TWI724749B - Inspection equipment for glass substrate and method thereof - Google Patents
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本發明涉及一種用於檢測一具有複數個數據線、複數個閘極線、一水平邊緣與一垂直邊緣之玻璃基板之一檢測設備及其方法,尤指一種包括一水平感測單元,具有至少兩個第一磁阻感測器,以及一垂直感測單元,具有至少兩個第二磁阻感測器之一檢測設備及其檢測方法。 The invention relates to a detection device and a method for detecting a glass substrate with a plurality of data lines, a plurality of gate lines, a horizontal edge and a vertical edge, and in particular to a detection device including a horizontal sensing unit having at least Two first magnetoresistive sensors and a vertical sensing unit are provided with one of at least two second magnetoresistive sensors detecting equipment and its detecting method.
目前用於檢測玻璃基板的開路/短路/跨接的檢測設備,其檢出開路/短路/跨接的精確度仍有待提升,俾能避免習知技藝中,磁阻感測器的電流偵測受到提供電壓給閘極線或數據線之訊號源所產生磁場干擾的間題,以進一步地減少瑕疵與降低生產成本。如何改善現存用於檢查玻璃基板的開路/短路/跨接的檢測設備的功能,使得玻璃基板上電路的開路/短路/跨接的檢出率能被提高,是一值得深思的問題。 The current detection equipment used to detect open/short/bridging of glass substrates still needs to improve the accuracy of detecting open/short/bridging, so as to avoid the current detection of magnetoresistive sensors in the prior art. It is subject to the problem of magnetic field interference generated by the signal source supplying voltage to the gate line or the data line to further reduce defects and reduce production costs. How to improve the function of the existing inspection equipment for inspecting the open/short/bridge of the glass substrate so that the detection rate of the circuit on the glass substrate can be improved, which is a question worth pondering.
職是之故,發明人鑒於習知技術之缺失,乃思及改良發明之意念,終能發明出本案之「玻璃基板檢測設備及其方法」。 For this reason, in view of the lack of conventional technology, the inventor thought and improved the idea of invention, and finally invented the "glass substrate inspection equipment and method" of this case.
本發明的主要目的在於提供一種用於檢測一具有複數個數據線、複數個閘極線、一水平邊緣與一垂直邊緣之玻璃基板之一檢測設備及其方法,該檢測設備包括一具有至少兩個第一磁阻感測器的水平感測單元,以及一具有至少兩個第二磁阻感測器的垂直感測單元,其中該至少兩個第二磁阻感測器用於依序感測兩相鄰閘極線上二感應電流之一第一差值,當該第一差值不為零時,該兩相鄰閘極線的其中之一有一線路異常,以及該至少兩個第一磁阻感測器用於依序感測兩相鄰數據線上二感應電流之一第二差值,當該第二差值不為零時,該兩相鄰數據線的其中之一有一線路異常,以提升玻璃基板上開路、短路及/或跨接等線路異常的檢出率。 The main purpose of the present invention is to provide a detection device and method for detecting a glass substrate with a plurality of data lines, a plurality of gate lines, a horizontal edge and a vertical edge, the detection device including a detection device with at least two A horizontal sensing unit of a first magnetoresistive sensor, and a vertical sensing unit having at least two second magnetoresistive sensors, wherein the at least two second magnetoresistive sensors are used for sequential sensing The first difference of one of the two induced currents on two adjacent gate lines. When the first difference is not zero, one of the two adjacent gate lines has a line abnormality, and the at least two first magnetic The resistance sensor is used to sequentially sense a second difference value of one of the two induced currents on two adjacent data lines. When the second difference value is not zero, one of the two adjacent data lines has an abnormality. Improve the detection rate of circuit abnormalities such as open circuit, short circuit and/or jumper on the glass substrate.
本案之又一主要目的在於提供一種用於檢測一具有複數個數據線、複數個閘極線、一水平邊緣與一垂直邊緣之玻璃基板之一檢測設備,包含一磁阻感測裝置,該磁阻感測裝置包括一水平感測單元,具有至少兩個第一磁阻感測器,以及一垂直感測單元,具有至少兩個第二磁阻感測器,其中當該磁阻感測裝置沿該水平邊緣且垂直於該複數個閘極線移動,和自一外部電源提供一第一電壓給該複數個閘極線時,該至少兩個第二磁阻感測器分別用於依序感測兩相鄰閘極線的二個感測電流之一第一差值,當該第一差值不為零時,該兩相鄰閘極線的其中之一有一第一線路異常,以及當該磁阻感測裝置沿該垂直邊緣且垂直於該複數個數據線移動,和自該外部電源提供一第二電壓 給該複數個數據線時,該至少兩個第一磁阻感測器分別用於依序感測兩相鄰數據線的二個感測電流之一第二差值,當該第二差值不為零時,該兩相鄰數據線的其中之一有一第二線路異常。 Another main purpose of this case is to provide a detection device for detecting a glass substrate with a plurality of data lines, a plurality of gate lines, a horizontal edge and a vertical edge, including a magnetoresistive sensing device, the magnetic The resistance sensing device includes a horizontal sensing unit with at least two first magnetoresistive sensors, and a vertical sensing unit with at least two second magnetoresistive sensors, wherein when the magnetoresistive sensing device When moving along the horizontal edge and perpendicular to the plurality of gate lines, and when a first voltage is provided to the plurality of gate lines from an external power source, the at least two second magnetoresistive sensors are respectively used in sequence Sensing a first difference of one of the two sensing currents of two adjacent gate lines, when the first difference is not zero, one of the two adjacent gate lines has a first line abnormality, and When the magnetoresistive sensing device moves along the vertical edge and perpendicular to the plurality of data lines, and a second voltage is provided from the external power supply When the plurality of data lines are provided, the at least two first magnetoresistive sensors are respectively used to sequentially sense the second difference of one of the two sensing currents of two adjacent data lines, when the second difference When it is not zero, one of the two adjacent data lines has a second line abnormality.
