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TWI849689B - Pressing mechanism, testing device, and processing machine - Google Patents

Pressing mechanism, testing device, and processing machine Download PDF

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Publication number
TWI849689B
TWI849689B TW112101604A TW112101604A TWI849689B TW I849689 B TWI849689 B TW I849689B TW 112101604 A TW112101604 A TW 112101604A TW 112101604 A TW112101604 A TW 112101604A TW I849689 B TWI849689 B TW I849689B
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Taiwan
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crimping
flow channel
gas
channel
delivery
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TW112101604A
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Chinese (zh)
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TW202429106A (en
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謝旼達
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鴻勁精密股份有限公司
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Publication of TW202429106A publication Critical patent/TW202429106A/en
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Publication of TWI849689B publication Critical patent/TWI849689B/en

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Abstract

The pressing mechanism includes a supporter, a pressing unit, and a ventilation unit. The carrying member of the pressing unit has a pressing member having a suction nozzle. The ventilation unit includes a gas channel on the pressing member which communicates the suction nozzle. The gas channel has a first branch channel and a second branch channel. The carrying member has a first supply structure and a second supply structure for connecting to the suction pipe and the gas supply pipe respectively. The first branch channel communicates the first supply structure and the suction pipe for gas suction so as to pick up the electronic component. The second branch channel communicates the second supply structure and the gas supply pipe for injecting gas at a predetermined temperature so as to control the temperature of the electronic component. Thereby, the ventilation unit can used to pick up the electronic component or control the temperature of the electronic component by the single gas channel.

Description

壓接機構、測試裝置及作業機Crimping machine, testing device and operating machine

本發明提供一種可於同一氣體流道變換執行取放或溫控電子元件,而有效縮小體積及節省能源成本之壓接機構。The present invention provides a crimping mechanism that can perform pick-up and placement or temperature control of electronic components in the same gas flow channel, thereby effectively reducing the size and saving energy costs.

電子元件日後會應用於高溫環境或低溫環境,於出廠前,需以作業機之測試裝置對電子元件執行熱測作業或冷測作業,以淘汰不良品。以冷測作業為例,測試裝置包含測試器及壓接機構,測試器以供承置及測試電子元件 ,壓接機構位於測試器之上方,並設有壓接具以壓接電子元件,壓接具之抽氣孔供吸附移載電子元件,另於壓接具之上方設有獨立之冷媒座,冷媒座之兩端分別以冷媒輸送管連接冷媒供應設備,使冷媒供應設備將冷媒輸入至冷媒座,以溫控壓接具,壓接具將低溫傳導至電子元件,使電子元件於模擬日後應用低溫環境執行冷測作業,冷媒座再將冷媒輸出至冷媒供應設備。 Electronic components will be used in high-temperature or low-temperature environments in the future. Before they are shipped out of the factory, they need to be subjected to heat or cold testing using a test device on a processing machine to eliminate defective products. Taking the cold test operation as an example, the test device includes a tester and a crimping mechanism. The tester is used to hold and test electronic components. The crimping mechanism is located above the tester and is provided with a crimping tool to crimp the electronic components. The suction hole of the crimping tool is used to absorb and transfer the electronic components. In addition, an independent refrigerant seat is provided above the crimping tool. The two ends of the refrigerant seat are connected to the refrigerant supply equipment with refrigerant delivery pipes, so that the refrigerant supply equipment inputs the refrigerant to the refrigerant seat, and the crimping tool is controlled by temperature. The crimping tool transfers the low temperature to the electronic components, so that the electronic components can perform cold test operations in a low temperature environment in the future. The refrigerant seat then outputs the refrigerant to the refrigerant supply equipment.

此一方式雖可溫控壓接具,但以冷媒作為溫控之能源,不僅增加溫控能源成本,冷媒供應設備之體積大必須獨立配置,更需配置複數個轉接管及較長尺寸之冷媒輸送管等,方可將冷媒輸送至冷媒座,以致相當佔用場所空間,亦增加配置作業上之不便。Although this method can be used to control the temperature of the press fittings, using the refrigerant as the energy source for temperature control not only increases the energy cost of temperature control, but also requires the refrigerant supply equipment to be large and must be configured independently. It also requires multiple transfer tubes and longer refrigerant delivery pipes to transport the refrigerant to the refrigerant seat, which takes up a lot of space and increases the inconvenience of the configuration operation.

又,冷媒供應設備之冷媒輸送管具有一定之剛性以供輸送冷媒,因而不易作較小曲弧之彎折,導致壓接機構必須於壓接具之周側預留較大之配置空間,方可裝配冷媒輸送管,進而不利壓接機構之空間配置。In addition, the refrigerant delivery pipe of the refrigerant supply equipment has a certain rigidity for delivering the refrigerant, and therefore is not easy to bend into a smaller arc, which results in the crimping mechanism having to reserve a larger configuration space around the crimping tool in order to assemble the refrigerant delivery pipe, which is disadvantageous for the spatial configuration of the crimping mechanism.

由於作業機之測試裝置以冷媒作為溫控能源,當工作人員欲將作業機搬移至不同作業場所時,即需分別拆卸、分次搬運及重新組裝校機該作業機與冷媒供應設備,造成搬運作業上之繁瑣與不便。Since the test device of the operating machine uses refrigerant as the temperature control energy source, when the staff wants to move the operating machine to a different operating site, they need to dismantle, transport and reassemble the operating machine and the refrigerant supply equipment separately, which makes the transportation operation cumbersome and inconvenient.

