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TWI840267B - Ingot cutting equipment - Google Patents

Ingot cutting equipment Download PDF

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Publication number
TWI840267B
TWI840267B TW112124595A TW112124595A TWI840267B TW I840267 B TWI840267 B TW I840267B TW 112124595 A TW112124595 A TW 112124595A TW 112124595 A TW112124595 A TW 112124595A TW I840267 B TWI840267 B TW I840267B
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ingot
wire
cutting
wafer
cutting device
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TW112124595A
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Chinese (zh)
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TW202502505A (en
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林岳鋒
蔡明義
嚴仕育
劉萓姗
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國立勤益科技大學
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Abstract

一種晶錠切割裝置,其包含有一晶錠固定裝置與一線切割裝置,其中,所述晶錠固定裝置具有一導軌,該導軌一側設有一固定之固定端,該導軌上另一側更設有一可沿所述導軌移動之活動端,所述固定端設有一轉軸部,該轉軸部上設有一吸取部,所述活動端上可固定設置一晶錠,該晶錠設置於所述活動端與該固定端間,並以該吸取部真空吸附所述晶錠之一端,且所述轉軸部可進行轉動而帶動該吸取部進行旋轉,所述線切割裝置具有一可二維移動之送線器,以該送線器持續輸送一切割線,該切割線是一鑽石線,且所述線切割裝置具有一輸液管用以噴灑切削液。 A wafer cutting device includes a wafer fixing device and a wire cutting device, wherein the wafer fixing device has a guide rail, a fixed end is provided on one side of the guide rail, and a movable end that can move along the guide rail is provided on the other side of the guide rail, the fixed end is provided with a rotating shaft portion, and a suction portion is provided on the rotating shaft portion, and a wafer can be fixedly arranged on the movable end, the wafer is arranged between the movable end and the fixed end, and one end of the wafer is vacuum-absorbed by the suction portion, and the rotating shaft portion can be rotated to drive the suction portion to rotate, the wire cutting device has a wire feeder that can move in two dimensions, and the wire feeder continuously feeds a cutting wire, the cutting wire is a diamond wire, and the wire cutting device has a liquid infusion tube for spraying cutting fluid.

Description

晶錠切割裝置 Ingot cutting device

本發明係有關於一種晶錠切割裝置,尤指一種改善加工精度且能夠應用於較高硬度的晶錠切割裝置。 The present invention relates to a wafer cutting device, in particular to a wafer cutting device that improves processing accuracy and can be applied to wafers with higher hardness.

按,半導體業蓬勃發展,由於電子產品廣泛的被消費運用,晶片的需求量也有爆炸式的成長,半導體產業鏈在我國也有著相當重要的地位,晶圓代工便是半導體產業當中的基礎,而晶圓主要以矽做為原料製成,為了達到晶圓指定的半徑,在兼顧成本與品質的考量下常使用直拉法先製成圓棒狀的晶錠再進行切割。 According to the report, the semiconductor industry is booming. Due to the widespread consumption and application of electronic products, the demand for chips has also exploded. The semiconductor industry chain also plays a very important role in our country. Wafer foundry is the foundation of the semiconductor industry. Wafers are mainly made of silicon as raw materials. In order to achieve the specified radius of the wafer, the Czochralski method is often used to make round rod-shaped crystal ingots and then cut them, taking into account both cost and quality.

習知的晶錠切割裝置,如中華民國第I786740號專利「晶碇切割裝置及晶碇切割方法」,是以一驅動單元驅動一晶碇往切割線移動且驅動切割線往復移動,從而達到切割效果,配合其圖式觀之不難看出,其加工晶碇的方式並沒有辦法進行高精度的切割,且使用複數之切割線時雖然能提高加工效率,但是不注重精度可能導致良率不加反而降低加工效率,且沒辦法應對較高硬度的晶碇。 Known ingot cutting devices, such as the Republic of China Patent No. I786740 "Ingot Cutting Device and Ingot Cutting Method", use a driving unit to drive an ingot to move toward a cutting line and drive the cutting line to move back and forth, thereby achieving a cutting effect. It is not difficult to see from the diagram that the ingot processing method cannot achieve high-precision cutting, and although the use of multiple cutting lines can improve processing efficiency, the lack of attention to precision may result in a decrease in processing efficiency instead of an increase in yield, and it cannot handle ingots with higher hardness.

