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TWI403221B - Plasma generation apparatus and plasma treatment apparatus - Google Patents

Plasma generation apparatus and plasma treatment apparatus Download PDF

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Publication number
TWI403221B
TWI403221B TW098137562A TW98137562A TWI403221B TW I403221 B TWI403221 B TW I403221B TW 098137562 A TW098137562 A TW 098137562A TW 98137562 A TW98137562 A TW 98137562A TW I403221 B TWI403221 B TW I403221B
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Taiwan
Prior art keywords
antenna structure
antenna
power supply
supply unit
generating apparatus
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TW098137562A
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Chinese (zh)
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TW201034527A (en
Inventor
Sung-Il Ahn
Sang-Ho Song
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Wonik Ips Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00Details of, or arrangements associated with, antennas
    • H01Q1/36Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
    • H01Q1/364Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith using a particular conducting material, e.g. superconductor
    • H01Q1/366Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith using a particular conducting material, e.g. superconductor using an ionized gas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01QANTENNAS, i.e. RADIO AERIALS
    • H01Q7/00Loop antennas with a substantially uniform current distribution around the loop and having a directional radiation pattern in a plane perpendicular to the plane of the loop
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • H05H1/4645Radiofrequency discharges
    • H05H1/4652Radiofrequency discharges using inductive coupling means, e.g. coils

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)

Description

一種等離子發生裝置及等離子處理裝置Plasma generating device and plasma processing device

本發明涉及一種等離子發生裝置,尤其是一種感應耦合等離子發生裝置。The present invention relates to a plasma generating apparatus, and more particularly to an inductively coupled plasma generating apparatus.

隨著半導體基板、平板顯示基板、太陽能電池基板等的面積變大,處理這些基板的製造裝置也隨之變大。等離子處理裝置用於蝕刻、沉積、離子注入、物質表面處理等各種工藝。隨著等離子處理裝置的面積變大,其工藝均勻性及工藝速度成為最大的問題。工藝均勻性可依賴於等離子的密度。As the area of the semiconductor substrate, the flat display substrate, the solar cell substrate, and the like increases, the manufacturing apparatus for processing these substrates also becomes large. Plasma processing devices are used in various processes such as etching, deposition, ion implantation, and surface treatment of materials. As the area of the plasma processing apparatus becomes larger, process uniformity and process speed become the biggest problems. Process uniformity can depend on the density of the plasma.

本發明的目的在於提供一種可形成均勻等離子的等離子發生裝置。It is an object of the present invention to provide a plasma generating apparatus which can form a uniform plasma.

根據本發明一實施例的一種等離子發生裝置,包括:絕緣板(Smn),沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板,包括其上設置絕緣板並具有四角形形狀的貫通孔(Hmn);天線結構體(Tmn),設置於各絕緣板上。上述天線結構體,包括:第一型天線結構體,接近於金屬上板的邊緣而設置;第二型天線結構體,接近於金屬上板的邊而設置;其中,第一型天線結構體比第二型天線結構體消耗更多的電力,從而可形成均勻等離子。A plasma generating apparatus according to an embodiment of the present invention includes: an insulating plate (Smn) arranged in a matrix form along a first direction and a second direction across the first direction; a metal upper plate including an insulating plate disposed thereon A through hole (Hmn) having a quadrangular shape; and an antenna structure (Tmn) provided on each of the insulating plates. The antenna structure includes: a first type antenna structure disposed close to an edge of the metal upper plate; and a second type antenna structure disposed close to an edge of the metal upper plate; wherein the first type antenna structure is The second type of antenna structure consumes more power so that a uniform plasma can be formed.

在本發明一實施例中,上述天線結構體還包括由上述第二型天線結構體及上述第一型天線結構體圍繞而成的第三型天線結構體。In an embodiment of the invention, the antenna structure further includes a third antenna structure surrounded by the second antenna structure and the first antenna structure.

在本發明一實施例中,上述第二型天線結構體比上述第三型天線結構體消耗更多電力。In an embodiment of the invention, the second antenna structure consumes more power than the third antenna structure.