本發明之目的一,提供一種壓接機構,包含架置器、壓接單元及換氣單元,壓接單元裝配於架置器,並於承載具設有至少一具有吸嘴之壓接具 ,以供取放及壓接電子元件,換氣單元於壓接具設有氣體流道,氣體流道之第一端相通吸嘴,第二端連通至少一輸送結構,輸送結構能夠使氣體流道抽氣,以供壓接具之吸嘴取放電子元件,或者變換使同一氣體流道輸送預設溫度之氣體,以供預溫壓接具及電子元件;藉以,換氣單元於同一氣體流道變換執行抽氣或供應預設溫度氣體,而可取放或溫控電子元件,不僅有效節省能源成本,並可簡化機構設計而便於組裝。 The first object of the present invention is to provide a crimping mechanism, comprising a mount, a crimping unit and a ventilation unit. The crimping unit is mounted on the mount, and at least one crimping tool with a suction nozzle is provided on the carrier. , for taking and placing and crimping electronic components, the ventilation unit is provided with a gas flow channel on the crimping tool, the first end of the gas flow channel is connected to the suction nozzle, and the second end is connected to at least one conveying structure, the conveying structure can make the gas flow channel evacuate air for the suction nozzle of the crimping tool to take and place electronic components, or change the same gas flow channel to convey gas of a preset temperature for pre-heating the crimping tool and electronic components; thereby, the ventilation unit can change the same gas flow channel to perform evacuation or supply gas of a preset temperature, and can take and place or temperature control electronic components, which not only effectively saves energy costs, but also simplifies the mechanism design and facilitates assembly.

本發明之目的二,提供一種壓接機構,其換氣單元於氣體流道設有第一、二支流道,至少一輸送結構包含第一、二輸送結構,以分別連接抽氣管及供氣管,於氣體流道的第一支流道相通第一輸送結構及抽氣管而可抽氣,使吸嘴拾取電子元件,或於同一氣體流道的第二支流道相通第二輸送結構及供氣管而可輸入預設溫度氣體,使壓接具及氣體溫控電子元件;藉以換氣單元於同一氣體流道變換執行抽氣或供應預設溫度氣體,而可取放或溫控電子元件,以有效提高壓接機構之使用效能。The second object of the present invention is to provide a crimping mechanism, wherein a ventilation unit is provided with a first and a second branch flow channel in a gas flow channel, and at least one delivery structure includes a first and a second delivery structure to respectively connect an exhaust pipe and an air supply pipe. The first delivery structure and the exhaust pipe are connected in the first branch flow channel of the gas flow channel to exhaust air, so that a suction nozzle can pick up electronic components, or the second delivery structure and the air supply pipe are connected in the second branch flow channel of the same gas flow channel to input a preset temperature gas, so that the crimping tool and the gas temperature control the electronic components; the ventilation unit can switch to perform exhaust or supply preset temperature gas in the same gas flow channel, so as to take in or place or temperature control the electronic components, thereby effectively improving the use efficiency of the crimping mechanism.

本發明之目的三,提供一種測試裝置,包含測試機構及本發明壓接機構,測試機構設有至少一測試器,以供測試電子元件;本發明壓接機構位於測試機構之上方,包含架置器、壓接單元及換氣單元,以供取放及溫控電子元件。The third object of the present invention is to provide a testing device, including a testing mechanism and the crimping mechanism of the present invention, wherein the testing mechanism is provided with at least one tester for testing electronic components; the crimping mechanism of the present invention is located above the testing mechanism, and includes a mount, a crimping unit and a ventilation unit for taking, placing and temperature controlling the electronic components.

本發明之目的四,提供一種作業機,包含機台、供料裝置、收料裝置、測試裝置、輸送裝置及中央控制裝置,供料裝置配置於機台,並設有至少一供料器,以供容置至少一待測電子元件;收料裝置配置於機台,並設有至少一收料器,以供容置至少一已測電子元件;測試裝置配置於機台,包含測試機構及本發明壓接機構,測試機構設有至少一測試器,以供測試電子元件,壓接機構位於測試機構之上方,包含架置器、壓接單元及換氣單元,以供取放及溫控電子元件;輸送裝置配置於機台,並設有至少一輸送器,以供輸送電子元件;中央控制裝置以控制及整合各裝置作動而執行自動化作業。The fourth object of the present invention is to provide an operating machine, including a machine, a feeding device, a receiving device, a testing device, a conveying device and a central control device. The feeding device is arranged on the machine and is provided with at least one feeder for accommodating at least one electronic component to be tested; the receiving device is arranged on the machine and is provided with at least one receiver for accommodating at least one tested electronic component; the testing device is arranged on the machine and includes a testing mechanism and the crimping mechanism of the present invention. The testing mechanism is provided with at least one tester for testing electronic components. The crimping mechanism is located above the testing mechanism and includes a mounter, a crimping unit and a ventilation unit for taking, placing and temperature-controlling electronic components; the conveying device is arranged on the machine and is provided with at least one conveyor for conveying electronic components; the central control device controls and integrates the actions of each device to perform automated operations.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable you to have a further understanding of the present invention, a preferred embodiment is given below with accompanying drawings:

請參閱圖1,本發明壓接機構之第一實施例包含架置器、壓接單元及換氣單元。Please refer to FIG1 , the first embodiment of the crimping mechanism of the present invention includes a mount, a crimping unit and a ventilation unit.

架置器以供裝配壓接單元;依作業需求,架置器可為固定式或活動式配置,例如架置器可為固定式之機架,例如架置器可為活動式之移載臂。於本實施例,架置器為可作至少一方向位移之移載臂11,移載臂11可由移載驅動源(圖未示出)驅動作Y-Z方向位移,以帶動壓接單元及換氣單元同步位移。The mounting device is used to assemble the crimping unit; according to the operation requirements, the mounting device can be a fixed or movable configuration, for example, the mounting device can be a fixed rack, for example, the mounting device can be a movable transfer arm. In this embodiment, the mounting device is a transfer arm 11 that can be displaced in at least one direction, and the transfer arm 11 can be driven by a transfer drive source (not shown) to move in the Y-Z direction to drive the crimping unit and the ventilation unit to move synchronously.

壓接單元裝配於架置器,並設有至少一承載具,以供裝配至少一具吸嘴之壓接具,而取放及壓接電子元件。更進一步,壓接具可固設於承載具,或者可於承載具作至少一方向位移。更進一步,壓接具之一端可成型吸嘴或者裝配一獨立之吸嘴。依作業需求,承載具可直接裝配於架置器,或者於承載具與架置器之間配置浮動器。The crimping unit is mounted on the mounter and is provided with at least one carrier for mounting a crimping tool with at least one suction nozzle to pick up and crimp electronic components. Furthermore, the crimping tool can be fixed on the carrier or can be displaced in at least one direction on the carrier. Furthermore, one end of the crimping tool can be formed with a suction nozzle or equipped with an independent suction nozzle. According to the operation requirements, the carrier can be directly mounted on the mounter, or a floater can be configured between the carrier and the mounter.

