorption are well-known in the field of stealth dicing technology, and therefore, their description is omitted here.

空間光調變器(spatial light modulator,SLM)30可對自雷射光源10側入射的雷射光進行空間調變來形成處理調變圖案。可由控制部20控制空間光調變器30,以按照設定的處理調變圖案對雷射光進行調變。根據控制部20的控制,在空間光調變器30中按照處理調變圖案調變的雷射光可藉由聚光光學系統60在處理對象1內部的彼此不同深度的多個聚光點聚光。The spatial light modulator (SLM) 30 can spatially modulate laser light incident from the side of the laser source 10 to form a processing modulation pattern. The control unit 20 can control the spatial light modulator 30 to modulate the laser light according to the set processing modulation pattern. According to the control unit 20, the laser light modulated according to the processing modulation pattern in the spatial light modulator 30 can be focused by the focusing optical system 60 at multiple focusing points at different depths inside the processing object 1.

控制部20可控制空間光調變器30,以形成設定的處理調變圖案。另外,控制部20可根據處理對象1及/或根據處理方向來控制空間光調變器30,以對處理調變圖案進行調整,從而調整雷射光的聚光點位置。The control unit 20 can control the spatial light modulator 30 to form a preset processing modulation pattern. In addition, the control unit 20 can control the spatial light modulator 30 according to the processing object 1 and/or according to the processing direction to adjust the processing modulation pattern, thereby adjusting the focal point position of the laser light.

作為空間光調變器30,可包括反射型空間光調變器。作為另一例,作為空間光調變器30亦可包括透射型空間光調變器。在圖1及後述的圖7及圖8中,空間光調變器30以反射型空間光調變器為例進行說明及圖示,但並不限於此。Spatial light modulator 30 may include a reflective spatial light modulator. As another example, spatial light modulator 30 may also include a transmissive spatial light modulator. In FIG1 and FIG7 and FIG8 described below, spatial light modulator 30 is illustrated and illustrated using a reflective spatial light modulator as an example, but is not limited thereto.

空間光調變器30例如可配備成以畫素單位或子畫素單位進行光控制。空間光調變器30可包括例如反射型液晶(矽上液晶(Liquid Crystal on Silicon,LCOS))空間光調變器,以反射並輸出入射的雷射光,並根據控制部20的控制按照處理調變圖案對雷射光進行調變。反射型液晶空間光調變器根據由各畫素或子畫素在液晶層形成的電場(electric field)而使液晶分子的排列方向發生變化,因此,通過液晶層的雷射光的相位亦會因畫素而不同。藉由此種相位調變,可形成處理調變圖案。The spatial light modulator 30 can be configured to control light at the pixel level or sub-pixel level. The spatial light modulator 30 may include, for example, a reflective liquid crystal on silicon (LCOS) spatial light modulator to reflect and output incident laser light, and modulate the laser light according to a processing modulation pattern under the control of the control unit 20. The reflective liquid crystal spatial light modulator changes the alignment direction of liquid crystal molecules based on the electric field formed by each pixel or sub-pixel in the liquid crystal layer; therefore, the phase of the laser light passing through the liquid crystal layer also differs from pixel to pixel. This phase modulation allows the formation of a processing modulation pattern.

作為另一例,空間光調變器30可包括數位光處理(Digital Light Processing,DLP)型空間光調變器,所述DLP型空間光調變器包括數位微鏡元件(digital mirror device,DMD)的二維排列以使得可以畫素單位或子畫素單位進行光控制。DLP型空間光調變器可以畫素單位或子畫素單位接通/關閉光,或以使反射的光的行進方向及由此產生的發散角變不同的方式進行調整,從而形成處理調變圖案。As another example, the spatial light modulator 30 may include a digital light processing (DLP) type spatial light modulator, which includes a two-dimensional arrangement of digital mirror devices (DMDs) to enable light control at the pixel level or sub-pixel level. The DLP type spatial light modulator can turn light on/off at the pixel level or sub-pixel level, or adjust the direction of travel of reflected light and the resulting divergence angle in different ways to form a processing modulation pattern.

空間光調變器30可形成處理調變圖案,以使按照處理調變圖案調變的雷射光可在處理對象1內部的彼此不同深度的多個聚光點聚光。此時,按照處理調變圖案調變的雷射光可包含相對於基本光成分折射力不同的光成分。折射力不同的光成分是對基本光成分進行散焦的光成分,且可對應於具有負折射力及/或正折射力的光成分。基本光成分表示折射力未被空間光調變器30調整的光成分,而散焦的光成分可表示折射力被空間光調變器30調整的光成分。折射力不同的光成分聚光的聚光點可位於基本光成分聚光的聚光點之前或之後。The spatial light modulator 30 can form a processing modulation pattern so that laser light modulated according to the processing modulation pattern can be focused at multiple focal points at different depths within the processing object 1. At this time, the laser light modulated according to the processing modulation pattern may contain light components with different refractive intensities relative to the basic light component. The light components with different refractive intensities are light components that defocus the basic light component and may correspond to light components with negative and/or positive refractive intensities. The basic light component represents the light component whose refractive intensities are not adjusted by the spatial light modulator 30, while the defocused light component may represent the light component whose refractive intensities are adjusted by the spatial light modulator 30. The focal point of the light components with different refractive intensities can be located before or after the focal point of the basic light component.

作為一例,空間光調變器30可由控制部20控制,以使按照處理調變圖案調變的雷射光包括基本光成分及與其折射力不同的光成分。折射力不同的光成分可為表示正折射力或負折射力的光成分。在此情況下,在圖3中,第一聚光點P1及第二聚光點P2中的一者為例如基本光成分的聚光點,而另一者可為以相對於基本光成分顯示負折射力或正折射力的方式散焦的光成分的聚光點。As an example, the spatial light modulator 30 can be controlled by the control unit 20 so that the laser light modulated according to the processing modulation pattern includes a basic light component and a light component with a different refractive power. The light component with a different refractive power can be a light component representing positive or negative refractive power. In this case, in FIG3, one of the first focusing point P1 and the second focusing point P2 is, for example, the focusing point of the basic light component, while the other can be the focusing point of the light component that is defocused in a manner that displays negative or positive refractive power relative to the basic light component.

作為另一例,空間光調變器30可由控制部20控制,以使按照處理調變圖案調變的雷射光包含以顯示正折射力的方式散焦的光成分及以顯示負折射力的方式散焦的光成分。在此情況下,圖3中第一聚光點P1及第二聚光點P2中的一個聚光點為例如以顯示負折射力的方式散焦的光成分的聚光點,而另一個可為以顯示正折射力的方式散焦的光成分的聚光點。As another example, the spatial light modulator 30 can be controlled by the control unit 20 so that the laser light modulated according to the processing modulation pattern includes light components that are focused in a manner exhibiting positive refractive power and light components that are focused in a manner exhibiting negative refractive power. In this case, one of the first focusing point P1 and the second focusing point P2 in FIG3 is, for example, a focusing point for light components that are focused in a manner exhibiting negative refractive power, while the other can be a focusing point for light components that are focused in a manner exhibiting positive refractive power.

作為又一例,空間光調變器30亦可由控制部20控制,以形成使雷射光在處理對象1內部在彼此不同深度的三個或三個以上的聚光點處聚光的處理調變圖案。在此情況下,按照處理調變圖案調變的雷射光可藉由聚光光學系統60在處理對象1內部的彼此不同深度的三個或三個以上的聚光點聚光。例如,在三個聚光點中中間深度的聚光點可為基本光成分的聚光點,第一深度的聚光點可為例如相對於基本光成分以顯示正折射力的方式散焦的光成分的聚光點,第三深度的聚光點可為例如相對於基本光成分以顯示負折射力的方式散焦的光成分的聚光點。As another example, the spatial light modulator 30 can also be controlled by the control unit 20 to form a processing modulation pattern that focuses the laser light at three or more focal points at different depths within the processing object 1. In this case, the laser light modulated according to the processing modulation pattern can be focused by the focusing optical system 60 at three or more focal points at different depths within the processing object 1. For example, the focal point at the middle depth among the three focal points can be the focal point of the basic light component, the focal point at the first depth can be, for example, the focal point of the light component that is defocused relative to the basic light component in a manner exhibiting positive refractive power, and the focal point at the third depth can be, for example, the focal point of the light component that is defocused relative to the basic light component in a manner exhibiting negative refractive power.

圖3顯示利用聚光光學系統60使藉由空間光調變器30按照設定的處理調變圖案調變的雷射光在處理對象1內部的多個聚光點聚光的例子。Figure 3 shows an example of using a focusing optical system 60 to focus laser light modulated by a spatial light modulator 30 according to a set processing modulation pattern at multiple focusing points inside the processing object 1.