故本發明人即有鑑於此,乃思及發明的意念,遂以多年的經驗加以設計,經多方探討並試作樣品試驗,及多次修正改良,乃推出本發明。 Therefore, the inventor of this invention took this into consideration and came up with the idea of invention. He then designed it based on his years of experience, conducted many discussions and conducted sample tests, and made many revisions and improvements before launching this invention.

本發明所欲解決之技術問題在於針對現有技術存在的上述缺失,提供一種改善加工精度且能夠應用於較高硬度的晶錠切割裝置。 The technical problem that the present invention aims to solve is to provide a device for cutting ingots with improved processing accuracy and capable of being applied to the above-mentioned deficiencies of the existing technology.

解決問題之技術特點: Technical features for solving the problem:

本發明提供一種晶錠切割裝置,其包含有一晶錠固定裝置與一線切割裝置,其中,所述晶錠固定裝置具有一導軌,該導軌一側設有一固定之固定端,該導軌上另一側更設有一可沿所述導軌移動之活動端,所述固定端設有一轉軸部,該轉軸部上設有一吸取部,所述活動端上可固定設置一晶錠,該晶錠設置於所述活動端與該固定端間,並以該吸取部真空吸附所述晶錠之一端,且所述轉軸部可進行轉動而帶動該吸取部進行旋轉;所述線切割裝置具有一可二維移動之送線器,以該送線器持續輸送一切割線,該切割線是一鑽石線,且所述線切割裝置具有一輸液管用以噴灑切削液;藉由上述結構,移動所述活動端移動該晶錠將其一端貼於該吸取部上進行真空吸附,所述轉軸部進行旋轉而帶動該晶錠旋轉,所述送線器進行移動令該切割線接觸所述晶錠進行切割,該送線器移動直至完成切割,所述晶錠吸附於該吸取部上之一端形成一晶圓,移動所述活動端移開該晶錠後使用者可將所述晶圓從該吸取部上取下,而後再次進行切割。 The present invention provides a wafer cutting device, which includes a wafer fixing device and a wire cutting device, wherein the wafer fixing device has a guide rail, a fixed end is provided on one side of the guide rail, and a movable end that can move along the guide rail is provided on the other side of the guide rail, the fixed end is provided with a rotating shaft portion, and a suction portion is provided on the rotating shaft portion, and a wafer can be fixedly arranged on the movable end, and the wafer is arranged between the movable end and the fixed end, and one end of the wafer is vacuum-absorbed by the suction portion, and the rotating shaft portion can be rotated to drive the suction portion to rotate; the wire cutting device has a two-dimensionally movable feeding portion. The wire feeder continuously feeds a cutting wire, which is a diamond wire, and the wire cutting device has a liquid delivery tube for spraying cutting fluid; through the above structure, the movable end is moved to move the ingot so that one end of the ingot is attached to the suction part for vacuum adsorption, the shaft part rotates to drive the ingot to rotate, the wire feeder moves to make the cutting wire contact the ingot for cutting, the wire feeder moves until the cutting is completed, the ingot is adsorbed on one end of the suction part to form a wafer, and after the movable end is moved to remove the ingot, the user can remove the wafer from the suction part and then cut it again.

進一步地,所述晶錠為4H-SiC晶柱。 Furthermore, the ingot is a 4H-SiC crystal column.

進一步地,所述導軌設有至少一微調部用以調整滑移該導軌。 Furthermore, the guide rail is provided with at least one fine-tuning portion for adjusting the sliding of the guide rail.

進一步地,所述線切割裝置設有一超音波裝置用以震動去除該切割線上的碎屑。 Furthermore, the wire cutting device is provided with an ultrasonic device for vibrating and removing debris on the cutting wire.

本發明的主要目的在於,所述晶錠是透過該線切割裝置進行單一的切割,而有較高的精度,從而避免加工上的誤差影響良率,且以所述吸取部能夠吸附該晶錠,亦可將所述晶錠切割後產生的該晶圓5吸附,而能增進加工的效率,且所述轉軸部可進行轉動而帶動該晶錠進行旋轉,又該送線器持續輸送之所述切割線,配合材質為鑽石線之該切割線,而能夠切割材質較為堅硬之該晶錠。 The main purpose of the present invention is that the ingot is cut individually by the wire cutting device with higher precision, thereby avoiding the processing error affecting the yield rate, and the suction part can absorb the ingot, and can also absorb the wafer 5 produced after the ingot is cut, so as to improve the processing efficiency, and the shaft part can rotate to drive the ingot to rotate, and the cutting wire continuously transported by the wire feeder, in conjunction with the cutting wire made of diamond wire, can cut the ingot with a harder material.