本案之下一主要目的在於提供一種用於檢測一具有複數個數據線與複數個閘極線之玻璃基板之一檢測設備,包含一磁阻感測裝置,該磁阻感測裝置包括一水平感測單元,具有至少兩個第一磁阻感測器,以及一垂直感測單元,具有至少兩個第二磁阻感測器,其中當該磁阻感測裝置依一垂直於該複數個閘極線的方向移動,且該複數個閘極線接收一第一電壓時,該至少兩個第二磁阻感測器用於依序感測兩相鄰閘極線上二感應電流之一第一差值,當該第一差值不為零時,該兩相鄰閘極線的其中之一有一線路異常,以及當該磁阻感測裝置依一垂直於該複數個數據線的方向移動,且該複數個數據線接收一第二電壓時,該至少兩個第一磁阻感測器用於依序感測兩相鄰數據線上二感應電流之一第二差值,當該第二差值不為零時,該兩相鄰數據線的其中之一有一線路異常。 The main purpose of this case is to provide a detection device for detecting a glass substrate with a plurality of data lines and a plurality of gate lines, including a magnetoresistive sensing device, the magnetoresistive sensing device including a level sensor The sensing unit has at least two first magnetoresistive sensors, and a vertical sensing unit has at least two second magnetoresistive sensors, wherein when the magnetoresistive sensing device is perpendicular to the plurality of gates When the direction of the pole line moves, and the plurality of gate lines receive a first voltage, the at least two second magnetoresistive sensors are used to sequentially sense the first difference of one of the two induced currents on two adjacent gate lines When the first difference is not zero, one of the two adjacent gate lines has a line abnormality, and when the magnetoresistive sensing device moves in a direction perpendicular to the plurality of data lines, and When the plurality of data lines receive a second voltage, the at least two first magnetoresistive sensors are used to sequentially sense a second difference between two induced currents on two adjacent data lines. When the second difference is not When it is zero, one of the two adjacent data lines is abnormal.
本案之另一主要目的在於提供一種使用一具有一磁阻感測裝置之檢測設備以檢測一具有複數個數據線與複數個閘極線之玻璃基板之方法,其中該磁阻感測裝置包括一具有至少兩個第一磁阻感測器之水平感測單元與一具有至少兩個第二磁阻感測器之垂直感測單元,該方法包含:當該磁阻感測裝置依一垂直於該複數個閘極線的 方向移動,且由一外部電源提供一第一電壓給該複數個閘極線時,使該至少兩個第二磁阻感測器依序感測兩相鄰閘極線的二個感應電流之一第一差值,其中當該第一差值不為零時,該兩相鄰閘極線的其中之一有一第一線路異常;以及當該磁阻感測裝置依一垂直於該複數個數據線的方向移動,且由該外部電源提供一第二電壓給該複數個數據線時,使該至少兩個第一磁阻感測器依序感測兩相鄰數據線的二個感應電流之一第二差值,其中當該第二差值不為零時,該兩相鄰數據線的其中之一有一第二線路異常。 Another main purpose of this case is to provide a method for detecting a glass substrate with a plurality of data lines and a plurality of gate lines using a detection device with a magnetoresistive sensing device, wherein the magnetoresistive sensing device includes a A horizontal sensing unit with at least two first magnetoresistive sensors and a vertical sensing unit with at least two second magnetoresistive sensors. The method includes: when the magnetoresistive sensing device is perpendicular to Of the multiple gate lines When moving in the direction and an external power supply provides a first voltage to the plurality of gate lines, the at least two second magnetoresistive sensors sequentially sense one of the two induced currents of two adjacent gate lines A first difference, wherein when the first difference is not zero, one of the two adjacent gate lines has a first line abnormality; and when the magnetoresistive sensing device is perpendicular to the plurality of When the direction of the data line moves, and the external power supply provides a second voltage to the plurality of data lines, the at least two first magnetoresistive sensors sequentially sense two induced currents of two adjacent data lines A second difference value, wherein when the second difference value is not zero, one of the two adjacent data lines has a second line abnormality.
本案之再一主要目的在於提供一種使用一具有一磁阻感測裝置以檢測一具有複數個數據線與複數個閘極線之玻璃基板之方法,其中當該玻璃基板置於一檢測平面時,該玻璃基板具一上側、一左側、一下側及一右側、該檢測平面具一訊號源以供電該複數個數據線與該複數個閘極線,俾使之受檢測、且該訊號源置於該左側、該下側為各該閘極線接地之一側及該右側為各該數據線接地之一側,該方法包含:使該磁阻感測裝置位於該玻璃基板上方;使該磁阻感測裝置沿該下側逐一感測該複數個閘極線;以及使該磁阻感測裝置沿該右側逐一感測該複數個數據線。 Another main purpose of this case is to provide a method for detecting a glass substrate with a plurality of data lines and a plurality of gate lines using a magnetoresistive sensing device, wherein when the glass substrate is placed on a detection plane, The glass substrate has an upper side, a left side, a lower side, and a right side. The detection plane has a signal source for supplying power to the plurality of data lines and the plurality of gate lines so as to be detected and the signal source is placed The left side and the lower side are the grounding side of each gate line, and the right side is the grounding side of each data line. The method includes: positioning the magnetoresistive sensing device above the glass substrate; making the magnetoresistive The sensing device senses the plurality of gate lines one by one along the lower side; and the magnetoresistive sensing device senses the plurality of data lines one by one along the right side.