參照圖3,當按照所設定的處理調變圖案調變的雷射光被聚光光學系統60聚焦於處理對象1內部時,調變的雷射光可在彼此不同深度的多個聚光點、例如第一聚光點P1及第二聚光點P2聚光。在多個聚光點、例如第一聚光點P1及第二聚光點P2處可分別吸收雷射光而形成第一改質區域4a及第二改質區域4b。圖3中顯示在距處理對象1的上部表面1a第一深度d1處定位第一聚光點P1、在距處理對象1的上部表面1a第二深度d2處定位第二聚光點P2的例子。此時,第一深度d1與第二深度d2彼此不同。如圖3例示性所示,藉由空間光調變器30按照處理調變圖案調變的雷射光可藉由聚光光學系統60而在距處理對象1的上部表面1a第一深度d1的第一聚光點P1及距處理對象1的上部表面1a第二深度d2的第二聚光點P2聚光,藉此在第一聚光點P1及第二聚光點P2可分別形成第一改質區域4a及第二改質區域4b。由於使處理對象1移動,因此可在第一深度d1及第二深度d2處分別形成第一改質區域4a的排列及第二改質區域4b的排列。在圖3及以下說明中,對在彼此不同的第一深度d1與第二深度d2的第一聚光點P1及第二聚光點P2的位置分別形成第一改質區域4a及第二改質區域4b的情形進行說明及圖示,但並不限於此。彼此不同深度的聚光點的數目及與其對應的改質區域的數目可為三個或三個以上。Referring to Figure 3, when laser light modulated according to a set processing modulation pattern is focused by the focusing optical system 60 onto the object being processed 1, the modulated laser light can be focused at multiple focusing points at different depths, such as a first focusing point P1 and a second focusing point P2. At these multiple focusing points, such as the first focusing point P1 and the second focusing point P2, the laser light can be absorbed to form a first modified region 4a and a second modified region 4b, respectively. Figure 3 shows an example where the first focusing point P1 is positioned at a first depth d1 from the upper surface 1a of the object being processed, and the second focusing point P2 is positioned at a second depth d2 from the upper surface 1a of the object being processed. In this case, the first depth d1 and the second depth d2 are different from each other. As illustrated in Figure 3, laser light modulated by the spatial light modulator 30 according to the processing modulation pattern can be focused by the focusing optical system 60 at a first focusing point P1 at a first depth d1 from the upper surface 1a of the object being processed and a second focusing point P2 at a second depth d2 from the upper surface 1a of the object being processed. This allows the formation of a first modified region 4a and a second modified region 4b at the first focusing point P1 and the second focusing point P2, respectively. By moving the object being processed, arrangements of the first modified region 4a and the second modified region 4b can be formed at the first depth d1 and the second depth d2, respectively. In Figure 3 and the following description, the cases where the first modified region 4a and the second modified region 4b are formed at positions of the first focusing point P1 and the second focusing point P2 at different depths d1 and d2 are explained and illustrated, but the description is not limited to this. The number of focal points at different depths and the number of corresponding modified regions can be three or more.

如上所述,空間光調變器30可形成處理調變圖案,以使雷射光可在處理對象1內部的彼此不同深度的多個聚光點聚光。此時,按照處理調變圖案調變的雷射光可包含相對於基本光成分折射力不同的光成分。As described above, the spatial light modulator 30 can form a processing modulation pattern so that the laser light can be focused at multiple focal points at different depths within the processing object 1. At this time, the laser light modulated according to the processing modulation pattern can contain light components with different refractive intensities relative to the basic light components.

另一方面,當利用聚光光學系統60使藉由形成處理調變圖案的空間光調變器30調變的雷射光在處理對象1內部聚光時,在雷射光聚光的彼此不同深度的多個聚光點處可分別形成改質區域。隨著處理對象1的移動,可沿著切割預定線L不連續地形成改質區域,因此可沿著切割預定線L形成位於彼此不同深度的多個改質區域的排列。多個改質區域的排列可分別形成切割線。On the other hand, when the laser light modulated by the spatial light modulator 30, which forms a processing modulation pattern, is focused inside the object 1 using the focusing optical system 60, modified regions can be formed at multiple focusing points at different depths of the focused laser light. As the object 1 moves, modified regions can be formed discontinuously along the predetermined cutting line L, thus forming an arrangement of multiple modified regions at different depths along the predetermined cutting line L. The arrangement of multiple modified regions can form a cutting line.

例如,在用於形成改質區域的一個占空比(duty)的雷射光照射期間,可在處理對象1內部在第一深度d1及第二深度d2的第一聚光點P1及第二聚光點P2的位置分別形成第一改質區域4a及第二改質區域4b。在雷射光照射於切割預定線L上的狀態下,若使處理對象1沿著切割預定線L移動,則可在對應於切割預定線L的處理對象1內部的第一深度d1及第二深度d2處分別形成第一改質區域4a排列及第二改質區域4b排列。此處,一個占空比是在一個位置處照射雷射光以形成第一改質區域4a及第二改質區域4b的時間。在一個占空比期間,雷射光可以脈波形態照射一次或照射多次。另外,在第一改質區域4a排列與第二改質區域4b排列中,改質區域之間的間隔可取決於處理對象1的移動速度及照射脈波形態的雷射光的占空比間隔。由於沿著切割預定線L不連續地排列的第一改質區域4a及第二改質區域4b在冷卻過程中產生的裂紋,處理對象1移動速度及脈波型雷射光照射占空比間隔等可確定沿著切割預定線L可對處理對象1進行切割的間隔。在深度方向上彼此相鄰的第一改質區域4a與第二改質區域4b在冷卻過程中產生的裂紋可彼此交匯。For example, during laser irradiation for one duty cycle to form the modified regions, a first modified region 4a and a second modified region 4b can be formed within the object being processed at positions of a first focal point P1 and a second focal point P2 at a first depth d1 and a second depth d2, respectively. When the laser light irradiates a predetermined cutting line L, if the object being processed is moved along the predetermined cutting line L, an arrangement of the first modified regions 4a and an arrangement of the second modified regions 4b can be formed at positions corresponding to the predetermined cutting line L at the first depth d1 and the second depth d2, respectively. Here, one duty cycle is the time required to irradiate laser light at one position to form the first modified regions 4a and the second modified regions 4b. During one duty cycle, the laser light can irradiate once or multiple times in a pulsed pattern. Furthermore, in the arrangement of the first modified regions 4a and the second modified regions 4b, the interval between the modified regions can be determined by the moving speed of the object 1 and the duty cycle interval of the pulsed laser light. Since the first modified regions 4a and the second modified regions 4b, which are discontinuously arranged along the predetermined cutting line L, generate cracks during the cooling process, the moving speed of the object 1 and the duty cycle interval of the pulsed laser light can determine the interval at which the object 1 can be cut along the predetermined cutting line L. The cracks generated during the cooling process in the first modified regions 4a and the second modified regions 4b, which are adjacent to each other in the depth direction, can intersect.

另一方面,在一個占空比期間,在深度方向上彼此相鄰地同時形成的第一改質區域4a與第二改質區域4b可以彼此間隔開的狀態存在,或者可在深度方向上合併而形成擴大的改質區域。On the other hand, during a duty cycle, the first remodeling region 4a and the second remodeling region 4b, which are adjacent to each other in the depth direction, can exist in a state of separation from each other, or they can merge in the depth direction to form an enlarged remodeling region.

當在深度方向上相鄰的第一改質區域4a與第二改質區域4b彼此間隔開時,第一改質區域4a的排列及第二改質區域4b的排列可分別形成切割線。在此情況下,在沿著切割預定線L的一次處理製程期間,可在處理對象1的第一深度d1及第二深度d2處分別同時形成切割線,從而可減少用於在彼此不同深度處依次形成多條切割線的切割製程重複次數,從而可縮短切割製程時間。When the first modified region 4a and the second modified region 4b, which are adjacent in the depth direction, are separated from each other, the arrangement of the first modified region 4a and the arrangement of the second modified region 4b can respectively form cutting lines. In this case, during one processing step along the predetermined cutting line L, cutting lines can be formed simultaneously at the first depth d1 and the second depth d2 of the object 1, thereby reducing the number of times the cutting process is repeated to sequentially form multiple cutting lines at different depths, and thus shortening the cutting process time.

另外,作為另一例,在深度方向上彼此相鄰的第一改質區域4a與第二改質區域4b亦可彼此合併而形成一個擴大的改質區域(圖4中的4')。在此情況下,第一改質區域4a的排列及第二改質區域4b的排列亦形成在深度方向上擴大的改質區域的排列,藉此可形成擴大的改質區域沿著切割預定線L不連續地排列的一條切割線。在此情況下,在沿著切割預定線L的一次處理製程期間,對應於藉由重複進行切割製程在彼此不同深度依序形成多條切割線,可在處理對象1內部形成包括擴大的改質區域的排列的切割線,從而可縮短切割製程時間。Alternatively, as another example, the first modified region 4a and the second modified region 4b, which are adjacent to each other in the depth direction, can also be merged to form an enlarged modified region (4' in Figure 4). In this case, the arrangement of the first modified region 4a and the arrangement of the second modified region 4b also form an arrangement of enlarged modified regions in the depth direction, thereby forming a cutting line in which the enlarged modified regions are discontinuously arranged along the predetermined cutting line L. In this case, during one processing step along the predetermined cutting line L, multiple cutting lines are sequentially formed at different depths by repeatedly performing the cutting process. This allows the formation of a cutting line including the arrangement of enlarged modified regions within the processed object 1, thereby shortening the cutting process time.

因此,根據實施例的雷射加工裝置100,藉由利用空間光調變器30對雷射光進行調變以形成處理調變圖案,從而在沿著切割預定線L進行的一次切割製程期間,在處理對象1內部的彼此不同深度處可同時形成多條切割線或者形成由擴大的改質區域的排列形成的一條切割線,因此可減少切割製程重複次數,且可縮短切割製程時間。Therefore, according to the laser processing apparatus 100 of the embodiment, by using a spatial light modulator 30 to modulate the laser light to form a processing modulation pattern, multiple cutting lines or a single cutting line formed by the arrangement of enlarged modified regions can be formed simultaneously at different depths inside the processed object 1 during a single cutting process along the predetermined cutting line L. This reduces the number of times the cutting process is repeated and shortens the cutting process time.

圖4用於說明在圖3的處理對象1內部產生裂紋c1的原理。圖4中參考符號4'是以虛線表示第一改質區域4a與第二改質區域4b彼此連接時擴大的改質區域。Figure 4 is used to illustrate the principle of crack c1 being generated inside the treated object 1 in Figure 3. In Figure 4, reference symbol 4' is a dashed line representing the expanded modified region when the first modified region 4a and the second modified region 4b are connected to each other.

參照圖4,可分別以第一改質區域4a及第二改質區域4b為起點、或者以第一改質區域4a及第二改質區域4b連接形成的擴大的改質區域4’為起點生成裂紋c1。裂紋c1可在藉由雷射處理加熱的改質區域冷卻的過程中產生。多條裂紋c1可延伸達到處理對象1的上部表面1a與下部表面1b。但並不限於此,當來自外部的應力作用於改質區域的情況下裂紋c1亦可能延伸。可以多條裂紋c1為基準對處理對象1進行切割。Referring to Figure 4, cracks c1 can be generated starting from either the first modified region 4a or the second modified region 4b, or from the expanded modified region 4' formed by connecting the first and second modified regions 4a and 4b. Cracks c1 can be generated during the cooling process of the modified regions heated by laser treatment. Multiple cracks c1 can extend to the upper surface 1a and lower surface 1b of the object being treated 1. However, this is not a limitation; cracks c1 may also extend when external stress is applied to the modified regions. The object being treated 1 can be cut using multiple cracks c1 as a reference.

