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TWI863631B - Cutting device and method for manufacturing cut product - Google Patents

Cutting device and method for manufacturing cut product Download PDF

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Publication number
TWI863631B
TWI863631B TW112139729A TW112139729A TWI863631B TW I863631 B TWI863631 B TW I863631B TW 112139729 A TW112139729 A TW 112139729A TW 112139729 A TW112139729 A TW 112139729A TW I863631 B TWI863631 B TW I863631B
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pixels
inspection
cutting device
determined
specific number
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TW112139729A
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TW202427574A (en
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田中龍太郎
水田彩香
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日商Towa股份有限公司
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    • H10P72/0428
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/06Grinders for cutting-off
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • H10P54/00
    • H10P72/0611
    • H10P72/0616
    • H10P95/00
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30148Semiconductor; IC; Wafer

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing & Machinery (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Image Processing (AREA)
  • Dicing (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Image Analysis (AREA)

Abstract

本發明提供一種能夠相對高效地進行切斷品的拍攝圖像中之檢查區域的自動設定之切斷裝置及切斷品的製造方法。切斷裝置包括拍攝部、第一處理部及第二處理部。拍攝部藉由拍攝複數個切斷品的一部分或全部來生成拍攝圖像。第一處理部設定拍攝圖像中之複數個檢查區域。第二處理部基於拍攝圖像中複數個檢查區域各自包含之圖像,檢查拍攝圖像中包含之各切斷品的外觀。第一處理部執行判定處理,該判定處理基於拍攝圖像中連續位於第一方向之特定數量的像素各自的像素值,判定特定數量的像素中是否包含複數個切斷品的任一邊的一部分。第一處理部反復移動特定數量的像素的位置來執行判定處理,以設定複數個檢查區域的至少一部分。The present invention provides a cutting device and a method for manufacturing a cut product that can relatively efficiently automatically set an inspection area in a photographed image of a cut product. The cutting device includes a photographing unit, a first processing unit, and a second processing unit. The photographing unit generates a photographed image by photographing a part or all of a plurality of cut products. The first processing unit sets a plurality of inspection areas in the photographed image. The second processing unit inspects the appearance of each cut product contained in the photographed image based on the images respectively contained in the plurality of inspection areas in the photographed image. The first processing unit performs a determination process that determines whether a specific number of pixels in the photographed image contain a part of any side of a plurality of cut products based on the pixel values of each of the specific number of pixels continuously located in a first direction. The first processing unit repeatedly moves the positions of a specific number of pixels to perform determination processing to set at least a portion of a plurality of inspection areas.

Description

切斷裝置及切斷品的製造方法Cutting device and method for manufacturing cut product

本發明關於一種切斷裝置及切斷品的製造方法。The present invention relates to a cutting device and a method for manufacturing a cut product.

日本特開2010-125488號公報(專利文獻1)揭示一種切斷工件之切斷裝置。於該切斷裝置中,藉由切斷工件來製造複數個單片化工件,並進行各單片化工件的外觀檢查(參考專利文獻1)。 [先前技術文獻] (專利文獻) Japanese Patent Publication No. 2010-125488 (Patent Document 1) discloses a cutting device for cutting a workpiece. In the cutting device, a plurality of singulated workpieces are manufactured by cutting the workpiece, and the appearance of each singulated workpiece is inspected (see Patent Document 1). [Prior Art Document] (Patent Document)

專利文獻1:日本特開2010-125488號公報Patent document 1: Japanese Patent Application Publication No. 2010-125488

[發明所欲解決之問題][The problem the invention is trying to solve]

藉由切斷基板而製造之切斷品(例如,單片化工件)的外觀的檢查例如是基於切斷品的拍攝圖像來進行。此時,於切斷品的拍攝圖像中設定檢查區域,並基於檢查區域內的圖像檢查切斷品的外觀。即,為了基於切斷品的拍攝圖像進行切斷品的外觀檢查,需要於切斷品的拍攝圖像中設定檢查區域。然而,於上述專利文獻1中,並未揭示檢查區域的具體設定方法。The inspection of the appearance of a cut product (e.g., a singulated workpiece) manufactured by cutting a substrate is performed, for example, based on a photographed image of the cut product. At this time, an inspection area is set in the photographed image of the cut product, and the appearance of the cut product is inspected based on the image in the inspection area. That is, in order to inspect the appearance of the cut product based on the photographed image of the cut product, it is necessary to set an inspection area in the photographed image of the cut product. However, in the above-mentioned patent document 1, a specific setting method of the inspection area is not disclosed.

本發明是為了解決上述問題而完成,其目的在於提供一種能夠相對高效地進行切斷品的拍攝圖像中之檢查區域的自動設定之切斷裝置及切斷品的製造方法。 [解決問題之技術手段] The present invention is completed to solve the above-mentioned problem, and its purpose is to provide a cutting device and a method for manufacturing a cut product that can relatively efficiently automatically set the inspection area in the photographed image of the cut product. [Technical means for solving the problem]

根據本發明的一方面之切斷裝置是藉由切斷基板來製造複數個切斷品。該切斷裝置包括拍攝部、第一處理部及第二處理部。拍攝部藉由拍攝複數個切斷品的一部分或全部來生成拍攝圖像。第一處理部設定拍攝圖像中之複數個檢查區域。第二處理部基於拍攝圖像中複數個檢查區域各自包含之圖像,檢查拍攝圖像中包含之各切斷品的外觀。複數個檢查區域各自的形狀為矩形。各切斷品的形狀為矩形。第一處理部執行判定處理,該判定處理基於拍攝圖像中連續位於第一方向之特定數量的像素各自的像素值,判定特定數量的像素中是否包含複數個切斷品的任一邊的一部分。特定數量小於拍攝圖像整體的第一方向上之像素數。第一處理部反復移動特定數量的像素的位置來執行判定處理,以設定複數個檢查區域的至少一部分。According to one aspect of the present invention, a cutting device manufactures a plurality of cut products by cutting a substrate. The cutting device includes a photographing unit, a first processing unit, and a second processing unit. The photographing unit generates a photographed image by photographing a part or all of the plurality of cut products. The first processing unit sets a plurality of inspection areas in the photographed image. The second processing unit inspects the appearance of each cut product contained in the photographed image based on the images contained in each of the plurality of inspection areas in the photographed image. Each of the plurality of inspection areas is rectangular in shape. The shape of each cut product is rectangular. The first processing unit performs a determination process, the determination process determining whether a specific number of pixels includes a portion of any side of a plurality of cut products based on the pixel values of each of the specific number of pixels continuously located in the first direction in the photographed image. The specific number is smaller than the number of pixels in the first direction of the entire photographed image. The first processing unit repeatedly moves the position of the specific number of pixels to perform the determination process to set at least a portion of the plurality of inspection areas.

根據本發明的另一方面之切斷品的製造方法使用上述切斷裝置。切斷裝置包括切斷台及切斷部。於切斷台配置基板。切斷部切斷配置於切斷台之基板。製造方法包括如下步驟:於切斷台配置基板;及,切斷配置於切斷台之基板。 (發明的效果) According to another aspect of the present invention, a method for manufacturing a cut product uses the above-mentioned cutting device. The cutting device includes a cutting table and a cutting unit. A substrate is arranged on the cutting table. The cutting unit cuts the substrate arranged on the cutting table. The manufacturing method includes the following steps: arranging a substrate on the cutting table; and, cutting the substrate arranged on the cutting table. (Effect of the invention)

根據本發明,可提供一種能夠相對高效地進行切斷品的拍攝圖像中之檢查區域的自動設定之切斷裝置及切斷品的製造方法。According to the present invention, a cutting device and a method for manufacturing a cut product can be provided, which can relatively efficiently automatically set the inspection area in the photographed image of the cut product.

以下,參考圖式對本發明的一方面的實施方式(以下亦稱為「本實施方式」)詳細地進行說明。再者,對圖中相同或相當的部分附上相同符號,並省略其說明。又,為了便於理解,適當省略或誇大對象來示意性地描述各圖式。Hereinafter, an embodiment of one aspect of the present invention (hereinafter also referred to as "this embodiment") is described in detail with reference to the drawings. In addition, the same symbols are attached to the same or corresponding parts in the drawings, and their descriptions are omitted. In addition, in order to facilitate understanding, each drawing is schematically described by appropriately omitting or exaggerating objects.

[1.構成] <1-1.切斷裝置的構成> 第1圖是示意性地示出根據本實施方式的切斷裝置1之俯視圖。切斷裝置1構成為藉由切斷封裝基板(待切斷物的一例),而將該封裝基板單片化為複數個電子零件(切斷品的一例)。於封裝基板中,固定有半導體晶片之基板或引線框架由樹脂密封。再者,待切斷物並非必須為封裝基板,例如,亦可為未由樹脂密封之基板(包括晶圓)。 [1. Configuration] <1-1. Configuration of cutting device> FIG. 1 schematically shows a top view of a cutting device 1 according to the present embodiment. The cutting device 1 is configured to singulate a package substrate (an example of an object to be cut) into a plurality of electronic components (an example of a cut product) by cutting the package substrate. In the package substrate, a substrate or a lead frame to which a semiconductor chip is fixed is sealed by a resin. Furthermore, the object to be cut does not necessarily have to be a package substrate, and for example, it may be a substrate (including a wafer) that is not sealed by a resin.

作為封裝基板的一例,可列舉球柵陣列(Ball Grid Array, BGA)封裝基板、平面網格陣列(Land Grid Array, LGA)封裝基板、晶片尺寸封裝(Chip Size Package, CSP)封裝基板、發光二極體(Light Emitting Diode, LED)封裝基板及方形扁平無引腳(Quad Flat No-leaded, QFN)封裝基板。As an example of a package substrate, there can be listed a ball grid array (BGA) package substrate, a land grid array (LGA) package substrate, a chip size package (CSP) package substrate, a light emitting diode (LED) package substrate, and a quad flat no-leaded (QFN) package substrate.

又,切斷裝置1構成為檢查單片化之複數個電子零件中的每一個。於切斷裝置1中,拍攝各電子零件,並基於拍攝圖像進行各電子零件的檢查。經過該檢查生成檢查資料,將各電子零件分類為「良品」或「不良品」。The cutting device 1 is configured to inspect each of the plurality of singulated electronic components. In the cutting device 1, each electronic component is photographed, and each electronic component is inspected based on the photographed image. Inspection data is generated through the inspection, and each electronic component is classified as "good" or "defective".

於該例中,使用封裝基板P1作為待切斷物,由切斷裝置1將封裝基板P1單片化為複數個電子零件S1(參考第2圖)。以下,於封裝基板P1的兩面中,將由樹脂密封之面稱為模具面,將與模具面相反之面稱為球/引線面。再者,當待切斷物為未由樹脂密封之基板時,於切斷時朝上之面(切斷面)相當於本實施方式中之球/引線面,切斷面的相反面相當於本實施方式中之模具面。In this example, a package substrate P1 is used as the object to be cut, and the cutting device 1 singulates the package substrate P1 into a plurality of electronic components S1 (see FIG. 2). Hereinafter, of the two surfaces of the package substrate P1, the surface sealed by the resin is referred to as the mold surface, and the surface opposite to the mold surface is referred to as the ball/lead surface. Furthermore, when the object to be cut is a substrate not sealed by the resin, the surface facing upward during cutting (cutting surface) is equivalent to the ball/lead surface in this embodiment, and the surface opposite to the cutting surface is equivalent to the mold surface in this embodiment.

如第1圖所示,切斷裝置1包括切斷模組A1、以及檢查及收納模組B1作為構成要素。切斷模組A1構成為藉由切斷封裝基板P1來製造複數個電子零件S1。檢查及收納模組B1構成為檢查所製造之複數個電子零件S1中的每一個,之後,將電子零件S1收納於托盤中。於切斷裝置1中,各構成要素相對於其他構成要素可拆裝且可交換。As shown in FIG. 1 , the cutting device 1 includes a cutting module A1 and an inspection and storage module B1 as components. The cutting module A1 is configured to manufacture a plurality of electronic components S1 by cutting a package substrate P1. The inspection and storage module B1 is configured to inspect each of the manufactured plurality of electronic components S1 and then store the electronic components S1 in a tray. In the cutting device 1 , each component is detachable and interchangeable with respect to other components.

切斷模組A1主要包括基板供給部3、定位部4、切斷台530、主軸部6及搬送部7。The cutting module A1 mainly includes a substrate supply unit 3, a positioning unit 4, a cutting table 530, a spindle unit 6 and a conveying unit 7.

基板供給部3藉由自容納複數個封裝基板P1之料盒M1逐一推出封裝基板P1,而將封裝基板P1逐一供給至定位部4。此時,封裝基板P1以球/引線面朝上之狀態配置。The substrate supply unit 3 supplies the package substrates P1 one by one to the positioning unit 4 by pushing out the package substrates P1 one by one from the magazine M1 accommodating a plurality of package substrates P1. At this time, the package substrates P1 are arranged in a state where the ball/lead surface faces upward.

定位部4藉由將自基板供給部3推出之封裝基板P1配置於軌道部4a上,而進行封裝基板P1的定位。之後,定位部4將已定位之封裝基板P1搬送至切斷台5。The positioning section 4 positions the package substrate P1 pushed out from the substrate supply section 3 on the rail section 4a. Then, the positioning section 4 transports the positioned package substrate P1 to the cutting table 5.

切斷台5保持待切斷之封裝基板P。此處,例示有具有兩個切斷台5之雙切割台構成的切斷裝置1。切斷台5包括保持構件5a、旋轉機構5b及移動機構5c。保持構件5a藉由自下方吸附由定位部4搬送之封裝基板P1,而保持封裝基板P1。旋轉機構5b能夠使保持構件5a於水平面上沿圖中的θ1方向旋轉。移動機構5c能夠使保持構件5a沿圖中的Y軸移動。The cutting table 5 holds the package substrate P to be cut. Here, a cutting device 1 having a double cutting table structure with two cutting tables 5 is exemplified. The cutting table 5 includes a holding member 5a, a rotating mechanism 5b, and a moving mechanism 5c. The holding member 5a holds the package substrate P1 by sucking the package substrate P1 conveyed by the positioning unit 4 from below. The rotating mechanism 5b can rotate the holding member 5a in the θ1 direction in the figure on a horizontal plane. The moving mechanism 5c can move the holding member 5a along the Y axis in the figure.

主軸部6藉由切斷封裝基板P1,而將封裝基板P1單片化為複數個電子零件S1。此處,例示有具有兩個主軸部6之雙主軸構成的切斷裝置1。主軸部6可沿圖中的X軸及Z軸移動。再者,切斷裝置1亦可為具有一個主軸部6之單主軸構成。The spindle unit 6 separates the package substrate P1 into a plurality of electronic components S1 by cutting the package substrate P1. Here, a cutting device 1 having a dual spindle structure with two spindle units 6 is exemplified. The spindle unit 6 can move along the X-axis and the Z-axis in the figure. Furthermore, the cutting device 1 can also be a single spindle structure with one spindle unit 6.

主軸部6包括旋轉軸6c。於主軸部6的旋轉軸6c上,固定有刀片6a。刀片6a藉由高速旋轉而切斷封裝基板P1,從而將封裝基板P1單片化為複數個電子零件S1。刀片6a於由未圖示之第一及第二凸緣夾持之狀態下安裝於旋轉軸6c。第一及第二凸緣藉由螺母等未圖示之緊固構件固定於旋轉軸6c。The main shaft portion 6 includes a rotating shaft 6c. A blade 6a is fixed to the rotating shaft 6c of the main shaft portion 6. The blade 6a cuts the package substrate P1 by rotating at high speed, thereby singulating the package substrate P1 into a plurality of electronic components S1. The blade 6a is mounted on the rotating shaft 6c in a state of being clamped by the first and second flanges not shown. The first and second flanges are fixed to the rotating shaft 6c by fastening members not shown such as nuts.

於切斷模組A1上設置有切削水用噴嘴、冷卻水用噴嘴及除屑水用噴嘴等(未圖示)。切削水用噴嘴向高速旋轉之刀片6a噴射切削水。冷卻水用噴嘴向封裝基板P1的切斷位置附近噴射冷卻水。除屑水用噴嘴噴射吹去切斷屑等之除屑水。The cutting module A1 is provided with a cutting water nozzle, a cooling water nozzle, and a chip removal water nozzle (not shown). The cutting water nozzle sprays cutting water toward the high-speed rotating blade 6a. The cooling water nozzle sprays cooling water toward the cutting position of the package substrate P1. The chip removal water nozzle sprays chip removal water to blow away the cutting chips.