本案之又一主要目的在於提供一種用以檢測一玻璃基板之磁阻感測裝置,其中該玻璃基板具有複數個數據線與複數個閘極線,且該玻璃基板受一訊號源供電,俾使該複數個數據線與該複數個閘極線受檢測,該磁阻感 測裝置包含一第一磁阻感測器,以及一第二磁阻感測器,與該第一磁阻感測器成對設置,且用以成對共同逐一感測該複數個數據線或該複數個閘極線,以分別獲得一第一及一第二感測訊號,以及以該第一及該第二感測訊號之差值,以判斷各該被檢測之相關數據線或閘極線是否正常。 Another main purpose of this case is to provide a magnetoresistive sensing device for detecting a glass substrate, wherein the glass substrate has a plurality of data lines and a plurality of gate lines, and the glass substrate is powered by a signal source to enable The plurality of data lines and the plurality of gate lines are tested, and the magnetoresistive inductance The sensing device includes a first magnetoresistive sensor and a second magnetoresistive sensor, which are arranged in pairs with the first magnetoresistive sensor, and are used to sense the plurality of data lines one by one in pairs. The plurality of gate lines are used to obtain a first and a second sensing signal, respectively, and the difference between the first and the second sensing signal is used to determine each related data line or gate to be detected Whether the line is normal.
本案之下一主要目的在於提供一種用以檢測一基板之磁阻感測裝置,其中該基板具有複數個電路線,且該基板受一訊號源供電,俾使該複數電路線受檢測,該磁阻感測裝置包含二第一磁阻感測單元,用以感測該複數個電路線之第一及第二相鄰兩電路線而分別產生一第一及一第二第一訊號分量,以及二第二磁阻感測單元,與該第一磁阻感測單元成對設置,用以感測該相鄰兩電路線而分別產生一第一及一第二第二訊號分量,其中該第一第一訊號分量與第一第二訊號分量構成該第一相鄰電路線之一第一感測訊號,且該第二第一訊號分量與第二第二訊號分量構成該第二相鄰電路線之一第二感測訊號,以及以該第一及該第二感測訊號之差值,以判斷各該被檢測之相關電路線是否正常。 A main purpose of this case is to provide a magnetoresistive sensing device for detecting a substrate, wherein the substrate has a plurality of circuit lines, and the substrate is powered by a signal source, so that the plurality of circuit lines are detected, the magnetic The resistance sensing device includes two first magnetoresistive sensing units for sensing the first and second adjacent circuit lines of the plurality of circuit lines to generate a first and a second first signal component, respectively, and Two second magnetoresistive sensing units are arranged in pairs with the first magnetoresistive sensing unit for sensing the two adjacent circuit lines to respectively generate a first and a second signal component, wherein the first A first signal component and a first second signal component constitute a first sensing signal of the first adjacent circuit line, and the second first signal component and a second second signal component constitute the second adjacent circuit A second sensing signal of one of the lines, and the difference between the first and the second sensing signal is used to determine whether each of the detected related circuit lines is normal.
1:檢測設備 1: Testing equipment
11:磁阻感測裝置 11: Magnetoresistive sensing device
111:水平感測單元 111: Level sensing unit
1111/1111a-1111d:第一磁阻感測器 1111/1111a-1111d: The first magnetoresistive sensor
112:垂直感測單元 112: vertical sensing unit
1121/1121a-1121d:第二磁阻感測器 1121/1121a-1121d: The second magnetoresistive sensor
1112/1122/TL071:訊號放大器 1112/1122/TL071: signal amplifier
113:後級裝置 113: Post-device
12:橫樑 12: beam
2:玻璃基板 2: glass substrate
21:閘極線 21: Gate line
22:數據線 22: data line
23:下側/水平邊緣 23: lower side/horizontal edge
24:右側/垂直邊緣 24: Right/Vertical Edge
25:外部電源 25: External power supply
26:斜線段 26: slash
IN+/IN-:輸入端 IN+/IN-: Input terminal
GND:接地 GND: Ground
OUTA:輸出端 OUTA: output terminal
RA/RB/RC/RD:等效電阻 RA/RB/RC/RD: equivalent resistance
OUT+:正電壓輸出端 OUT+: Positive voltage output terminal
OUT-:負電壓輸出端 OUT-: Negative voltage output terminal
VOUT+:輸出正電壓 V OUT+ : Output positive voltage
VOUT-:輸出負電壓 V OUT- : output negative voltage
VCC:供電電壓 VCC: supply voltage
第一圖:其係顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置在檢測玻璃基板時移動方式之示意圖。 The first figure: It is a schematic diagram showing the movement of the magnetoresistive sensing device of the inspection equipment according to the preferred embodiment of the present invention when inspecting the glass substrate.
第二圖:其係顯示一依據本發明構想之較佳實施例 的檢測設備之磁阻感測裝置內部的磁阻感測器配置方式之示意圖。 Figure 2: It shows a preferred embodiment according to the concept of the present invention A schematic diagram of the configuration of the magnetoresistive sensor inside the magnetoresistive sensing device of the testing equipment.
第三圖:其係顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的一對實質平行於數據線之磁阻感測器置於玻璃基板的二相鄰數據線上方的示意圖。 The third figure: It shows a pair of magnetoresistive sensors substantially parallel to the data line of the magnetoresistive sensing device of the detection equipment according to the preferred embodiment of the present invention, placed on two adjacent data lines of the glass substrate Schematic diagram of the party.