在本發明一實施例中,沿上述第一方向排列的絕緣板的數(m)為3以上,而沿上述第二方向排列的絕緣板的數(n)為3以上。In an embodiment of the invention, the number (m) of the insulating plates arranged in the first direction is 3 or more, and the number (n) of the insulating plates arranged in the second direction is 3 or more.

在本發明一實施例中,上述第一型天線結構體相互電串聯,而上述第二型天線結構體相互電並聯。In an embodiment of the invention, the first antenna structures are electrically connected in series, and the second antenna structures are electrically connected in parallel with each other.

在本發明一實施例中,上述第三型天線結構體相互電並聯。In an embodiment of the invention, the third antenna structures are electrically connected in parallel with each other.

在本發明一實施例中,上述天線結構體形成於印刷電路板或由導線彎曲形成。In an embodiment of the invention, the antenna structure is formed on a printed circuit board or formed by bending a wire.

在本發明一實施例中,上述印刷電路板為雙面基板,而上述天線結構體包括金、銀、銅、鎳、錫中的至少一種。In an embodiment of the invention, the printed circuit board is a double-sided substrate, and the antenna structure includes at least one of gold, silver, copper, nickel, and tin.

在本發明一實施例中,上述天線結構體具有相同形狀。In an embodiment of the invention, the antenna structure has the same shape.

在本發明一實施例中,還包括與上述第一型天線結構體電串聯的第一電抗元件,及與上述第二型天線結構體電串聯的第二電抗元件中的至少一個。In an embodiment of the invention, the method further includes at least one of a first reactance element electrically connected in series with the first type antenna structure and a second reactance element electrically connected in series with the second type antenna structure.

在本發明一實施例中,還包括與上述第一型天線結構體電串聯的第一電抗元件、與上述第二型天線結構體電串聯的第二電抗元件、及上述第三型天線結構體電串聯的第三電抗元件中的至少一個。In an embodiment of the invention, the method further includes: a first reactance component electrically connected in series with the first antenna structure; a second reactance component electrically connected in series with the second antenna structure; and the third antenna structure At least one of the third reactance elements electrically connected in series.

在本發明一實施例中,上述第一電抗元件、第二電抗元件及第三電抗元件,包括可變電抗元件。In an embodiment of the invention, the first reactance element, the second reactance element, and the third reactance element include a variable reactance element.

在本發明一實施例中,流經上述第一型天線結構體各天線結構體的第一電流大於流經上述第二型天線結構體各天線結構體的第二電流,而流經上述第二型天線結構體各天線結構體的第二電流大於流經上述第三型天線結構體各天線結構體的第三電流。In an embodiment of the present invention, the first current flowing through each antenna structure of the first antenna structure is greater than the second current flowing through each antenna structure of the second antenna structure, and flows through the second The second current of each antenna structure of the antenna structure is greater than the third current flowing through each antenna structure of the third antenna structure.

在本發明一實施例中,還包括向上述天線結構體(Tmn)提供電力的電源部,而上述電源部電串聯於上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體。According to an embodiment of the present invention, the power supply unit that supplies power to the antenna structure (Tmn) is electrically connected to the first antenna structure, the second antenna structure, and the third Antenna structure.

在本發明一實施例中,還包括向上述天線結構體(Tmn)提供電力的多個電源部,第一電源部向上述第一型天線結構體提供電力,第二電源部向上述第二型天線結構體提供電力,而第三電源部向上述第三型天線結構體提供電力。In one embodiment of the present invention, the method further includes a plurality of power supply units that supply power to the antenna structure (Tmn), wherein the first power supply unit supplies power to the first antenna structure, and the second power supply unit to the second type The antenna structure supplies power, and the third power supply unit supplies power to the third type antenna structure.

在本發明一實施例中,上述第一電源部的第一驅動頻率、上述第二電源部的第二驅動頻率及上述第三電源部的第三驅動頻率中的至少一個互相不同。In an embodiment of the invention, at least one of the first driving frequency of the first power supply unit, the second driving frequency of the second power supply unit, and the third driving frequency of the third power supply unit are different from each other.

在本發明一實施例中,上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體中的至少一個具有不同的結構。In an embodiment of the invention, at least one of the first antenna structure, the second antenna structure, and the third antenna structure has a different structure.