其他目的、優點和本發明的新穎特性將從以下詳細的描述與相關的附圖更加顯明。 Other objects, advantages and novel features of the present invention will become more apparent from the following detailed description and the related drawings.

本發明部分: Parts of this invention:

(10):晶錠固定裝置 (10): Crystal ingot fixing device

(11):導軌 (11):Guide rails

(12):固定端 (12): Fixed end

(121):轉軸部 (121): Rotating shaft

(122):吸取部 (122): Absorption Department

(13):活動端 (13):Activity terminal

(14):晶錠 (14): Crystal Tablet

(15):晶圓 (15): Wafer

(16):微調部 (16): Fine-tuning department

(20):線切割裝置 (20): Wire cutting device

(21):送線器 (21): Wire feeder

(22):切割線 (22): Cutting line

(23):輸液管 (23): Infusion tube

(24):超音波裝置 (24):Ultrasound device

〔第1圖〕係本發明未固定晶錠狀態之立體圖。 [Figure 1] is a three-dimensional diagram of the present invention in an unfixed crystal state.

〔第2圖〕係本發明固定晶錠狀態之立體圖。 [Figure 2] is a three-dimensional diagram of the fixed crystal state of the present invention.

〔第3圖〕係本發明之俯視圖。 [Figure 3] is a top view of the present invention.

〔第4圖〕係本發明線切割裝置平移之示意圖。 [Figure 4] is a schematic diagram of the translation of the wire cutting device of the present invention.

〔第5圖〕係本發明線切割裝置進行切割方向移動之示意圖。 [Figure 5] is a schematic diagram of the wire cutting device of the present invention moving in the cutting direction.

〔第6圖〕係本發明線切割裝置進行切割方向移動配合轉軸部旋轉之示意圖。 [Figure 6] is a schematic diagram of the wire cutting device of the present invention moving in the cutting direction and cooperating with the rotation of the shaft.

〔第7圖〕係本發明進行切割之示意圖。 [Figure 7] is a schematic diagram of the cutting process of the present invention.

〔第8圖〕係本發明進行切割之俯視視角示意圖。 [Figure 8] is a top view diagram of the cutting process of the present invention.

〔第9圖〕係本發明加工獲得晶片之示意圖。 [Figure 9] is a schematic diagram of the chip obtained by processing of the present invention.

〔第10圖〕係本發明重新固定晶錠狀態之示意圖。 [Figure 10] is a schematic diagram of the re-fixed crystal state of the present invention.

為使 貴審查委員對本發明之目的、特徵及功效能夠有更進一步之瞭解與認識,以下茲請配合【圖式簡單說明】詳述如後: In order to enable the review committee to have a deeper understanding and knowledge of the purpose, features and effects of this invention, please refer to the [Simple Diagram Description] for details as follows:

先請由第1圖與第2圖所示觀之,本發明提供一種晶錠切割裝置,其包含有一晶錠固定裝置(10)與一線切割裝置(20),其中,所述晶錠固定裝置(10)具有一導軌(11),該導軌(11)一側設有一固定之固定端(12),該導軌(11)上另一側更設有一可沿所述導軌(11)移動之活動端(13),所述固定端(12)設有一轉軸部(121),該轉軸部(121)上設有一吸取部(122),所述活動端(13)上可固定設置一晶錠(14),該晶錠(14)設置於所述活動端(13)與該固定端(12)間,並以該吸取部(122)真空吸附所述晶錠(14)之一端,且所述轉軸部(121)可進行轉動而帶動該吸取部(122)進行旋轉;所述線切割裝置(20)具有一可二維移動之送線器(21),以該送線器(21)持續輸送一切割線(22),該切割線(22)是一鑽石線,且所述線切割裝置(20)具有一輸液管(23)用以噴灑切削液。 First, please refer to FIG. 1 and FIG. 2. The present invention provides a wafer cutting device, which includes a wafer fixing device (10) and a wire cutting device (20), wherein the wafer fixing device (10) has a guide rail (11), one side of the guide rail (11) is provided with a fixed end (12), and the other side of the guide rail (11) is further provided with a movable end (13) that can move along the guide rail (11), the fixed end (12) is provided with a rotating shaft portion (121), the rotating shaft portion (121) is provided with a suction portion (122), and the movable end (13) can be fixed on the guide rail (11). A crystal ingot (14) is arranged between the movable end (13) and the fixed end (12), and the suction part (122) vacuum absorbs one end of the crystal ingot (14), and the rotating shaft part (121) can rotate to drive the suction part (122) to rotate; the wire cutting device (20) has a wire feeder (21) that can move in two dimensions, and the wire feeder (21) continuously feeds a cutting wire (22), and the cutting wire (22) is a diamond wire, and the wire cutting device (20) has a liquid delivery pipe (23) for spraying cutting fluid.