於本實施例,壓接單元包含承載具12及壓接具13,承載具12之頂面以連接件裝配於移載臂11,而可由移載臂11帶動作Y-Z方向位移,承載具12之內部設有容置部,容置部為一呈Z方向配置的通孔121,以供置入固設壓接具13 ,壓接具13於第一端設有管部131,管部131之底面朝頂面凹設有容置空間132,以供裝配吸嘴133,吸嘴133以供取放及壓接電子元件。更進一步,壓接具13之管部131能夠溫控及壓接電子元件。 In this embodiment, the crimping unit includes a carrier 12 and a crimping tool 13. The top surface of the carrier 12 is assembled to the transfer arm 11 by a connector, and can be driven by the transfer arm 11 to move in the Y-Z direction. The interior of the carrier 12 is provided with a receiving portion, which is a through hole 121 arranged in the Z direction for inserting and fixing the crimping tool 13. The crimping tool 13 is provided with a tube 131 at the first end, and the bottom surface of the tube 131 is concavely provided with a receiving space 132 toward the top surface for assembling a suction nozzle 133. The suction nozzle 133 is used for picking up and crimping electronic components. Furthermore, the tube 131 of the crimping tool 13 can control temperature and crimp electronic components.

換氣單元於壓接具13設有至少一相通吸嘴133之氣體流道,氣體流道連通至少一輸送結構,至少一輸送結構連通供氣管及抽氣管,以供氣體流道輸送預設溫度氣體,能夠溫控壓接具13及電子元件(圖未示出),或者變換同一氣體流道抽氣,能夠使壓接具13之吸嘴133取放電子元件。The ventilation unit is provided with at least one gas flow channel connected to the suction nozzle 133 on the crimping tool 13, and the gas flow channel is connected to at least one conveying structure, and at least one conveying structure is connected to the gas supply pipe and the exhaust pipe, so that the gas flow channel can convey gas of preset temperature, which can control the temperature of the crimping tool 13 and the electronic components (not shown in the figure), or change the same gas flow channel to exhaust, so that the suction nozzle 133 of the crimping tool 13 can pick up and place the electronic components.

依作業需求,換氣單元之氣體流道可直接連通至少一輸送結構,或者氣體流道設有至少一支流道,以供連通至少一輸送結構。According to the operation requirements, the gas flow channel of the ventilation unit can be directly connected to at least one delivery structure, or the gas flow channel is provided with at least one branch flow channel for connecting to at least one delivery structure.

依作業需求,至少一輸送結構於承載具12設有至少一輸氣道,至少一輸氣道以供連通支流道及至少一輸送管。According to the operation requirements, at least one conveying structure is provided with at least one air delivery channel on the carrier 12, and the at least one air delivery channel is used to connect the branch channel and at least one conveying pipe.

依作業需求,至少一輸送結構之輸送管連接至少一控制器,至少一控制器連接抽氣管及供氣管,以供控制變換該輸送管抽氣或輸送預設溫度氣體。According to the operation requirements, the delivery pipe of at least one delivery structure is connected to at least one controller, and at least one controller is connected to the exhaust pipe and the air supply pipe to control the change of the delivery pipe to exhaust or deliver the preset temperature gas.

於本實施例,換氣單元於壓接具13之內部設有一呈Z方向配置之氣體流道141,氣體流道141之第一端相通吸嘴133,第二端連通一呈X方向配置之支流道142,支流道142連通至少一輸送結構;輸送結構包含輸氣道143、輸送管144及控制器145,輸氣道143呈X方向配置設於承載具12之內部,並以一端連通該氣體流道141之支流道142,另一端連通輸送管144,由於輸送管144用以輸送氣體,使得輸送管144可作較小曲弧之彎折配置,毋需於承載具12之周側預留較大配置空間,進而利於壓接機構之空間配置。輸送管144連通一控制器145,控制器145可為控制閥,並連通抽氣管146及供氣管147,抽氣管146連接一抽氣設備(圖未示出),以供抽氣,供氣管147連接一供氣設備(圖未示出),以供應預設溫度之氣體(如低溫氣體或高溫氣體),而可利用控制器145控制變換輸送管144連通抽氣管146或供氣管147,以供抽氣或輸送預設溫度氣體。In the present embodiment, the ventilation unit is provided with a gas flow channel 141 arranged in the Z direction inside the crimping device 13. The first end of the gas flow channel 141 is connected to the suction nozzle 133, and the second end is connected to a branch channel 142 arranged in the X direction. The branch channel 142 is connected to at least one conveying structure; the conveying structure includes an air delivery channel 143, a conveying pipe 144 and a controller 145. The air delivery channel 143 is arranged in the X direction inside the carrier 12, and is connected to the branch channel 142 of the gas flow channel 141 at one end, and is connected to the conveying pipe 144 at the other end. Since the conveying pipe 144 is used to convey gas, the conveying pipe 144 can be configured to be bent in a smaller arc, and there is no need to reserve a larger configuration space around the carrier 12, which is beneficial to the spatial configuration of the crimping mechanism. The delivery pipe 144 is connected to a controller 145, which can be a control valve, and is connected to an exhaust pipe 146 and an air supply pipe 147. The exhaust pipe 146 is connected to an exhaust device (not shown) for exhausting air, and the air supply pipe 147 is connected to an air supply device (not shown) for supplying gas of a preset temperature (such as low-temperature gas or high-temperature gas). The controller 145 can be used to control the change of the delivery pipe 144 to connect to the exhaust pipe 146 or the air supply pipe 147 for exhausting air or delivering gas of a preset temperature.

因此,壓接機構之換氣單元以具有預設溫度氣體作為溫控能源,不僅有效節省能源成本,供氣設備之體積小,而可便利配置於作業機,並縮短輸送管144及供氣管147之長度,及利於場所空間配置,以及便利搬移作業機及供氣設備,進而提高配置作業上之便利性。Therefore, the ventilation unit of the crimping mechanism uses gas with a preset temperature as the temperature control energy source, which not only effectively saves energy costs, but also reduces the size of the air supply equipment and can be conveniently configured on the operating machine, shortens the length of the delivery pipe 144 and the air supply pipe 147, facilitates the site space configuration, and facilitates the movement of the operating machine and the air supply equipment, thereby improving the convenience of the configuration operation.