於切斷台5吸附封裝基板P1後,由第一位置確認相機5d拍攝封裝基板P1,從而確認封裝基板P1的位置。使用第一位置確認相機5d進行之確認例如為設置於封裝基板P1上之對準標記的位置的確認。對準標記的位置資訊例如用於確定封裝基板P1的切斷線。After the cutting station 5 absorbs the package substrate P1, the first position confirmation camera 5d photographs the package substrate P1 to confirm the position of the package substrate P1. The confirmation performed using the first position confirmation camera 5d is, for example, confirmation of the position of the alignment mark set on the package substrate P1. The position information of the alignment mark is used, for example, to determine the cutting line of the package substrate P1.

之後,切斷台5沿圖中的Y軸向主軸部6移動。於切斷台5移動至刀片6a的下方之後,使切斷台5與主軸部6相對移動,藉此,切斷封裝基板P1。之後,視需要,藉由切斷模組A1所具備之第二位置確認相機6b拍攝封裝基板P1,從而確認封裝基板P1的位置等。使用第二位置確認相機6b進行之確認例如為封裝基板P1的切斷位置及切斷寬度的確認。After that, the cutting table 5 moves along the Y axis in the figure toward the main shaft portion 6. After the cutting table 5 moves to the bottom of the blade 6a, the cutting table 5 and the main shaft portion 6 are moved relative to each other, thereby cutting the package substrate P1. After that, if necessary, the package substrate P1 is photographed by the second position confirmation camera 6b of the cutting module A1 to confirm the position of the package substrate P1, etc. The confirmation performed using the second position confirmation camera 6b is, for example, confirmation of the cutting position and cutting width of the package substrate P1.

於封裝基板P1的切斷完成後,切斷台5於吸附有已單片化之複數個電子零件S1之狀態下,沿圖中的Y軸向遠離主軸部6之方向移動。於該移動過程中,由第一清潔器5e進行電子零件S1的上表面(球/引線面)的清洗及乾燥。該清洗例如可藉由對電子零件S1的上表面直接噴射清洗水來進行,亦可藉由經由刷子等將清洗水供給至電子零件S1的上表面來進行。再者,於切斷裝置1中,設置有沿圖中的X軸方向排列之兩個第一清潔器5e,但第一清潔器5e的數量並不限於此。After the cutting of the package substrate P1 is completed, the cutting table 5 moves along the Y-axis in the figure in a direction away from the main shaft portion 6 while adsorbing a plurality of singulated electronic components S1. During the movement, the upper surface (ball/lead surface) of the electronic component S1 is cleaned and dried by the first cleaner 5e. The cleaning can be performed, for example, by directly spraying cleaning water on the upper surface of the electronic component S1, or by supplying cleaning water to the upper surface of the electronic component S1 through a brush or the like. Furthermore, in the cutting device 1, two first cleaners 5e arranged along the X-axis in the figure are provided, but the number of the first cleaners 5e is not limited thereto.

搬送部7自上方吸附保持於切斷台5之電子零件S1,並將電子零件S1搬送至檢查及收納模組B1的檢查台11。於該搬送過程中,利用第二清潔器7a進行電子零件S1的下表面(模具面)的清洗及乾燥。該清洗例如可藉由對電子零件S1的下表面直接噴射清洗水來進行,亦可藉由經由刷子等將清洗水供給至電子零件S1的下表面來進行。The conveying unit 7 sucks and holds the electronic component S1 held on the cutting table 5 from above, and conveys the electronic component S1 to the inspection table 11 of the inspection and storage module B1. During the conveying process, the lower surface (mold surface) of the electronic component S1 is cleaned and dried by the second cleaner 7a. The cleaning can be performed by directly spraying cleaning water on the lower surface of the electronic component S1, or by supplying cleaning water to the lower surface of the electronic component S1 through a brush or the like.

檢查及收納模組B1主要包括檢查台11、第一光學檢查相機12、第二光學檢查相機13、配置部14及抽出部15。再者,第一光學檢查相機12亦可設置於切斷模組A1。The inspection and storage module B1 mainly includes an inspection table 11, a first optical inspection camera 12, a second optical inspection camera 13, a configuration unit 14, and a withdrawal unit 15. Furthermore, the first optical inspection camera 12 may also be disposed in the cutting module A1.

檢查台11保持電子零件S1,以進行電子零件S1的光學檢查。檢查台11可沿圖中的X軸移動。又,檢查台11可上下反轉。於檢查台11,設置有藉由吸附電子零件S1而保持電子零件S1之保持構件11b(參考第2圖)。The inspection table 11 holds the electronic component S1 to perform optical inspection of the electronic component S1. The inspection table 11 can move along the X axis in the figure. In addition, the inspection table 11 can be reversed up and down. The inspection table 11 is provided with a holding member 11b (refer to FIG. 2) that holds the electronic component S1 by adsorbing the electronic component S1.

第一光學檢查相機12及第二光學檢查相機13分別拍攝電子零件S1的模具面及球/引線面。基於由第一光學檢查相機12及第二光學檢查相機13生成之圖像資料,進行與電子零件S1的外觀相關之各種檢查(外觀檢查)。作為外觀檢查的一例,可列舉電子零件S1的大小的檢查、球部BA1的大小的檢查及相鄰之球部BA1之間的長度的檢查。第一光學檢查相機12及第二光學檢查相機13分別配置為於檢查台11附近對上方進行拍攝。The first optical inspection camera 12 and the second optical inspection camera 13 respectively photograph the mold surface and the ball/lead surface of the electronic component S1. Based on the image data generated by the first optical inspection camera 12 and the second optical inspection camera 13, various inspections related to the appearance of the electronic component S1 (appearance inspection) are performed. As an example of appearance inspection, there can be listed the inspection of the size of the electronic component S1, the inspection of the size of the ball part BA1, and the inspection of the length between adjacent ball parts BA1. The first optical inspection camera 12 and the second optical inspection camera 13 are respectively configured to shoot upward near the inspection table 11.

第一光學檢查相機12拍攝由搬送部7搬送至檢查台11之電子零件S1的模具面。之後,搬送部7將電子零件S1載置於檢查台11的保持構件11b上。於保持構件11b吸附電子零件S1後,檢查台11上下反轉。檢查台11向第二光學檢查相機13的上方移動,從而由第二光學檢查相機13拍攝電子零件S1的球/引線面。The first optical inspection camera 12 photographs the mold surface of the electronic component S1 transported by the transport unit 7 to the inspection table 11. After that, the transport unit 7 places the electronic component S1 on the holding member 11b of the inspection table 11. After the holding member 11b absorbs the electronic component S1, the inspection table 11 is turned upside down. The inspection table 11 moves to the top of the second optical inspection camera 13, so that the second optical inspection camera 13 photographs the ball/lead surface of the electronic component S1.

第2圖是示意性地示出利用第二光學檢查相機13拍攝電子零件S1之情形之圖。檢查台11包括檢查台主體11a及保持構件11b。保持構件11b設置於檢查台主體11a的下方。於保持構件11b中,保持電子零件S1之面例如由黑色橡膠構成。再者,橡膠的顏色並非必須為黑色,例如亦可為白色等。由保持構件11b吸附保持之複數個電子零件S1由第二光學檢查相機13拍攝。基於表示由第二光學檢查相機13生成之拍攝圖像之圖像資料或拍攝圖像(以下亦簡稱為「拍攝圖像」)來進行與各電子零件S1的球/引線面的外觀相關之檢查。稍後對與各電子零件S1的球/引線面的外觀相關之檢查的工序詳細地進行說明。FIG. 2 is a diagram schematically showing the situation of photographing the electronic component S1 using the second optical inspection camera 13. The inspection table 11 includes an inspection table main body 11a and a retaining member 11b. The retaining member 11b is arranged below the inspection table main body 11a. In the retaining member 11b, the surface retaining the electronic component S1 is made of, for example, black rubber. Furthermore, the color of the rubber does not have to be black, for example, it can also be white. The plurality of electronic components S1 adsorbed and retained by the retaining member 11b are photographed by the second optical inspection camera 13. Inspection related to the appearance of the ball/lead surface of each electronic component S1 is performed based on the image data or the captured image (hereinafter also referred to as the "captured image") representing the captured image generated by the second optical inspection camera 13. The inspection process related to the appearance of the ball/lead surface of each electronic component S1 will be described in detail later.

再次參考第1圖,於配置部14,配置檢查完畢的電子零件S1。配置部14可沿圖中的Y軸移動。檢查台11將檢查完畢的電子零件S1配置於配置部14。Referring to FIG. 1 again, the electronic component S1 after inspection is arranged in the arrangement section 14. The arrangement section 14 can move along the Y axis in the figure. The inspection table 11 arranges the electronic component S1 after inspection in the arrangement section 14.

抽出部15將配置於配置部14之電子零件S1轉移至托盤。電子零件S1基於使用第一光學檢查相機12及第二光學檢查相機13進行之檢查的結果,分為「良品」或「不良品」。抽出部15基於分類結果,將各電子零件S1轉移至良品用托盤15a或不良品用托盤15b。即,良品收納於良品用托盤15a中,不良品收納於不良品用托盤15b中。良品用托盤15a及不良品用托盤15b分別於裝滿電子零件S1時,更換為新托盤。The extraction unit 15 transfers the electronic components S1 arranged in the arrangement unit 14 to the tray. The electronic components S1 are classified as "good products" or "defective products" based on the results of the inspection using the first optical inspection camera 12 and the second optical inspection camera 13. The extraction unit 15 transfers each electronic component S1 to the good product tray 15a or the defective product tray 15b based on the classification results. That is, good products are stored in the good product tray 15a, and defective products are stored in the defective product tray 15b. The good product tray 15a and the defective product tray 15b are replaced with new trays when they are full of electronic components S1.

切斷裝置1進而包括電腦50及監視器20。監視器20構成為顯示圖像。監視器20例如由液晶監視器或有機電致發光(Electro Luminescence, EL)監視器等顯示器件構成。監視器20例如設置於切斷裝置1的正面。The cutting device 1 further includes a computer 50 and a monitor 20. The monitor 20 is configured to display an image. The monitor 20 is, for example, a display device such as a liquid crystal monitor or an organic electroluminescence (EL) monitor. The monitor 20 is, for example, disposed on the front of the cutting device 1.

電腦50例如控制切斷模組A1以及檢查及収納模組B1的各部的動作。由電腦50控制例如基板供給部3、定位部4、切斷台5、主軸部6、搬送部7、檢查台11、第一光學檢查相機12、第二光學檢查相機13、配置部14、抽出部15及監視器20的動作。The computer 50 controls the operation of the cutting module A1 and the inspection and storage module B1. The computer 50 controls the operation of the substrate supply unit 3, the positioning unit 4, the cutting table 5, the spindle unit 6, the conveying unit 7, the inspection table 11, the first optical inspection camera 12, the second optical inspection camera 13, the configuration unit 14, the extraction unit 15 and the monitor 20.

又,電腦50例如基於由第一光學檢查相機12及第二光學檢查相機13生成之圖像資料,來進行電子零件S1的各種檢查。接著,對電腦50詳細地進行說明。Furthermore, the computer 50 performs various inspections of the electronic component S1 based on, for example, image data generated by the first optical inspection camera 12 and the second optical inspection camera 13. Next, the computer 50 will be described in detail.

<1-2.電腦的構成> 第3圖是示意性地示出電腦50的硬體構成之圖。如第3圖所示,電腦50包括控制部70、輸入輸出I/F(interface)90、受理部95及記憶部80,各構成經由匯流排電連接。 <1-2. Computer structure> Figure 3 is a diagram schematically showing the hardware structure of the computer 50. As shown in Figure 3, the computer 50 includes a control unit 70, an input/output I/F (interface) 90, a receiving unit 95, and a memory unit 80, and each structure is electrically connected via a bus.

控制部70包括中央處理單元(Central Processing Unit, CPU)72、隨機存取記憶體(Random Access Memory, RAM)74及唯讀記憶體(Read Only Memory, ROM)76等。控制部70構成為根據資訊處理,來控制電腦50內的各構成要素及切斷裝置1內的各構成要素。The control unit 70 includes a central processing unit (CPU) 72, a random access memory (RAM) 74, and a read-only memory (ROM) 76. The control unit 70 is configured to control each component in the computer 50 and each component in the cutting device 1 according to information processing.

輸入輸出I/F90構成為經由信號線,與切斷裝置1中包括之各構成要素通信。輸入輸出I/F90用於自電腦50向切斷裝置1內的各構成要素發送資料,且用於接收自切斷裝置1內的各構成要素發送至電腦50之資料。受理部95構成為受理來自使用者之指示。受理部95例如由觸控面板、鍵盤、滑鼠及麥克風的一部分或全部構成。The input/output I/F 90 is configured to communicate with each component included in the cutting device 1 via a signal line. The input/output I/F 90 is used to send data from the computer 50 to each component in the cutting device 1, and is used to receive data sent from each component in the cutting device 1 to the computer 50. The receiving unit 95 is configured to receive instructions from the user. The receiving unit 95 is composed of, for example, a part or all of a touch panel, a keyboard, a mouse, and a microphone.

記憶部80例如為硬盤驅動器、固態硬盤等輔助記憶裝置。記憶部80例如構成為記憶控制程式。藉由利用控制部70執行控制程式81,來實現切斷裝置1中之各種動作。當控制部70執行控制程式81時,控制程式81於RAM74中展開。並且,控制部70藉由利用CPU72解釋並執行於RAM74中展開之控制程式81來控制各構成要素。The memory unit 80 is, for example, an auxiliary memory device such as a hard disk drive or a solid state hard disk. The memory unit 80 is, for example, configured to store a control program. By using the control unit 70 to execute the control program 81, various actions in the cutting device 1 are realized. When the control unit 70 executes the control program 81, the control program 81 is expanded in the RAM 74. In addition, the control unit 70 controls each component by using the CPU 72 to interpret and execute the control program 81 expanded in the RAM 74.

[2.檢查區域的自動設定的必要性] 如上所述,於切斷裝置1中,基於由第一光學檢查相機12及第二光學檢查相機13生成之拍攝圖像,進行電子零件S1的外觀檢查。 [2. Necessity of automatic setting of inspection area] As described above, in the cutting device 1, the appearance inspection of the electronic component S1 is performed based on the captured images generated by the first optical inspection camera 12 and the second optical inspection camera 13.

第4圖是示意性地示出由第二光學檢查相機13生成之拍攝圖像IM1的一例之圖。參考第4圖,於拍攝圖像IM1中,顯現有複數個電子零件S1,例如,顯現有電子零件S1A、S1B、S1C、S1D。於拍攝圖像IM1中,複數個電子零件S1排列成格子狀。因拍攝圖像IM1為拍攝各電子零件S1的球/引線面所得之圖像,故於拍攝圖像IM1中顯現有各電子零件S1的複數個球部BA1。又,於相互相鄰之兩個電子零件S1之間,顯現有檢查台11的保持構件11b。FIG. 4 is a diagram schematically showing an example of a captured image IM1 generated by the second optical inspection camera 13. Referring to FIG. 4, in the captured image IM1, a plurality of electronic components S1 are displayed, for example, electronic components S1A, S1B, S1C, and S1D are displayed. In the captured image IM1, a plurality of electronic components S1 are arranged in a grid pattern. Since the captured image IM1 is an image obtained by photographing the ball/lead surface of each electronic component S1, a plurality of ball portions BA1 of each electronic component S1 are displayed in the captured image IM1. In addition, between two adjacent electronic components S1, the retaining member 11b of the inspection table 11 is displayed.

撮影圖像IM1為灰度(256灰度)的圖像。於該例中,各電子零件S1的顏色較保持構件11b的顏色亮。例如,各電子零件S1由灰色表示,保持構件11b由黑色表示。再者,亦將拍攝圖像中「顯現有」拍攝對象稱為拍攝圖像中「包含」拍攝對象。The captured image IM1 is a grayscale image (256 grayscales). In this example, the color of each electronic component S1 is brighter than the color of the holding member 11b. For example, each electronic component S1 is represented by gray, and the holding member 11b is represented by black. Furthermore, "appearing" the photographed image is also referred to as "including" the photographed image.