由第6圖到第10圖所示觀之,藉由上述結構,移動所述活動端(13)移動該晶錠(14)將其一端貼於該吸取部(122)上進行真空吸附,所述轉軸部(121)進行旋轉而帶動該晶錠(14)旋轉,所述送線器(21)進行移動令該切割線(22)接觸所述晶錠(14)進行切割,該送線器(21)移動直至完成切割,所述晶錠(14)吸附於該吸取部(122)上之一端形成一晶圓(15),移動所述活動端(13)移開該晶錠(14)後使用者可將所述晶圓(15)從該吸取部(122)上取下,而後再次進行切割。 As shown in Figures 6 to 10, by means of the above structure, the movable end (13) is moved to move the ingot (14) so that one end thereof is attached to the suction portion (122) for vacuum suction, the shaft portion (121) is rotated to drive the ingot (14) to rotate, the wire feeder (21) is moved to make the cutting wire (22) contact the ingot (14) for cutting, the wire feeder (21) is moved until the cutting is completed, the ingot (14) is adsorbed on one end of the suction portion (122) to form a wafer (15), and after the movable end (13) is moved to remove the ingot (14), the user can remove the wafer (15) from the suction portion (122) and then cut it again.

本發明提供一種晶錠切割裝置,其中,所述晶錠(14)為4H-SiC晶柱,其有著較高的硬度。 The present invention provides a crystal ingot cutting device, wherein the crystal ingot (14) is a 4H-SiC crystal column, which has a relatively high hardness.

本發明提供一種晶錠切割裝置,其中,所述吸取部(122)是 一真空吸盤。 The present invention provides a wafer cutting device, wherein the suction portion (122) is a vacuum suction cup.

本發明提供一種晶錠切割裝置,其中,所述導軌(11)設有至少一微調部(16)用以調整滑移該導軌(11)。 The present invention provides a wafer cutting device, wherein the guide rail (11) is provided with at least one fine adjustment portion (16) for adjusting the sliding movement of the guide rail (11).

本發明提供一種晶錠切割裝置,其中,所述線切割裝置(20)設有一超音波裝置(24)用以震動去除該切割線(22)上的碎屑。 The present invention provides a wafer cutting device, wherein the wire cutting device (20) is provided with an ultrasonic device (24) for vibrating and removing debris on the cutting wire (22).

其詳細使用態樣,請由第3圖與第4圖所示觀之,由於所述送線器(21)可二維移動,該送線器(21)可以平移決定從何處切割該晶錠(14),而能調整切割後得到之所述晶圓(15)的厚度,由第5圖到第7圖所示觀之,且該送線器(21)移動令所述切割線(22)接觸該晶錠(14)進行切割,所述切割線(22)持續輸送配合該轉軸部(121)帶動所述晶錠(14),從而有效精確的進行切割,又該切割線(22)是一鑽石線,也能有效應對硬度較高之所述晶錠(14),期間所述輸液管(23)噴灑切削液用以降溫保持精度與品質,由第8圖到第10圖所示觀之,切割完畢後移開所述送線器(21)並退開該活動端(13)及該晶錠(14),並從所述吸取部(122)上取出該晶圓(15),之後再次推進該活動端(13)及該晶錠(14)抵於所述吸取部(122)上,再次以該吸取部(122)進行真空吸附,重複上述步驟進行切割生產該晶圓(15),以該導軌配合所述轉軸部(121)、活動端(13),而能達到第四軸向的加工。 The detailed usage is shown in FIG. 3 and FIG. 4. Since the wire feeder (21) can move in two dimensions, the wire feeder (21) can be moved horizontally to determine where to cut the crystal (14), and the thickness of the wafer (15) obtained after cutting can be adjusted. As shown in FIG. 5 to FIG. 7, the wire feeder (21) moves to make the cutting wire (22) contact the crystal (14) for cutting. The cutting wire (22) continuously transports and cooperates with the rotating shaft (121) to drive the crystal (14), so as to effectively and accurately cut. Moreover, the cutting wire (22) is a diamond wire, which can also effectively deal with the crystal (14) with higher hardness. ), during which the liquid delivery tube (23) sprays cutting fluid to cool down and maintain accuracy and quality. As shown in Figures 8 to 10, after cutting, the wire feeder (21) is removed and the movable end (13) and the crystal (14) are withdrawn, and the wafer (15) is taken out from the suction part (122). Then, the movable end (13) and the crystal (14) are pushed against the suction part (122) again, and the suction part (122) is used for vacuum adsorption again. The above steps are repeated to cut and produce the wafer (15). The guide rail cooperates with the rotating shaft part (121) and the movable end (13), so as to achieve the processing of the fourth axis.

