TWI640793B - Power button test system and method thereof - Google Patents
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Abstract
一種電源鍵測試系統與方法,用以偵測測試機的電源鍵。此方法包括:感測測試機在開機狀態或關機狀態;若為關機狀態時,控制一單穩態計時電路導通;單穩態計時電路倒數一預設時間;以及當預設時間倒數至零,導通電源鍵以模擬一按壓電源鍵動作。A power button test system and method for detecting a power button of a test machine. The method comprises: sensing the test machine in a power-on state or a power-off state; if it is in a power-off state, controlling a monostable timing circuit to be turned on; the monostable timing circuit is counting down a preset time; and when the preset time is counted down to zero Turn on the power button to simulate a press power button action.
Description
本發明是有關於一種電源鍵測試系統與方法。The invention relates to a power button test system and method.
就現有技術而言,關於電源鍵的測試流程,通常是使用軟體搭配基本輸入輸出系統(Basic Input and Output,BIOS)執行,如此一來,無法真實體現並模擬使用者實際按壓電源鍵啟動或喚醒機器動作,因而導致部分無法預期的問題在出貨後產生。As far as the prior art is concerned, the test procedure of the power button is usually performed by using a software with a Basic Input and Output (BIOS) system, so that the user does not actually embody and simulate the actual pressing of the power button to start or wake up. The machine moves, causing some unforeseen problems to occur after shipment.
本發明提供一種電源鍵測試系統與方法,在電子產品研發初期及出貨前,增加電源鍵的多元測試方式,更貼近使用者的操作模式,藉以發現未知的產品問題,以提升產品良率。本案採用簡單邏輯電路及電阻電容充放電路即可達成驗證測試,成本低廉。本案亦可利用微控制單元或可程式化邏輯器件來開發設計,藉以模組化並減小體積。The invention provides a power key test system and method. In the initial stage of electronic product development and before shipment, the multi-test mode of the power button is added, which is closer to the user's operation mode, so as to discover unknown product problems and improve the product yield. In this case, a simple logic circuit and a resistor-capacitor charging and discharging circuit can be used to achieve verification test, and the cost is low. The case can also be developed using a micro control unit or a programmable logic device to modularize and reduce the size.
本發明之一實施方式提供一種電源鍵測試系統,用以偵測一測試機的一電源鍵是否能正常使用。此電源鍵測試系統包括一控制模組及一模擬模組。控制模組連接至測試機,控制模組包括第一繼電器,第一繼電器感測測試機處於開機狀態或關機狀態。模擬模組耦接至控制模組,模擬模組包括一單穩態計時電路及一第二繼電器。當第一繼電器感測到目前測試機為關機狀態時,第一繼電器控制單穩態計時電路導通,單穩態計時電路倒數一預設時間。第二繼電器耦接至單穩態計時電路,當單穩態計時電路倒數預設時間至零,單穩態計時電路輸出一切換訊號至第二繼電器,第二繼電器根據此切換訊號導通電源鍵以模擬按壓電源鍵動作。One embodiment of the present invention provides a power key test system for detecting whether a power button of a test machine can be used normally. The power button test system includes a control module and an analog module. The control module is connected to the testing machine, and the control module includes a first relay, and the first relay senses that the testing machine is in a power on state or a power off state. The analog module is coupled to the control module, and the analog module includes a monostable timing circuit and a second relay. When the first relay senses that the current test machine is in the off state, the first relay controls the monostable timing circuit to be turned on, and the monostable timing circuit counts down for a preset time. The second relay is coupled to the monostable timing circuit. When the monostable timing circuit counts down to a preset time to zero, the monostable timing circuit outputs a switching signal to the second relay, and the second relay turns on the power button according to the switching signal. Simulate pressing the power button action.
本發明之一實施方式提供一種電源鍵測試方法,用以偵測一測試機的電源鍵是否能正常使用。此方法包括:感測測試機在開機狀態或關機狀態;若為關機狀態時,控制一單穩態計時電路導通;單穩態計時電路倒數一預設時間;以及當該單穩態計時電路倒數預設時間至零,導通電源鍵以模擬一按壓電源鍵動作。An embodiment of the present invention provides a power key test method for detecting whether a power button of a test machine can be used normally. The method includes: sensing the test machine in a power-on state or a power-off state; if in the power-off state, controlling a monostable timing circuit to be turned on; the monostable timing circuit is counting down a preset time; and when the monostable timing circuit Count down the preset time to zero, turn on the power button to simulate a press power button action.