第四圖:其係顯示一對應於第三圖中aa’線段之橫切面的該對磁阻感測器與該二相鄰數據線之剖面圖。 The fourth figure: it shows a cross-sectional view of the pair of magnetoresistive sensors and the two adjacent data lines corresponding to the cross section of the aa' line segment in the third figure.
第五圖:其係顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的二個分別實質平行於數據線與閘極線之磁阻感測器用於檢測玻璃基板上二相鄰的斜線段的示意圖。 Figure 5: It shows a magnetoresistive sensing device of a testing device according to a preferred embodiment of the present invention. Two magnetoresistive sensors which are substantially parallel to the data line and the gate line are used for testing on the glass substrate. Schematic diagram of two adjacent diagonal lines.
第六圖:其係顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的一個磁阻感測器電連接於一訊號放大器與一後級裝置的電路示意圖。 Fig. 6: It is a schematic diagram showing a circuit of a magnetoresistive sensor of a magnetoresistive sensing device of a detection device according to a preferred embodiment of the present invention, which is electrically connected to a signal amplifier and a subsequent device.
第一圖是顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置在檢測玻璃基板時移動方式之示意圖。在第一圖中,一檢測設備1包括一磁阻感測裝置11與一橫樑12。該檢測設備1用於檢測一玻璃基板2。該玻璃基板2包括複數個閘極線21、複數個數據線22、一水平邊緣23、一垂直邊緣24與一外部電源25。
The first figure is a schematic diagram showing the movement of the magnetoresistive sensing device of the inspection equipment according to the preferred embodiment of the present invention when inspecting a glass substrate. In the first figure, a
如第一圖所示,檢測玻璃基板2時,檢測設備1會針對數據線22及閘極線21分別供電後移動該磁阻感測
裝置11以逐一檢測每一條線是否正常。在第一圖中,該磁阻感測裝置11從位置A移動至位置B時,該檢測設備1提供閘極線1至閘極線N電源,該磁阻感測裝置11逐一檢測閘極線1至閘極線N是否正常。如第一圖所示,該磁阻感測裝置11從位置B移動至位置C時,該磁阻感測裝置11提供數據線1至數據線M電源,該磁阻感測裝置11逐一檢測數據線1至數據線M是否正常。在第一圖中,該磁阻感測裝置11從位置A移動至位置B,再從位置B移動至位置C,形成L型移動路徑並完成該複數個數據線22及該複數個閘極線21的檢查。
As shown in the first figure, when inspecting the
第二圖是顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置內部的磁阻感測器配置方式之示意圖。在第二圖中,該磁阻感測裝置11包括一水平感測單元111與一垂直感測單元112。該磁阻感測裝置11上同時有垂直方向磁阻感測器(垂直感測單元112所包括之第二磁阻感測器1121a-1121d)及水平方向的磁組感測器(水平感測單元111所包括之第一磁阻感測器1111a-1111d),可以同時偵測垂直及水平兩個方向的磁場變化,可以同時滿足玻璃基板數據線及閘極線檢測需求。如第二圖所示,同一個方向的磁組感測器是以2個為一組,2個同一個方向的磁組感測器(例如,第一磁阻感測器1111a與1111b或者1111c與1111d)的輸出差(二相鄰數據線或閘極線之二感測電流之差)是否為零作為判讀二相鄰數據線或閘極線之一是否有一線路異常。
The second figure is a schematic diagram showing the arrangement of the magnetoresistive sensors inside the magnetoresistive sensing device of the detection equipment according to the preferred embodiment of the present invention. In the second figure, the
第三圖是顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的一對實質平行於數據線之磁阻感測器置於玻璃基板的二相鄰數據線上方的示意圖。在第三圖中,第一磁阻感測器1111a與1111b,其周遭磁場大小變化同時,改變第一磁阻感測器1111a與1111b的磁阻大小,可以應用於電流偵測。如第三圖所示,待測物為玻璃基板(運用於薄膜電晶體的液晶顯示器:TFT-LCD)2,該第一磁阻感測器1111a與1111b置於待測物上方。數據線1~數據線M及閘極線1~閘極線N(LCD的解析度MxN,其中數據線X與數據線Y的X>=1且X<=M,Y>=1且Y<=M)為LCD上的走線用來導通電流控制LCD上的畫素(Pixel)顯示功能。如第三圖所示,檢測數據線1~數據線M的線路電氣特性是否一致時,外部電源25提供一第二電壓給數據線1~數據線M用來產生電流,電流產生磁場,磁場可以改變第一磁阻感測器1111a與1111b內部電阻大小。在第三圖中,當第一磁阻感測器1111a與1111b分別在數據線X或數據線Y上方的位置,其中數據線X或數據線Y有線路異常,2個第一磁阻感測器1111a與1111b的輸出差不為零;反之當數據線X或數據線Y線路相同時,2個第一磁阻感測器1111a與1111b的輸出差為零,以此判讀二相鄰閘極線、數據線或斜線段的電氣特性是否一致。
The third figure shows a pair of magnetoresistive sensors of the magnetoresistive sensing device of the detection equipment according to the preferred embodiment of the present invention, which are substantially parallel to the data lines, placed above two adjacent data lines on the glass substrate Schematic. In the third figure, the magnetic field around the