拍攝圖像IM1的形狀為矩形,各電子零件S1的形狀為矩形。再者,於本說明書中,「矩形」是指長方形(四個角全部相等的四邊形),亦可指正方形。拍攝圖像IM1的左邊IL1、右邊IR1、上邊IT1及下邊IB1分別與各電子零件S1的左邊EL1、右邊ER1、上邊ET1及下邊EB1平行。此處,平行不僅包含嚴格的含義,亦包含實質的含義。即,即便兩邊所成之角度不為0,於兩邊所成之角度為誤差範圍內的值時,兩邊亦平行。The shape of the captured image IM1 is a rectangle, and the shape of each electronic component S1 is a rectangle. Furthermore, in this specification, "rectangle" refers to a rectangle (a quadrilateral with four equal angles), and may also refer to a square. The left side IL1, the right side IR1, the top side IT1, and the bottom side IB1 of the captured image IM1 are parallel to the left side EL1, the right side ER1, the top side ET1, and the bottom side EB1 of each electronic component S1, respectively. Here, parallel not only includes a strict meaning, but also includes a substantial meaning. That is, even if the angle formed by the two sides is not 0, the two sides are parallel when the angle formed by the two sides is a value within the error range.

當基於拍攝圖像IM1進行電子零件S1的外觀檢查時,首先,設定拍攝圖像IM1中之複數個檢查區域T1。各檢查區域T1與拍攝圖像IM1中包含之任一電子零件S1對應。例如,檢查區域T1A、T1B、T1C、T1D分別與電子零件S1A、S1B、S1C、S1D對應。於切斷裝置1中,基於拍攝圖像IM1中複數個檢查區域T1各自包含之圖像,檢查拍攝圖像IM1中包含之各電子零件S1的外觀。When the appearance inspection of the electronic component S1 is performed based on the captured image IM1, first, a plurality of inspection areas T1 in the captured image IM1 are set. Each inspection area T1 corresponds to any electronic component S1 included in the captured image IM1. For example, the inspection areas T1A, T1B, T1C, and T1D correspond to the electronic components S1A, S1B, S1C, and S1D, respectively. In the cutting device 1, based on the images included in each of the plurality of inspection areas T1 in the captured image IM1, the appearance of each electronic component S1 included in the captured image IM1 is inspected.

作為各檢查區域T1的設定方法,例如可考慮操作者手動設定之方法。然而,當操作者手動設定各檢查區域T1時,可能發生例如檢查區域T1的設定需要相對較長的時間的問題、檢查區域T1的設定精度因不同操作者而不同的問題、及檢查區域T1的設定錯誤的發生頻率較高的問題。As a method for setting each inspection area T1, for example, a method of manually setting by an operator may be considered. However, when the operator manually sets each inspection area T1, there may be problems such as that the setting of the inspection area T1 requires a relatively long time, the setting accuracy of the inspection area T1 varies between operators, and the frequency of setting errors of the inspection area T1 is high.

於根據本實施方式之切斷裝置1中,自動設定各檢查區域T1。因此,根據切斷裝置1,能夠抑制操作者手動設定各檢查區域T1時可能產生之各問題的發生。又,詳細內容將於下文敘述,但於切斷裝置1中,對與各檢查區域T1的自動設定相關之算法進行了各種努力。因此,根據切斷裝置1,能夠相對高效地進行各檢查區域T1的自動設定。In the cutting device 1 according to the present embodiment, each inspection area T1 is automatically set. Therefore, according to the cutting device 1, it is possible to suppress the occurrence of various problems that may occur when the operator manually sets each inspection area T1. In addition, although the details will be described below, in the cutting device 1, various efforts are made on the algorithm related to the automatic setting of each inspection area T1. Therefore, according to the cutting device 1, it is possible to perform the automatic setting of each inspection area T1 relatively efficiently.

[3.電子零件(切斷品)的外觀檢查的工序] 第5圖是示出電子零件S1的外觀檢查的工序之流程圖。於根據本實施方式之切斷裝置1中,第二光學檢查相機13一次僅拍攝配置於檢查台11之所有電子零件S1中的部分電子零件S1,並以拍攝圖像為單位檢查各電子零件S1的外觀。藉由反復進行第二光學檢查相機13與檢查台11之間的位置關係的調整、及由第二光學檢查相機13進行之拍攝,來檢查配置於檢查台11之所有電子零件S1的外觀。 [3. Appearance inspection process of electronic components (cut products)] Figure 5 is a flow chart showing the appearance inspection process of electronic components S1. In the cutting device 1 according to the present embodiment, the second optical inspection camera 13 only photographs some of the electronic components S1 arranged on the inspection table 11 at a time, and inspects the appearance of each electronic component S1 in units of photographed images. By repeatedly adjusting the positional relationship between the second optical inspection camera 13 and the inspection table 11 and photographing by the second optical inspection camera 13, the appearance of all electronic components S1 arranged on the inspection table 11 is inspected.

第5圖之流程圖所示之處理例如於進行為了配置於檢查台11之所有電子零件S1的外觀檢查而進行之複數次拍攝中的首次拍攝時,由電腦50的控制部70執行。The processing shown in the flowchart of FIG. 5 is executed by the control unit 70 of the computer 50, for example, when performing the first shot of a plurality of shots for the appearance inspection of all the electronic components S1 arranged on the inspection table 11.

參考第5圖,控制部70控制第二光學檢查相機13,以拍攝配置於檢查台11之複數個電子零件S1(步驟S100)。控制部70執行由第二光學檢查相機13生成之拍攝圖像IM1中之各檢查區域T1的設定處理(步驟S110)。稍後對步驟S110中之處理詳細地進行說明。Referring to FIG. 5 , the control unit 70 controls the second optical inspection camera 13 to photograph the plurality of electronic components S1 disposed on the inspection table 11 (step S100). The control unit 70 performs setting processing of each inspection area T1 in the photographed image IM1 generated by the second optical inspection camera 13 (step S110). The processing in step S110 will be described in detail later.

控制部70基於各檢查區域T1中包含之圖像,執行拍攝圖像IM1中包含之各電子零件S1的各種外觀檢查處理(步驟S120)。例如,當利用為了配置於檢查台11之所有電子零件S1的外觀檢查而進行之複數次拍攝中的第二次及之後的拍攝進行外觀檢查時,使用為了利用第一次拍攝進行外觀檢查而設定之各檢查區域T1,從而省略步驟S110的處理。The control unit 70 performs various appearance inspection processes of each electronic component S1 included in the photographed image IM1 based on the images included in each inspection area T1 (step S120). For example, when the appearance inspection is performed using the second and subsequent photographs among the multiple photographs performed for the appearance inspection of all the electronic components S1 arranged on the inspection table 11, each inspection area T1 set for the appearance inspection using the first photograph is used, thereby omitting the processing of step S110.

第6圖是示出檢查區域的設定處理(第5圖的步驟S110)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 6 is a flowchart showing the process of setting the inspection area (step S110 in Fig. 5). The process shown in the flowchart is executed by the control unit 70 of the computer 50.

參考第6圖,控制部70執行與拍攝圖像IM1中包含之複數個電子零件S1中的第一個電子零件S1對應之檢查區域T1(例如,第4圖中之檢查區域T1A)的設定處理(步驟S200)。稍後對步驟S200中之處理詳細地進行說明。Referring to FIG. 6 , the control unit 70 performs a setting process (step S200 ) of the inspection area T1 (for example, the inspection area T1A in FIG. 4 ) corresponding to the first electronic component S1 among the plurality of electronic components S1 included in the captured image IM1 . The process in step S200 will be described in detail later.

控制部70以步驟S200中設定之檢查區域T1為基準,執行與存在於沿行方向移動後之位置之電子零件S1對應之檢查區域T1(例如,第4圖中之檢查區域T1B)的設定處理(步驟S210)。稍後對步驟S210中之處理詳細地進行說明。The control unit 70 performs a setting process (step S210) of the inspection area T1 corresponding to the electronic component S1 located after the movement in the row direction (for example, the inspection area T1B in FIG. 4) based on the inspection area T1 set in step S200. The process in step S210 will be described in detail later.

控制部70以於步驟S200中設定之檢查區域T1為基準,執行與存在於沿列方向移動後之位置之電子零件S1對應之檢查區域T1(例如,第4圖中之檢查區域T1C)的設定處理(步驟S220)。稍後對步驟S220中之處理詳細地進行說明。The control unit 70 performs setting processing of the inspection area T1 (for example, the inspection area T1C in FIG. 4 ) corresponding to the electronic component S1 located at the position after the movement in the row direction based on the inspection area T1 set in step S200 (step S220 ). The processing in step S220 will be described in detail later.

控制部70基於經過步驟S200、S210、S220中之處理所設定之各檢查區域T1,確定行方向上之檢查區域T1的數量及列方向上之檢查區域T1的數量,並基於其結果,設定其他檢查區域T1(例如,第4圖中之檢查區域T1D)(步驟S230)。若為第4圖所示的例子,則經過步驟S200、S210、S220中之處理,確定行方向上之檢查區域T1的數量為「2」,且確定列方向上之檢查區域T1的數量為「2」。並且,設定其他檢查區域T1,使各檢查區域T1排列成兩列兩行的格子狀。The control unit 70 determines the number of inspection areas T1 in the row direction and the number of inspection areas T1 in the column direction based on the inspection areas T1 set through the processing in steps S200, S210, and S220, and sets other inspection areas T1 (for example, the inspection area T1D in FIG. 4) based on the result (step S230). In the example shown in FIG. 4, after the processing in steps S200, S210, and S220, the number of inspection areas T1 in the row direction is determined to be "2", and the number of inspection areas T1 in the column direction is determined to be "2". In addition, the other inspection areas T1 are set so that the inspection areas T1 are arranged in a grid shape of two columns and two rows.

第7圖是示出第一個檢查區域T1的設定處理(第6圖的步驟S200)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 7 is a flow chart showing the steps of the setting process of the first inspection area T1 (step S200 of Fig. 6). The process shown in the flow chart is executed by the control unit 70 of the computer 50.

參考第7圖,控制部70執行用於確定拍攝圖像IM1中包含之複數個電子零件S1中第一個電子零件(以下亦簡稱為「第一個電子零件」)S1的左邊EL1之處理(步驟S300)。稍後對步驟S300中之處理詳細地進行說明。控制部70基於確定出之左邊EL1,執行用於確定第一個電子零件S1的右邊ER1之處理(步驟S310)。稍後對步驟S310中之處理詳細地進行說明。Referring to FIG. 7 , the control unit 70 performs a process (step S300) for determining the left side EL1 of the first electronic component S1 (hereinafter also referred to as the "first electronic component") among the plurality of electronic components S1 included in the photographed image IM1. The process in step S300 will be described in detail later. Based on the determined left side EL1, the control unit 70 performs a process (step S310) for determining the right side ER1 of the first electronic component S1. The process in step S310 will be described in detail later.

控制部70基於確定出之左邊EL1及右邊ER1,執行用於確定第一個電子零件S1的上邊ET1之處理(步驟S320)。稍後對步驟S320中之處理詳細地進行說明。控制部70基於確定出之左邊EL1及右邊ER1,執行用於確定第一個電子零件S1的下邊EB1之處理(步驟S330)。稍後對步驟S330中之處理詳細地進行說明。控制部70基於確定出之左邊EL1、右邊ER1、上邊ET1及下邊EB1,設定與第一個電子零件S1對應之檢查區域T1(步驟S340)。The control unit 70 performs processing for determining the upper side ET1 of the first electronic component S1 based on the determined left side EL1 and right side ER1 (step S320). The processing in step S320 will be described in detail later. The control unit 70 performs processing for determining the lower side EB1 of the first electronic component S1 based on the determined left side EL1 and right side ER1 (step S330). The processing in step S330 will be described in detail later. The control unit 70 sets the inspection area T1 corresponding to the first electronic component S1 based on the determined left side EL1, right side ER1, upper side ET1 and lower side EB1 (step S340).

第8圖是用於說明確定拍攝圖像IM1中第一個電子零件S1的左邊EL1的一部分之工序之圖。參考第8圖,於切斷裝置1中,執行左邊判定處理。左邊判定處理為如下處理:基於連續位於行方向上之特定數量的像素(以下亦簡稱為「特定數量的像素」)各自的像素值,判定該特定數量的像素中是否包含左邊EL1的一部分。於左邊判定處理中,基於特定數量的像素各自的像素值,確定保持構件11b與電子零件S1的邊界。例如,確定自圖中左側向右側,像素值較小的像素(與保持構件11b對應之像素(暗像素))與像素值較大的像素(與電子零件S1對應之像素(亮像素))依次相鄰排列之部分。FIG. 8 is a diagram for explaining the process of determining a portion of the left side EL1 of the first electronic component S1 in the captured image IM1. Referring to FIG. 8, in the cutting device 1, a left side determination process is performed. The left side determination process is the following process: based on the pixel values of each of a specific number of pixels (hereinafter also referred to as "a specific number of pixels") continuously located in the row direction, it is determined whether the specific number of pixels includes a portion of the left side EL1. In the left side determination process, based on the pixel values of each of the specific number of pixels, the boundary between the retaining component 11b and the electronic component S1 is determined. For example, a portion is determined in which pixels with smaller pixel values (pixels corresponding to the retaining component 11b (dark pixels)) and pixels with larger pixel values (pixels corresponding to the electronic component S1 (bright pixels)) are arranged adjacent to each other in sequence from the left side to the right side in the figure.

當經過左邊判定處理判定出特定數量的像素中未包含左邊EL1的一部分時,待判定之特定數量的像素的位置例如變更為右斜下方,並對變更後之特定數量的像素執行左邊判定處理。藉由反復執行待判定之特定數量的像素的位置變更與左邊判定處理,來確定左邊EL1的一部分的位置。When it is determined through the left edge determination process that a portion of the left edge EL1 is not included in the specific number of pixels, the position of the specific number of pixels to be determined is changed, for example, to the lower right, and the left edge determination process is performed on the changed specific number of pixels. By repeatedly performing the position change of the specific number of pixels to be determined and the left edge determination process, the position of a portion of the left edge EL1 is determined.

第9圖是用於說明作為左邊判定處理的對象之特定數量的像素的位置如何變更之圖。於該圖所示之拍攝圖像IM1中,為了便於說明,省略了各電子零件S1的圖像等。Fig. 9 is a diagram for explaining how the positions of a specific number of pixels that are the target of the left edge determination process change. In the captured image IM1 shown in this figure, the images of the electronic components S1 and the like are omitted for the sake of convenience.

參考第9圖,拍攝圖像IM1由複數個像素PX1構成。於切斷裝置1中,首先,自左上端的像素PX1向行方向的右側選擇五個像素(特定數量的像素的一例),並對所選擇之五個像素執行左邊判定處理。當判定出所選擇之五個像素中不包含左邊EL1的一部分時,五個像素的位置各向行方向右側及列方向下側變更一個像素。並且,對變更後的五個像素執行左邊判定處理。反復執行五個像素的位置變更及左邊判定處理,直至確定左邊EL1的一部分為止。Referring to FIG. 9, the captured image IM1 is composed of a plurality of pixels PX1. In the cutting device 1, first, five pixels (an example of a specific number of pixels) are selected from the upper left pixel PX1 to the right in the row direction, and the selected five pixels are subjected to left edge determination processing. When it is determined that the selected five pixels do not include a portion of the left edge EL1, the positions of the five pixels are changed by one pixel each to the right in the row direction and to the bottom in the column direction. And, the left edge determination processing is performed on the changed five pixels. The position change of the five pixels and the left edge determination processing are repeatedly performed until a portion of the left edge EL1 is determined.

第10圖是用於對左邊判定處理中之近似曲線L1的生成進行說明之圖。參考第10圖,橫軸表示特定數量的像素各自的位置,縱軸表示像素值。於左邊判定處理中,生成表示特定數量的像素的像素值自拍攝圖像IM1中之左側向右側如何變化之近似曲線L1。於生成近似曲線L1時,例如應用已知的各種技術。FIG. 10 is a diagram for explaining the generation of the approximate curve L1 in the left edge determination process. Referring to FIG. 10, the horizontal axis represents the position of each of the specific number of pixels, and the vertical axis represents the pixel value. In the left edge determination process, an approximate curve L1 is generated to represent how the pixel values of the specific number of pixels change from the left side to the right side in the self-shot image IM1. When generating the approximate curve L1, for example, various known techniques are applied.