以下將以圖式揭露本發明之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本發明。也就是說,在本發明部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。The embodiments of the present invention are disclosed in the following drawings, and the details of However, it should be understood that these practical details are not intended to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, some of the conventional structures and elements are shown in the drawings in a simplified schematic manner in order to simplify the drawings.
本發明提供一電源鍵測試系統與方法,用以偵測一測試機的電源鍵是否能正常使用。第1圖繪示本發明第一實施方式之電源鍵測試系統的功能方塊圖,電源鍵測試系統100用以偵測測試機110的電源鍵112是否能正常使用。其中,測試機110由電源供應設備120提供電力,電源供應設備120可以是一電源供應器或市電輸入端,測試機110可以是一電腦或其他相類似之電子裝置。電源鍵測試系統100包括:一控制模組130及一模擬模組140,控制模組130及模擬模擬140之間相互耦接。其中,控制模組130連接至測試機110的第一通用序列匯流排端口114(Universal Serial Bus,USB),模擬模組140連接至測試機110的第二通用序列匯流排端口116。當測試機110在開機狀態時,第一通用序列匯流排端口114供電,當測試機110在關機狀態時,第一通用序列匯流排端口114不供電,而第二通用序列匯流排端口116則是持續供電。The invention provides a power button test system and method for detecting whether a power button of a test machine can be used normally. 1 is a functional block diagram of a power button test system according to a first embodiment of the present invention. The power button test system 100 is configured to detect whether the power button 112 of the test machine 110 can be used normally. The test machine 110 is powered by the power supply device 120. The power supply device 120 can be a power supply or a mains input. The test machine 110 can be a computer or other similar electronic device. The power button test system 100 includes a control module 130 and an analog module 140. The control module 130 and the analog module 140 are coupled to each other. The control module 130 is connected to the first universal serial bus port 114 (USB) of the testing machine 110, and the analog module 140 is connected to the second universal serial bus port 116 of the testing machine 110. When the test machine 110 is in the power-on state, the first universal sequence bus port 114 is powered. When the test machine 110 is in the power-off state, the first universal sequence bus port 114 is not powered, and the second universal sequence bus port 116 is Continuous power supply.
控制模組130包括一第一繼電器132及一第一發光單元134。模擬模組140包括一單穩態計時電路150、一第二發光單元160及一第二繼電器170,單穩態計時電路150、第二發光單元160及第二繼電器170依序串接。其中,單穩態計時電路150包括一電容單元152、一電阻單元154及一計時單元156。The control module 130 includes a first relay 132 and a first lighting unit 134. The analog module 140 includes a monostable timing circuit 150, a second lighting unit 160, and a second relay 170. The monostable timing circuit 150, the second lighting unit 160, and the second relay 170 are serially connected in series. The monostable timing circuit 150 includes a capacitor unit 152, a resistor unit 154, and a timing unit 156.
第2圖繪示本發明第一實施方式之電源鍵測試方法的流程圖,請同時參照第1圖及第2圖。首先,判斷測試機110是否在關機狀態(步驟S210),控制模組130中的第一繼電器132先感測測試機110現為開機狀態或關機狀態。第一繼電器132可視為一電子開關,測試機110為開機或關機狀態將會影響第一繼電器132,藉以使第一繼電器132有不同的電路導通情況。FIG. 2 is a flow chart showing a power key test method according to the first embodiment of the present invention. Please refer to FIG. 1 and FIG. 2 at the same time. First, it is judged whether the test machine 110 is in the off state (step S210), and the first relay 132 in the control module 130 first senses that the test machine 110 is currently in the power on state or the power off state. The first relay 132 can be regarded as an electronic switch. The powering on or off state of the testing machine 110 will affect the first relay 132, so that the first relay 132 has different circuit conduction conditions.
其中,控制模組130所包括的第一發光單元134,其並聯於第一繼電器132。當測試機110為開機狀態,第一發光單元134導通發光,當測試機110為關機狀態,則第一發光單元134不發光,藉以提醒測試人員目前測試機110為開機狀態或關機狀態。The first light emitting unit 134 included in the control module 130 is connected to the first relay 132 in parallel. When the testing machine 110 is in the power-on state, the first lighting unit 134 is turned on. When the testing machine 110 is in the power-off state, the first lighting unit 134 does not emit light, thereby reminding the tester that the testing machine 110 is currently in the power-on state or the power-off state.