依作業需求,壓接機構可於承載具12配置至少一加熱件(圖未示出),以供配合調節氣體之預設溫度。另可於壓接具13配置至少一感測器(圖未示出),以感測溫度。According to the operation requirements, the crimping mechanism can be equipped with at least one heating element (not shown) on the carrier 12 to adjust the preset temperature of the gas. In addition, at least one sensor (not shown) can be equipped on the crimping tool 13 to sense the temperature.

請參閱圖2~4,本發明壓接機構應用於測試裝置10,測試裝置10包含測試機構及壓接機構,測試機構設有至少一測試器,以供測試電子元件,於本實施例,測試器設有電性連接之電路板151及測試座152,測試座152以供承置及測試電子元件。本發明壓接機構配置於測試機構之上方,以供於測試座152取放及壓接電子元件。Please refer to Figures 2 to 4. The crimping mechanism of the present invention is applied to a test device 10. The test device 10 includes a test mechanism and a crimping mechanism. The test mechanism is provided with at least one tester for testing electronic components. In this embodiment, the tester is provided with an electrically connected circuit board 151 and a test socket 152. The test socket 152 is used to hold and test electronic components. The crimping mechanism of the present invention is arranged above the test mechanism to allow the test socket 152 to take, place and crimp electronic components.

壓接機構之移載臂11帶動壓接單元及換氣單元位移至一承載電子元件21之載台(圖未示出),令壓接單元之壓接具13的吸嘴133貼合電子元件21之頂面,換氣單元之控制器145控制輸送管144連通抽氣管146,並關閉供氣管147 ,由於抽氣管146連接一抽氣設備,以及輸送管144連通輸氣道143一端,而可使抽氣管146經由輸送管144對承載具12之輸氣道143抽氣,輸氣道143另一端經由相通之支流道142而對壓接具13之氣體流道141抽氣,在氣體流道141連通吸嘴133的要件下,可使吸嘴133具有吸力而吸附電子元件21,並使壓接具13之管部131貼合電子元件21之頂面,於移載臂11帶動承載具12及壓接具13作Z方向向上位移時,即可使吸嘴133於載台取出電子元件21,移載臂11再帶動承載具12、壓接具13及電子元件21位移至測試座152之上方。 The transfer arm 11 of the crimping mechanism drives the crimping unit and the ventilation unit to move to a carrier (not shown) that carries the electronic component 21, so that the suction nozzle 133 of the crimping tool 13 of the crimping unit fits the top surface of the electronic component 21, and the controller 145 of the ventilation unit controls the delivery pipe 144 to connect the exhaust pipe 146 and close the air supply pipe 147 Since the exhaust pipe 146 is connected to an exhaust device and the delivery pipe 144 is connected to one end of the air delivery channel 143, the exhaust pipe 146 can exhaust air from the air delivery channel 143 of the carrier 12 through the delivery pipe 144, and the other end of the air delivery channel 143 can exhaust air from the gas flow channel 141 of the press-fit device 13 through the connected branch channel 142. Under the condition that the gas flow channel 141 is connected to the suction nozzle 133, the suction nozzle 133 can be connected to the suction nozzle 133. 133 has suction force to absorb the electronic component 21, and makes the tube 131 of the crimping tool 13 stick to the top surface of the electronic component 21. When the transfer arm 11 drives the carrier 12 and the crimping tool 13 to move upward in the Z direction, the suction nozzle 133 can take out the electronic component 21 from the carrier. The transfer arm 11 then drives the carrier 12, the crimping tool 13 and the electronic component 21 to move to the top of the test seat 152.

於移載臂11帶動承載具12、壓接具13及電子元件21作Z方向向下位移,將電子元件21置入測試座152後,換氣單元之控制器145控制變換輸送管144連通供氣管147,並關閉抽氣管146,以解除吸嘴133之吸力,由於供氣管147連接一供氣設備,而可依測試作業需求提供預設溫度之氣體(例如低溫氣體),使得供氣管147將預設低溫氣體輸送至輸送管144,輸送管144將預設低溫氣體輸送至承載具12內之輸氣道143,在輸氣道143連通壓接具13之支流道142的要件下 ,而可經由支流道142將預設低溫氣體輸送至壓接具13之同一氣體流道141,使預設低溫氣體直接與壓接具13作熱交換,而提高溫度傳導率,以利迅速溫控壓接具13呈預設低溫狀態,由於壓接具13之管部131貼合電子元件21之頂面,而可將低溫傳導至電子元件21,並搭配氣體流道141將低溫氣體吹送至電子元件21之頂面,而增加低溫氣體與電子元件21之熱交換面積,低溫氣體再排出壓接具13 ,在壓接具13及低溫氣體之雙重溫控電子元件21的使用狀態下,即可更加迅速使電子元件21於模擬日後低溫環境之測試座152內執行冷測作業;因此,換氣單元不僅可於同一氣體流道141執行抽氣或供氣動作,並簡化機構設計而易於組裝 ,以及有效節省能源成本。 After the transfer arm 11 drives the carrier 12, the crimping tool 13 and the electronic component 21 to move downward in the Z direction and place the electronic component 21 into the test seat 152, the controller 145 of the ventilation unit controls the changeover delivery pipe 144 to connect to the air supply pipe 147 and closes the exhaust pipe 146 to release the suction force of the suction nozzle 133. Since the air supply pipe 147 is connected to an air supply device, it can provide gas of a preset temperature (such as low-temperature gas) according to the test operation requirements, so that the air supply pipe 147 delivers the preset low-temperature gas to the delivery pipe 144, and the delivery pipe 144 delivers the preset low-temperature gas to the air delivery channel 143 in the carrier 12. Under the condition that the air delivery channel 143 is connected to the branch channel 142 of the crimping tool 13 , and the preset low-temperature gas can be transported to the same gas flow channel 141 of the crimping tool 13 through the branch channel 142, so that the preset low-temperature gas directly exchanges heat with the crimping tool 13, thereby increasing the temperature conductivity, so as to quickly control the crimping tool 13 to a preset low-temperature state. Since the tube 131 of the crimping tool 13 is attached to the top surface of the electronic component 21, the low temperature can be transferred to the electronic component 21, and the gas flow channel 141 is used to blow the low-temperature gas to the top surface of the electronic component 21, thereby increasing the heat exchange area between the low-temperature gas and the electronic component 21, and the low-temperature gas is then discharged from the crimping tool 13 , when the electronic component 21 is used in the dual temperature control state of the crimping tool 13 and the low-temperature gas, the electronic component 21 can be more quickly subjected to cold testing in the test seat 152 simulating the low-temperature environment in the future; therefore, the ventilation unit can not only perform air extraction or air supply in the same gas flow channel 141, but also simplify the mechanism design and facilitate assembly , and effectively save energy costs.