第11圖是示意性地示出表示對近似曲線L1進行微分之結果之曲線L2之圖。參考第11圖,橫軸表示特定數量的像素各自的位置,縱軸表示微分值。於左邊判定處理中,進行所生成之近似曲線L1的微分。於左邊判定處理中,當微分值的最大值超過閾值(第一特定值)時,判定特定數量的像素中存在左邊EL1的一部分。若判定出特定數量的像素中存在左邊EL1的一部分,則基於確定出之左邊EL1的一部分確定左邊EL1的其他部分。FIG. 11 schematically shows a curve L2 which is a result of differentiating the approximate curve L1. Referring to FIG. 11, the horizontal axis represents the positions of the respective specific number of pixels, and the vertical axis represents the differential value. In the left edge determination process, the generated approximate curve L1 is differentiated. In the left edge determination process, when the maximum value of the differential value exceeds the threshold value (first specific value), it is determined that a part of the left edge EL1 exists in the specific number of pixels. If it is determined that a part of the left edge EL1 exists in the specific number of pixels, the other parts of the left edge EL1 are determined based on the determined part of the left edge EL1.

第12圖是用於對確定左邊EL1的其他部分之工序進行說明之圖。參考第12圖,像素PX1A為與經過左邊判定處理所得到之微分值的最大值(最大值>第一特定值)對應之像素PX1的一例。於確定左邊EL1的其他部分之處理中,首先,執行確定左邊EL1的上端之處理,之後,執行確定左邊EL1的下端之處理。FIG. 12 is a diagram for explaining the process of determining the other parts of the left edge EL1. Referring to FIG. 12, pixel PX1A is an example of a pixel PX1 corresponding to the maximum value (maximum value> first specific value) of the differential value obtained through the left edge determination process. In the process of determining the other parts of the left edge EL1, first, the process of determining the upper end of the left edge EL1 is performed, and then the process of determining the lower end of the left edge EL1 is performed.

具體而言,選擇包括像素PX1A、像素PX1A左側的兩個像素及像素PX1A右側的兩個像素在內之五個像素作為待判定的像素。反復執行使待判定的五個像素的位置向列方向上側移動一個像素之處理與左邊判定處理,直至判定出所選擇之五個像素中不包含左邊EL1的一部分為止。當所選擇之五個像素各自表示保持構件11b(參考第4圖)時,停止使待判定的五個像素的位置向列方向上側移動一個像素之處理,並確定左邊EL1的上端。再者,待判定的像素並非必須為包括像素PX1A、像素PX1A左側的兩個像素及像素PX1A右側的兩個像素在內之五個像素。例如,待判定的像素亦可為包括像素PX1A、像素PX1A左側的一個像素及像素PX1A右側的一個像素在內之三個像素,亦可為包括像素PX1A、像素PX1A左側的兩個像素及像素PX1A右側的一個像素在內之四個像素,亦可為包括像素PX1A、像素PX1A左側的一個像素及像素PX1A右側的兩個像素在內之四個像素。Specifically, five pixels including pixel PX1A, two pixels on the left side of pixel PX1A, and two pixels on the right side of pixel PX1A are selected as pixels to be determined. The processing of moving the positions of the five pixels to be determined by one pixel to the side in the column direction and the left-side determination processing are repeatedly performed until it is determined that the selected five pixels do not include a part of the left side EL1. When the selected five pixels each represent the holding member 11b (refer to Figure 4), the processing of moving the positions of the five pixels to be determined by one pixel to the side in the column direction is stopped, and the upper end of the left side EL1 is determined. Furthermore, the pixels to be determined do not necessarily have to be five pixels including pixel PX1A, two pixels on the left side of pixel PX1A, and two pixels on the right side of pixel PX1A. For example, the pixels to be determined may be three pixels including pixel PX1A, a pixel on the left side of pixel PX1A, and a pixel on the right side of pixel PX1A; or four pixels including pixel PX1A, two pixels on the left side of pixel PX1A, and a pixel on the right side of pixel PX1A; or four pixels including pixel PX1A, a pixel on the left side of pixel PX1A, and two pixels on the right side of pixel PX1A.

若確定出左邊EL1的上端,則反復執行使待判定的五個像素的位置向列方向下側移動一個像素之處理與左邊判定處理,直至判定出包括像素PX1A、像素PX1A左側的兩個像素及像素PX1A右側的兩個像素在內之五個像素內不包含左邊EL1的一部分為止。若所選擇之五個像素分別與保持構件11b(參考第4圖)對應,則停止使待判定的五個像素的位置向列方向下側移動一個像素之處理,並確定左邊EL1的下端。If the upper end of the left side EL1 is determined, the processing of moving the positions of the five pixels to be determined by one pixel downward in the column direction and the left side determination processing are repeatedly performed until it is determined that the five pixels including the pixel PX1A, the two pixels on the left side of the pixel PX1A, and the two pixels on the right side of the pixel PX1A do not include a part of the left side EL1. If the selected five pixels correspond to the holding member 11b (refer to Figure 4), respectively, the processing of moving the positions of the five pixels to be determined by one pixel downward in the column direction is stopped, and the lower end of the left side EL1 is determined.

第13圖是用於說明基於與經過左邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定左邊EL1之工序之圖。於該例中,各自包括與微分值的最大值(最大值>第一特定值)對應之像素位置(微分最大位置PO1)之複數個像素PX1沿列方向排列。此時,例如,藉由於各微分最大位置PO1應用特定算法,而確定左邊EL1。作為特定算法的一例,可列舉隨機抽樣一致(Random Sample Consensus, RANSAC)。藉此,確定第一個電子零件S1的左邊。FIG. 13 is a diagram for explaining the process of determining the left side EL1 based on each pixel position corresponding to each maximum value (maximum value > first specific value) of the differential value obtained through the left side determination process. In this example, a plurality of pixels PX1 each including a pixel position (differential maximum position PO1) corresponding to the maximum value (maximum value > first specific value) of the differential value are arranged in the row direction. At this time, for example, by applying a specific algorithm to each differential maximum position PO1, the left side EL1 is determined. As an example of a specific algorithm, Random Sample Consensus (RANSAC) can be cited. In this way, the left side of the first electronic component S1 is determined.

第14圖是示出第一個電子零件S1中之左邊EL1的確定處理(第7圖的步驟S300)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 14 is a flow chart showing the process of determining the left side EL1 of the first electronic component S1 (step S300 in Fig. 7). The process shown in the flow chart is executed by the control unit 70 of the computer 50.

參考第14圖,控制部70確定作為左邊判定處理的對象的特定數量的像素的位置(步驟S400)。控制部70例如自拍攝圖像IM1的左上端的像素PX1向右側確定五個像素作為左邊判定處理的對象。14, the control unit 70 determines the positions of a specific number of pixels as targets for left edge determination processing (step S400). For example, the control unit 70 determines five pixels to the right from the upper left pixel PX1 of the captured image IM1 as targets for left edge determination processing.

控制部70基於確定出之五個像素的像素值生成近似曲線(步驟S410)。控制部70進行所生成之近似曲線的微分(步驟S420)。控制部70判定微分值的最大值是否大於第一特定值(步驟S430)。若判定出微分值的最大值為第一特定值以下(步驟S430中為「否」),則控制部70使作為左邊判定處理的對象之五個像素的位置向右斜下方移動(步驟S440),並再次執行步驟S410、S420、S430(左邊判定處理)。The control unit 70 generates an approximate curve based on the pixel values of the determined five pixels (step S410). The control unit 70 performs differentiation of the generated approximate curve (step S420). The control unit 70 determines whether the maximum value of the differential value is greater than the first specific value (step S430). If it is determined that the maximum value of the differential value is less than the first specific value ("No" in step S430), the control unit 70 moves the position of the five pixels that are the object of the left side judgment processing to the right and downward (step S440), and executes steps S410, S420, and S430 (left side judgment processing) again.

另一方面,若判定出微分值的最大值大於第一特定值(步驟S430中為「是」),則控制部70執行分別確定左邊EL1的上端及下端之處理(步驟S450)。稍後對分別確定左邊EL1的上端及下端之處理詳細地進行說明。On the other hand, if it is determined that the maximum value of the differential value is greater than the first specific value ("Yes" in step S430), the control unit 70 executes a process of separately determining the upper end and the lower end of the left side EL1 (step S450). The process of separately determining the upper end and the lower end of the left side EL1 will be described in detail later.

若分別確定左邊EL1的上端及下端,則控制部70判定上端與下端之間的長度與第一特定長度的差是否小於第二特定值(步驟S460)。第一特定長度例如為與電子零件S1的上端與下端之間的長度的規格值對應之長度。第二特定值例如亦可為與電子零件S1的上端與下端之間的長度的規格值的0.5%~5%對應之長度。If the upper end and the lower end of the left side EL1 are determined, the control unit 70 determines whether the difference between the length between the upper end and the lower end and the first specific length is less than the second specific value (step S460). The first specific length is, for example, a length corresponding to the specification value of the length between the upper end and the lower end of the electronic component S1. The second specific value may also be, for example, a length corresponding to 0.5% to 5% of the specification value of the length between the upper end and the lower end of the electronic component S1.

若判定出上端與下端之間的長度與第一特定長度的差為第二特定值以上(步驟S460中為「否」),則控制部70最後於步驟S430中,以判定出微分值的最大值大於第一特定值之五個像素為基準,執行步驟S440的處理。例如,當作為左邊判定處理的對象之特定數量的像素中包含球部BA1(參考第4圖)時,可能會發生這種情況。If it is determined that the difference between the length between the upper end and the lower end and the first specific length is greater than the second specific value ("No" in step S460), the control unit 70 finally performs the processing of step S440 in step S430 based on the five pixels whose maximum value of the differential value is greater than the first specific value. For example, this may occur when the ball part BA1 (refer to Figure 4) is included in the specific number of pixels as the object of the left side determination processing.

另一方面,若判定出上端與下端之間的長度與第一特定長度的差小於第二特定值(步驟S460中為「是」),則控制部70基於與經過左邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定左邊EL1(步驟S470)。On the other hand, if it is determined that the difference between the length between the upper end and the lower end and the first specific length is less than the second specific value ("Yes" in step S460), the control unit 70 determines the left edge EL1 based on the pixel positions corresponding to the maximum values (maximum value > first specific value) of the differential values obtained after the left edge judgment processing (step S470).

第15圖是示出左邊EL1的上端及下端各自的確定處理(第14圖的步驟S450)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 15 is a flowchart showing the process of determining the upper end and the lower end of the left side EL1 (step S450 in Fig. 14). The process shown in the flowchart is executed by the control unit 70 of the computer 50.

參考第15圖,控制部70以包括與於第14圖的步驟S420中算出之微分值的最大值(最大值>第一特定值)對應之像素PX1在內之特定數量的像素(五個像素)的位置為基準,使作為左邊判定處理的對象之特定數量的像素的位置向列方向上側移動一個像素(步驟S500)。Referring to Figure 15, the control unit 70 shifts the position of a specific number of pixels (five pixels) that are the objects of left-side judgment processing by one pixel to the side in the column direction based on the position of a specific number of pixels (five pixels) including the pixel PX1 corresponding to the maximum value of the differential value calculated in step S420 of Figure 14 (maximum value > first specific value) (step S500).

控制部70基於變更位置後之五個像素的像素值生成近似曲線(步驟S510)。控制部70進行所生成之近似曲線的微分(步驟S520)。控制部70判定微分值的最大值是否大於第一特定值(步驟S530)。若判定出微分值的最大值大於第一特定值(步驟S530中為「是」),則控制部70再次執行步驟S500的處理。另一方面,若判定出微分值的最大值為第一特定值以下(步驟S530中為「否」),則控制部70確定左邊EL1的上端(步驟S540)。The control unit 70 generates an approximate curve based on the pixel values of the five pixels after the position change (step S510). The control unit 70 performs differentiation of the generated approximate curve (step S520). The control unit 70 determines whether the maximum value of the differential value is greater than the first specific value (step S530). If it is determined that the maximum value of the differential value is greater than the first specific value ("Yes" in step S530), the control unit 70 executes the processing of step S500 again. On the other hand, if it is determined that the maximum value of the differential value is less than the first specific value ("No" in step S530), the control unit 70 determines the upper end of the left side EL1 (step S540).

控制部70以包括與於第14圖的步驟S420中算出之微分值的最大值(最大值>第一特定值)對應之像素PX1在內之特定數量的像素(五個像素)的位置為基準,使作為左邊判定處理的對象之特定數量的像素的位置向列方向下側移動一個像素(步驟S550)。The control unit 70 moves the position of a specific number of pixels (five pixels) that are the objects of left-side judgment processing by one pixel downward in the column direction based on the position of a specific number of pixels (five pixels) including the pixel PX1 corresponding to the maximum value of the differential value calculated in step S420 of Figure 14 (maximum value > first specific value) (step S550).

控制部70基於變更位置後之五個像素的像素值生成近似曲線(步驟S560)。控制部70進行所生成之近似曲線的微分(步驟S570)。控制部70判定微分值的最大值是否大於第一特定值(步驟S580)。若判定出微分值的最大值大於第一特定值(步驟S580中為「是」),則控制部70再次執行步驟S550的處理。另一方面,若判定出微分值的最大值為第一特定值以下(步驟S580中為「否」),則控制部70確定左邊EL1的下端(步驟S590)。藉此,確定左邊EL1的上端及下端。The control unit 70 generates an approximate curve based on the pixel values of the five pixels after the position change (step S560). The control unit 70 performs differentiation of the generated approximate curve (step S570). The control unit 70 determines whether the maximum value of the differential value is greater than the first specific value (step S580). If it is determined that the maximum value of the differential value is greater than the first specific value ("Yes" in step S580), the control unit 70 executes the processing of step S550 again. On the other hand, if it is determined that the maximum value of the differential value is less than the first specific value ("No" in step S580), the control unit 70 determines the lower end of the left side EL1 (step S590). Thereby, the upper end and the lower end of the left side EL1 are determined.

如此,於根據本實施方式之切斷裝置1中,反復移動特定數量的像素的位置來執行左邊判定處理,以設定複數個檢查區域T1的至少一部分。因此,根據切斷裝置1,例如,相較於基於整個拍攝圖像IM1中包含之各像素PX1的像素值來設定檢查區域T1之情形,能夠高效地自動設定檢查區域T1。Thus, in the cutting device 1 according to the present embodiment, the positions of a specific number of pixels are repeatedly moved to perform the left edge determination process to set at least a portion of the plurality of inspection areas T1. Therefore, according to the cutting device 1, for example, compared with setting the inspection area T1 based on the pixel value of each pixel PX1 included in the entire captured image IM1, the inspection area T1 can be automatically set efficiently.

又,根據切斷裝置1,因特定數量的像素的位置逐漸斜向移動,複數個電子零件S1的任一邊(例如,左邊EL1)的一部分與特定數量的像素於相對較早的階段相交,故能夠相對高效地確定複數個電子零件S1的任一邊的一部分。Furthermore, according to the cutting device 1, since the positions of a specific number of pixels gradually move diagonally, a portion of any side (for example, the left side EL1) of the plurality of electronic components S1 intersects with the specific number of pixels at a relatively early stage, so a portion of any side of the plurality of electronic components S1 can be determined relatively efficiently.

又,根據切斷裝置,因基於確定出之左邊EL1的一部分確定左邊EL1的其他部分,故能夠相對高效地確定整個左邊EL1。Furthermore, according to the cutting device, since the other parts of the left side EL1 are determined based on the determined part of the left side EL1, the entire left side EL1 can be determined relatively efficiently.

第16圖是用於對確定第一個電子零件S1的右邊ER1之工序進行說明之圖。參考第16圖,於確定左邊EL1後,基於左邊EL1確定第一個電子零件S1的右邊ER1。Fig. 16 is a diagram for explaining the process of determining the right side ER1 of the first electronic component S1. Referring to Fig. 16, after the left side EL1 is determined, the right side ER1 of the first electronic component S1 is determined based on the left side EL1.