承上所述,若步驟S210的判斷為是,第一繼電器132感測到目前測試機110為關機狀態時,則第一繼電器132與模擬模組140之間的電路導通,即控制單穩態計時電路150導通(步驟S220)。反之,當若步驟S210的判斷為否,表示測試機110目前為開機狀態,則第一繼電器132控制單穩態計時電路150為不導通(步驟S215),控制模組130接著持續感測測試機110的開關機狀態是否有改變。As described above, if the determination in step S210 is YES, the first relay 132 senses that the current test machine 110 is in the off state, then the circuit between the first relay 132 and the analog module 140 is turned on, that is, the control monostable The timer circuit 150 is turned on (step S220). On the other hand, if the determination in step S210 is NO, indicating that the test machine 110 is currently in the on state, the first relay 132 controls the monostable timer circuit 150 to be non-conductive (step S215), and the control module 130 continues to sense the tester. Whether the state of the switch of 110 has changed.
在步驟S220之後,單穩態計時電路150倒數一預設時間(步驟S230)。其中,單穩態計時電路150包括電容單元152、電阻單元154及計時單元156,電容單元152、電阻單元154及計時單元156三者相互耦接。當第一繼電器132控制單穩態計時電路150導通後,計時單元156倒數該預設時間,其中該預設時間為電容單元152的電容值及電阻單元154的電阻值所決定。After step S220, the monostable timer circuit 150 counts down a predetermined time (step S230). The monostable timing circuit 150 includes a capacitor unit 152, a resistor unit 154, and a timing unit 156. The capacitor unit 152, the resistor unit 154, and the timing unit 156 are coupled to each other. When the first relay 132 controls the monostable timer circuit 150 to be turned on, the timing unit 156 counts down the preset time, wherein the preset time is determined by the capacitance value of the capacitor unit 152 and the resistance value of the resistor unit 154.
接著,單穩態計時電路150判斷預設時間是否倒數至零(步驟S240)。若步驟S240的判斷為否,則繼續倒數。若步驟S240的判斷為是,單穩態計時電路150輸出一切換訊號至第二繼電器170,第二繼電器170根據該切換訊號導通電源鍵112,以模擬按壓電源鍵動作 (步驟S250)。Next, the one-shot timing circuit 150 determines whether the preset time is counted down to zero (step S240). If the determination in the step S240 is NO, the countdown is continued. If the determination in the step S240 is YES, the monostable timer circuit 150 outputs a switching signal to the second relay 170, and the second relay 170 turns on the power button 112 according to the switching signal to simulate the pressing of the power button operation (step S250).
其中,第二繼電器170亦可視為一電子開關,單穩態計時電路150是否送出切換訊號,將會影響第二繼電器170是否觸發測試機110的電源鍵112。舉例來說,第二繼電器170的其中一腳位可連接至測試機110的電源鍵112腳位,當第二繼電器170接收到單穩態計時電路150所送出的切換訊號時,第二繼電器170則觸發電源鍵112。當電源鍵112被觸發之後,測試機110為開機狀態,則第一繼電器132控制單穩態計時電路150為不導通。The second relay 170 can also be regarded as an electronic switch. Whether the one-shot timer circuit 150 sends a switching signal will affect whether the second relay 170 triggers the power button 112 of the testing machine 110. For example, one of the pins of the second relay 170 can be connected to the power button 112 of the test machine 110. When the second relay 170 receives the switching signal sent by the monostable timer circuit 150, the second relay 170 The power button 112 is then triggered. When the power button 112 is triggered and the test machine 110 is turned on, the first relay 132 controls the monostable timer circuit 150 to be non-conductive.
此外,模擬模組140所包括的第二發光單元160,串聯於單穩態計時電路150及第二繼電器170之間,當單穩態計時電路150為導通,第二發光單元160導通發光。當第二發光單元160導通發亮,即提醒測試人員此時單穩態計時電路150已送出切換訊號予第二繼電器170。In addition, the second light emitting unit 160 included in the analog module 140 is connected in series between the monostable timer circuit 150 and the second relay 170. When the monostable timer circuit 150 is turned on, the second light emitting unit 160 is turned on. When the second lighting unit 160 is turned on, the tester is reminded that the monostable timer circuit 150 has sent the switching signal to the second relay 170.