另一方面,根據實施例的雷射加工裝置100,亦可在使形成改質區域的深度不同的同時,沿著切割預定線L進行兩次以上處理製程,以產生足以用於進行處理對象1的切割的裂紋。例如,當藉由光學系統位置控制部改變聚光光學系統60與處理對象1之間的間隔同時執行雷射處理時,可改變在光軸方向(Z方向)上在處理對象1內部形成切割線的位置。此時,各切割線可包括例如由參照圖3說明的同時形成的多個改質區域4a、4b的排列形成的多條切割線,或者包括由參照圖4說明的擴大的改質區域4’的排列形成的切割線。例如,在一次處理製程期間如圖3所示形成兩條切割線時,若進行兩次處理製程,則可在處理對象1內部在光軸方向(Z方向)上彼此不同位置形成四條切割線。另外,當如圖4所示形成由擴大的改質區域4’排列形成的切割線時,若進行兩次處理製程,則可在處理對象1內部在光軸方向(Z方向)上彼此不同位置分別形成跨及寬範圍形成的兩條處理線。On the other hand, according to the embodiment of the laser processing apparatus 100, the processing process can be performed more than twice along the predetermined cutting line L while forming different depths of the modified regions, so as to generate cracks sufficient for cutting the object 1. For example, when laser processing is performed simultaneously by changing the interval between the focusing optical system 60 and the object 1 by the optical system position control unit, the position of the cutting line formed inside the object 1 in the optical axis direction (Z direction) can be changed. At this time, each cutting line may include, for example, multiple cutting lines formed by the arrangement of multiple modified regions 4a, 4b formed simultaneously as described with reference to FIG. 3, or cutting lines formed by the arrangement of enlarged modified regions 4' as described with reference to FIG. 4. For example, when two cutting lines are formed during a single processing step as shown in Figure 3, if two processing steps are performed, four cutting lines can be formed at different positions along the optical axis (Z direction) within the processed object 1. Furthermore, when cutting lines are formed by arranging enlarged modified regions 4' as shown in Figure 4, if two processing steps are performed, two processing lines with spans and widths can be formed at different positions along the optical axis (Z direction) within the processed object 1.

再次參照圖1,根據實施例的雷射加工裝置100,中繼透鏡光學系統50可將在空間光調變器30按照處理調變圖案調變的雷射光傳遞至聚光光學系統60。中繼透鏡光學系統50可配備成將由空間光調變器30形成的處理調變圖案的像傳遞至聚光光學系統60的入射瞳。為此,中繼透鏡光學系統50可位於空間光調變器30與聚光光學系統60之間。Referring again to Figure 1, in the laser processing apparatus 100 of the embodiment, the relay lens optical system 50 can transmit laser light modulated by the spatial light modulator 30 according to the processed modulation pattern to the focusing optical system 60. The relay lens optical system 50 can be configured to transmit the image of the processed modulation pattern formed by the spatial light modulator 30 to the entrance pupil of the focusing optical system 60. For this purpose, the relay lens optical system 50 can be located between the spatial light modulator 30 and the focusing optical system 60.

中繼透鏡光學系統50包括第一透鏡組51、第二透鏡組56、位於第一透鏡組51與第二透鏡組56之間的場透鏡55,且可配備成使空間光調變器30的處理調變圖案形成面與聚光光學系統60的入射瞳構成成像關係。The relay lens optical system 50 includes a first lens group 51, a second lens group 56, and a field lens 55 located between the first lens group 51 and the second lens group 56. It can be configured to form an imaging relationship between the processing modulation pattern forming surface of the spatial light modulator 30 and the entrance pupil of the focusing optical system 60.

根據實施例的中繼透鏡光學系統50,第一透鏡組51及第二透鏡組56分別可包括兩片以上透鏡。例如,第一透鏡組51及第二透鏡組56分別可包括具有正折射力的透鏡及具有負折射力的透鏡。另外,中繼透鏡光學系統50可以形成例如3f透鏡系統的方式配備。According to the relay lens optical system 50 of the embodiment, the first lens group 51 and the second lens group 56 may each include two or more lenses. For example, the first lens group 51 and the second lens group 56 may each include a lens with positive refractive power and a lens with negative refractive power. In addition, the relay lens optical system 50 may be configured in a manner such as a 3F lens system.

圖5概略性地顯示圖1的中繼透鏡光學系統50的實施例。Figure 5 schematically shows an embodiment of the relay lens optical system 50 of Figure 1.

參照圖5,中繼透鏡光學系統50可以第一透鏡組51及第二透鏡組56分別包括兩片透鏡且場透鏡55包括例如一片透鏡的方式構成。第一透鏡組51可由包括例如具有正折射力的第一透鏡52及具有負折射力的第二透鏡53的兩片透鏡組成。場透鏡55例如可配備成具有正折射力。第二透鏡組56可由包括例如具有正折射力的第一透鏡57與具有負折射力的第二透鏡58的兩片透鏡組成。Referring to Figure 5, the relay lens optical system 50 can be configured such that the first lens group 51 and the second lens group 56 each include two lenses, and the field lens 55 includes, for example, one lens. The first lens group 51 can be composed of two lenses, including, for example, a first lens 52 with positive refractive power and a second lens 53 with negative refractive power. The field lens 55 can be configured, for example, to have positive refractive power. The second lens group 56 can be composed of two lenses, including, for example, a first lens 57 with positive refractive power and a second lens 58 with negative refractive power.

如圖5例示性所示,中繼透鏡光學系統50可藉由在第一透鏡組51與第二透鏡組56之間佈置場透鏡55來形成3f透鏡系統。As illustrated in Figure 5, the relay lens optical system 50 can form a 3f lens system by placing a field lens 55 between the first lens group 51 and the second lens group 56.

例如,可以以下方式設計中繼透鏡光學系統50:第一透鏡組51的焦距為f1且第二透鏡組56的焦距為f2,第一透鏡組51的中心與第二透鏡組56的中心之間的距離為f1+f2,則使場透鏡55位於距第一透鏡組51的中心f1、距第二透鏡組56的中心f2處。在此情況下,自物體表面S1、例如空間光調變器30的處理調變圖案形成面S1至第一透鏡組51的中心的距離為f1/2,自第二透鏡組56的中心至上表面S2、例如聚光光學系統60的入射瞳S2的距離可為f2/2,因此中繼透鏡光學系統50可形成3f透鏡單元系統。For example, the relay lens optical system 50 can be designed as follows: the focal length of the first lens group 51 is f1 and the focal length of the second lens group 56 is f2 , and the distance between the center of the first lens group 51 and the center of the second lens group 56 is f1 + f2 , so that the field lens 55 is located at a distance of f1 from the center of the first lens group 51 and f2 from the center of the second lens group 56. In this case, the distance from the object surface S1, such as the processing modulation pattern forming surface S1 of the spatial light modulator 30, to the center of the first lens group 51 is f 1/2 , and the distance from the center of the second lens group 56 to the upper surface S2, such as the entrance pupil S2 of the focusing optical system 60, can be f 2/2 . Therefore, the intermediate lens optical system 50 can form a 3f lens unit system.

如上所述,藉由利用在第一透鏡組51與第二透鏡組56之間佈置場透鏡55的結構來構成中繼透鏡光學系統50,可形成3f透鏡單元系統。因此,可減小自空間光調變器30的處理調變圖案形成面S1開始至聚光光學系統60的入射瞳S2之間的光路徑長度,可縮小雷射加工裝置100的光學系統,且可縮小雷射加工裝置100的整體大小。此處,處理調變圖案形成面S1可對應於包括例如空間光調變器30的入/出射面30a或空間光調變器30的厚度範圍內的任一點的面。As described above, by utilizing a field lens 55 arranged between the first lens group 51 and the second lens group 56 to construct a relay lens optical system 50, a 3f lens unit system can be formed. Therefore, the optical path length from the processing modulation pattern forming surface S1 of the spatial light modulator 30 to the entrance pupil S2 of the focusing optical system 60 can be reduced, the optical system of the laser processing apparatus 100 can be reduced, and the overall size of the laser processing apparatus 100 can be reduced. Here, the processing modulation pattern forming surface S1 can correspond to a surface including, for example, the entrance/exit surface 30a of the spatial light modulator 30 or any point within the thickness range of the spatial light modulator 30.

圖6a用於說明根據實施例的中繼透鏡光學系統50的光路徑長度減小效果。圖6b示出比較例的中繼透鏡光學系統50’的光路徑長度,且對比較例的中繼透鏡光學系統50’由實施例的中繼透鏡光學系統50的第一透鏡組51與第二透鏡組56組成的情況進行顯示。圖6a例示性顯示第一透鏡組51與第二透鏡組56的有效焦距相同時,根據實施例的中繼透鏡光學系統50中的光路徑,且圖6b例示性顯示第一透鏡組51與第二透鏡組56的有效焦距相同時,比較例的中繼透鏡光學系統50’中的光路徑,且顯示比較例的中繼透鏡光學系統50’構成遠心透鏡光學系統的例子。Figure 6a illustrates the reduction effect of the optical path length of the relay lens optical system 50 according to the embodiment. Figure 6b shows the optical path length of the comparative example relay lens optical system 50', and illustrates the case where the comparative example relay lens optical system 50' consists of the first lens group 51 and the second lens group 56 of the relay lens optical system 50 of the embodiment. Figure 6a illustrates the optical path in the relay lens optical system 50 according to the embodiment when the effective focal lengths of the first lens group 51 and the second lens group 56 are the same, and Figure 6b illustrates the optical path in the comparative example relay lens optical system 50' when the effective focal lengths of the first lens group 51 and the second lens group 56 are the same, and shows an example of the comparative example relay lens optical system 50' constituting a telecentric lens optical system.