然,低溫氣體排出之方式,例如氣體由壓接具13之管部131底面與電子元件21間之間隙排出,或者例如於壓接具13之管部131開設排氣孔(圖未示出)以供排出,亦或者例如壓接具13之管部31僅具有二壓塊部接觸電子元件21 ,氣體可由二壓塊部以外之部位排出,不受限於本實施例。 However, the low-temperature gas discharge method, for example, the gas is discharged from the gap between the bottom surface of the tube 131 of the crimping tool 13 and the electronic component 21, or for example, the tube 131 of the crimping tool 13 is provided with an exhaust hole (not shown) for discharge, or for example, the tube 31 of the crimping tool 13 only has two pressing blocks to contact the electronic component 21. The gas can be discharged from a part other than the two pressing blocks, which is not limited to this embodiment.

請參閱圖5,本發明壓接機構之第二實施例的設計大致相同第一實施例,其差異在於換氣單元於氣體流道141設有第一支流道1481及第二支流道1482,第一支流道1481及第二支流道1482之位置高度可相同或具有位差,於本實施例,第一支流道1481及第二支流道1482之位置高度具有位差。至少一輸送結構包含第一輸送結構及第二輸送結構,第一輸送結構能夠連通第一支流道1481,以供抽氣,第二輸送結構能夠連通第二支流道1482,以供輸送預設溫度氣體。第一輸送結構於承載具12設有第一輸氣道,第一輸氣道連接第一輸送管以供抽氣,第二輸送結構於承載具12設有第二輸氣道,第二輸氣道連接第二輸送管以供輸送預設溫度氣體。第一輸送管及第二輸送管連接至少一控制器,控制器連接抽氣管及供氣管,以供控制變換抽氣或輸送預設溫度氣體。Please refer to FIG. 5 . The design of the second embodiment of the crimping mechanism of the present invention is substantially the same as the first embodiment. The difference is that the ventilation unit is provided with a first branch channel 1481 and a second branch channel 1482 in the gas flow channel 141. The position heights of the first branch channel 1481 and the second branch channel 1482 can be the same or have a position difference. In this embodiment, the position heights of the first branch channel 1481 and the second branch channel 1482 have a position difference. At least one delivery structure includes a first delivery structure and a second delivery structure. The first delivery structure can be connected to the first branch channel 1481 for exhausting gas, and the second delivery structure can be connected to the second branch channel 1482 for delivering gas of a preset temperature. The first delivery structure is provided with a first air delivery channel on the carrier 12, and the first air delivery channel is connected to the first delivery pipe for air extraction. The second delivery structure is provided with a second air delivery channel on the carrier 12, and the second air delivery channel is connected to the second delivery pipe for delivering preset temperature gas. The first delivery pipe and the second delivery pipe are connected to at least one controller, and the controller is connected to the air extraction pipe and the air supply pipe for controlling the change of air extraction or delivery of preset temperature gas.

壓接具13可於承載具12之通孔121作Z方向位移,例如壓接具13可受電子元件之反作用力頂推而作Z方向位移,例如壓接單元以承載驅動源驅動承載具12作Z方向位移,不受限於本實施例。The crimping tool 13 can be displaced in the Z direction in the through hole 121 of the carrier 12. For example, the crimping tool 13 can be displaced in the Z direction by being pushed by the reaction force of the electronic component. For example, the crimping unit drives the carrier 12 to be displaced in the Z direction by a supporting driving source, which is not limited to this embodiment.

於本實施例,移載臂11可帶動壓接單元及換氣單元作Y-Z方向位移。換氣單元之第一輸送結構於承載具12設有呈X方向配置之第一輸氣道1491 ,第一輸氣道1491連通第一輸送管1501以供抽氣,第一輸送管1501連接控制器145,由於控制器145連接抽氣管146及供氣管147,而可控制變換抽氣或輸送預設溫度氣體,因此控制器145可控制第一輸送管1501相通或未相通抽氣管146,而可控制氣體流道141抽氣或未抽氣;第二輸送結構於承載具12設有第二輸氣道1492,第二輸氣道1492與第一輸氣道1491之位置高度具有位差,第二輸氣道1492連接第二輸送管1502以供輸送預設溫度氣體,第二輸送管1502連接控制器145,控制器145控制第二輸送管1502相通或未相通供氣管147,以控制氣體流道141輸送或未輸送預設溫度氣體。壓接單元設置承載驅動源(例如壓缸,圖未示出),以供帶動壓接具13於承載具12之通孔121內作Z方向位移於第一位置或第二位置,使換氣單元之氣體流道141的第一支流道1481連通第一輸氣道1491,或者使氣體流道141的第二支流道1482連通第二輸氣道1492。 In this embodiment, the transfer arm 11 can drive the crimping unit and the ventilation unit to move in the Y-Z direction. The first conveying structure of the ventilation unit is provided with a first air delivery channel 1491 arranged in the X direction on the carrier 12. The first air delivery channel 1491 is connected to the first delivery pipe 1501 for air extraction. The first delivery pipe 1501 is connected to the controller 145. Since the controller 145 is connected to the air extraction pipe 146 and the air supply pipe 147, it can control the change of air extraction or the delivery of the preset temperature gas. Therefore, the controller 145 can control the first delivery pipe 1501 to be connected or not connected to the air extraction pipe 146, and can control whether the gas flow channel 141 is exhausted or not exhausted; the second conveying structure is provided on the carrier 12. Device 12 is provided with a second air supply channel 1492, and the second air supply channel 1492 has a height difference with the first air supply channel 1491. The second air supply channel 1492 is connected to the second delivery pipe 1502 for delivering gas of a preset temperature. The second delivery pipe 1502 is connected to the controller 145. The controller 145 controls whether the second delivery pipe 1502 is connected to or not connected to the air supply pipe 147 to control whether the gas flow channel 141 delivers or not delivers gas of a preset temperature. The press-fit unit is provided with a carrier driving source (e.g., a pressure cylinder, not shown) to drive the press-fit tool 13 to move in the through hole 121 of the carrier 12 in the Z direction to the first position or the second position, so that the first branch channel 1481 of the gas flow channel 141 of the ventilation unit is connected to the first gas supply channel 1491, or the second branch channel 1482 of the gas flow channel 141 is connected to the second gas supply channel 1492.