本發明提供一種電源鍵測試系統與方法,在電子產品研發初期及出貨前,增加電源鍵的多元測試方式,更貼近使用者的操作模式,藉以發現未知的產品問題,以提升產品良率。本案採用簡單邏輯電路及電阻電容充放電路即可達成驗證測試,成本低廉。本案亦可利用微控制單元或可程式化邏輯器件來開發設計,藉以模組化並減小體積。The invention provides a power key test system and method. In the initial stage of electronic product development and before shipment, the multi-test mode of the power button is added, which is closer to the user's operation mode, so as to discover unknown product problems and improve the product yield. In this case, a simple logic circuit and a resistor-capacitor charging and discharging circuit can be used to achieve verification test, and the cost is low. The case can also be developed using a micro control unit or a programmable logic device to modularize and reduce the size.
雖然本發明已以多種實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the invention has been described above in terms of various embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application attached.
100‧‧‧電源鍵測試系統100‧‧‧Power Key Test System
110‧‧‧測試機110‧‧‧Tester
112‧‧‧電源鍵112‧‧‧Power button
114‧‧‧第一通用序列匯流排端口114‧‧‧First universal sequence bus port
116‧‧‧第二通用序列匯流排端口116‧‧‧Second universal serial bus port
120‧‧‧電源供應設備120‧‧‧Power supply equipment
130‧‧‧控制模組130‧‧‧Control Module
132‧‧‧第一繼電器132‧‧‧First relay
134‧‧‧第一發光單元134‧‧‧first lighting unit
140‧‧‧模擬模組140‧‧‧simulation module
150‧‧‧單穩態計時電路150‧‧‧monostable timing circuit
152‧‧‧電容單元152‧‧‧Capacitor unit
154‧‧‧電阻單元154‧‧‧resistance unit
156‧‧‧計時單元156‧‧‧Time unit
160‧‧‧第二發光單元160‧‧‧second lighting unit
170‧‧‧第二繼電器170‧‧‧Second relay
S210~S250‧‧‧電源鍵測試方法流程步驟S210~S250‧‧‧Power key test method flow steps
第1圖繪示本發明第一實施方式之電源鍵測試系統的功能方塊圖。 第2圖繪示本發明第一實施方式之電源鍵測試方法的流程圖。FIG. 1 is a functional block diagram of a power key test system according to a first embodiment of the present invention. FIG. 2 is a flow chart showing a power key test method according to the first embodiment of the present invention.
Claims (7)
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| TW106128181A TWI640793B (en) | 2017-08-18 | 2017-08-18 | Power button test system and method thereof |
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| TW106128181A TWI640793B (en) | 2017-08-18 | 2017-08-18 | Power button test system and method thereof |
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| TWI640793B true TWI640793B (en) | 2018-11-11 |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1916863A (en) * | 2005-08-19 | 2007-02-21 | 佛山市顺德区顺达电脑厂有限公司 | Test device and method |
| TW200712851A (en) * | 2005-09-05 | 2007-04-01 | Hon Hai Prec Ind Co Ltd | Controller and method for on-off switching of power supply |
| CN202837495U (en) * | 2012-09-13 | 2013-03-27 | 苏州市电子产品检验所有限公司 | Life testing machine of power supply keypress switch |
| US20140232205A1 (en) * | 2013-02-18 | 2014-08-21 | Compal Electronics, Inc. | Electronic apparatus |
| TW201716919A (en) * | 2015-08-18 | 2017-05-16 | 鴻海精密工業股份有限公司 | Method and system for closing electronic devices |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1916863A (en) * | 2005-08-19 | 2007-02-21 | 佛山市顺德区顺达电脑厂有限公司 | Test device and method |
| TW200712851A (en) * | 2005-09-05 | 2007-04-01 | Hon Hai Prec Ind Co Ltd | Controller and method for on-off switching of power supply |
| CN202837495U (en) * | 2012-09-13 | 2013-03-27 | 苏州市电子产品检验所有限公司 | Life testing machine of power supply keypress switch |
| US20140232205A1 (en) * | 2013-02-18 | 2014-08-21 | Compal Electronics, Inc. | Electronic apparatus |
| TW201716919A (en) * | 2015-08-18 | 2017-05-16 | 鴻海精密工業股份有限公司 | Method and system for closing electronic devices |
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