在圖6a及圖6b中,為了進行比較,顯示第一透鏡組51及第二透鏡組56的有效焦距為f而彼此相同的例子。在圖6a及圖6b中,A表示第一透鏡組51的中心位置,B表示第二透鏡組56的中心位置,C表示場透鏡55的中心位置。另外,在圖6a、圖6b中,參考編號S1、S1'表示入射瞳,S2、S2'表示出射瞳,入射瞳S1、S1’對應於空間光調變器30的處理調變圖案形成面,且出射瞳 S2、S2’可對應於聚光光學系統60的入射瞳。In Figures 6a and 6b, for comparison, examples are shown where the effective focal lengths f of the first lens group 51 and the second lens group 56 are the same. In Figures 6a and 6b, A represents the center position of the first lens group 51, B represents the center position of the second lens group 56, and C represents the center position of the field lens 55. Additionally, in Figures 6a and 6b, reference numerals S1 and S1' represent the entrance pupils, and S2 and S2' represent the exit pupils. The entrance pupils S1 and S1' correspond to the processing modulation pattern forming surface of the spatial light modulator 30, and the exit pupils S2 and S2' can correspond to the entrance pupils of the focusing optical system 60.

如圖6a所示,實施例的中繼透鏡光學系統50可包括第一透鏡組51、第二透鏡組56、位於距第一透鏡組51和第二透鏡組56的中心的中間位置的場透鏡55。因此,根據實施例的中繼透鏡光學系統50,入射瞳S1位於距第一透鏡組51 f/2的距離處,且出射瞳S2可位於距第二透鏡組56 f/2的距離處。As shown in Figure 6a, the relay lens optical system 50 of the embodiment may include a first lens group 51, a second lens group 56, and a field lens 55 located at an intermediate position from the center of the first lens group 51 and the second lens group 56. Therefore, according to the relay lens optical system 50 of the embodiment, the entrance pupil S1 is located at a distance of f/2 from the first lens group 51, and the exit pupil S2 may be located at a distance of f/2 from the second lens group 56.

相比之下,如圖6b所示,比較例的中繼透鏡光學系統50’可由第一透鏡組51及第二透鏡組56組成。因此,根據比較例的中繼透鏡光學系統50’,入射瞳S1’位於距第一透鏡組51 f的距離處,且出射瞳S2’位於距第二透鏡組56 f的距離處。In contrast, as shown in Figure 6b, the comparative relay lens optical system 50' may consist of a first lens group 51 and a second lens group 56. Therefore, according to the comparative relay lens optical system 50', the entrance pupil S1' is located at a distance f from the first lens group 51, and the exit pupil S2' is located at a distance f from the second lens group 56.

自圖6a及圖6b的比較可知,相較於比較例的中繼透鏡光學系統50’,根據實施例的中繼透鏡光學系統50藉由在第一透鏡組51與第二透鏡組56之間更包括場透鏡55,從而可將光路徑長度自4f縮小至3f。另外,自根據後述圖9a的實施例的中繼透鏡光學系統50與圖11a的比較例的中繼透鏡光學系統50’的比較可知,比較例的中繼透鏡光學系統50’在應用遠心透鏡構成的光學系統時,相較於不應用遠心透鏡構成時需要更多的透鏡個數,而在根據實施例的中繼透鏡光學系統50中,由於場透鏡55代替了該作用,因此可更有效地減少透鏡個數及光路徑長度。As can be seen from the comparison of Figures 6a and 6b, compared with the intermediate lens optical system 50' of the comparative example, the intermediate lens optical system 50 of the embodiment further includes a field lens 55 between the first lens group 51 and the second lens group 56, thereby reducing the optical path length from 4f to 3f. Furthermore, a comparison between the relay lens optical system 50 of the embodiment described later in Figure 9a and the relay lens optical system 50' of the comparative example in Figure 11a shows that the relay lens optical system 50' of the comparative example requires more lenses when using a telecentric lens optical system compared to when it does not use a telecentric lens optical system. In the relay lens optical system 50 of the embodiment, since the field lens 55 replaces this function, the number of lenses and the optical path length can be reduced more effectively.

如上所述,根據實施例的中繼透鏡光學系統50,藉由在第一透鏡組51與第二透鏡組56之間更包括場透鏡55,從而可縮小光路徑長度,藉此可縮小光學系統及縮小與其對應的雷射加工裝置100的整體大小。As described above, the relay lens optical system 50 of the embodiment includes a field lens 55 between the first lens group 51 and the second lens group 56, thereby reducing the length of the light path and thus reducing the overall size of the optical system and the corresponding laser processing apparatus 100.

另一方面,在圖5中顯示第一透鏡組51及第二透鏡組56分別由兩片透鏡組成的例子,此僅為例示性的,實施例並不限於此。另外,在圖5中顯示場透鏡55由一片透鏡組成的例子,且實施例並不限於此。例如,可多樣地設計第一透鏡組51、第二透鏡組56以及佈置於其之間的場透鏡55,以使中繼透鏡光學系統50形成3f透鏡單元系統。On the other hand, Figure 5 shows an example where the first lens group 51 and the second lens group 56 are each composed of two lenses; this is merely illustrative, and the embodiments are not limited thereto. Additionally, Figure 5 shows an example where the field lens 55 is composed of a single lens, and the embodiments are not limited thereto. For example, the first lens group 51, the second lens group 56, and the field lens 55 disposed therebetween can be designed in various ways to form a 3f lens unit system in the relay lens optical system 50.

此種中繼透鏡光學系統50可將藉由空間光調變器30形成的處理調變圖案的像傳遞至聚光光學系統60的入射瞳。聚光光學系統60可使經由中繼透鏡光學系統50傳遞的雷射光在安置於支撐台5上的處理對象1內部聚光來形成聚光點。This relay lens optical system 50 can transmit the image of the processing modulation pattern formed by the spatial light modulator 30 to the entrance pupil of the focusing optical system 60. The focusing optical system 60 can focus the laser light transmitted through the relay lens optical system 50 inside the processing object 1 placed on the support stage 5 to form a focusing point.

此時,如上所述,根據在空間光調變器30中形成的處理調變圖案,可在處理對象1內部的彼此不同深度處獲得多個雷射光的聚光點。藉此,可在多個聚光點分別形成改質區域,因此形成在深度方向上彼此間隔開的改質區域,或者可形成在多個聚光點形成的改質區域彼此連接而在深度方向上擴大的改質區域。At this time, as described above, based on the processing modulation pattern formed in the spatial light modulator 30, multiple laser light focusing points can be obtained at different depths within the processing object 1. This allows modification regions to be formed at each of the multiple focusing points, thus creating modification regions that are spaced apart in the depth direction, or creating modification regions that expand in the depth direction by connecting the modification regions formed at the multiple focusing points.

例如,如圖3所示,在處理對象1內部的第一深度d1及第二深度d2處形成第一聚光點P1及第二聚光點P2,從而可在第一深度d1及第二深度d2處同時形成第一改質區域4a及第二改質區域4b。For example, as shown in Figure 3, a first focusing point P1 and a second focusing point P2 are formed at a first depth d1 and a second depth d2 inside the object being processed, thereby simultaneously forming a first modified region 4a and a second modified region 4b at the first depth d1 and the second depth d2.

因此,藉由台位置控制部70的控制,在使台3沿著切割預定線L移動從而使處理對象1移動,同時使雷射光在處理對象1內部聚光時,在處理對象1內部沿著切割預定線L在第一深度d1的第一聚光點P1位置形成不連續地形成第一改質區域4a的排列,以及在與第一深度d1不同的第二深度d2的第二聚光點P2位置形成不連續地形成第二改質區域4b的排列。Therefore, under the control of the stage position control unit 70, the stage 3 is moved along the cutting predetermined line L, thereby moving the object to be processed. At the same time, when the laser light is focused inside the object to be processed, a discontinuous arrangement of first modified regions 4a is formed at the first focusing point P1 position at the first depth d1 along the cutting predetermined line L, and a discontinuous arrangement of second modified regions 4b is formed at the second focusing point P2 position at the second depth d2, which is different from the first depth d1.

即,由於使處理對象1移動,可在第一深度d1形成第一改質區域4a的排列及在第二深度d2形成第二改質區域4b的排列。此時,在一個占空比期間,在深度方向上彼此相鄰地同時形成的第一改質區域4a及第二改質區域4b可以彼此間隔開的狀態存在,或者可在深度方向上合併而形成擴大的改質區域4’。That is, by moving the object being processed 1, an arrangement of first modified regions 4a can be formed at a first depth d1 and an arrangement of second modified regions 4b can be formed at a second depth d2. At this time, during a duty cycle, the first modified regions 4a and the second modified regions 4b, which are formed simultaneously and adjacent to each other in the depth direction, can exist in a state of being separated from each other, or they can merge in the depth direction to form an enlarged modified region 4'.

因此,根據實施例的雷射加工裝置100,在沿著切割預定線L的一次處理製程期間,可在處理對象1內部在深度方向上形成多條切割線,或者形成包括擴大的改質區域4’排列的一條切割線,從而可減少沿著切割預定線L進行的切割製程重複次數,從而可縮短切割製程時間。Therefore, according to the laser processing apparatus 100 of the embodiment, during one processing process along the predetermined cutting line L, multiple cutting lines can be formed in the depth direction inside the processed object 1, or a single cutting line including the enlarged modified region 4' can be formed, thereby reducing the number of times the cutting process is repeated along the predetermined cutting line L, and thus shortening the cutting process time.

另一方面,再次參照圖1,聚光光學系統60可包括物鏡61,所述物鏡61使藉由中繼透鏡光學系統50傳遞的雷射光在處理對象1內部聚光。另外,根據實施例的雷射加工裝置100可在中繼透鏡光學系統50與聚光光學系統60的物鏡61之間更包括反射鏡101。當聚光光學系統60僅包括物鏡61時,傳遞處理調變圖案的像的聚光光學系統60的入射瞳可對應於物鏡61的入射瞳。On the other hand, referring again to FIG1, the condensing optical system 60 may include an objective lens 61, which focuses the laser light transmitted by the relay lens optical system 50 within the object being processed 1. Furthermore, according to the embodiment, the laser processing apparatus 100 may further include a reflector 101 between the relay lens optical system 50 and the objective lens 61 of the condensing optical system 60. When the condensing optical system 60 includes only the objective lens 61, the entrance pupil of the condensing optical system 60 transmitting the image of the processed modulation pattern may correspond to the entrance pupil of the objective lens 61.