請參閱圖6~7,壓接機構之移載臂11帶動壓接單元及換氣單元位移至一承載電子元件21之載台(圖未示出),令壓接具13的吸嘴133貼合電子元件21之頂面;壓接單元之承載驅動源(圖未示出)帶動壓接具13於承載具12之通孔121內作Z方向位移至第一位置,使換氣單元之氣體流道141的第一支流道1481連通第一輸氣道1491,並使第二支流道1482與第二輸氣道1492錯位而封閉;控制器145控制第一輸送管1501連通抽氣管146,並關閉供氣管147,由於抽氣管146連接一抽氣設備,以及第一輸送管1501連通第一輸氣道1491一端,而可使抽氣管146經由第一輸送管1501對承載具12之第一輸氣道1491抽氣,第一輸氣道1491之另一端經第一支流道1481而對壓接具13之氣體流道141抽氣,使吸嘴133具有吸力而吸附電子元件21,並使壓接具13之管部131貼合電子元件21之頂面,於移載臂11帶動承載具12及壓接具13作Z方向向上位移時,即可使吸嘴133於載台取出電子元件21,移載臂11再帶動承載具12、壓接具13及電子元件21位移至測試座152之上方。Please refer to Figures 6 and 7. The transfer arm 11 of the crimping mechanism drives the crimping unit and the ventilation unit to move to a carrier (not shown) carrying the electronic component 21, so that the suction nozzle 133 of the crimping tool 13 is attached to the top surface of the electronic component 21; the carrying drive source (not shown) of the crimping unit drives the crimping tool 13 to move to the first position in the Z direction in the through hole 121 of the carrier 12, so that the first branch channel 1481 of the gas flow channel 141 of the ventilation unit is connected to the first air supply channel 1491, and the second branch channel 1482 is misaligned with the second air supply channel 1492 and closed; the controller 145 controls the first delivery pipe 1501 to connect to the exhaust pipe 146, and closes the air supply pipe 147. Since the exhaust pipe 146 is connected to an exhaust device, The first delivery tube 1501 is connected to one end of the first air supply channel 1491, so that the exhaust tube 146 can exhaust air from the first air supply channel 1491 of the carrier 12 through the first delivery tube 1501, and the other end of the first air supply channel 1491 exhausts air from the gas flow channel 141 of the crimping tool 13 through the first branch channel 1481, so that the suction nozzle 133 has suction force to adsorb the electronic component 21, and the tube portion 131 of the crimping tool 13 is attached to the top surface of the electronic component 21. When the transfer arm 11 drives the carrier 12 and the crimping tool 13 to move upward in the Z direction, the suction nozzle 133 can take out the electronic component 21 from the carrier, and the transfer arm 11 then drives the carrier 12, the crimping tool 13 and the electronic component 21 to move to the top of the test seat 152.

於移載臂11帶動承載具12、壓接具13及電子元件21作Z方向向下位移,將電子元件21置入測試座152後,壓接單元之承載驅動源(圖未示出)帶動壓接具13於承載具12之通孔121內作Z方向位移至第二位置,使換氣單元之氣體流道141的第二支流道1482連通第二輸氣道1492,並使第一支流道1481與第一輸氣道1491錯位而封閉;控制器145控制變換第二輸送管1502連通供氣管147,並關閉抽氣管146,以解除吸嘴133之吸力;供氣管147將預設低溫氣體輸送至第二輸送管1502,第二輸送管1502將預設低溫氣體輸送至承載具12內之第二輸氣道1492,第二輸氣道1492經由第二支流道1482將預設低溫氣體輸送至壓接具13之同一氣體流道141,使氣體流道141內之預設低溫氣體直接與壓接具13作熱交換 ,而提高溫度傳導率,以利迅速溫控壓接具13呈預設低溫狀態,壓接具13之管部131將低溫傳導至電子元件21,並搭配氣體流道141將低溫氣體吹送至電子元件21之頂面,而增加低溫氣體與電子元件21之熱交換面積,低溫氣體再排出壓接具13,在壓接具13及低溫氣體之雙重溫控電子元件21的使用狀態下,即可更加迅速使電子元件21於模擬日後低溫環境之測試座152內執行冷測作業。 The transfer arm 11 drives the carrier 12, the crimping tool 13 and the electronic component 21 to move downward in the Z direction. After the electronic component 21 is placed in the test seat 152, the carrier drive source (not shown) of the crimping unit drives the crimping tool 13 to move in the Z direction to the second position in the through hole 121 of the carrier 12, so that the second branch channel 1482 of the gas flow channel 141 of the ventilation unit is connected to the second gas supply channel 1492, and the first branch channel 1481 and the first gas supply channel 1491 are misaligned and closed; the controller 145 controls the conversion of the second The delivery pipe 1502 is connected to the air supply pipe 147 and the exhaust pipe 146 is closed to release the suction force of the suction nozzle 133; the air supply pipe 147 delivers the preset low-temperature gas to the second delivery pipe 1502, and the second delivery pipe 1502 delivers the preset low-temperature gas to the second air delivery channel 1492 in the carrier 12. The second air delivery channel 1492 delivers the preset low-temperature gas to the same gas flow channel 141 of the crimping tool 13 through the second branch flow channel 1482, so that the preset low-temperature gas in the gas flow channel 141 directly exchanges heat with the crimping tool 13. , and improve the temperature conductivity, so as to quickly control the temperature of the crimping tool 13 to a preset low temperature state. The tube 131 of the crimping tool 13 transfers the low temperature to the electronic component 21, and the gas flow channel 141 blows the low temperature gas to the top surface of the electronic component 21, thereby increasing the heat exchange area between the low temperature gas and the electronic component 21. The low temperature gas is then discharged from the crimping tool 13. In the use state of the double temperature control of the electronic component 21 by the crimping tool 13 and the low temperature gas, the electronic component 21 can be more quickly cold tested in the test seat 152 simulating the low temperature environment in the future.