第四圖是顯示一對應於第三圖中aa’線段之橫切面的該對磁阻感測器與該二相鄰數據線之剖面圖。第一磁阻感測器1111a與1111b分別在數據線X或數據線Y位
置上方距離d的位置(間距為d)。
The fourth figure is a cross-sectional view of the pair of magnetoresistive sensors and the two adjacent data lines corresponding to the cross-section of the aa' line in the third figure. The
第五圖是顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的二個分別實質平行於數據線與閘極線之磁阻感測器用於檢測玻璃基板上二相鄰的斜線段的示意圖。如第五圖所示,針對具有水平邊緣23與垂直邊緣24之玻璃基板2上的斜線段26(非水平或垂直的線段)的電流感測,該感測裝置11上同時有垂直方向磁阻感測器(垂直感測單元112(見第二圖)所包括之第二磁阻感測器1121)及水平方向的磁組感測器(水平感測單元111(見第二圖)所包括之第一磁阻感測器1111),可以同時偵測垂直及水平兩個方向的磁場分量,再加總該兩分量以計算實際電流值。
The fifth figure shows the two magnetoresistive sensors of the magnetoresistive sensing device of the detection equipment according to the preferred embodiment of the present invention, which are respectively substantially parallel to the data line and the gate line, for detecting two phases on the glass substrate. Schematic diagram of adjacent diagonal line segments. As shown in the fifth figure, for the current sensing of the diagonal line segment 26 (non-horizontal or vertical line segment) on the
第六圖是顯示一依據本發明構想之較佳實施例的檢測設備之磁阻感測裝置的一個磁阻感測器電連接於一訊號放大器與一後級裝置的電路示意圖。如第六圖所示,第一或第二磁阻感測器1111/1121接收外部電源所供應的5V電壓,RA/RB/RC/RD為第一或第二磁阻感測器1111/1121的內部等效電阻,當第一或第二磁阻感測器1111/1121接收到磁場,RA/RB/RC/RD的大小會改變,其兩輸出端OUT+/OUT-的代表二感應電流之兩輸出電壓的差會改變,經過TL071訊號放大器1112/1122,其具有兩輸入端IN+與IN-和輸出端OUTA,且由輸出端OUTA輸出一放大的電壓訊號VOUTA給後級裝置113以判讀電壓訊號。
FIG. 6 is a schematic diagram showing a circuit of a magnetoresistive sensor of a magnetoresistive sensing device of a detection device according to a preferred embodiment of the present invention, which is electrically connected to a signal amplifier and a subsequent device. As shown in Figure 6, the first or
如第一圖所示,本案提供一種用於檢測一具
有複數個數據線22、複數個閘極線21、一水平邊緣23與一垂直邊緣24之玻璃基板2之一檢測設備,包含一磁阻感測裝置11,該磁阻感測裝置11包括一水平感測單元111,具有至少兩個第一磁阻感測器1111,以及一垂直感測單元112,具有至少兩個第二磁阻感測器1121,其中當該磁阻感測裝置11沿該水平邊緣23且垂直於該複數個閘極線21移動,和自一外部電源25提供一第一電壓給該複數個閘極線21時,該至少兩個第二磁阻感測器1121分別用於依序感測兩相鄰閘極線21的二個感測電流以獲得兩者間之一第一差值,當該第一差值不為零時,該兩相鄰閘極線21的其中之一有一第一線路異常,以及當該磁阻感測裝置沿該垂直邊緣24且垂直於該複數個數據線22移動,和自該外部電源25提供一第二電壓給該複數個數據線22時,該至少兩個第一磁阻感測器1111分別用於依序感測兩相鄰數據線22的二個感測電流以獲得兩者間之一第二差值,當該第二差值不為零時,該兩相鄰數據線的其中之一有一第二線路異常。
As shown in the first figure, this case provides a method for detecting a
A detection device for a
如第一圖與第六圖所示之該檢測設備1,更包括一可移動之橫樑12,其中該磁阻感測裝置11設置於該橫樑12上,藉由該橫樑12之移動以檢測該玻璃基板2,該玻璃基板2具有一各該閘極線21接地之下側與一各該數據線22接地之右側,該水平邊緣23為該下側,且該垂直邊緣24為該右側,各該第一磁阻感測器1111與各該第二磁阻感測器1121是選自由一巨磁阻感測器、一異向磁阻感測器與一
穿隧磁阻感測器所組成群組的其中之一,該至少兩個第一磁阻感測器1111為一對或複數對彼此平行的第一磁阻感測器1111,使各該對第一磁阻感測器1111實質平行於各該數據線22,以偵測一水平方向磁場變化,該至少兩個第二磁阻感測器1121為一對或複數對彼此平行的第二磁阻感測器1121,使各該對第二磁阻感測器1121實質平行於各該閘極線21,以偵測一垂直方向磁場變化,當各該閘極線21或各該數據線22因通電而產生電流時,將使鄰近各該閘極線21或各該數據線22的各該第一磁阻感測器1111或各該第二磁阻感測器1121周遭的一磁場大小產生變化,因而改變各該第一磁阻感測器1111或各該第二磁阻感測器1121內部一磁阻的大小,進而使得各該第一磁阻感測器1111或各該第二磁阻感測器1121所產生之一感應電流亦隨之改變。
As shown in the first and sixth figures, the
如第一圖與第二圖所示之該檢測設備1,其中該水平感測單元111用以偵測該玻璃基板2之一平行於該水平邊緣23之方向的磁場變化,該垂直感測單元112用以偵測該玻璃基板之一平行於該垂直邊緣24之方向的磁場變化,依據該垂直感測單元112對相鄰兩閘極線21上之一兩垂直感測電流之差是否為零即可判斷該相鄰兩閘極線21是否具有該第一線路異常,且依據該水平感測單元111對相鄰兩數據線22上之一兩水平感測電流之差是否為零即可判斷該相鄰兩數據線22是否具有該第二線路異常,因而可以同時滿足該玻璃基板2上該複數個閘極線21與該複