另一方面,圖7及圖8顯示可應用於圖1的雷射加工裝置100的光學系統構成的其他實施例。在圖1、圖7、圖8中,光學零件之間的間隔、光學零件的大小、形狀等僅為了說明佈置關係而例示性地示出,實施例並不限於此。On the other hand, Figures 7 and 8 show other embodiments of the optical system configuration that can be applied to the laser processing apparatus 100 of Figure 1. In Figures 1, 7, and 8, the spacing between optical components, the size and shape of the optical components, etc., are shown only illustratively to illustrate the arrangement relationship, and the embodiments are not limited thereto.

參照圖7及圖8,聚光光學系統60可更包括在中繼透鏡光學系統50與物鏡61之間使雷射光的束寬擴大的光束擴展器65。如圖7例示性所示,光束擴展器65可佈置於中繼透鏡光學系統50與反射鏡101之間。另外,如圖8例示性所示,光束擴展器65亦可佈置於反射鏡101與物鏡61之間。Referring to Figures 7 and 8, the focusing optical system 60 may further include a beam expander 65 between the relay lens optical system 50 and the objective lens 61 to broaden the beamwidth of the laser light. As illustrated in Figure 7, the beam expander 65 may be positioned between the relay lens optical system 50 and the mirror 101. Alternatively, as illustrated in Figure 8, the beam expander 65 may also be positioned between the mirror 101 and the objective lens 61.

如圖7及圖8例示性所示,當聚光光學系統60更包括光束擴展器65時,傳遞處理調變圖案的像的聚光光學系統60的入射瞳可對應於光束擴展器65的入射瞳。As illustrated in Figures 7 and 8, when the focusing optical system 60 further includes a beam expander 65, the entrance pupil of the focusing optical system 60 that transmits the image of the processed modulation pattern can correspond to the entrance pupil of the beam expander 65.

另一方面,圖8顯示可應用於圖1的雷射加工裝置100的光學系統構成的實施例,在與圖1及圖7進行比較時,不僅光束擴展器65的佈置存在不同,而且空間光調變器30的佈置亦存在不同。On the other hand, Figure 8 shows an embodiment of the optical system configuration applicable to the laser processing apparatus 100 of Figure 1. When compared with Figures 1 and 7, not only is the arrangement of the beam expander 65 different, but the arrangement of the spatial light modulator 30 is also different.

參照圖8,當將自雷射光源10發射的雷射光行進的方向或垂直於所述方向的方向稱為第一行進方向時,雷射加工裝置100可配備成以與第一行進方向平行地佈置空間光調變器30。為此,雷射加工裝置100可更包括光學部件40,所述光學部件40配備成使雷射光傾斜地入射至空間光調變器30且使自空間光調變器30中調變並反射的雷射光沿著與第一行進方向平行的方向行進。自雷射光源10側入射至光學部件40的雷射光的行進方向可對應於第一行進方向。Referring to Figure 8, when the direction of travel of the laser light emitted from the laser source 10, or the direction perpendicular to said direction, is referred to as the first travel direction, the laser processing apparatus 100 may be configured to arrange the spatial light modulator 30 parallel to the first travel direction. For this purpose, the laser processing apparatus 100 may further include an optical component 40, which is configured to obliquely incident the laser light onto the spatial light modulator 30 and to cause the laser light modulated and reflected from the spatial light modulator 30 to travel in a direction parallel to the first travel direction. The travel direction of the laser light incident on the optical component 40 from the side of the laser source 10 may correspond to the first travel direction.

圖8中顯示光學部件40具有三角形形狀的剖面結構的例子。光學部件40可包括彼此形成角且相對於空間光調變器30傾斜地定位的第一表面41及第二表面43、以及位於與空間光調變器30相反側的第三表面45。Figure 8 shows an example of an optical component 40 having a triangular cross-sectional structure. The optical component 40 may include a first surface 41 and a second surface 43 that are angled to each other and tilted relative to the spatial light modulator 30, and a third surface 45 located on the opposite side of the spatial light modulator 30.

光學部件40例如可為稜鏡結構,在此情況下,第一表面41及第二表面43為折射/通過面,且第三表面45可為內部反射面。第三表面45例如可與空間光調變器30平行地佈置。如上所述,當光學部件40是稜鏡結構時,沿著第一行進方向入射至光學部件40的雷射光可折射/通過第一表面41,且在第三表面45處進行內部反射以再次折射/通過第一表面41並入射至空間光調變器30。在空間光調變器30中以形成處理調變圖案的方式調變並反射的雷射光可折射/通過第二表面43,且在第三表面45處進行內部反射並再次折射/通過第二表面43,沿著第一行進方向行進並傳遞至中繼透鏡光學系統50。The optical component 40 may be a prism structure, in which case the first surface 41 and the second surface 43 are refractive/transmitting surfaces, and the third surface 45 may be an internal reflective surface. The third surface 45 may be arranged parallel to the spatial light modulator 30, for example. As described above, when the optical component 40 is a prism structure, laser light incident on the optical component 40 along the first travel direction can be refracted/transmitted through the first surface 41, and internally reflected at the third surface 45 to be refracted/transmitted through the first surface 41 again and incident on the spatial light modulator 30. In the spatial light modulator 30, the laser light modulated and reflected in a manner that forms a processing modulation pattern can be refracted/passed through the second surface 43, and internally reflected at the third surface 45 and refracted/passed through the second surface 43 again, traveling along the first travel direction and transmitted to the relay lens optical system 50.

作為另一例,光學部件40的第一表面41及第二表面43可分別為第一反射面及第二反射面。在此情況下,第一表面41配備成反射在第一行進方向上入射的雷射光且使其傾斜地入射至空間光調變器30,第二表面43可配備成反射在空間光調變器30中以形成處理調變圖案的方式調變並反射的雷射光並使其沿著第一行進方向行進。可確定由第一表面41與第二表面43形成的角度以獲得此種行進路徑。As another example, the first surface 41 and the second surface 43 of the optical component 40 can be a first reflective surface and a second reflective surface, respectively. In this case, the first surface 41 is configured to reflect laser light incident in the first travel direction and obliquely incident it into the spatial light modulator 30, and the second surface 43 can be configured to reflect the laser light modulated and reflected in the spatial light modulator 30 in a manner that forms a processing modulation pattern and cause it to travel along the first travel direction. The angle formed by the first surface 41 and the second surface 43 can be determined to obtain this travel path.

另一方面,在根據實施例的雷射加工裝置100中,為了不擴大光學系統的大小的適當的佈置,確保所需的光路徑,如圖1、圖7及圖8中所示,可進一步應用反射鏡110、111、113、115。另一方面,在圖1、圖7及圖8中,中繼透鏡光學系統50的第一透鏡組51及第二透鏡組56、聚光光學系統60的光束擴展器65及物鏡61被示出為單個透鏡,此僅為例示性示出,並非對實施例進行限定。如後述圖9b例示性所示,物鏡61可由多個透鏡組成,且光束擴展器65亦可由多個透鏡組成。On the other hand, in the laser processing apparatus 100 according to the embodiment, in order to ensure the required optical path without increasing the size of the optical system through proper arrangement, as shown in Figures 1, 7 and 8, mirrors 110, 111, 113 and 115 can be further applied. On the other hand, in Figures 1, 7 and 8, the first lens group 51 and the second lens group 56 of the intermediate lens optical system 50, the beam expander 65 of the focusing optical system 60 and the objective lens 61 are shown as a single lens; this is merely illustrative and not intended to limit the embodiment. As illustrated in Figure 9b below, the objective lens 61 can be composed of multiple lenses, and the beam expander 65 can also be composed of multiple lenses.

再次參照圖1,台位置控制部70可控制台3的移動,所述台3與放置處理對象1的支撐台5連接。台3可以可進行二維平面(xy平面)移動的方式構成。台位置控制部70可對台3在二維平面上的移動進行控制。Referring again to Figure 1, the stage position control unit 70 can control the movement of the stage 3, which is connected to the support stage 5 on which the object to be processed 1 is placed. The stage 3 can be configured to move in a two-dimensional plane (xy plane). The stage position control unit 70 can control the movement of the stage 3 in the two-dimensional plane.

另一方面,如上所述,當更包括光學系統位置控制部時,光學系統位置控制部可改變例如聚光光學系統60、例如物鏡61在光軸方向(z方向)上的位置。作為另一例,光學系統位置控制部可改變雷射加工裝置100的光學系統整體或包括物鏡61及光束擴展器65的聚光光學系統60在光軸方向(z方向)上的位置。藉此,可在距處理對象1的上部表面1a設定的深度處形成切割線,且亦可改變切割線形成深度。On the other hand, as described above, when an optical system position control unit is included, the optical system position control unit can change, for example, the position of the focusing optical system 60 or the objective lens 61 in the optical axis direction (z direction). As another example, the optical system position control unit can change the position of the entire optical system of the laser processing apparatus 100 or the focusing optical system 60 including the objective lens 61 and the beam expander 65 in the optical axis direction (z direction). This allows a cutting line to be formed at a depth set at the upper surface 1a of the object being processed 1, and also allows the cutting line formation depth to be changed.

圖9a及圖9b概略性地顯示根據實施例的中繼透鏡光學系統50及包括所述中繼透鏡光學系統50的雷射加工裝置100的整個透鏡光學系統中的光路經。表1顯示根據圖9a的實施例的中繼透鏡光學系統50的設計資料以及透鏡的材質、折射力。圖10a、圖10b、圖10c分別表示利用表1的設計資料形成的實施例的中繼透鏡光學系統50及包括所述中繼透鏡光學系統50的雷射加工裝置100的整個透鏡光學系統的調變轉換函數(modulation transfer function,MTF)性能、像差(色像差、像散、失真)、光線像差。 Figures 9a and 9b schematically show the optical paths in the entire lens optical system, including the relay lens optical system 50 and the laser processing apparatus 100 comprising the relay lens optical system 50, according to an embodiment. Table 1 shows the design data of the relay lens optical system 50 of the embodiment according to Figure 9a, as well as the lens material and refractive power. Figures 10a, 10b, and 10c respectively show the modulation transfer function (MTF) performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations of the relay lens optical system 50 and the entire lens optical system, including the laser processing apparatus 100 comprising the relay lens optical system 50, formed using the design data in Table 1.