請參閱圖1~4及圖8,本發明壓接機構應用於電子元件作業機,作業機包含機台30、供料裝置40、收料裝置50、測試裝置10、輸送裝置60及中央控制裝置(圖未示出);供料裝置40裝配於機台30,並設有至少一供料器,以容納至少一待測之電子元件;收料裝置50裝配於機台30,並設有至少一收料器 ,以容納至少一已測之電子元件;測試裝置10配置於機台30,包含測試機構及本發明之壓接機構,測試機構設有至少一測試器,以供測試電子元件,本發明壓接機構以供取放及壓接電子元件,並能夠溫控電子元件執行測試作業;於本實施例,測試器設有電性連接之電路板151及具傳輸件(如探針)之測試座152,測試座152以供承置及測試電子元件;輸送裝置60裝配於機台30,並設有至少一輸送器,以輸送電子元件;於本實施例,輸送裝置60設有第一輸送器61,以於供料裝置40之供料器取出待測電子元件,並將待測電子元件移載至第二輸送器62,第二輸送器62將待測電子元件載送至測試裝置10之側方,測試裝置10之壓接機構以移載臂11將承載具12及壓接具13移載至第二輸送器62之上方,並以壓接具13將第二輸送器62之待測電子元件移載至測試座152而執行測試作業,以及將已測電子元件移載至第三輸送器63而載出,第四輸送器64於第三輸送器63取出已測電子元件,並輸送至收料裝置50之收料器處而分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to Figures 1 to 4 and Figure 8. The crimping mechanism of the present invention is applied to an electronic component processing machine, which includes a machine 30, a feeding device 40, a receiving device 50, a testing device 10, a conveying device 60 and a central control device (not shown); the feeding device 40 is mounted on the machine 30 and is provided with at least one feeder to accommodate at least one electronic component to be tested; the receiving device 50 is mounted on the machine 30 and is provided with at least one receiving device , to accommodate at least one tested electronic component; the testing device 10 is arranged on the machine 30, including a testing mechanism and a crimping mechanism of the present invention, the testing mechanism is provided with at least one tester for testing electronic components, the crimping mechanism of the present invention is used for taking and crimping electronic components, and can temperature-control the electronic components to perform testing operations; in this embodiment, the tester is provided with an electrically connected circuit board 151 and a test seat 152 with a transmission component (such as a probe), and the test seat 152 is used to hold and test electronic components; the conveying device 60 is assembled on the machine 30, and is provided with at least one conveyor for conveying electronic components; in this embodiment, the conveying device 60 is provided with a first conveyor 61, which takes out the electronic component to be tested from the feeder of the feeding device 40, and feeds the electronic component to be tested The sub-components are transferred to the second conveyor 62, and the second conveyor 62 carries the electronic components to be tested to the side of the test device 10. The crimping mechanism of the test device 10 uses the transfer arm 11 to transfer the carrier 12 and the crimping tool 13 to the top of the second conveyor 62, and uses the crimping tool 13 to transfer the electronic components to be tested in the second conveyor 62 to the test seat 152 to perform the test operation, and transfer the tested electronic components to the third conveyor 63 for unloading. The fourth conveyor 64 takes out the tested electronic components from the third conveyor 63 and transports them to the receiver of the receiving device 50 for classification and storage; the central control device (not shown) is used to control and integrate the actions of each device to perform automated operations and achieve practical benefits of improving operation efficiency.

測試裝置10 移載臂11 承載具12 通孔121 壓接具13 管部131 容置空間132 吸嘴133 氣體流道141 支流道142 輸氣道143 輸送管144 控制器145 抽氣管146 供氣管147 第一支流道1481 第二支流道1482 第一輸氣道1491 第二輸氣道1492 第一輸送管1501 第二輸送管1502 電路板151 測試座152 電子元件21 機台30 供料裝置40 收料裝置50 輸送裝置60 第一輸送器61 第二輸送器62 第三輸送器63 第四輸送器64 Test device 10 Transfer arm 11 Carrier 12 Through hole 121 Crimping device 13 Tube 131 Accommodation space 132 Suction nozzle 133 Gas flow channel 141 Branch channel 142 Air supply channel 143 Delivery pipe 144 Controller 145 Exhaust pipe 146 Air supply pipe 147 First branch channel 1481 Second branch channel 1482 First air supply channel 1491 Second air supply channel 1492 First delivery pipe 1501 Second delivery pipe 1502 Circuit board 151 Test seat 152 Electronic component 21 Machine 30 Feeding device 40 Receiving device 50 Delivery device 60 First conveyor 61 Second conveyor 62 Third conveyor 63 Fourth conveyor 64

圖1:本發明壓接機構第一實施例之示意圖。 圖2:本發明壓接機構應用於測試裝置之示意圖。 圖3至圖4:本發明壓接機構之使用示意圖。 圖5:本發明壓接機構第二實施例之示意圖。 圖6至圖7:本發明壓接機構之使用示意圖。 圖8:本發明測試裝置應用於作業機之示意圖。 Figure 1: Schematic diagram of the first embodiment of the crimping mechanism of the present invention. Figure 2: Schematic diagram of the crimping mechanism of the present invention applied to a test device. Figures 3 to 4: Schematic diagrams of the use of the crimping mechanism of the present invention. Figure 5: Schematic diagram of the second embodiment of the crimping mechanism of the present invention. Figures 6 to 7: Schematic diagrams of the use of the crimping mechanism of the present invention. Figure 8: Schematic diagram of the test device of the present invention applied to a working machine.