以自左邊EL1中包含之各像素的位置向行方向右側移動複數個像素後之位置的各像素為基準,向行方向右側選擇特定數量的像素(五個像素),來生成五個像素的集合。對五個像素的集合中包含之各五個像素執行右邊判定處理。為了確定右邊ER1而最先選擇之各五個像素中位於最左側之各像素的位置為自左邊EL1的位置向行方向右側移動複數個像素後之位置。自左邊EL1的位置移動之複數個像素的數量例如基於電子零件S1的左右方向的長度的規格值而預先確定。A set of five pixels is generated by selecting a specific number of pixels (five pixels) to the right of the row direction based on the positions of the pixels included in the left side EL1 after being moved a plurality of pixels to the right in the row direction. The right side determination process is performed on each of the five pixels included in the set of five pixels. The position of each pixel located on the left side of each of the five pixels selected first to determine the right side ER1 is the position after being moved a plurality of pixels to the right of the row direction from the position of the left side EL1. The number of the plurality of pixels moved from the position of the left side EL1 is predetermined, for example, based on the specification value of the length of the electronic component S1 in the left-right direction.

右邊判定處理為如下處理:基於特定數量的像素各自的像素值,判定該特定數量的像素中是否包含右邊ER1的一部分。於右邊判定處理中,基於特定數量的像素各自的像素值,確定保持構件11b與電子零件S1的邊界。例如,確定自圖中右側向左側,像素值較小的像素(與保持構件11b對應之像素(暗像素))與像素值較大的像素(與電子零件S1對應之像素(亮像素))依次相鄰排列之部分。The right edge determination process is a process for determining whether a portion of the right edge ER1 is included in a specific number of pixels based on the pixel values of each of the specific number of pixels. In the right edge determination process, the boundary between the holding member 11b and the electronic component S1 is determined based on the pixel values of each of the specific number of pixels. For example, a portion is determined where pixels with smaller pixel values (pixels corresponding to the holding member 11b (dark pixels)) and pixels with larger pixel values (pixels corresponding to the electronic component S1 (bright pixels)) are arranged adjacent to each other in sequence from the right side to the left side in the figure.

於上述左邊判定處理中,對於作為左邊判定處理的對象之五個像素,基於各像素值自圖中左側向右側如何變化來判定特定數量的像素中是否包含左邊EL1的一部分。另一方面,於右邊判定處理中,對於作為右邊判定處理的對象之五個像素,基於各像素值自圖中右側向左側如何變化來判定特定數量的像素中是否包含右邊ER1的一部分。其原因在於,於包含左邊EL1之五個像素中,像素值自左側向右側變大(變亮),與此相對,於包含右邊ER1之五個像素中,像素值自右側向左側變大。於其他方面,左邊判定處理的內容與右邊判定處理的內容相同。In the above-mentioned left side determination processing, for the five pixels as the object of the left side determination processing, it is determined whether a part of the left side EL1 is included in a certain number of pixels based on how each pixel value changes from the left side to the right side in the figure. On the other hand, in the right side determination processing, for the five pixels as the object of the right side determination processing, it is determined whether a part of the right side ER1 is included in a certain number of pixels based on how each pixel value changes from the right side to the left side in the figure. The reason is that, in the five pixels including the left side EL1, the pixel value increases (becomes brighter) from the left side to the right side, while, in contrast, in the five pixels including the right side ER1, the pixel value increases from the right side to the left side. In other respects, the content of the left side determination processing is the same as that of the right side determination processing.

當經過右邊判定處理判定出特定數量的像素(所選擇之五個像素)的集合中存在不包含右邊ER1的一部分之特定數量的像素時,使特定數量的像素的集合的位置向行方向右側移動一個像素。並且,對變更後的特定數量的像素的集合執行右邊判定處理。藉由反復執行特定數量的像素的集合的位置變更與右邊判定處理,來確定右邊ER1的位置。When it is determined through the right edge determination process that there are a certain number of pixels that do not include a part of the right edge ER1 in the set of the certain number of pixels (the selected five pixels), the position of the set of the certain number of pixels is moved one pixel to the right in the row direction. And the right edge determination process is performed on the changed set of the certain number of pixels. By repeatedly performing the position change of the set of the certain number of pixels and the right edge determination process, the position of the right edge ER1 is determined.

第17圖是示出第一個電子零件S1中之右邊ER1的確定處理(第7圖的步驟S310)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 17 is a flow chart showing the process of determining the right side ER1 of the first electronic component S1 (step S310 of Fig. 7). The process shown in the flow chart is executed by the control unit 70 of the computer 50.

參考第17圖,控制部70確定作為右邊判定處理的對象之特定數量的像素的集合的位置(步驟S600)。控制部70例如以自左邊EL1中包含之各像素PX1的位置向行方向右側移動複數個像素後之位置的各像素PX1為基準,向行方向右側確定特定數量的像素(五個像素)作為右邊判定處理的對象的集合的位置。Referring to FIG. 17 , the control unit 70 determines the position of a set of a specific number of pixels as the target of the right edge determination process (step S600). For example, the control unit 70 determines the position of a specific number of pixels (five pixels) as the target of the right edge determination process to the right in the row direction, based on the position of each pixel PX1 included in the left edge EL1 after being shifted to the right in the row direction by a plurality of pixels.

控制部70基於確定出之各五個像素的像素值生成複數個近似曲線(步驟S610)。控制部70進行所生成之複數個近似曲線各自的微分(步驟S620)。控制部70判定微分值的各最大值是否大於第一特定值(步驟S630)。若判定出微分值的最大值的一部分為第一特定值以下(步驟S630中為「否」),則控制部70使作為右邊判定處理的對象之五個像素的集合的位置向右側移動一個像素(步驟S640)。The control unit 70 generates a plurality of approximate curves based on the pixel values of each of the five pixels determined (step S610). The control unit 70 performs differentiation on each of the generated plurality of approximate curves (step S620). The control unit 70 determines whether each maximum value of the differential value is greater than a first specific value (step S630). If it is determined that a part of the maximum values of the differential values is less than the first specific value ("No" in step S630), the control unit 70 moves the position of the set of five pixels as the object of the right side determination processing by one pixel to the right (step S640).

控制部70基於作為變更後的右邊判定處理的對象之五個像素的集合的位置,判定是否產生錯誤(步驟S650)。例如,當作為變更後的右邊判定處理的對象之五個像素的集合的左端的各像素的位置與左邊EL1的位置之間的長度長於電子零件S1在左右方向的長度的規格值,且它們的差為預先設定之長度以上時,判定產生錯誤。The control unit 70 determines whether an error has occurred based on the position of the set of five pixels that are the object of the changed right edge determination process (step S650). For example, when the length between the position of each pixel at the left end of the set of five pixels that are the object of the changed right edge determination process and the position of the left edge EL1 is longer than the specification value of the length of the electronic component S1 in the left-right direction, and the difference between them is greater than a preset length, it is determined that an error has occurred.

若判定出產生錯誤(步驟S650中為「是」),則控制部70最後以於第14圖的步驟S430中判定出微分值的最大值大於第一特定值之五個像素為基準,再次執行步驟S440的處理。另一方面,若判定出未產生錯誤(步驟S650中為「否」),則控制部70再次執行步驟S610、S620、S630(右邊判定處理)。If it is determined that an error has occurred ("Yes" in step S650), the control unit 70 finally executes the process of step S440 again based on the five pixels whose maximum value of the differential value is greater than the first specific value in step S430 of FIG. 14. On the other hand, if it is determined that no error has occurred ("No" in step S650), the control unit 70 executes steps S610, S620, and S630 (right judgment process) again.

另一方面,若判定出微分值的各最大值大於第一特定值(步驟S630中為「是」),則控制部70基於與經過右邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定右邊ER1(步驟S650)。On the other hand, if it is determined that the maximum values of the differential values are greater than the first specific value ("Yes" in step S630), the control unit 70 determines the right edge ER1 based on the pixel positions corresponding to the maximum values of the differential values obtained after the right edge determination processing (maximum value > first specific value) (step S650).

第18圖是用於對分別確定第一個電子零件S1的上邊ET1及下邊EB1之工序進行說明之圖。參考第18圖,於確定左邊EL1及右邊ER1後,基於左邊EL1及右邊ER1,分別確定第一個電子零件S1的上邊ET1及下邊EB1。Fig. 18 is a diagram for explaining the process of respectively determining the upper side ET1 and the lower side EB1 of the first electronic component S1. Referring to Fig. 18, after the left side EL1 and the right side ER1 are determined, the upper side ET1 and the lower side EB1 of the first electronic component S1 are respectively determined based on the left side EL1 and the right side ER1.

具體而言,選擇與連結左邊EL1及右邊ER1各自的上端的像素而成之直線正交、且沿列方向排列之特定數量的像素(五個像素)的集合中位於左端之特定數量的像素,並對所選擇之五個像素執行上邊判定處理。上邊判定處理為如下處理:基於特定數量的像素各自的像素值,判定該特定數量的像素中是否包含上邊ET1的一部分。於上邊判定處理中,基於特定數量的像素各自的像素值,確定保持構件11b與電子零件S1的邊界。例如,確定自圖中上側向下側,像素值較小的像素(與保持構件11b對應之像素(暗像素))與像素值較大的像素(與電子零件S1對應之像素(亮像素))依次相鄰排列之部分。Specifically, a specific number of pixels located at the left end of a set of a specific number of pixels (five pixels) arranged in the column direction and orthogonal to the straight line connecting the pixels at the upper ends of the left edge EL1 and the right edge ER1 are selected, and the upper edge determination processing is performed on the selected five pixels. The upper edge determination processing is the following processing: based on the pixel value of each of the specific number of pixels, it is determined whether the specific number of pixels contains a part of the upper edge ET1. In the upper edge determination processing, based on the pixel value of each of the specific number of pixels, the boundary between the retaining member 11b and the electronic component S1 is determined. For example, from the upper side to the lower side in the figure, the part where the pixels with smaller pixel values (pixels corresponding to the retaining member 11b (dark pixels)) and the pixels with larger pixel values (pixels corresponding to the electronic component S1 (bright pixels)) are arranged adjacent to each other in sequence is determined.

於上述左邊判定處理中,對於作為左邊判定處理的對象之五個像素,基於各像素值自圖中左側向右側如何變化來判定特定數量的像素中是否包含左邊EL1的一部分。另一方面,於上邊判定處理中,對於作為上邊判定處理的對象之五個像素,基於各像素值自圖中上側向下側如何變化來判定特定數量的像素中是否包含上邊ET1的一部分。其原因在於,於包含左邊EL1之五個像素中,像素值自左側向右側變大(變亮),與此相對,於包含上邊ET1之五個像素中,像素值自上側向下側變大。於其他方面,左邊判定處理的內容與上邊判定處理的內容相同。In the above-mentioned left edge determination processing, for the five pixels that are the object of the left edge determination processing, it is determined whether a part of the left edge EL1 is included in a specific number of pixels based on how each pixel value changes from the left side to the right side in the figure. On the other hand, in the top edge determination processing, for the five pixels that are the object of the top edge determination processing, it is determined whether a part of the top edge ET1 is included in a specific number of pixels based on how each pixel value changes from the top side to the bottom side in the figure. The reason is that, among the five pixels that include the left edge EL1, the pixel value increases (becomes brighter) from the left side to the right side, while, in contrast, among the five pixels that include the top edge ET1, the pixel value increases from the top side to the bottom side. In other respects, the content of the left edge determination processing is the same as that of the top edge determination processing.

反復執行待判定之特定數量的像素的位置向行方向右側的變更與上邊判定處理,直至經過上邊判定處理判定出特定數量的像素中不包含上邊ET1的一部分為止。若經過上邊判定處理判定出特定數量的像素中不包含上邊ET1的一部分,則分別確定上邊ET1的左端及右端,從而確定上邊ET1。The position change of the specific number of pixels to be determined toward the right in the row direction and the upper edge determination process are repeatedly performed until it is determined through the upper edge determination process that the specific number of pixels does not include a portion of the upper edge ET1. If it is determined through the upper edge determination process that the specific number of pixels does not include a portion of the upper edge ET1, the left end and the right end of the upper edge ET1 are determined respectively, thereby determining the upper edge ET1.

又,選擇與連結左邊EL1及右邊ER1各自的下端的像素而成之直線正交、且沿列方向排列之特定數量的像素(五個像素)的集合中位於左端之特定數量的像素,並對所選擇之五個像素執行下邊判定處理。下邊判定處理為如下處理:基於特定數量的像素各自的像素值,判定該特定數量的像素中是否包含下邊EB1的一部分。於下邊判定處理中,基於特定數量的像素各自的像素值,確定保持構件11b與電子零件S1的邊界。例如,確定自圖中下側向上側,像素值較小的像素(與保持構件11b對應之像素(暗像素))與像素值較大的像素(與電子零件S1對應之像素(亮像素))依次相鄰排列之部分。In addition, a specific number of pixels located at the left end of a set of a specific number of pixels (five pixels) arranged in the column direction and orthogonal to the straight line connecting the pixels at the lower ends of the left side EL1 and the right side ER1 are selected, and the bottom judgment processing is performed on the selected five pixels. The bottom judgment processing is as follows: based on the pixel value of each of the specific number of pixels, it is determined whether the specific number of pixels includes a part of the bottom EB1. In the bottom judgment processing, based on the pixel value of each of the specific number of pixels, the boundary between the holding member 11b and the electronic component S1 is determined. For example, from the bottom to the top in the figure, the part where pixels with smaller pixel values (pixels corresponding to the holding member 11b (dark pixels)) and pixels with larger pixel values (pixels corresponding to the electronic component S1 (bright pixels)) are arranged adjacent to each other in sequence is determined.

於上述左邊判定處理中,對於作為左邊判定處理的對象之五個像素,基於各像素值自圖中左側向右側如何變化來判定特定數量的像素中是否包含左邊EL1的一部分。另一方面,於下邊判定處理中,對於作為下邊判定處理的對象之五個像素,基於各像素值自圖中下側向上側如何變化來判定特定數量的像素中是否包含下邊EB1的一部分。其原因在於,於包含左邊EL1之五個像素中,像素值自左側向右側變大(變亮),與此相對,於包含下邊EB1之五個像素中,像素值自下側向上側變大。於其他方面,左邊判定處理的內容與下邊判定處理的內容相同。In the above-mentioned left edge determination processing, for the five pixels that are the object of the left edge determination processing, it is determined whether a part of the left edge EL1 is included in a specific number of pixels based on how each pixel value changes from the left side to the right side in the figure. On the other hand, in the bottom edge determination processing, for the five pixels that are the object of the bottom edge determination processing, it is determined whether a part of the bottom edge EB1 is included in a specific number of pixels based on how each pixel value changes from the bottom side to the top side in the figure. The reason is that, among the five pixels that include the left edge EL1, the pixel value increases (becomes brighter) from the left side to the right side, while, in contrast, among the five pixels that include the bottom edge EB1, the pixel value increases from the bottom side to the top side. In other respects, the content of the left edge determination processing is the same as that of the bottom edge determination processing.

反復執行待判定之特定數量的像素的位置向行方向右側的變更與下邊判定處理,直至經過下邊判定處理判定出特定數量的像素中不包含下邊EB1的一部分為止。若經過下邊判定處理判定出特定數量的像素中不包含下邊EB1的一部分,則分別確定下邊EB1的左端及右端,從而確定下邊EB1。The position change of the specific number of pixels to be determined toward the right side in the row direction and the bottom edge determination process are repeatedly performed until it is determined through the bottom edge determination process that the specific number of pixels does not include a part of the bottom edge EB1. If it is determined through the bottom edge determination process that the specific number of pixels does not include a part of the bottom edge EB1, the left end and the right end of the bottom edge EB1 are determined respectively, thereby determining the bottom edge EB1.

第19圖是示出第一個電子零件S1中之上邊ET1的確定處理(第7圖的步驟S320)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 19 is a flow chart showing the process of determining the upper edge ET1 in the first electronic component S1 (step S320 in Fig. 7). The process shown in the flow chart is executed by the control unit 70 of the computer 50.

參考第19圖,控制部70確定作為上邊判定處理的對象之特定數量的像素的位置(步驟S700)。控制部70例如確定與連結左邊EL1及右邊ER1各自的上端的像素而成之直線正交、且沿列方向排列之特定數量的像素(五個像素)的集合中位於左端之特定數量的像素作為上邊判定處理的對象。Referring to FIG. 19 , the control unit 70 determines the positions of a specific number of pixels as the target of the upper edge determination process (step S700). For example, the control unit 70 determines a specific number of pixels located at the left end of a set of a specific number of pixels (five pixels) arranged in the column direction and perpendicular to a straight line connecting pixels at the upper ends of the left edge EL1 and the right edge ER1 as the target of the upper edge determination process.