數個數據線22是否異常的一檢測需求,各該對第二磁阻感測器1121a-1121b/1121c-1121d是設置於該磁阻感測裝置11之一縱向中心軸線的左右各一(1121a與1121c在左,而11121b與1121d在右),且該複數對第二磁阻感測器(第一對1121a與1121b以及第二對1121c與1121d)是依序沿該縱向中心軸線向上或向下分佈於該磁阻感測裝置的中央位置,該水平感測單元設置於該磁阻感測裝置的左側及/或右側,當一第一對第一磁阻感測器(1111a與1111b)設置於該磁阻感測裝置的左側時,則一第二對第一磁阻感測器(1111c與1111d)設置於該磁阻感測裝置11的右側,各該對第一磁阻感測器(1111a與1111b以及1111c與1111d)是依平行於該縱向中心軸線之一縱線方向的一上側與一下側各設置其一,至一第三對與一第四對第一磁阻感測器以及其餘的該複數對第一磁阻感測器(未顯示)則依先左側後右側順序,且沿該縱線方向向上或向下延伸排列,該一對第一磁阻感測器(例如:當僅有1111a與1111b時)用以產生該兩水平感測電流之差的一第一數值,該複數對第一磁阻感測器(例如:當具有兩對:1111a與1111b以及1111c與1111d時)用以產生該兩水平感測電流之差的複數個(例如2個)第一數值,該複數個第一數值用於互相比對,以提高該水平感測單元111的一精確度,該一對第二磁阻感測器(例如:當僅有1121a與1121b時)用以產生該兩垂直感測電流之差的一第二數值,該複數對第二磁阻感測器(例如:當具有兩對:1121a與1121b以及1121c與1121d時)用以產生
該兩垂直感測電流之差的複數個(例如2個)第二數值,該複數個第二數值用於互相比對,以提高該垂直感測單元112的一精確度。
As shown in the first figure and the second figure, the
如第一圖與第五圖所示之該檢測設備1,其中該玻璃基板2更包括至少二斜線段26,各該斜線段26是一非實質水平於該水平邊緣23且非實質垂直於該垂直邊緣24的線段,當該磁阻感測裝置11以一垂直於該至少二斜線段26之方向移動,以檢測該至少二斜線段26之兩相鄰斜線段26的二個感測電流之一第三差值時,該至少兩個第二磁阻感測器1121分別用於依序感測該第三差值的一垂直分量,且該至少兩個第一磁阻感測器1111分別用於依序感測該第三差值的一水平分量,加總該垂直分量與該水平分量以獲得該第三差值,當該第三差值不為零時,該兩相鄰斜線段26的其中之一有一第三線路異常。
As shown in the first and fifth figures of the
如第一圖與第四圖所示之該檢測設備1,其中該磁阻感測裝置11設置於該玻璃基板2上方,且兩者間具有一間距d,該磁阻感測裝置11首先沿著該水平邊緣23移動,而後沿著該垂直邊緣24移動,或者首先沿著該垂直邊緣24移動,而後沿著該水平邊緣23移動,以檢測該複數個閘極線21與該複數個數據線22,當檢測該至少二斜線段26時,則沿著垂直於該至少二斜線段26之方向移動,該第一至該第三線路異常各自是一短路、一跨接或一開路。
As shown in the first and fourth figures of the
如第一圖與第六圖所示之該檢測設備1,其中該磁阻感測裝置11更包括一後級裝置113,該水平感測單
元111與該垂直感測單元112更各包括至少二訊號放大器1112/1122,各該訊號放大器1112/1122包括兩輸入端IN+/IN-與一輸出端OUTA,各該第一磁阻感測器1111與各該第二磁阻感測器1121各包括一正電壓輸出端OUT+與一負電壓輸出端OUT-,分別電連接於對應的該兩輸入端IN+/IN-,各該訊號放大器1112/1122用以自該輸出端OUTA輸出一經放大的電壓訊號VOUTA給該後級裝置113,以判讀代表該第一差值、該第二差值或該第三差值之一電壓訊號,其中GND為一接地,VOUT+為一輸出正電壓,VOUT-為一輸出負電壓,且VCC為一供電電壓。
As shown in the first and sixth figures, the
如第一圖與第六圖所示,本案提供一種用於檢測一具有複數個數據線22與複數個閘極線21之玻璃基板2之一檢測設備1,包含一磁阻感測裝置11,該磁阻感測裝置11包括一水平感測單元111,具有至少兩個第一磁阻感測器1111,以及一垂直感測單元112,具有至少兩個第二磁阻感測器1121,其中當該磁阻感測裝置11依一垂直於該複數個閘極線21的方向移動,且該複數個閘極線21接收一第一電壓時,該至少兩個第二磁阻感測器1121用於感測兩相鄰閘極線21上二感應電流之一第一差值,當該第一差值不為零時,該兩相鄰閘極線21的其中之一有一線路異常,以及當該磁阻感測裝置11依一垂直於該複數個數據線22的方向移動,且該複數個數據線22接收一第二電壓時,該至少兩個第一磁阻感測器1111用於感測兩相鄰數據線22上二感應電流之一第二差值,當該第二差值不為零時,
該兩相鄰數據線的其中之一有一線路異常。
As shown in the first and sixth figures, the present application provides a
如第一圖與第六圖所示,本案提供一種使用一具有一磁阻感測裝置11之檢測設備1以檢測一具有複數個數據線22與複數個閘極線21之玻璃基板2之方法,其中該磁阻感測裝置11包括一具有至少兩個第一磁阻感測器1111之水平感測單元111與一具有至少兩個第二磁阻感測器1121之垂直感測單元112,該方法包含:當該磁阻感測裝置11依一垂直於該複數個閘極線21的方向移動,且由一外部電源25提供一第一電壓給該複數個閘極線21時,使該至少兩個第二磁阻感測器1121分別依序感測兩相鄰閘極線21的二個感應電流以獲得兩者之一第一差值,其中當該第一差值不為零時,該兩相鄰閘極線21的其中之一有一第一線路異常;以及當該磁阻感測裝置11依一垂直於該複數個數據線22的方向移動,且由該外部電源25提供一第二電壓給該複數個數據線22時,使該至少兩個第一磁阻感測器1111分別依序感測兩相鄰數據線22的二個感應電流以獲得兩者之一第二差值,其中當該第二差值不為零時,該兩相鄰數據線22的其中之一有一第二線路異常。 As shown in the first and sixth figures, the present application provides a method for detecting a glass substrate 2 with a plurality of data lines 22 and a plurality of gate lines 21 using a detection device 1 with a magnetoresistive sensing device 11 , Wherein the magnetoresistive sensing device 11 includes a horizontal sensing unit 111 with at least two first magnetoresistive sensors 1111 and a vertical sensing unit 112 with at least two second magnetoresistive sensors 1121, The method includes: when the magnetoresistive sensing device 11 moves in a direction perpendicular to the plurality of gate lines 21, and an