本發明提供之晶錠切割裝置具有以下功效:所述晶錠(14)是透過該線切割裝置(20)進行單一的切割,而有較高的精度,從而避免加工上的誤差影響良率,且以所述吸取部(122)能夠吸附該晶錠(14),亦可將所述晶錠(14)切割後產生的該晶圓(15)吸附,而能增進加工的效率,且所述轉軸部(121)可進行轉動而帶動該晶錠(14)進行旋轉,又該送線器(21)持續輸送之所 述切割線(22),配合材質為鑽石線之該切割線(22),而能夠切割材質較為堅硬之該晶錠(14)。 The ingot cutting device provided by the present invention has the following effects: the ingot (14) is cut individually by the wire cutting device (20) with high precision, thereby avoiding the influence of processing errors on the yield rate, and the suction part (122) can absorb the ingot (14) and the wafer (15) generated after the ingot (14) is cut, thereby improving the processing efficiency, and the shaft part (121) can rotate to drive the ingot (14) to rotate, and the wire feeder (21) continuously transports the cutting wire (22), which is made of diamond wire, to cut the ingot (14) with a harder material.

綜上所述,本發明確實已達突破性之結構設計,而具有改良之發明內容,同時又能夠達到產業上之利用性與進步性,且本發明未見於任何刊物,亦具新穎性,當符合專利法相關法條之規定,爰依法提出發明專利申請,懇請 鈞局審查委員授予合法專利權,至為感禱。 In summary, this invention has indeed achieved a breakthrough structural design and has improved invention content. At the same time, it can achieve industrial applicability and progress. Moreover, this invention has not been seen in any publication and is also novel. It should comply with the relevant provisions of the Patent Law. Therefore, we have filed an invention patent application in accordance with the law and pleaded with the review committee of the Jun Bureau to grant legal patent rights. We are very grateful.

唯以上所述者,僅為本發明之一較佳實施例而已,當不能以之限定本發明實施之範圍;即大凡依本發明申請專利範圍所作之均等變化與修飾,皆應仍屬本發明專利涵蓋之範圍內。 However, the above is only a preferred embodiment of the present invention and should not be used to limit the scope of implementation of the present invention; that is, all equivalent changes and modifications made according to the scope of the patent application of the present invention should still fall within the scope of the patent of the present invention.

(10):晶錠固定裝置 (10): Crystal ingot fixing device

(11):導軌 (11):Guide rails

(12):固定端 (12): Fixed end

(121):轉軸部 (121): Rotating shaft

(122):吸取部 (122): Absorption Department

(13):活動端 (13):Activity terminal

(14):晶錠 (14): Crystal Tablet

(16):微調部 (16): Fine-tuning department

(20):線切割裝置 (20): Wire cutting device

(21):送線器 (21): Wire feeder

(22):切割線 (22): Cutting line

(23):輸液管 (23): Infusion tube

(24):超音波裝置 (24):Ultrasound device

Claims (5)