移載臂11 承載具12 通孔121 壓接具13 氣體流道141 控制器145 抽氣管146 供氣管147 第一支流道1481 第二支流道1482 第一輸氣道1491 第二輸氣道1492 第一輸送管1501 第二輸送管1502 Transfer arm 11 Carrier 12 Through hole 121 Press fitting 13 Gas flow channel 141 Controller 145 Air extraction pipe 146 Air supply pipe 147 First branch flow channel 1481 Second branch flow channel 1482 First air supply channel 1491 Second air supply channel 1492 First delivery pipe 1501 Second delivery pipe 1502

Claims (8)

一種壓接機構,包含:架置器;壓接單元:裝配於該架置器,並設有至少一承載具,以供裝配至少一具有吸嘴之壓接具,而取放及壓接電子元件,該壓接單元設有至少一承載驅動源,以供驅動該壓接具於該承載具內位移;換氣單元:於該壓接具設有至少一相通該吸嘴之氣體流道,並設有相通該氣體流道之第一支流道及第二支流道,該換氣單元設有第一輸送結構及第二輸送結構,該第一輸送結構設有相通之第一輸氣道及第一輸送管,該第一輸送管連接抽氣管,該第二輸送結構設有相通第二輸氣道及第二輸送管,該第二輸送管連接供氣管,於該壓接具位移而變換該第一支流道相通該第一輸氣道,能夠使該壓接具之該氣體流道抽氣而拾取該電子元件,或者於該壓接具位移壓接該電子元件,而變換該第二支流道相通該第二輸氣道,能夠使該氣體流道朝向該電子元件吹送預設溫度氣體而溫控。 A crimping mechanism comprises: a mounter; a crimping unit: assembled on the mounter and provided with at least one carrier for assembling at least one crimping tool with a suction nozzle to pick up and crimp electronic components, the crimping unit is provided with at least one carrier driving source for driving the crimping tool to move in the carrier; a ventilation unit: the crimping tool is provided with at least one gas flow channel connected to the suction nozzle, and is provided with a first branch flow channel and a second branch flow channel connected to the gas flow channel, the ventilation unit is provided with a first conveying structure and a second conveying structure, the first conveying structure is provided with There are a first gas delivery channel and a first delivery pipe connected to each other, the first delivery pipe is connected to the exhaust pipe, the second delivery structure is provided with a second gas delivery channel and a second delivery pipe connected to the air supply pipe, when the crimping tool is displaced, the first branch flow channel is changed to be connected to the first gas delivery channel, so that the gas flow channel of the crimping tool can be exhausted to pick up the electronic component, or when the crimping tool is displaced to crimp the electronic component, the second branch flow channel is changed to be connected to the second gas delivery channel, so that the gas flow channel can blow a preset temperature gas toward the electronic component for temperature control. 如請求項1所述之壓接機構,其該換氣單元之該第一支流道及該第二支流道之位置高度具有位差。 As in the crimping mechanism described in claim 1, the first branch flow channel and the second branch flow channel of the ventilation unit have a height difference. 如請求項1所述之壓接機構,其該壓接單元之該壓接具的該氣體流道呈Z方向配置,該第一支流道及該第二支流道呈X方向配置。 As described in claim 1, the gas flow channel of the crimping tool of the crimping unit is arranged in the Z direction, and the first branch flow channel and the second branch flow channel are arranged in the X direction. 如請求項1所述之壓接機構,其該換氣單元之該第一輸送管及該第二輸送管連接至少一控制器,該控制器連接該抽氣管及該供氣管,以供控制抽氣或輸送預設溫度氣體。 As described in claim 1, the first delivery pipe and the second delivery pipe of the ventilation unit are connected to at least one controller, and the controller is connected to the exhaust pipe and the air supply pipe to control the exhaust or delivery of preset temperature gas. 如請求項1所述之壓接機構,其該承載具設有至少一容置部,以供容置該壓接具。 The crimping mechanism as described in claim 1, wherein the carrier is provided with at least one receiving portion for receiving the crimping tool. 如請求項1所述之壓接機構,其該架置器可作至少一方向位移。 The crimping mechanism described in claim 1, wherein the mount can be displaced in at least one direction. 一種測試裝置,包含:測試機構:設有至少一測試器,以供測試電子元件;至少一如請求項1所述之壓接機構:以供取放及壓接該電子元件,並能夠溫控該電子元件執行測試作業。 A testing device, comprising: a testing mechanism: equipped with at least one tester for testing electronic components; at least one crimping mechanism as described in claim 1: for taking, placing and crimping the electronic components, and capable of temperature-controlling the electronic components to perform testing operations. 一種作業機,包含:機台;供料裝置:配置於該機台,並設有至少一供料器,以供容置至少一待測電子元件;收料裝置:配置於該機台,並設有至少一收料器,以供容置至少一已測電子元件;至少一如請求項7所述之測試裝置:配置於該機台;輸送裝置:配置於該機台,並設有至少一輸送器,以供輸送電子元件;中央控制裝置:以控制及整合各裝置作動而執行自動化作業。 A processing machine comprises: a machine; a feeding device: arranged on the machine and provided with at least one feeder for accommodating at least one electronic component to be tested; a receiving device: arranged on the machine and provided with at least one receiver for accommodating at least one electronic component that has been tested; at least one testing device as described in claim 7: arranged on the machine; a conveying device: arranged on the machine and provided with at least one conveyor for conveying electronic components; a central control device: for controlling and integrating the actions of various devices to perform automated operations.
TW112101604A 2023-01-13 2023-01-13 Pressing mechanism, testing device, and processing machine TWI849689B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201447325A (en) * 2013-04-23 2014-12-16 Seiko Epson Corp Processor and inspection device
CN107884698A (en) * 2016-09-29 2018-04-06 精工爱普生株式会社 Electronic component handling apparatus and electronic component inspection device
TWM615381U (en) * 2021-01-20 2021-08-11 捷創科技股份有限公司 Electronic component testing device with heat dissipation and automatic calibration functions

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201447325A (en) * 2013-04-23 2014-12-16 Seiko Epson Corp Processor and inspection device
CN107884698A (en) * 2016-09-29 2018-04-06 精工爱普生株式会社 Electronic component handling apparatus and electronic component inspection device
TWM615381U (en) * 2021-01-20 2021-08-11 捷創科技股份有限公司 Electronic component testing device with heat dissipation and automatic calibration functions

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