external power supply 25 provides a first voltage to the plurality of gate lines 21, the At least two second magnetoresistive sensors 1121 respectively sense the two induced currents of two adjacent gate lines 21 in sequence to obtain a first difference between the two, wherein when the first difference is not zero , One of the two adjacent gate lines 21 has a first line abnormality; and when the magnetoresistive sensing device 11 moves in a direction perpendicular to the plurality of data lines 22, and the external power supply 25 provides a When the second voltage is applied to the plurality of data lines 22, the at least two first magnetoresistive sensors 1111 respectively sense the two induced currents of two adjacent data lines 22 in order to obtain one of the second difference When the second difference is not zero, one of the two adjacent data lines 22 has a second line abnormality.
如第一圖所示之該方法,其中該玻璃基板2更包括一水平邊緣23與一垂直邊緣24,該當該磁阻感測裝置11依該垂直於該複數個閘極線21的方向移動之步驟更包括:使該磁阻感測裝置11沿著該水平邊緣23且垂直於該複數個閘極線21而移動,以檢測該複數個閘極線21是否有該第一線路異常,且該當該磁阻感測裝置11依該垂直於該複
數個數據線22的方向移動之步驟更包括:使該磁阻感測裝置11沿著該垂直邊緣24且垂直於該複數個數據線22而移動,以檢測該複數個數據線22是否有該第二線路異常。
As shown in the method shown in the first figure, the
如第一圖、第五圖與第六圖所示之該方法,其中該玻璃基板2更包括至少二斜線段26,各該斜線段26是一非實質水平於該水平邊緣23且非實質垂直於該垂直邊緣24的線段,該方法更包括:使該磁阻感測裝置11以一垂直於該至少二斜線段26之方向移動,以檢測該至少二斜線段26之兩相鄰斜線段26的二個感測電流之一第三差值;使該至少兩個第二磁阻感測器1121分別用於依序感測該第三差值的一垂直分量:使該至少兩個第一磁阻感測器1111分別用於依序感測該第三差值的一水平分量;以及加總該垂直分量與該水平分量以獲得該第三差值,其中當該第三差值不為零時,該兩相鄰斜線段26的其中之一有一第三線路異常。
As shown in the method shown in the first, fifth and sixth figures, the
如第一圖所示,本案提供一種使用一具有一磁阻感測裝置11以檢測一具有複數個數據線22與複數個閘極線21之玻璃基板2之方法,其中當該玻璃基板2置於一檢測平面2時,該玻璃基板2具一上側、一左側、一下側23及一右側24、該檢測平面2具一訊號源25以供電該複數個數據線22與該複數個閘極線21,俾使之受檢測、且該訊號源25置於該左側24、該下側23為各該閘極線21接地之一側及該右側24為各該數據線接地之一側,該方法包含:使該磁阻感測裝置11位於該玻璃基板2上方;使該磁阻感測裝
置11沿該下側23逐一感測該複數個閘極線21;以及使該磁阻感測裝置11沿該右側24逐一感測該複數個數據線22。
As shown in the first figure, this application provides a method for detecting a
如第一圖與第二圖所示,本案提供一種用以檢測一玻璃基板2之磁阻感測裝置11,其中該玻璃基板2具有複數個數據線22與複數個閘極線21,且該玻璃基板2受一訊號源25供電,俾使該複數個數據線22與該複數個閘極線21受檢測,該磁阻感測裝置11包含:一第一磁阻感測器1111a/1121a;以及一第二磁阻感測器1111b/1121b,與該第一磁阻感測器1111a/1121a成對設置,且用以:成對共同逐一感測該複數個數據線22或該複數個閘極線21,以分別獲得一第一及一第二感測訊號;以及以該第一及該第二感測訊號之差值,以判斷各該被檢測之相關數據線22或閘極線21是否正常。
As shown in the first and second figures, the present application provides a
如第一圖與第二圖所示,該對磁阻感測器1111a-1111b/1121a-1121b係用以感測該複數個數據線22及該複數個閘極線21兩者之一,且該磁阻感測裝置11更包括另一對磁阻感測器1121a-1121b/1111a-1111b,用以感測該複數個數據線22及該複數個閘極線21兩者之另一。
As shown in the first and second figures, the pair of
如第二圖與第五圖所示,本案提供一種用以檢測一基板2之磁阻感測裝置11,其中該基板2具有複數個電路線26,且該基板受一訊號源25供電,俾使該複數電路線26受檢測,該磁阻感測裝置11包含:二第一磁阻感測器1111a-1111b/1111c-1111d,用以感測該複數個電路線26之第一及第二相鄰兩電路線26而分別產生一第一及一第二
第一訊號分量;以及二第二磁阻感測器1121a-1121b/1121c-1121d,與該第一磁阻感測器1111a-1111b/1111c-1111d成對設置,用以感測該相鄰兩電路線26而分別產生一第一及一第二第二訊號分量,其中:該第一第一訊號分量與該第一第二訊號分量構成該第一相鄰電路線26之一第一感測訊號,且該第二第一訊號分量與該第二第二訊號分量構成該第二相鄰電路線26之一第二感測訊號;以及以該第一及該第二感測訊號之差值,以判斷各該被檢測之相關電路線26是否正常。
As shown in the second and fifth figures, this application provides a