一種晶錠切割裝置,其包含有一晶錠固定裝置與一線切割裝置,其中: A wafer cutting device includes a wafer fixing device and a wire cutting device, wherein: 所述晶錠固定裝置具有一導軌,該導軌一側設有一固定之固定端,該導軌上另一側更設有一可沿所述導軌移動之活動端,所述固定端設有一轉軸部,該轉軸部上設有一吸取部,所述活動端上可固定設置一晶錠,該晶錠設置於所述活動端與該固定端間,並以該吸取部真空吸附所述晶錠之一端,且所述轉軸部可進行轉動而帶動該吸取部進行旋轉; The crystal ingot fixing device has a guide rail, a fixed end is provided on one side of the guide rail, and a movable end that can move along the guide rail is provided on the other side of the guide rail. The fixed end is provided with a rotating shaft portion, and a suction portion is provided on the rotating shaft portion. A crystal ingot can be fixedly arranged on the movable end, and the crystal ingot is arranged between the movable end and the fixed end, and one end of the crystal ingot is vacuum-absorbed by the suction portion, and the rotating shaft portion can be rotated to drive the suction portion to rotate; 所述線切割裝置具有一可二維移動之送線器,以該送線器持續輸送一切割線,該切割線是一鑽石線,且所述線切割裝置具有一輸液管用以噴灑切削液; The wire cutting device has a two-dimensionally movable wire feeder, which continuously feeds a cutting wire, which is a diamond wire, and the wire cutting device has a fluid delivery tube for spraying cutting fluid; 藉由上述結構,移動所述活動端移動該晶錠將其一端貼於該吸取部上進行真空吸附,所述轉軸部進行旋轉而帶動該晶錠旋轉,所述送線器進行移動令該切割線接觸所述晶錠進行切割,該送線器移動直至完成切割,所述晶錠吸附於該吸取部上之一端形成一晶圓,移動所述活動端移開該晶錠後使用者可將所述晶圓從該吸取部上取下,而後再次進行切割。 By means of the above structure, the movable end is moved to move the ingot so that one end of the ingot is attached to the suction part for vacuum suction, the shaft part is rotated to drive the ingot to rotate, the wire feeder is moved to make the cutting wire contact the ingot for cutting, the wire feeder is moved until the cutting is completed, the ingot is adsorbed on one end of the suction part to form a wafer, and after the movable end is moved to remove the ingot, the user can remove the wafer from the suction part and then cut it again. 如請求項1所述之晶錠切割裝置,其中,所述晶錠為4H-SiC晶柱。 The ingot cutting device as described in claim 1, wherein the ingot is a 4H-SiC crystal column. 如請求項1所述之晶錠切割裝置,其中,所述吸取部是一真空吸盤。 The wafer cutting device as described in claim 1, wherein the suction portion is a vacuum suction cup. 如請求項1所述之晶錠切割裝置,其中,所述導軌設有至少一微調部用以調整滑移該導軌。 The ingot cutting device as described in claim 1, wherein the guide rail is provided with at least one fine adjustment portion for adjusting the sliding of the guide rail. 如請求項1所述之晶錠切割裝置,其中,所述線切割裝置設有一超音波裝置用以震動去除該切割線上的碎屑。 The ingot cutting device as described in claim 1, wherein the wire cutting device is provided with an ultrasonic device for vibrating and removing debris on the cutting wire.
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08258037A (en) * 1995-03-27 1996-10-08 Sharp Corp Multi-wire saw device and slicing method using the same
JP2003011117A (en) * 2001-07-05 2003-01-15 Canon Inc Columnar base material cutting method, columnar base material cutting device, ingot cutting method using light, ingot cutting device using light, and wafer manufacturing method
CN103706954A (en) * 2014-01-10 2014-04-09 中国科学院长春光学精密机械与物理研究所 Low Cut Loss Laser Cutting Saw
US20150375317A1 (en) * 2013-03-22 2015-12-31 Korea Institute Of Insdustrial Technology, Wire saw
US20210060818A1 (en) * 2016-02-22 2021-03-04 Sumitomo Electric Industries, Ltd. Method for manufacturing silicon carbide substrate, method for manufacturing silicon carbide epitaxial substrate, and method for manufacturing silicon carbide semiconductor device
TW202317346A (en) * 2021-10-20 2023-05-01 國立中央大學 A method of quick slicing of ingot column

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08258037A (en) * 1995-03-27 1996-10-08 Sharp Corp Multi-wire saw device and slicing method using the same
JP2003011117A (en) * 2001-07-05 2003-01-15 Canon Inc Columnar base material cutting method, columnar base material cutting device, ingot cutting method using light, ingot cutting device using light, and wafer manufacturing method
US20150375317A1 (en) * 2013-03-22 2015-12-31 Korea Institute Of Insdustrial Technology, Wire saw
CN103706954A (en) * 2014-01-10 2014-04-09 中国科学院长春光学精密机械与物理研究所 Low Cut Loss Laser Cutting Saw
US20210060818A1 (en) * 2016-02-22 2021-03-04 Sumitomo Electric Industries, Ltd. Method for manufacturing silicon carbide substrate, method for manufacturing silicon carbide epitaxial substrate, and method for manufacturing silicon carbide semiconductor device
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TWI803019B (en) * 2021-10-20 2023-05-21 國立中央大學 A method of quick slicing of ingot column

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