控制部70基於確定出之五個像素的像素值生成近似曲線(步驟S710)。控制部70進行所生成之近似曲線的微分(步驟S720)。控制部70判定微分值的最大值是否大於第一特定值(步驟S730)。若判定出微分值的最大值大於第一特定值(步驟S730中為「是」),則控制部70使作為上邊判定處理的對象之五個像素的位置向行方向右側移動一個像素(步驟S740),再次執行步驟S710、S720、S730(上邊判定處理)。The control unit 70 generates an approximate curve based on the pixel values of the determined five pixels (step S710). The control unit 70 performs differentiation of the generated approximate curve (step S720). The control unit 70 determines whether the maximum value of the differential value is greater than the first specific value (step S730). If it is determined that the maximum value of the differential value is greater than the first specific value ("Yes" in step S730), the control unit 70 moves the positions of the five pixels that are the objects of the upper judgment processing by one pixel to the right in the row direction (step S740), and executes steps S710, S720, and S730 (upper judgment processing) again.

另一方面,若判定出微分值的最大值為第一特定值以下(步驟S730中為「否」),則控制部70判定左邊EL1的上端的位置與判定出微分值的最大值為第一特定值以下之特定數量的像素的位置之間的長度(左右長度)與第二特定長度的差是否小於第三特定值(步驟S750)。第二特定長度例如為與電子零件S1的左右方向的長度的規格值對應之長度。第三特定值例如亦可為與電子零件S1的左右方向的長度的規格值的0.5%~5%對應之長度。On the other hand, if it is determined that the maximum value of the differential value is less than the first specific value ("No" in step S730), the control unit 70 determines whether the difference between the length (left-right length) between the position of the upper end of the left side EL1 and the position of the specific number of pixels where the maximum value of the differential value is determined to be less than the first specific value and the second specific length is less than a third specific value (step S750). The second specific length is, for example, a length corresponding to the specification value of the length of the electronic component S1 in the left-right direction. The third specific value may also be, for example, a length corresponding to 0.5% to 5% of the specification value of the length of the electronic component S1 in the left-right direction.

若判定出左右長度與第二特定長度的差為第三特定值以上(步驟S750中為「否」),則控制部70最後以於第14圖的步驟S430中判定出微分值的最大值大於第一特定值之五個像素為基準,再次執行步驟S440的處理。If it is determined that the difference between the left and right lengths and the second specific length is greater than the third specific value ("No" in step S750), the control unit 70 finally executes the processing of step S440 again based on the five pixels in step S430 of Figure 14 where the maximum value of the differential value is greater than the first specific value.

另一方面,若判定出左右長度與第二特定長度的差小於第三特定值(步驟S750中為「是」),則控制部70基於與經過上邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定上邊ET1(步驟S760)。On the other hand, if it is determined that the difference between the left and right lengths and the second specific length is less than the third specific value ("Yes" in step S750), the control unit 70 determines the upper edge ET1 based on the pixel positions corresponding to the maximum values (maximum value > first specific value) of the differential values obtained through the upper edge determination processing (step S760).

第20圖是示出第一個電子零件S1中之下邊EB1的確定處理(第7圖的步驟S330)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。Fig. 20 is a flow chart showing the process of determining the lower edge EB1 in the first electronic component S1 (step S330 in Fig. 7). The process shown in the flow chart is executed by the control unit 70 of the computer 50.

參考第20圖,控制部70確定作為下邊判定處理的對象之特定數量的像素的位置(步驟S800)。控制部70例如確定與連結左邊EL1及右邊ER1各自的下端的像素而成之直線正交、且沿列方向排列之特定數量的像素(五個像素)的集合中位於左端之特定數量的像素作為下邊判定處理的對象。Referring to FIG. 20, the control unit 70 determines the positions of a specific number of pixels as the target of the bottom edge determination process (step S800). For example, the control unit 70 determines a specific number of pixels located at the left end of a set of a specific number of pixels (five pixels) arranged in the column direction and perpendicular to a straight line connecting pixels at the bottom ends of the left side EL1 and the right side ER1 as the target of the bottom edge determination process.

控制部70基於確定出之五個像素的像素值生成近似曲線(步驟S810)。控制部70進行所生成之近似曲線的微分(步驟S820)。控制部70判定微分值的最大值是否大於第一特定值(步驟S830)。若判定出微分值的最大值大於第一特定值(步驟S830中為「是」),則控制部70使作為下邊判定處理的對象之五個像素的位置向行方向右側移動一個像素(步驟S840),再次執行步驟S810、S820、S830(下邊判定處理)。The control unit 70 generates an approximate curve based on the pixel values of the determined five pixels (step S810). The control unit 70 performs differentiation of the generated approximate curve (step S820). The control unit 70 determines whether the maximum value of the differential value is greater than the first specific value (step S830). If it is determined that the maximum value of the differential value is greater than the first specific value ("Yes" in step S830), the control unit 70 moves the positions of the five pixels that are the objects of the following determination processing by one pixel to the right in the row direction (step S840), and executes steps S810, S820, and S830 again (the following determination processing).

另一方面,若判定出微分值的最大值為第一特定值以下(步驟S830中為「否」),則控制部70判定左邊EL1的下端的位置與判定出微分值的最大值為第一特定值以下之特定數量的像素的位置之間的長度(左右長度)與第二特定長度的差是否小於第三特定值(步驟S850)。On the other hand, if the maximum value of the differential value is determined to be less than the first specific value ("No" in step S830), the control unit 70 determines whether the difference between the length (left-right length) between the position of the lower end of the left side EL1 and the position of a specific number of pixels where the maximum value of the differential value is determined to be less than the first specific value and the second specific length is less than a third specific value (step S850).

若判定出左右長度與第二特定長度的差為第三特定值以上(步驟S850中為「否」),則控制部70最後以於第14圖的步驟S430中判定出微分值的最大值大於第一特定值之五個像素為基準,再次執行步驟S440的處理。If it is determined that the difference between the left and right lengths and the second specific length is greater than the third specific value ("No" in step S850), the control unit 70 finally executes the processing of step S440 again based on the five pixels in step S430 of Figure 14 where the maximum value of the differential value is greater than the first specific value.

另一方面,若判定出左右長度與第二特定長度的差小於第三特定值(步驟S850中為「是」),則控制部70基於與經過下邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定下邊EB1(步驟S860)。並且,基於確定出之左邊EL1、右邊ER1、上邊ET1及下邊EB1來設定檢查區域T1。On the other hand, if it is determined that the difference between the left and right lengths and the second specific length is less than the third specific value ("Yes" in step S850), the control unit 70 determines the lower edge EB1 based on the pixel positions corresponding to the maximum values (maximum value>first specific value) of the differential values obtained through the lower edge determination process (step S860). Furthermore, the inspection area T1 is set based on the determined left edge EL1, right edge ER1, upper edge ET1, and lower edge EB1.

如此,根據本實施方式之切斷裝置1,因基於確定出之左邊EL1來確定包含左邊EL1之電子零件S1的另外三邊,故能夠相對高效地設定檢查區域T1。In this way, according to the cutting device 1 of this embodiment, the inspection area T1 can be set relatively efficiently because the other three sides of the electronic component S1 including the left side EL1 are determined based on the determined left side EL1.

又,根據切斷裝置1,於探索與左邊EL1相對之右邊ER1時,已確定左邊EL1,且已掌握右邊ER1的兩端(上端及下端)的大致位置,故能夠相對高效地確定右邊ER1。又,根據切斷裝置1,於探索除左邊EL1及右邊ER1以外之兩邊(上邊ET1及下邊EB1)時,已確定左邊EL1及右邊ER1,且已把握除左邊EL1及右邊ER1以外之兩邊各自的兩端的大致位置,故能夠相對高效地確定除左邊EL1及右邊ER1以外之兩邊。Furthermore, according to the cutting device 1, when searching for the right side ER1 opposite to the left side EL1, the left side EL1 has been determined, and the approximate positions of the two ends (upper end and lower end) of the right side ER1 have been grasped, so the right side ER1 can be determined relatively efficiently. Furthermore, according to the cutting device 1, when searching for two sides (upper end ET1 and lower end EB1) other than the left side EL1 and the right side ER1, the left side EL1 and the right side ER1 have been determined, and the approximate positions of the two ends of the two sides other than the left side EL1 and the right side ER1 have been grasped, so the two sides other than the left side EL1 and the right side ER1 can be determined relatively efficiently.

第21圖是用於說明於相對於第一個檢查區域T1沿行方向或列方向移動後之位置設定其他檢查區域T1之工序之圖。參考第21圖,例如,基於檢查區域T1A,分別設定相對於檢查區域T1A沿行方向移動後之位置的檢查區域T1B及相對於檢查區域T1A沿列方向移動後之位置的檢查區域T1C。FIG. 21 is a diagram for explaining the process of setting other inspection regions T1 at positions relative to the first inspection region T1 after moving along the row direction or column direction. Referring to FIG. 21, for example, based on the inspection region T1A, the inspection region T1B at the position relative to the inspection region T1A after moving along the row direction and the inspection region T1C at the position relative to the inspection region T1A after moving along the column direction are set.

為了設定相對於檢查區域T1A沿行方向移動後之位置的檢查區域T1,例如,選擇與檢查區域T1A形狀相同的臨時檢查區域T1B1。臨時檢查區域T1B1的形狀與檢查區域T1A的形狀相同。即,臨時檢查區域T1B1的左邊、右邊、上邊及下邊各自的長度分別與檢查區域T1A的左邊、右邊、上邊及下邊各自的長度相同。In order to set the inspection area T1 relative to the inspection area T1A after the inspection area T1A is moved in the row direction, for example, a temporary inspection area T1B1 having the same shape as the inspection area T1A is selected. The shape of the temporary inspection area T1B1 is the same as that of the inspection area T1A. That is, the lengths of the left side, right side, top side and bottom side of the temporary inspection area T1B1 are respectively the same as the lengths of the left side, right side, top side and bottom side of the inspection area T1A.

臨時檢查區域T1B1的位置為相對於檢查區域T1A的位置沿行方向移動複數個像素後之位置。自檢查區域T1A的位置移動之複數個像素的數量例如是基於電子零件S1的左右方向的長度的規格值預先設定。The position of the temporary inspection area T1B1 is a position shifted by a plurality of pixels in the row direction relative to the position of the inspection area T1A. The number of pixels shifted from the position of the inspection area T1A is preset based on the specification value of the length of the electronic component S1 in the left-right direction, for example.

若選擇臨時檢查區域T1(例如,臨時檢查區域T1B1),則執行判定處理(以下亦稱為「各邊判定處理」),判定臨時檢查區域T1(例如,臨時檢查區域T1B1)的左邊、右邊、上邊及下邊是否分別與電子零件S1(例如,電子零件S1B)的左邊、右邊、上邊及下邊對應。於各邊判定處理中,沿臨時檢查區域T1的左邊反復執行左邊判定處理,且沿臨時檢查區域T1的右邊反復執行右邊判定處理。又,沿臨時檢查區域T1的上邊反復執行上邊判定處理,且沿臨時檢查區域T1的下邊反復執行下邊判定處理。藉此,判定臨時檢查區域T1的各邊是否與電子零件S1的邊對應。If the temporary inspection area T1 (e.g., temporary inspection area T1B1) is selected, a determination process (hereinafter also referred to as "each side determination process") is performed to determine whether the left side, right side, top side, and bottom side of the temporary inspection area T1 (e.g., temporary inspection area T1B1) correspond to the left side, right side, top side, and bottom side of the electronic component S1 (e.g., electronic component S1B), respectively. In the each side determination process, the left side determination process is repeatedly performed along the left side of the temporary inspection area T1, and the right side determination process is repeatedly performed along the right side of the temporary inspection area T1. In addition, the top side determination process is repeatedly performed along the top side of the temporary inspection area T1, and the bottom side determination process is repeatedly performed along the bottom side of the temporary inspection area T1. In this way, it is determined whether the sides of the temporary inspection area T1 correspond to the sides of the electronic component S1.

若判定出臨時檢查區域T1的任一邊與電子零件S1的邊不對應,則於沿行方向移動一個像素後之位置處選擇新的臨時檢查區域T1(例如,臨時檢查區域T1B2)。並且,對新選擇之臨時檢查區域T1執行各邊判定處理。反復進行使臨時檢查區域T1的位置沿行方向移動之處理與各邊判定處理,直至判定出臨時檢查區域T1的各邊與電子零件S1的邊對應為止。藉此,設定相對於第一個檢查區域T1沿行方向移動後之位置的另一檢查區域T1。藉由反復進行相同工序,來設定與相對於第一個設定之檢查區域T1沿行方向移動後之位置處所存在之各電子零件S1對應之檢查區域T1。If it is determined that any side of the temporary inspection area T1 does not correspond to the side of the electronic component S1, a new temporary inspection area T1 (for example, temporary inspection area T1B2) is selected at the position after moving one pixel along the row direction. And, the side determination process is performed on the newly selected temporary inspection area T1. The process of moving the position of the temporary inspection area T1 along the row direction and the side determination process are repeated until it is determined that the sides of the temporary inspection area T1 correspond to the sides of the electronic component S1. In this way, another inspection area T1 is set relative to the position of the first inspection area T1 after moving along the row direction. By repeatedly performing the same process, an inspection area T1 is set corresponding to each electronic component S1 existing at a position after moving along the row direction relative to the first set inspection area T1.

為了設定相對於檢查區域T1A沿列方向移動後之位置的檢查區域T1,例如,選擇與檢查區域T1A形狀相同的臨時檢查區域T1C1。臨時檢查區域T1C1的形狀與檢查區域T1A的形狀相同。即,臨時檢查區域T1C1的左邊、右邊、上邊及下邊各自的長度分別與檢查區域T1A的左邊、右邊、上邊及下邊各自的長度相同。In order to set the inspection region T1 relative to the inspection region T1A after being moved in the row direction, for example, a temporary inspection region T1C1 having the same shape as the inspection region T1A is selected. The shape of the temporary inspection region T1C1 is the same as that of the inspection region T1A. That is, the lengths of the left side, right side, top side, and bottom side of the temporary inspection region T1C1 are respectively the same as the lengths of the left side, right side, top side, and bottom side of the inspection region T1A.

臨時檢查區域T1C1的位置為相對於檢查區域T1A的位置沿列方向移動複數個像素後之位置。自檢查區域T1A的位置移動之複數個像素的數量例如基於電子零件S1的上下方向的長度的規格值預先設定。The position of the temporary inspection area T1C1 is a position shifted by a plurality of pixels in the row direction relative to the position of the inspection area T1A. The number of pixels shifted from the position of the inspection area T1A is preset based on the specification value of the length of the electronic component S1 in the vertical direction, for example.

若選擇臨時檢查區域T1(例如,臨時檢查區域T1C1),則執行各邊判定處理。若判定出臨時檢查區域T1的任一邊與電子零件S1的邊不對應,則於沿列方向移動一個像素後之位置選擇新的臨時檢查區域T1(例如,臨時檢查區域T1C2)。並且,對新選擇之臨時檢查區域T1執行各邊判定處理。反復進行使臨時檢查區域T1的位置沿列方向移動之處理與各邊判定處理,直至判定出臨時檢查區域T1的各邊與電子零件S1的邊對應為止。藉此,設定相對於第一個檢查區域T1沿列方向移動後之位置的另一檢查區域T1。藉由反復進行相同工序,來設定與相對於第一個設定之檢查區域T1沿列方向移動後之位置處所存在之各電子零件S1對應之檢查區域T1。If a temporary inspection area T1 (for example, temporary inspection area T1C1) is selected, the edge determination process is performed. If it is determined that any edge of the temporary inspection area T1 does not correspond to the edge of the electronic component S1, a new temporary inspection area T1 (for example, temporary inspection area T1C2) is selected at the position after moving one pixel along the column direction. And, the edge determination process is performed on the newly selected temporary inspection area T1. The process of moving the position of the temporary inspection area T1 along the column direction and the edge determination process are repeated until it is determined that the edges of the temporary inspection area T1 correspond to the edges of the electronic component S1. In this way, another inspection area T1 is set relative to the position of the first inspection area T1 after moving along the column direction. By repeatedly performing the same process, the inspection area T1 corresponding to each electronic component S1 existing at the position after being moved along the row direction relative to the first set inspection area T1 is set.