綜上所述,本發明提供一種用於檢測一具有複數個數據線、複數個閘極線、一水平邊緣與一垂直邊緣之玻璃基板之一檢測設備及其方法,該檢測設備包括一具有至少兩個第一磁阻感測器的水平感測單元,以及一具有至少兩個第二磁阻感測器的垂直感測單元,其中該至少兩個第二磁阻感測器用於感測兩相鄰閘極線上二感應電流之一第一差值,當該第一差值不為零時,該兩相鄰閘極線的其中之一有一線路異常,以及該至少兩個第一磁阻感測器用於感測兩相鄰數據線上二感應電流之一第二差值,當該第二差值不為零時,該兩相鄰數據線的其中之一有一線路異常,以提升各該開路、各該短路及/或各該跨接的檢出率,故其確實具有新穎性與進步性。 In summary, the present invention provides a detection device and method for detecting a glass substrate with a plurality of data lines, a plurality of gate lines, a horizontal edge and a vertical edge. The detection device includes a detection device having at least Two horizontal sensing units of first magnetoresistive sensors, and a vertical sensing unit having at least two second magnetoresistive sensors, wherein the at least two second magnetoresistive sensors are used to sense two A first difference value of one of the two induced currents on adjacent gate lines. When the first difference value is not zero, one of the two adjacent gate lines has an abnormality, and the at least two first magnetic resistances The sensor is used to sense a second difference value of one of the two induced currents on two adjacent data lines. When the second difference value is not zero, one of the two adjacent data lines has a line abnormality to improve the The detection rate of open circuit, each short circuit and/or each bridge is indeed novel and progressive.
是以,縱使本案已由上述之實施例所詳細敘述而可由熟悉本技藝之人士任施匠思而為諸般修飾,然皆不脫如附申請專利範圍所欲保護者。 Therefore, even though this case has been described in detail by the above-mentioned embodiments and can be modified in many ways by those familiar with the art, it does not deviate from the protection of the scope of the attached patent application.
1‧‧‧檢測設備 1‧‧‧Testing equipment
11‧‧‧磁阻感測裝置 11‧‧‧Magnetic resistance sensing device
12‧‧‧橫樑 12‧‧‧Beam
2‧‧‧玻璃基板 2‧‧‧Glass substrate
21‧‧‧閘極線 21‧‧‧Gate line
22‧‧‧數據線 22‧‧‧Data cable
23‧‧‧水平邊緣 23‧‧‧Horizontal edge
24‧‧‧垂直邊緣 24‧‧‧Vertical edge
25‧‧‧外部電源 25‧‧‧External power supply
Claims (11)
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| TW109101423A TWI724749B (en) | 2020-01-15 | 2020-01-15 | Inspection equipment for glass substrate and method thereof |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020030490A1 (en) * | 2000-07-21 | 2002-03-14 | Shigeo Honda | Plane magnetic sensor and plane magnetic sensor for multidimensional magnetic field analysis |
| TW200424536A (en) * | 2003-05-06 | 2004-11-16 | Lg Philips Lcd Co Ltd | Method and apparatus for inspecting flat panel display |
| TW200518866A (en) * | 2003-12-03 | 2005-06-16 | Quanta Display Inc | Apparatus and method for inspecting and repairing circuit defect |
| US20130076687A1 (en) * | 2011-09-27 | 2013-03-28 | Kabushiki Kaisha Toshiba | Touch panel and display device |
| TWI634339B (en) * | 2017-11-21 | 2018-09-01 | 興城科技股份有限公司 | Method and apparatus for testing a tft panel |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020030490A1 (en) * | 2000-07-21 | 2002-03-14 | Shigeo Honda | Plane magnetic sensor and plane magnetic sensor for multidimensional magnetic field analysis |
| TW200424536A (en) * | 2003-05-06 | 2004-11-16 | Lg Philips Lcd Co Ltd | Method and apparatus for inspecting flat panel display |
| TW200518866A (en) * | 2003-12-03 | 2005-06-16 | Quanta Display Inc | Apparatus and method for inspecting and repairing circuit defect |
| US20130076687A1 (en) * | 2011-09-27 | 2013-03-28 | Kabushiki Kaisha Toshiba | Touch panel and display device |
| TWI634339B (en) * | 2017-11-21 | 2018-09-01 | 興城科技股份有限公司 | Method and apparatus for testing a tft panel |
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