參照圖9a、圖9b及表1,在根據實施例的中繼透鏡光學系統50中,第一透鏡組(透鏡1)51可包括兩片透鏡52:G1、53:G2,場透鏡(Field Lens)55包括一片透鏡G1,第二透鏡組(透鏡2)56包括兩片透鏡57:G1、58:G2。第一透鏡組51可包括例如具有正折射力的透鏡52:G1及具有負折射力的透鏡53:G2。場透鏡55可包括例如具有正折射力的透鏡G1。第二透鏡組56可包括例如具有正折射力的透鏡57:G1及具有負折射力的透鏡58:G2 。在表1中,G1表示具有正折射力的透鏡,且G2表示具有負折射力的透鏡。Referring to Figures 9a and 9b and Table 1, in the relay lens optical system 50 according to the embodiment, the first lens group (lens 1) 51 may include two lenses 52: G1 and 53: G2, the field lens 55 includes one lens G1, and the second lens group (lens 2) 56 includes two lenses 57: G1 and 58: G2. The first lens group 51 may include, for example, a lens 52: G1 with positive refractive power and a lens 53: G2 with negative refractive power. The field lens 55 may include, for example, a lens G1 with positive refractive power. The second lens group 56 may include, for example, a lens 57: G1 with positive refractive power and a lens 58: G2 with negative refractive power. In Table 1, G1 represents a lens with positive refractive power, and G2 represents a lens with negative refractive power.

另一方面,如圖9b所示,聚光光學系統60可包括光束擴展器65與物鏡61,且光束擴展器65包括多個透鏡,物鏡61可包括多個透鏡。如圖9b所示,當聚光光學系統60包括光束擴展器65與物鏡61時,聚光光學系統60的入射瞳可對應於光束擴展器的入射瞳。On the other hand, as shown in FIG9b, the condensing optical system 60 may include a beam expander 65 and an objective lens 61, and the beam expander 65 includes multiple lenses, and the objective lens 61 may include multiple lenses. As shown in FIG9b, when the condensing optical system 60 includes a beam expander 65 and an objective lens 61, the entrance pupil of the condensing optical system 60 may correspond to the entrance pupil of the beam expander.

在圖9b中,表示光學系統長度的起始點S1表示中繼透鏡光學系統50的入射瞳,可對應於上述空間光調變器30的處理調變圖案形成面。點S2是中繼透鏡光學系統50的出射瞳,且可對應於聚光光學系統60的入射瞳。點I是聚光光學系統60的物鏡61的焦點位置,可對應於上述處理對象1內部的基本光成分的聚光點。雷射加工裝置100的透鏡光學系統可由中繼透鏡光學系統50與聚光光學系統60組成,雷射加工裝置100的透鏡光學系統長度可對應於自所述起始點S1至點I的距離(①)。In Figure 9b, the starting point S1, representing the length of the optical system, represents the entrance pupil of the relay lens optical system 50, which corresponds to the processing modulation pattern forming surface of the spatial light modulator 30. Point S2 is the exit pupil of the relay lens optical system 50 and corresponds to the entrance pupil of the condenser optical system 60. Point I is the focal point of the objective lens 61 of the condenser optical system 60, which corresponds to the focusing point of the basic light component inside the processing object 1. The lens optical system of the laser processing apparatus 100 can be composed of the relay lens optical system 50 and the condenser optical system 60, and the length of the lens optical system of the laser processing apparatus 100 can correspond to the distance from the starting point S1 to point I (①).

利用表1的資料設計中繼透鏡光學系統50時,如圖10a、圖10b、圖10c所示,可知實施例的中繼透鏡光學系統50及包括所述中繼透鏡光學系統50的雷射加工裝置100的整個透鏡光學系統表現出良好的MTF性能、像差(色像差、像散、失真)、光線像差。另外,當利用表1的資料設計中繼透鏡光學系統50時,實施例的中繼透鏡光學系統50的光路徑長度(自起始點S1至點S2的距離(②))約為913.356 mm,且雷射加工裝置100的整個透鏡系統的光路徑長度(自起始點S1至點I的距離(①))可約為1150 mm。When designing the relay lens optical system 50 using the data in Table 1, as shown in Figures 10a, 10b, and 10c, it can be seen that the relay lens optical system 50 of the embodiment and the entire lens optical system including the laser processing apparatus 100 of the relay lens optical system 50 exhibit good MTF performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations. In addition, when the relay lens optical system 50 is designed using the data in Table 1, the optical path length of the relay lens optical system 50 in the embodiment (the distance from the starting point S1 to point S2 (②)) is about 913.356 mm, and the optical path length of the entire lens system of the laser processing apparatus 100 (the distance from the starting point S1 to point I (①)) can be about 1150 mm.

圖11a及圖11b概略性地顯示以具有與實施例的中繼透鏡光學系統50相似的光學性能的方式設計的比較例的中繼透鏡光學系統50’及包括所述中繼透鏡光學系統50’的雷射加工裝置的整個透鏡光學系統中的光路徑。表2顯示圖11a的比較例的中繼透鏡光學系統50’的設計資料及透鏡的材質、折射力。圖12a、圖12b、圖12c分別表示利用表2的設計資料形成的比較例的中繼透鏡光學系統50’及包括所述中繼透鏡光學系統50’的雷射加工裝置的整個透鏡光學系統的MTF性能、像差(色像差、像散、失真)、光線像差。 Figures 11a and 11b schematically show a comparative relay lens optical system 50' designed to have similar optical performance to the relay lens optical system 50 of the embodiment, and the optical path in the entire lens optical system including the laser processing apparatus of the relay lens optical system 50'. Table 2 shows the design data of the comparative relay lens optical system 50' of Figure 11a, as well as the lens material and refractive power. Figures 12a, 12b, and 12c respectively show the MTF performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations of the comparative relay lens optical system 50' and the entire lens optical system including the laser processing apparatus of the relay lens optical system 50', formed using the design data in Table 2.

參照圖11a、圖11b及表2,比較例的中繼透鏡光學系統50’由第一透鏡組(透鏡1)51’與第二透鏡組(透鏡2)56’組成,且第一透鏡組(透鏡1)51’由三片透鏡52’:G1’、53’:G2’、54’:G3’組成,且第二透鏡組(透鏡2)56’可由三片透鏡57’:G1’、58’:G2’、59’:G3’組成。第一透鏡組51’可由具有正折射力的透鏡52’:G1’、具有負折射力的透鏡53’:G2’具有正折射力的透鏡54’:G3’組成。第二透鏡組56可由具有正折射力的透鏡57’:G1’、具有負折射力的透鏡58’:G2’、具有正折射力的透鏡59’:G3’組成。另一方面,聚光光學系統60可與圖9b中相同。Referring to Figures 11a and 11b and Table 2, the comparative example relay lens optical system 50' consists of a first lens group (lens 1) 51' and a second lens group (lens 2) 56'. The first lens group (lens 1) 51' consists of three lenses 52':G1', 53':G2', and 54':G3', and the second lens group (lens 2) 56' can be composed of three lenses 57':G1', 58':G2', and 59':G3'. The first lens group 51' can be composed of a lens 52':G1' with positive refractive power, a lens 53':G2' with negative refractive power, and a lens 54':G3' with positive refractive power. The second lens group 56 may consist of a lens 57’:G1’ with positive refractive power, a lens 58’:G2’ with negative refractive power, and a lens 59’:G3’ with positive refractive power. On the other hand, the focusing optical system 60 may be the same as that in FIG9b.

在圖11b中,表示光學系統長度的起始點S1'為比較例的中繼透鏡光學系統50’的入射瞳,點S2'為比較例的中繼透鏡光學系統50’的出射瞳與聚光光學系統60的入射瞳,點I'可對應於聚光光學系統60的物鏡61的焦點位置。雷射加工裝置的整個透鏡系統可由中繼透鏡光學系統50’與聚光光學系統60組成,雷射加工裝置的整個透鏡系統的光路徑長度①'對應於自上述起始點S1'至點I'的距離。In Figure 11b, the starting point S1', representing the length of the optical system, is the entrance pupil of the comparative relay lens optical system 50'. Point S2' represents the exit pupil of the comparative relay lens optical system 50' and the entrance pupil of the condenser optical system 60. Point I' corresponds to the focal position of the objective lens 61 of the condenser optical system 60. The entire lens system of the laser processing apparatus can be composed of the relay lens optical system 50' and the condenser optical system 60. The optical path length ①' of the entire lens system of the laser processing apparatus corresponds to the distance from the aforementioned starting point S1' to point I'.

利用表2的資料設計比較例的中繼透鏡光學系統50’時,如圖12a、圖12b、圖12c所示,可知,比較例的中繼透鏡光學系統50’及包括所述中繼透鏡光學系統50’的雷射加工裝置的整個透鏡系統表現出良好的MTF性能、像差(色像差、像散、失真)、光線像差。另外,利用表2的資料設計比較例的中繼透鏡光學系統50’時,比較例的中繼透鏡光學系統50’的光路徑長度(自起始點S1'至點S2'的距離②')約為1145.356 mm,雷射加工裝置的整個透鏡系統的光路徑長度(自起始點S1'至點I'的距離①')約為1382 mm。When designing the comparative relay lens optical system 50' using the data in Table 2, as shown in Figures 12a, 12b, and 12c, it can be seen that the comparative relay lens optical system 50' and the entire lens system including the laser processing apparatus of the relay lens optical system 50' exhibit good MTF performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations. In addition, when designing the comparative relay lens optical system 50' using the data in Table 2, the optical path length of the comparative relay lens optical system 50' (distance ②' from the starting point S1' to point S2') is approximately 1145.356 mm, and the optical path length of the entire lens system of the laser processing apparatus (distance ①' from the starting point S1' to point I') is approximately 1382 mm.