第22圖是示出相對於第一個檢查區域T1沿行方向移動後之位置處之另一檢查區域T1的設定處理(第6圖的步驟S210)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。FIG. 22 is a flowchart showing the process of setting another inspection area T1 at a position after the first inspection area T1 is moved in the row direction (step S210 in FIG. 6 ). The process shown in the flowchart is executed by the control unit 70 of the computer 50 .

參考第22圖,控制部70基於已設定之檢查區域T1,於自已設定之檢查區域T1沿行方向移動複數個像素後之位置處選擇臨時檢查區域T1(步驟S900)。控制部70對所選擇之臨時檢查區域T1執行各邊判定處理(步驟S910)。控制部70判定臨時檢查區域T1的各邊是否與電子零件S1的邊對應(步驟S920)。Referring to FIG. 22, the control unit 70 selects a temporary inspection area T1 at a position after the set inspection area T1 is moved by a plurality of pixels along the row direction (step S900). The control unit 70 performs each edge determination processing on the selected temporary inspection area T1 (step S910). The control unit 70 determines whether each edge of the temporary inspection area T1 corresponds to the edge of the electronic component S1 (step S920).

若判定出臨時檢查區域T1的任一邊與電子零件S1的邊不對應(步驟S920中為「否」),則控制部70藉由使臨時檢查區域T1的位置沿行方向移動一個像素來變更臨時檢查區域T1的位置(步驟S930)。之後,控制部70再次執行步驟S910、S920的處理。If it is determined that any side of the temporary inspection area T1 does not correspond to the side of the electronic component S1 ("No" in step S920), the control unit 70 changes the position of the temporary inspection area T1 by moving the position of the temporary inspection area T1 by one pixel in the row direction (step S930). Afterwards, the control unit 70 executes the processing of steps S910 and S920 again.

另一方面,若判定出臨時檢查區域T1的各邊與電子零件S1的邊對應(步驟S920中為「是」),則控制部70設定當前選擇之臨時檢查區域T1作為檢查區域T1(步驟S940)。之後,控制部70判定是否已設定與存在於行方向上之所有電子零件S1對應之檢查區域T1(步驟S950)。若判定出與存在於行方向上之所有電子零件S1對應之檢查區域T1的設定未完成(步驟S950中為「否」),則控制部70再次執行步驟S900的處理。另一方面,若判定出已設定與存在於行方向上之所有電子零件S1對應之檢查區域T1(步驟S950中為「是」),則該流程圖所示之處理結束。On the other hand, if it is determined that the sides of the temporary inspection area T1 correspond to the sides of the electronic component S1 ("Yes" in step S920), the control unit 70 sets the currently selected temporary inspection area T1 as the inspection area T1 (step S940). Thereafter, the control unit 70 determines whether the inspection area T1 corresponding to all the electronic components S1 existing in the row direction has been set (step S950). If it is determined that the setting of the inspection area T1 corresponding to all the electronic components S1 existing in the row direction is not completed ("No" in step S950), the control unit 70 executes the processing of step S900 again. On the other hand, if it is determined that the inspection area T1 corresponding to all the electronic components S1 existing in the row direction has been set (“Yes” in step S950 ), the processing shown in the flowchart ends.

第23圖是示出相對於第一個檢查區域T1沿列方向移動後之位置處之另一檢查區域T1的設定處理(第6圖的步驟S220)的工序之流程圖。該流程圖所示之處理是由電腦50的控制部70執行。FIG. 23 is a flowchart showing the process of setting another inspection area T1 at a position after the first inspection area T1 is moved in the row direction (step S220 in FIG. 6 ). The process shown in the flowchart is executed by the control unit 70 of the computer 50 .

參考第23圖,控制部70基於已設定之檢查區域T1,於自已設定之檢查區域T1沿列方向移動複數個像素後之位置選擇臨時檢查區域T1(步驟S1000)。控制部70對所選擇之臨時檢查區域T1執行各邊判定處理(步驟S1010)。控制部70判定臨時檢查區域T1的各邊是否與電子零件S1的邊對應(步驟S1020)。Referring to FIG. 23 , the control unit 70 selects a temporary inspection area T1 based on the set inspection area T1 at a position after the set inspection area T1 is moved by a plurality of pixels along the column direction (step S1000). The control unit 70 performs each edge determination processing on the selected temporary inspection area T1 (step S1010). The control unit 70 determines whether each edge of the temporary inspection area T1 corresponds to the edge of the electronic component S1 (step S1020).

若判定出臨時檢查區域T1的任一邊與電子零件S1的邊不對應(步驟S1020中為「否」),則控制部70藉由使臨時檢查區域T1的位置沿列方向移動一個像素來變更臨時檢查區域T1的位置(步驟S1030)。之後,控制部70再次執行步驟S1010、S1020的處理。If it is determined that any side of the temporary inspection area T1 does not correspond to the side of the electronic component S1 ("No" in step S1020), the control unit 70 changes the position of the temporary inspection area T1 by moving the position of the temporary inspection area T1 by one pixel in the column direction (step S1030). Afterwards, the control unit 70 executes the processing of steps S1010 and S1020 again.

另一方面,若判定出臨時檢查區域T1的各邊與電子零件S1的邊對應(步驟S1020中為「是」),則控制部70設定當前選擇之臨時檢查區域T1作為檢查區域T1(步驟S1040)。之後,控制部70判定是否已設定與存在於列方向上之所有電子零件S1對應之檢查區域T1(步驟S1050)。若判定出與存在於列方向上之所有電子零件S1對應之檢查區域T1的設定未完成(步驟S1050中為「否」),則控制部70再次執行步驟S1000的處理。另一方面,若判定出已設定與存在於列方向上之所有電子零件S1對應之檢查區域T1(步驟S1050中為「是」),則該流程圖所示之處理結束。On the other hand, if it is determined that the sides of the temporary inspection area T1 correspond to the sides of the electronic component S1 ("Yes" in step S1020), the control unit 70 sets the currently selected temporary inspection area T1 as the inspection area T1 (step S1040). Thereafter, the control unit 70 determines whether the inspection area T1 corresponding to all the electronic components S1 existing in the column direction has been set (step S1050). If it is determined that the setting of the inspection area T1 corresponding to all the electronic components S1 existing in the column direction is not completed ("No" in step S1050), the control unit 70 executes the processing of step S1000 again. On the other hand, if it is determined that the inspection area T1 corresponding to all the electronic components S1 existing in the row direction has been set (“Yes” in step S1050 ), the processing shown in the flowchart ends.

如此,根據本實施方式之切斷裝置1,因基於最先確定之檢查區域T1來確定其他檢查區域T1,故能夠相對高效地確定複數個檢查區域T1。In this way, according to the cutting device 1 of this embodiment, since other inspection areas T1 are determined based on the inspection area T1 that is determined first, a plurality of inspection areas T1 can be determined relatively efficiently.

[4.特徵] 如上所述,於根據本實施方式之切斷裝置1中,反復移動特定數量的像素PX1的位置來執行判定處理(例如,左邊判定處理),以設定複數個檢查區域T1的至少一部分。因此,根據切斷裝置1,例如相較於基於整個拍攝圖像IM1中包含之各像素PX1的像素值來設定檢查區域T1之情形,能夠高效地自動設定檢查區域T1。 [4. Features] As described above, in the cutting device 1 according to the present embodiment, the positions of a specific number of pixels PX1 are repeatedly moved to perform a determination process (e.g., a left determination process) to set at least a portion of a plurality of inspection areas T1. Therefore, according to the cutting device 1, for example, compared with setting the inspection area T1 based on the pixel value of each pixel PX1 included in the entire captured image IM1, the inspection area T1 can be efficiently and automatically set.

再者,切斷裝置1為本發明中之「切斷裝置」的一例。電子零件S1為本發明中之「切斷品」的一例。第一光學檢查相機12及第二光學檢查相機13為本發明中之「拍攝部」的一例。控制部70為本發明中之「第一處理部」的一例、「第二處理部」的一例。拍攝圖像IM1為本發明中之「拍攝圖像」的一例。Furthermore, the cutting device 1 is an example of the "cutting device" in the present invention. The electronic component S1 is an example of the "cut product" in the present invention. The first optical inspection camera 12 and the second optical inspection camera 13 are examples of the "photographing unit" in the present invention. The control unit 70 is an example of the "first processing unit" and an example of the "second processing unit" in the present invention. The photographed image IM1 is an example of the "photographed image" in the present invention.

[5.其他實施方式] 上述實施方式的思想並不限於以上所說明之實施方式。例如,亦可組合任一實施方式的至少一部分構成與其他任一實施方式的至少一部分構成。以下,對可應用上述實施方式的思想之其他實施方式的一例進行說明。 [5. Other implementations] The concept of the above implementation is not limited to the implementation described above. For example, at least a part of the structure of any one implementation can be combined with at least a part of the structure of any other implementation. Below, an example of other implementations to which the concept of the above implementation can be applied is described.

<5-1> 於上述實施方式中,切斷裝置1由電腦50控制。然而,切斷裝置1亦可由複數台電腦控制,而無需由一台電腦50控制。 <5-1> In the above-mentioned embodiment, the cutting device 1 is controlled by the computer 50. However, the cutting device 1 can also be controlled by a plurality of computers, without being controlled by a single computer 50.

<5-2> 又,於上述實施方式中,檢查台11的保持構件11b的顏色為黑色。然而,如上所述,保持構件11b的顏色亦可為白色。當保持構件11b的顏色為白色時,於電子零件S1的左邊,像素值自左向右變小,於右邊,像素值自右向左變小。又,於電子零件S1的上邊,像素值自上向下變小,於下邊,像素值自下向上變小。因此,於左邊判定處理中,亦可於表示像素值自左向右的變化之近似曲線的微分值的最小值小於閾值時,判定特定數量的像素中包含左邊的一部分。又,於左邊判定處理中,亦可於表示像素值自右向左的變化之近似曲線的微分值的最大值大於閾值時,判定特定數量的像素中包含左邊的一部分。可以說於右邊判定處理、上邊判定處理及下邊判定處理之各者中亦相同。 <5-2> In the above-mentioned embodiment, the color of the holding member 11b of the inspection table 11 is black. However, as described above, the color of the holding member 11b may also be white. When the color of the holding member 11b is white, on the left side of the electronic component S1, the pixel value decreases from left to right, and on the right side, the pixel value decreases from right to left. Also, on the top of the electronic component S1, the pixel value decreases from top to bottom, and on the bottom, the pixel value decreases from bottom to top. Therefore, in the left side judgment processing, when the minimum value of the differential value of the approximate curve representing the change of the pixel value from left to right is less than the threshold value, it can be judged that a part of the left side is included in a specific number of pixels. Also, in the left side judgment processing, when the maximum value of the differential value of the approximate curve representing the change of the pixel value from right to left is greater than the threshold value, it can be judged that a part of the left side is included in a specific number of pixels. It can be said that the same is true for the right judgment process, the upper judgment process, and the lower judgment process.

<5-3> 又,於上述實施方式中,為了設定第一個檢查區域T1,首先,確定了左邊EL1。然而,最先確定之邊並不限於左邊EL1。亦可最先確定右邊ER1,亦可最先確定上邊ET1,亦可最先確定下邊EB1。 <5-3> In addition, in the above-mentioned embodiment, in order to set the first inspection area T1, the left side EL1 is determined first. However, the side to be determined first is not limited to the left side EL1. The right side ER1 may be determined first, the upper side ET1 may be determined first, or the lower side EB1 may be determined first.

<5-4> 又,於分別用於確定左邊EL1、右邊ER1、上邊ET1及下邊EB1之處理中,移動特定數量的像素時之像素的單位亦可不為一個像素。亦可以複數個像素為單位移動特定數量的像素的位置。又,特定數量的像素並非必須為五個像素。特定數量的像素為兩個像素以上的像素即可。又,於用於設定第二個及之後的檢查區域T1之處理中,移動臨時檢查區域T1時之像素的單位亦可不為一個像素。亦可以複數個像素為單位移動臨時檢查區域T1的位置。 <5-4> In addition, in the processing for determining the left side EL1, the right side ER1, the upper side ET1, and the lower side EB1, the unit of pixels when moving a specific number of pixels may not be one pixel. The position of a specific number of pixels may be moved by a plurality of pixels. In addition, the specific number of pixels does not necessarily have to be five pixels. The specific number of pixels may be two or more pixels. In addition, in the processing for setting the second and subsequent inspection areas T1, the unit of pixels when moving the temporary inspection area T1 may not be one pixel. The position of the temporary inspection area T1 may be moved by a plurality of pixels.

<5-5> 又,於上述實施方式中,根據基於特定數量的像素各自的像素值所生成之近似曲線的微分值,確定拍攝圖像IM1中之電子零件S1的各邊。然而,於拍攝圖像IM1中之電子零件S1的各邊的確定中,亦可不必使用該微分值。 <5-5> In the above-mentioned embodiment, the sides of the electronic component S1 in the photographed image IM1 are determined based on the differential value of the approximate curve generated based on the pixel values of each of a specific number of pixels. However, the differential value does not have to be used in determining the sides of the electronic component S1 in the photographed image IM1.

<5-6> 又,於上述實施方式中,第二光學檢查相機13一次僅拍攝配置於檢查台11之複數個電子零件S1中的一部分。然而,第二光學檢查相機13之拍攝區域並不限於此,亦可利用第二光學檢查相機13一次拍攝配置於檢查台11之所有複數個電子零件S1。 <5-6> In addition, in the above-mentioned embodiment, the second optical inspection camera 13 only photographs a part of the plurality of electronic components S1 arranged on the inspection table 11 at a time. However, the photographing area of the second optical inspection camera 13 is not limited thereto, and the second optical inspection camera 13 may also be used to photograph all the plurality of electronic components S1 arranged on the inspection table 11 at a time.

<5-7> 又,於上述實施方式中,不經過各邊判定處理地設定第二個及之後設定之檢查區域T1中的部分檢查區域T1(例如,第4圖的檢查區域T1D)。然而,第二個及之後設定之檢查區域T1的設定方法並不限於此,例如,亦可經過各邊判定處理來設定拍攝圖像IM1中第二個及之後設定之所有檢查區域T1。 <5-7> In addition, in the above-mentioned embodiment, part of the inspection area T1 (for example, the inspection area T1D in FIG. 4) in the second and subsequent inspection areas T1 is set without the side determination processing. However, the setting method of the second and subsequent inspection areas T1 is not limited to this. For example, all the second and subsequent inspection areas T1 in the captured image IM1 may be set through the side determination processing.

<5-8> 又,於上述實施方式中,於設定第一個檢查區域T1後,設定沿行方向移動後之位置的檢查區域T1,之後,設定沿列方向移動後之位置的檢查區域T1。然而,各檢查區域T1的設定順序並不限於此。例如,亦可於設定第一個檢查區域T1後,設定沿列方向移動後之位置的檢查區域T1,之後,設定沿行方向移動後之位置的檢查區域T1。 <5-8> In the above-mentioned embodiment, after setting the first inspection area T1, the inspection area T1 at the position after moving along the row direction is set, and then the inspection area T1 at the position after moving along the column direction is set. However, the setting order of each inspection area T1 is not limited to this. For example, after setting the first inspection area T1, the inspection area T1 at the position after moving along the column direction may be set, and then the inspection area T1 at the position after moving along the row direction may be set.

<5-9> 又,於上述實施方式中,為了設定第一個檢查區域T1,依次確定左邊EL1、右邊ER1、上邊ET1及下邊EB1。然而,確定各邊之順序並不限於此。 <5-9> In addition, in the above-mentioned embodiment, in order to set the first inspection area T1, the left side EL1, the right side ER1, the upper side ET1 and the lower side EB1 are determined in sequence. However, the order of determining the sides is not limited to this.

<5-10> 又,於上述實施方式中,主要對由第二光學檢查相機13拍攝之拍攝圖像IM1中之檢查區域T1的設定進行了說明,但亦可於由第一光學檢查相機12拍攝之拍攝圖像中之檢查區域的設定中進行同樣的處理。 <5-10> In addition, in the above-mentioned embodiment, the setting of the inspection area T1 in the image IM1 photographed by the second optical inspection camera 13 is mainly described, but the same processing can also be performed in the setting of the inspection area in the image photographed by the first optical inspection camera 12.

<5-11> 又,於上述實施方式中,當確定左邊EL1的一部分,要確定左邊EL1的其他部分時,首先,確定左邊EL1的上端,之後,確定左邊EL1的下端。然而,上端及下端的確定順序並不限於此。例如,當確定左邊EL1的一部分,要確定左邊EL1的其他部分時,亦可首先確定左邊EL1的下端,之後,確定左邊EL1的上端。 <5-11> In addition, in the above-mentioned implementation, when determining a part of the left side EL1 and determining the other part of the left side EL1, first, determine the upper end of the left side EL1, and then determine the lower end of the left side EL1. However, the order of determining the upper end and the lower end is not limited to this. For example, when determining a part of the left side EL1 and determining the other part of the left side EL1, the lower end of the left side EL1 may be determined first, and then the upper end of the left side EL1 may be determined.

以上,對本發明的實施方式進行了示例性說明。即,為了進行示例性說明,揭示了詳細說明及所附圖式。由此,於詳細說明及所附圖式所記載之構成要素中,有時會包括並非解決問題所必需的構成要素。因此,不應因於詳細說明及所附圖式中記載有這些並非必需的構成要素,便直接認定這些並非必需的構成要素是必需的。The above is an exemplary description of the implementation of the present invention. That is, the detailed description and the attached drawings are disclosed for the purpose of exemplary description. Therefore, the components described in the detailed description and the attached drawings sometimes include components that are not necessary to solve the problem. Therefore, it should not be directly determined that these non-essential components are essential just because they are described in the detailed description and the attached drawings.

又,上述實施方式在所有方面僅是本發明的例示。上述實施方式可於本發明的範圍內進行各種改良或變更。即,於實施本發明時,可根據實施方式適當地採用具體的構成。Furthermore, the above-mentioned embodiments are merely illustrative of the present invention in all aspects. The above-mentioned embodiments may be variously improved or modified within the scope of the present invention. That is, when implementing the present invention, a specific configuration may be appropriately adopted according to the embodiments.

1:切斷裝置 3:基板供給部 4:定位部 4a:軌道部 5:切斷台 5a:保持構件 5b:旋轉機構 5c:移動機構 5d:第一位置確認相機 5e:第一清潔器 6:主軸部 6a:刀片 6b:第二位置確認相機 6c:旋轉軸 7:搬送部 7a:第二清潔器 11:檢查台 11a:檢查台主體 11b:保持構件 12:第一光學檢查相機 13:第二光學檢查相機 14:配置部 15:抽出部 15a:良品用托盤 15b:不良品用托盤 20:監視器 50:電腦 70:控制部 72:CPU 74:RAM 76:ROM 80:記憶部 81:控制程式 90:輸入輸出I/F 95:受理部 A1:切斷模組 B1:檢查及收納模組 BA1:球部 EB1,IB1:下邊 EL1,IL1:左邊 ER1,IR1:右邊 ET1,IT1:上邊 IM1:拍攝圖像 L1:近似曲線 L2:曲線 M1:料盒 P1:封裝基板 PO1:微分最大位置 PX1,PX1A:像素 S1,S1A,S1B,S1C,S1D:電子零件 S100~S120,S200~S230,S300~S340,S400~S470,S500~S590,S600~S660,S700~S760,S800~S860,S900~S950,S1000~S1050:步驟 T1,T1A,T1B,T1C,T1D:檢查區域 T1B1,T1B2,T1B3,T1C1,T1C2,T1C3:臨時檢查區域 X,Y,Z:軸 θ1:方向 1: Cutting device 3: Substrate supply unit 4: Positioning unit 4a: Track unit 5: Cutting table 5a: Holding member 5b: Rotating mechanism 5c: Moving mechanism 5d: First position confirmation camera 5e: First cleaner 6: Main shaft unit 6a: Blade 6b: Second position confirmation camera 6c: Rotating shaft 7: Transport unit 7a: Second cleaner 11: Inspection table 11a: Inspection table body 11b: Holding member 12: First optical inspection camera 13: Second optical inspection camera 14: Arrangement unit 15: Extraction unit 15a: Tray for good products 15b: Tray for defective products 20: Monitor 50: Computer 70: Control unit 72: CPU 74: RAM 76: ROM 80: Memory unit 81: Control program 90: Input/output I/F 95: Acceptance unit A1: Cutting module B1: Inspection and storage module BA1: Ball unit EB1, IB1: Bottom EL1, IL1: Left ER1, IR1: Right ET1, IT1: Top IM1: Image capture L1: Approximate curve L2: Curve M1: Material box P1: Package substrate PO1: Differential maximum position PX1, PX1A: Pixel S1, S1A, S1B, S1C, S1D: Electronic components S100~S120,S200~S230,S300~S340,S400~S470,S500~S590,S600~S660,S700~S760,S800~S860,S900~S950,S1000~S1050: Steps T1,T1A,T1B,T1C,T1D: Inspection area T1B1,T1B2,T1B3,T1C1,T1C2,T1C3: Temporary inspection area X,Y,Z: Axes θ1: Direction

第1圖是示意性地示出切斷裝置之俯視圖。 第2圖是示意性地示出利用第二光學檢查相機拍攝電子零件之情形之圖。 第3圖是示意性地示出電腦的硬體構成之圖。 第4圖是示意性地示出由第二光學檢查相機生成之拍攝圖像的一例之圖。 第5圖是示出電子零件的外觀檢查的工序之流程圖。 第6圖是示出檢查區域的設定處理的工序之流程圖。 第7圖是示出第一個檢查區域的設定處理的工序之流程圖。 第8圖是用於說明確定拍攝圖像中第一個電子零件的左邊的一部分之工序之圖。 第9圖是用於說明作為左邊判定處理的對象之特定數量的像素的位置如何變更之圖。 第10圖是用於對左邊判定處理中之近似曲線的生成進行說明之圖。 第11圖是示意性地示出表示對近似曲線進行微分之結果之曲線之圖。 第12圖是用於對確定左邊的其他部分之工序進行說明之圖。 第13圖是用於說明基於與經過左邊判定處理所得到之微分值的各最大值(最大值>第一特定值)對應之各像素位置來確定左邊之工序之圖。 第14圖是示出第一個電子零件中之左邊的確定處理的工序之流程圖。 第15圖是示出左邊的上端及下端各自的確定處理的工序之流程圖。 第16圖是用於對確定第一個電子零件的右邊之工序進行說明之圖。 第17圖是示出第一個電子零件中之右邊的確定處理的工序之流程圖。 第18圖是用於對分別確定第一個電子零件的上邊及下邊之工序進行說明之圖。 第19圖是示出第一個電子零件中之上邊的確定處理的工序之流程圖。 第20圖是示出第一個電子零件中之下邊的確定處理的工序之流程圖。 第21圖是用於說明於相對於第一個檢查區域沿行方向或列方向移動後之位置設定其他檢查區域之工序之圖。 第22圖是示出相對於第一個檢查區域沿行方向移動後之位置處之另一檢查區域的設定處理的工序之流程圖。 第23圖是示出相對於第一個檢查區域沿列方向移動後之位置處之另一檢查區域的設定處理的工序之流程圖。 FIG. 1 is a schematic top view of a cutting device. FIG. 2 is a schematic diagram showing a situation where an electronic component is photographed using a second optical inspection camera. FIG. 3 is a schematic diagram showing the hardware configuration of a computer. FIG. 4 is a schematic diagram showing an example of a photographed image generated by a second optical inspection camera. FIG. 5 is a flowchart showing the process of appearance inspection of electronic components. FIG. 6 is a flowchart showing the process of setting the inspection area. FIG. 7 is a flowchart showing the process of setting the first inspection area. FIG. 8 is a diagram for explaining the process of determining a portion of the left side of the first electronic component in the photographed image. FIG. 9 is a diagram for explaining how the position of a specific number of pixels that are the object of the left judgment process changes. FIG. 10 is a diagram for explaining the generation of an approximate curve in the left side determination process. FIG. 11 is a diagram schematically showing a curve representing the result of differentiating the approximate curve. FIG. 12 is a diagram for explaining the process of determining the other parts of the left side. FIG. 13 is a diagram for explaining the process of determining the left side based on each pixel position corresponding to each maximum value (maximum value > first specific value) of the differential value obtained after the left side determination process. FIG. 14 is a flowchart showing the process of determining the left side in the first electronic component. FIG. 15 is a flowchart showing the process of determining the upper end and the lower end of the left side. FIG. 16 is a diagram for explaining the process of determining the right side of the first electronic component. FIG. 17 is a flowchart showing the process of determining the right side of the first electronic component. FIG. 18 is a diagram for explaining the process of determining the upper side and the lower side of the first electronic component. FIG. 19 is a flowchart showing the process of determining the upper side of the first electronic component. FIG. 20 is a flowchart showing the process of determining the lower side of the first electronic component. FIG. 21 is a diagram for explaining the process of setting another inspection area at a position after the first inspection area is moved in the row direction or column direction. FIG. 22 is a flowchart showing the process of setting another inspection area at a position after the first inspection area is moved in the row direction. FIG. 23 is a flowchart showing the process of setting another inspection area at a position after the first inspection area is moved in the column direction.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic storage information (please note in the order of storage institution, date, and number) None Foreign storage information (please note in the order of storage country, institution, date, and number) None

1:切斷裝置 1: Cutting device

3:基板供給部 3: Substrate supply unit

4:定位部 4: Positioning unit

4a:軌道部 4a: Track section

5:切斷台 5: Cutting table

5a:保持構件 5a: Retaining components

5b:旋轉機構 5b: Rotating mechanism

5c:移動機構 5c: Mobile mechanism

5d:第一位置確認相機 5d: First position confirmation camera

5e:第一清潔器 5e: First Cleaner

6:主軸部 6: Main shaft

6a:刀片 6a: Blade

6b:第二位置確認相機 6b: Second location confirmation camera

6c:旋轉軸 6c: Rotation axis

7:搬送部 7: Transportation Department

7a:第二清潔器 7a: Second cleaner

11:檢查台 11: Inspection table

12:第一光學檢查相機 12: First optical inspection camera

13:第二光學檢查相機 13: Second optical inspection camera

14:配置部 14: Configuration Department

15:抽出部 15: Extraction section

15a:良品用托盤 15a: Tray for good products

15b:不良品用托盤 15b: Tray for defective products

20:監視器 20: Monitor

50:電腦 50: Computer

A1:切斷模組 A1: Cutting module

B1:檢查及收納模組 B1: Inspection and storage module

M1:料盒 M1: Material box

P1:封裝基板 P1: packaging substrate

X,Y,Z:軸 X,Y,Z: axis

θ1:方向 θ1: direction

Claims (10)

一種切斷裝置,其藉由切斷基板來製造複數個切斷品,且包括:拍攝部,其藉由拍攝該複數個切斷品的一部分或全部來生成拍攝圖像;第一處理部,其設定該拍攝圖像中之複數個檢查區域;及,第二處理部,其基於該拍攝圖像中該複數個檢查區域各自包含之圖像,檢查該拍攝圖像中包含之各切斷品的外觀;並且,該複數個檢查區域各自的形狀為矩形,該各切斷品的形狀為矩形,該第一處理部執行判定處理,該判定處理基於該拍攝圖像中連續位於第一方向之特定數量的像素各自的像素值,判定該特定數量的像素中是否包含該複數個切斷品的任一邊的一部分,該特定數量小於該拍攝圖像整體的像素數,該第一處理部反復移動該特定數量的像素的位置來執行該判定處理,以設定該複數個檢查區域的至少一部分。 A cutting device, which manufactures a plurality of cut products by cutting a substrate, comprises: a photographing unit, which generates a photographed image by photographing a part or all of the plurality of cut products; a first processing unit, which sets a plurality of inspection areas in the photographed image; and a second processing unit, which inspects the appearance of each cut product contained in the photographed image based on the image contained in each of the plurality of inspection areas in the photographed image; and each of the plurality of inspection areas is rectangular in shape. The shape of the cut product is a rectangle. The first processing unit performs a determination process. The determination process determines whether a part of any side of the plurality of cut products is included in the specific number of pixels, based on the pixel values of each of the specific number of pixels continuously located in the first direction in the photographed image. The specific number is less than the number of pixels of the entire photographed image. The first processing unit repeatedly moves the position of the specific number of pixels to perform the determination process to set at least a part of the plurality of inspection areas. 如請求項1所述之切斷裝置,其中,該拍攝圖像的左邊、右邊、上邊及下邊分別與該各切斷品的左邊、右邊、上邊及下邊平行。 A cutting device as described in claim 1, wherein the left side, right side, top side and bottom side of the photographed image are respectively parallel to the left side, right side, top side and bottom side of each cut product. 如請求項1或2所述之切斷裝置,其中,該 第一處理部反復使該特定數量的像素的位置沿第二方向移動來執行該判定處理,以設定該複數個檢查區域的至少一部分,該第二方向是相對於該第一方向傾斜的方向。 The cutting device as described in claim 1 or 2, wherein the first processing unit repeatedly moves the position of the specific number of pixels along a second direction to perform the determination process to set at least a portion of the plurality of inspection areas, and the second direction is a direction inclined relative to the first direction. 如請求項1或2所述之切斷裝置,其中,該第一方向為行方向或列方向。 A cutting device as described in claim 1 or 2, wherein the first direction is a row direction or a column direction. 如請求項3所述之切斷裝置,其中,該第一處理部藉由使該特定數量的像素各自的位置沿行方向移動一個像素或複數個像素,且沿列方向移動一個像素或複數個像素,來使該特定數量的像素的位置沿該第二方向移動。 A cutting device as described in claim 3, wherein the first processing unit moves the positions of the specific number of pixels along the second direction by moving the positions of the specific number of pixels by one pixel or a plurality of pixels along the row direction and by one pixel or a plurality of pixels along the column direction. 如請求項1或2所述之切斷裝置,其中,該第一處理部於經過該判定處理判定出該特定數量的像素中包含作為該複數個切斷品的任一邊之第一邊的一部分時,基於判定出包含該第一邊的一部分之該特定數量的像素的至少一部分,確定該第一邊的其他部分,從而確定該第一邊。 The cutting device as claimed in claim 1 or 2, wherein when the first processing unit determines through the determination processing that the specific number of pixels includes a portion of the first side that is any side of the plurality of cut products, the first processing unit determines the other portion of the first side based on at least a portion of the specific number of pixels that are determined to include a portion of the first side, thereby determining the first side. 如請求項6所述之切斷裝置,其中,該第一處理部基於確定出之該第一邊來確定包含該第一邊之切斷品的另外三邊,並基於確定出之四邊來設定該複數個檢查區域中的任一個。 The cutting device as described in claim 6, wherein the first processing unit determines the other three sides of the cut product including the first side based on the determined first side, and sets any one of the plurality of inspection areas based on the determined four sides. 如請求項7所述之切斷裝置,其中,該第一處理部基於確定出之該第一邊來確定該另外三邊中與該第一邊相對之第二邊,之後,確定除該第一邊及該第二 邊以外之兩邊。 The cutting device as described in claim 7, wherein the first processing unit determines the second side opposite to the first side among the other three sides based on the determined first side, and then determines two sides other than the first side and the second side. 如請求項1或2所述之切斷裝置,其中,該第一處理部基於該複數個檢查區域中最先設定之檢查區域,來設定該複數個檢查區域中的其他檢查區域。 A cutting device as described in claim 1 or 2, wherein the first processing unit sets other inspection areas among the plurality of inspection areas based on the inspection area that is first set among the plurality of inspection areas. 一種切斷品的製造方法,其使用請求項1至9中任一項所述之切斷裝置,該切斷裝置包括:切斷台,其配置該基板;及,切斷部,其切斷配置於該切斷台之該基板;並且,該製造方法包括以下步驟:於該切斷台配置該基板;藉由切斷配置於該切斷台之該基板來製造該複數個切斷品;藉由拍攝該複數個切斷品的一部分或全部來生成該拍攝圖像;設定該拍攝圖像中之該複數個檢查區域;及,基於該拍攝圖像中該複數個檢查區域各自包含之圖像,來檢查該拍攝圖像中包含之該各切斷品的外觀。 A method for manufacturing a cut product, using the cutting device described in any one of claims 1 to 9, the cutting device comprising: a cutting table, which is provided with the substrate; and a cutting section, which cuts the substrate provided on the cutting table; and the manufacturing method comprises the following steps: providing the substrate on the cutting table; manufacturing the plurality of cut products by cutting the substrate provided on the cutting table; generating the photographed image by photographing a part or all of the plurality of cut products; setting the plurality of inspection areas in the photographed image; and inspecting the appearance of each cut product contained in the photographed image based on the images contained in each of the plurality of inspection areas in the photographed image.
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