如上所述,實施例的中繼透鏡光學系統50的光路徑長度②約為913.356 mm,包括所述中繼透鏡光學系統50的整個透鏡系統的光路徑長度①約為1150 mm,反之,比較例的中繼透鏡光學系統50’的光路徑長度②'約為1145.356 mm,包括所述中繼透鏡光學系統50’的雷射加工裝置的整個透鏡系統的光路徑長度①'約為1382 mm。由此,可確認,當應用實施例的中繼透鏡光學系統50時,可縮小光路徑長度,且可縮小雷射加工裝置100的整體大小。進而,根據實施例的中繼透鏡光學系統50,藉由在第一透鏡組51與第二透鏡組56之間包括場透鏡55,從而可確認相較於比較例的中繼透鏡光學系統50’而言透鏡個數減少。As described above, the optical path length ② of the relay lens optical system 50 in the embodiment is approximately 913.356 mm, and the optical path length ① of the entire lens system including the relay lens optical system 50 is approximately 1150 mm. Conversely, the optical path length ②' of the relay lens optical system 50' in the comparative example is approximately 1145.356 mm, and the optical path length ①' of the entire lens system including the relay lens optical system 50' is approximately 1382 mm. Therefore, it can be confirmed that when the relay lens optical system 50 of the embodiment is applied, the optical path length can be reduced, and the overall size of the laser processing apparatus 100 can be reduced. Furthermore, according to the relay lens optical system 50 of the embodiment, by including a field lens 55 between the first lens group 51 and the second lens group 56, it can be confirmed that the number of lenses is reduced compared to the relay lens optical system 50' of the comparative example.

如以上說明所述,根據實施例的中繼透鏡光學系統50及應用所述中繼透鏡光學系統50的雷射加工裝置100,可縮小光路徑長度及整個光學系統,藉此可縮小雷射加工裝置100的大小。As described above, the relay lens optical system 50 according to the embodiment and the laser processing apparatus 100 using the relay lens optical system 50 can reduce the optical path length and the entire optical system, thereby reducing the size of the laser processing apparatus 100.

上述中繼透鏡光學系統50及包括所述中繼透鏡光學系統50的雷射加工裝置100參照圖式所示的實施例進行了說明,但應理解此僅是例示,只要是相應領域內具有通常知識者則可據此進行多種變形及實現均等的其他實施例。因此,所揭示的實施例應自說明的觀點考慮,而並非自限定的觀點考慮。本說明書的範圍應解釋為由申請專利範圍示出而並非上述說明,且包括處於與其同等範圍內的所有差異。The relay lens optical system 50 and the laser processing apparatus 100 including the relay lens optical system 50 have been described with reference to the embodiments shown in the drawings. However, it should be understood that this is merely illustrative, and those skilled in the art can make various modifications and implement other equivalent embodiments accordingly. Therefore, the disclosed embodiments should be considered from the perspective of the description, and not from a self-limiting perspective. The scope of this specification should be interpreted as shown by the scope of the patent application and not the foregoing description, and includes all differences within its equivalent scope.

1:處理對象 1a:上部表面 1b:下部表面 2:功能元件 3:台 4':擴大的改質區域 4a:改質區域/第一改質區域 4b:改質區域/第二改質區域 5:支撐台 10:雷射光源 20:控制部 30:空間光調變器 30a:入/出射面 40:光學部件 41:第一表面 43:第二表面 45:第三表面 50、50':中繼透鏡光學系統 51:第一透鏡組 51':第一透鏡組/透鏡1 52、57:透鏡/第一透鏡 52'、53'、54'、57'、58'、59'、G1、G2、G3:透鏡 53、58:透鏡/第二透鏡 55:場透鏡 56:第二透鏡組 56':第二透鏡組/透鏡260:聚光光學系統 61:物鏡 65:光束擴展器 70:台位置控制部 100:雷射加工裝置 101、110、111、113、115:反射鏡 A、B、C:中心位置 c1:裂紋 d1:第一深度 d2:第二深度 f:有效焦距/距離 f1、f2:焦距 L:切割預定線 P1:第一聚光點 P2:第二聚光點 S1:物體表面/處理調變圖案形成面/起始點/入射瞳  S1':起始點/入射瞳 S2:上表面/入射瞳/出射瞳/點 S2':出射瞳/點 x、y、z:方向 ①、①'、②、②':距離/光路徑長度1: Processing Object 1a: Upper Surface 1b: Lower Surface 2: Functional Components 3: Stage 4': Expanded Modification Zone 4a: Modification Zone / First Modification Zone 4b: Modification Zone / Second Modification Zone 5: Support Stage 10: Laser Light Source 20: Control Unit 30: Spatial Light Modulator 30a: Entrance/Exit Surface 40: Optical Components 41: First Surface 43: Second Surface 45: Third Surface 50, 50': Relay Lens Optical System 51: First Lens Group 51': First Lens Group / Lens 1 52, 57: Lens/First Lens 52', 53', 54', 57', 58', 59', G1, G2, G3: Lens 53, 58: Lens/Second Lens 55: Field Lens 56: Second Lens Group 56': Second Lens Group/Lens 260: Condensing Optical System 61: Objective Lens 65: Beam Expander 70: Stage Position Control Unit 100: Laser Processing Device 101, 110, 111, 113, 115: Mirrors A, B, C: Center Position c1: Crack d1: First Depth d2: Second Depth f: Effective Focal Length/Distance f1 , f2 Focal length L: Cutting pre-defined line P1: First focal point P2: Second focal point S1: Object surface/processing modulation pattern forming surface/starting point/entrance pupil  S1': Starting point/entrance pupil S2: Upper surface/entrance pupil/exit pupil/point S2': Exit pupil/point x, y, z: Direction ①, ①', ②, ②': Distance/light path length

圖1概略性地顯示根據實施例的雷射加工裝置。 圖2是簡要示出圖1的處理對象的例示性構成的平面圖。 圖3顯示利用聚光光學系統使藉由空間光調變器按照設定的處理調變圖案調變的雷射光在處理對象內部的多個聚光點聚光的例子。 圖4用於說明在圖3的處理對象內部產生裂紋的原理。 圖5概略性地顯示圖1的中繼透鏡光學系統的實施例。 圖6a用於說明根據實施例的中繼透鏡光學系統的光路徑長度減小效果。 圖6b顯示比較例的中繼透鏡光學系統的光路徑長度。 圖7及圖8顯示可應用於圖1的雷射加工裝置的光學系統構成的其他實施例。 圖9a及圖9b概略性地顯示根據實施例的中繼透鏡光學系統及包括所述中繼透鏡光學系統的雷射加工裝置100的整個透鏡光學系統中的光路徑。 圖10a、圖10b、圖10c分別表示利用表1的設計資料形成的實施例的中繼透鏡光學系統及包括所述中繼透鏡光學系統的雷射加工裝置的整個透鏡光學系統的調變轉換函數(MTF)性能、像差(色像差、像散、失真)、光線像差。 圖11a及圖11b概略性地顯示比較例的中繼透鏡光學系統及包括所述中繼透鏡光學系統的雷射加工裝置的整個透鏡光學系統中的光路徑。 圖12a、圖12b、圖12c分別表示利用表2的設計資料形成的比較例的中繼透鏡光學系統及包括所述中繼透鏡光學系統的雷射加工裝置的整個透鏡光學系統的MTF性能、像差(色像差、像散、失真)、光線像差。Figure 1 schematically shows a laser processing apparatus according to an embodiment. Figure 2 is a plan view schematically showing the configuration of the object being processed in Figure 1. Figure 3 shows an example of focusing laser light, modulated by a spatial light modulator according to a set processing modulation pattern, at multiple focal points inside the object being processed using a focusing optical system. Figure 4 is used to illustrate the principle of crack generation inside the object being processed in Figure 3. Figure 5 schematically shows an embodiment of the relay lens optical system of Figure 1. Figure 6a is used to illustrate the effect of reducing the optical path length of the relay lens optical system according to an embodiment. Figure 6b shows the optical path length of a comparative example of a relay lens optical system. Figures 7 and 8 show other embodiments of the optical system configuration applicable to the laser processing apparatus of Figure 1. Figures 9a and 9b schematically show the optical paths in the relay lens optical system according to the embodiments and the entire lens optical system of the laser processing apparatus 100 including the relay lens optical system. Figures 10a, 10b, and 10c respectively show the modulation conversion function (MTF) performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations of the relay lens optical system of the embodiments formed using the design data in Table 1 and the entire lens optical system of the laser processing apparatus including the relay lens optical system. Figures 11a and 11b schematically show the optical paths in the comparative relay lens optical system and the entire lens optical system including the laser processing apparatus of the relay lens optical system. Figures 12a, 12b, and 12c respectively show the MTF performance, aberrations (chromatic aberration, astigmatism, distortion), and optical aberrations of the comparative relay lens optical system and the entire lens optical system including the laser processing apparatus of the relay lens optical system formed using the design data in Table 2.

1:處理對象 1: The target of the investigation

3:台 3: Taiwan

5:支撐台 5: Support Platform

10:雷射光源 10: Laser Light Source

20:控制部 20: Control Department

30:空間光調變器 30: Spatial Light Modulator

30a:入/出射面 30a: Entrance/Exit Surface

50:中繼透鏡光學系統 50: Intermediate Lens Optical System

51:第一透鏡組 51: First Lens Group

55:場透鏡 55: Field Lens

56:第二透鏡組 56: Second Lens Group

60:聚光光學系統 60: Concentrated Optical System

61:物鏡 61: Object Mirror

70:台位置控制部 70: Position Control Unit

100:雷射加工裝置 100: Laser processing equipment

101、110:反射鏡 101, 110: Reflecting Mirrors

x、y、z:方向 x, y, z: Direction

Claims (18)

一種雷射加工裝置,包括: 雷射光源,產生雷射光; 空間光調變器,對自所述雷射光源提供的所述雷射光進行調變以形成處理調變圖案; 聚光光學系統,使在所述空間光調變器中調變的所述雷射光在處理對象聚光; 中繼透鏡光學系統,位於所述空間光調變器與所述聚光光學系統之間,配備成使藉由所述空間光調變器形成的處理調變圖案的像傳遞至所述聚光光學系統的入射瞳,且包括第一透鏡組、第二透鏡組、位於所述第一透鏡組與所述第二透鏡組之間的場透鏡;以及 控制部,對所述空間光調變器進行控制,以按照所述處理調變圖案對所述雷射光進行調變, 其中所述場透鏡位在距所述第一透鏡組與所述第二透鏡組的中間位置, 其中所述中繼透鏡光學系統以形成3f透鏡單元的方式配備。 A laser processing apparatus includes: a laser light source for generating laser light; a spatial light modulator for modulating the laser light provided from the laser light source to form a processing modulation pattern; a focusing optical system for focusing the laser light modulated in the spatial light modulator onto a processing object; a relay lens optical system located between the spatial light modulator and the focusing optical system, configured to transmit an image of the processing modulation pattern formed by the spatial light modulator to the entrance pupil of the focusing optical system, and including a first lens group, a second lens group, and a field lens located between the first lens group and the second lens group; and a control unit for controlling the spatial light modulator to modulate the laser light according to the processing modulation pattern. The field lens is positioned midway between the first lens group and the second lens group. The relay lens optical system is configured to form a 3f lens unit. 如請求項1所述的雷射加工裝置,其中所述第一透鏡組及所述第二透鏡組分別包括兩片以上的透鏡。The laser processing apparatus as claimed in claim 1, wherein the first lens group and the second lens group each include two or more lenses. 如請求項2所述的雷射加工裝置,其中所述第一透鏡組及所述第二透鏡組分別包括具有正折射力的第一透鏡及具有負折射力的第二透鏡, 所述場透鏡配備成具有正折射力。 The laser processing apparatus as described in claim 2, wherein the first lens group and the second lens group each include a first lens with positive refractive power and a second lens with negative refractive power, the field lens is configured to have positive refractive power. 如請求項1所述的雷射加工裝置,其中所述空間光調變器根據所述控制部的控制形成所述處理調變圖案,以使按照所述處理調變圖案調變的所述雷射光藉由所述聚光光學系統而在所述處理對象的內部在彼此不同深度的多個聚光點聚光。The laser processing apparatus as claimed in claim 1, wherein the spatial light modulator forms the processing modulation pattern under the control of the control unit, so that the laser light modulated according to the processing modulation pattern is focused by the focusing optical system at multiple focusing points at different depths inside the object being processed. 如請求項4所述的雷射加工裝置,其中按照所述處理調變圖案調變的所述雷射光包含: 相對於基本光成分折射力不同的光成分。 The laser processing apparatus as described in claim 4, wherein the laser light modulated according to the processing modulation pattern comprises: light components with different refractive intensities relative to the basic light components. 如請求項1所述的雷射加工裝置,其中所述空間光調變器包括反射型空間光調變器。The laser processing apparatus as claimed in claim 1, wherein the spatial light modulator includes a reflective spatial light modulator. 如請求項6所述的雷射加工裝置,更包括光學部件, 在將自所述雷射光源側入射至所述光學部件的所述雷射光的行進方向稱為第一行進方向時, 所述光學部件為稜鏡結構,所述稜鏡結構配備成使所述雷射光傾斜地入射至所述空間光調變器且使在所述空間光調變器中調變並反射的所述雷射光沿著與所述第一行進方向平行的方向行進,且內部反射面與所述空間光調變器平行。 The laser processing apparatus as described in claim 6 further includes an optical component, where the direction of travel of the laser light incident on the optical component from the laser light source side is referred to as the first direction of travel, the optical component is a prism structure, the prism structure being configured such that the laser light is incident obliquely on the spatial light modulator and that the laser light modulated and reflected in the spatial light modulator travels in a direction parallel to the first direction of travel, and that an internal reflecting surface is parallel to the spatial light modulator. 如請求項1所述的雷射加工裝置,其中所述聚光光學系統包括: 物鏡,使入射的所述雷射光在所述處理對象聚光。 The laser processing apparatus as claimed in claim 1, wherein the focusing optical system comprises: an objective lens for focusing incident laser light onto the object being processed. 如請求項8所述的雷射加工裝置,其中所述聚光光學系統更包括: 光束擴展器,配備於所述中繼透鏡光學系統與所述物鏡之間,以將所述雷射光的束寬擴大。 The laser processing apparatus as claimed in claim 8, wherein the focusing optical system further comprises: a beam expander, disposed between the relay lens optical system and the objective lens, to expand the beamwidth of the laser light. 如請求項9所述的雷射加工裝置,更包括位於所述中繼透鏡光學系統與所述物鏡之間的反射鏡,且 所述光束擴展器佈置於所述中繼透鏡光學系統與所述反射鏡之間或所述反射鏡與所述物鏡之間。 The laser processing apparatus as described in claim 9 further includes a reflector located between the relay lens optical system and the objective lens, and the beam expander is disposed between the relay lens optical system and the reflector or between the reflector and the objective lens. 如請求項1至10中任一項所述的雷射加工裝置,更包括: 台,以能夠進行二維平面移動的方式構成;以及 台位置控制部,對所述台的二維平面移動進行控制。 The laser processing apparatus as described in any one of claims 1 to 10 further comprises: a stage configured to perform two-dimensional planar movement; and a stage position control unit for controlling the two-dimensional planar movement of the stage. 一種雷射加工裝置,包括: 雷射光源,產生雷射光; 反射型空間光調變器,對自所述雷射光源提供的所述雷射光進行調變以形成處理調變圖案; 聚光光學系統,使在所述反射型空間光調變器中調變的雷射光在處理對象聚光,且包括物鏡; 中繼透鏡光學系統,位於所述反射型空間光調變器與所述聚光光學系統之間,配備成使藉由所述反射型空間光調變器形成的處理調變圖案的像傳遞至所述聚光光學系統的入射瞳,且包括第一透鏡組、第二透鏡組、位於所述第一透鏡組與所述第二透鏡組之間的場透鏡; 台,以能夠進行二維平面移動的方式構成; 台位置控制部,對所述台的二維平面移動進行控制;以及 控制部,對所述空間光調變器進行控制,以按照所述處理調變圖案對所述雷射光進行調變, 其中所述場透鏡位在距所述第一透鏡組與所述第二透鏡組的中間位置, 其中所述中繼透鏡光學系統以形成3f透鏡單元的方式配備。 A laser processing apparatus includes: a laser light source for generating laser light; a reflective spatial light modulator for modulating the laser light provided from the laser light source to form a processing modulation pattern; a focusing optical system for focusing the laser light modulated in the reflective spatial light modulator onto a processing object, and including an objective lens; a relay lens optical system located between the reflective spatial light modulator and the focusing optical system, configured to transmit an image of the processing modulation pattern formed by the reflective spatial light modulator to the entrance pupil of the focusing optical system, and including a first lens group, a second lens group, and a field lens located between the first lens group and the second lens group; a stage configured to allow for two-dimensional planar movement; A stage position control unit controls the two-dimensional planar movement of the stage; and a control unit controls the spatial light modulator to modulate the laser light according to the processing modulation pattern, wherein the field lens is positioned midway between the first lens group and the second lens group, wherein the relay lens optical system is configured to form a 3f lens unit. 如請求項12所述的雷射加工裝置,其中所述第一透鏡組及所述第二透鏡組分別包括兩片以上的透鏡。The laser processing apparatus as described in claim 12, wherein the first lens group and the second lens group each include two or more lenses. 如請求項13所述的雷射加工裝置,其中所述第一透鏡組及所述第二透鏡組分別包括具有正折射力的第一透鏡及具有負折射力的第二透鏡, 所述場透鏡配備成具有正折射力。 The laser processing apparatus as claimed in claim 13, wherein the first lens group and the second lens group each include a first lens having positive refractive power and a second lens having negative refractive power, the field lens is configured to have positive refractive power. 如請求項12所述的雷射加工裝置,其中所述空間光調變器根據所述控制部的控制形成所述處理調變圖案,以使按照所述處理調變圖案調變的所述雷射光藉由所述聚光光學系統而在所述處理對象的內部在彼此不同深度的多個聚光點聚光。The laser processing apparatus as claimed in claim 12, wherein the spatial light modulator forms the processing modulation pattern under the control of the control unit, so that the laser light modulated according to the processing modulation pattern is focused by the focusing optical system at multiple focusing points at different depths inside the object being processed. 如請求項15所述的雷射加工裝置,其中按照所述處理調變圖案調變的所述雷射光包含: 相對於基本光成分折射力不同的光成分。 The laser processing apparatus as described in claim 15, wherein the laser light modulated according to the processing modulation pattern comprises: light components with different refractive intensities relative to the basic light components. 如請求項12所述的雷射加工裝置,更包括位於所述中繼透鏡光學系統與所述物鏡之間的反射鏡, 所述聚光光學系統更包括光束擴展器,所述光束擴展器配備於所述中繼透鏡光學系統與所述反射鏡之間或所述反射鏡與所述物鏡之間,以將所述雷射光的束寬擴大。 The laser processing apparatus as described in claim 12 further includes a reflector located between the relay lens optical system and the objective lens. The focusing optical system further includes a beam expander configured between the relay lens optical system and the reflector, or between the reflector and the objective lens, to expand the beamwidth of the laser light. 如請求項12至17中任一項所述的雷射加工裝置,更包括光學部件, 所述光學部件為稜鏡結構,且所述稜鏡結構在將自所述雷射光源側入射至所述光學部件的所述雷射光的行進方向稱為第一行進方向時,配備成使所述雷射光傾斜地入射至所述空間光調變器且使在所述空間光調變器中調變並反射的所述雷射光沿著與所述第一行進方向平行的方向行進,且內部反射面與所述空間光調變器平行。 The laser processing apparatus as described in any of claims 12 to 17 further includes an optical component, the optical component being a prism structure, and the prism structure, when the direction of travel of the laser light incident on the optical component from the laser light source side is referred to as the first direction of travel, is configured such that the laser light is obliquely incident on the spatial light modulator and that the laser light modulated and reflected in the spatial light modulator travels in a direction parallel to the first direction of travel, and that the internal reflecting surface is parallel to the spatial light modulator.
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11245070A (en) 1998-03-02 1999-09-14 Sumitomo Heavy Ind Ltd Laser processing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11245070A (en) 1998-03-02 1999-09-14 Sumitomo Heavy Ind Ltd Laser processing device

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