在本發明一實施例中,上述第一型天線結構體及上述第二型天線結構體中的至少一個具有不同的結構。In an embodiment of the invention, at least one of the first antenna structure and the second antenna structure has a different structure.

在本發明一實施例中,上述天線結構體(Tmn)各具有四角形形狀及雙層結構。In an embodiment of the invention, the antenna structures (Tmn) each have a quadrangular shape and a two-layer structure.

在本發明一實施例中,上述天線結構體(Tmn)各由多個輔助天線構成,且設置成在相同平面形成閉環(closed loop)。根據本發明一實施例的一種等離子處理裝置,包括:真空容器,對基板進行等離子處理;基板固定器,設置於上述真空容器內部;金屬上板,設置於上述真空容器上部面且包括多個貫通孔;及天線結構體(Tmn),設置於上述金屬上板上,沿第一方向及跨過第一方向的第二方向以矩陣形式排列,從而形成四角形。上述天線結構體(Tmn),包括:第一型天線結構體,設置於上述四角形邊緣;第二型天線結構體,接近於四角形的邊而設置;及第三型天線結構體,由上述第二型天線結構體及第一型天線結構體圍繞而成;其中,第一型天線結構體各消耗電力大於上述第二型天線結構體各消耗電力,而上述第二型天線結構體各消耗電力大於上述第三型天線結構體各消耗電力。In an embodiment of the invention, the antenna structures (Tmn) are each composed of a plurality of auxiliary antennas, and are arranged to form a closed loop on the same plane. According to an embodiment of the present invention, a plasma processing apparatus includes: a vacuum container for plasma processing a substrate; a substrate holder disposed inside the vacuum container; and a metal upper plate disposed on the upper surface of the vacuum container and including a plurality of through holes And the antenna structure (Tmn) is disposed on the metal upper plate and arranged in a matrix form along the first direction and the second direction across the first direction to form a quadrangle. The antenna structure (Tmn) includes: a first antenna structure disposed on the quadrangular edge; a second antenna structure disposed adjacent to a quadrangular edge; and a third antenna structure from the second The antenna structure and the first antenna structure are surrounded; wherein the power consumption of each of the first antenna structures is greater than the power consumption of the second antenna structure, and the power consumption of the second antenna structure is greater than Each of the third antenna structures described above consumes electric power.

在本發明一實施例中,沿上述第一方向排列的絕緣板的數(m)為3以上,而沿上述第二方向排列的絕緣板的數(n)為3以上。In an embodiment of the invention, the number (m) of the insulating plates arranged in the first direction is 3 or more, and the number (n) of the insulating plates arranged in the second direction is 3 or more.

在本發明一實施例中,上述第一型天線結構體相互電並聯,上述第二型天線結構體相互電並聯,而上述第三型天線結構體相互電並聯。In an embodiment of the invention, the first antenna structures are electrically connected in parallel, the second antenna structures are electrically connected in parallel, and the third antenna structures are electrically connected in parallel.

在本發明一實施例中,還包括與上述第一型天線結構體電串聯的第一電抗元件、與上述第二型天線結構體電串聯的第二電抗元件、及上述第三型天線結構體電串聯的第三電抗元件中的至少一個。In an embodiment of the invention, the method further includes: a first reactance component electrically connected in series with the first antenna structure; a second reactance component electrically connected in series with the second antenna structure; and the third antenna structure At least one of the third reactance elements electrically connected in series.

在本發明一實施例中,流經上述第一型天線結構體各天線結構體的第一電流大於流經上述第二型天線結構體各天線結構體的第二電流,而流經上述第二型天線結構體各天線結構體的第二電流大於流經上述第三型天線結構體各天線結構體的第三電流。In an embodiment of the present invention, the first current flowing through each antenna structure of the first antenna structure is greater than the second current flowing through each antenna structure of the second antenna structure, and flows through the second The second current of each antenna structure of the antenna structure is greater than the third current flowing through each antenna structure of the third antenna structure.

在本發明一實施例中,還包括向上述天線結構體(Tmn)提供電力的電源部,而上述電源部電串聯於上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體。在本發明一實施例中,還包括向上述天線結構體(Tmn)提供電力的多個電源部,第一電源部向上述第一型天線結構體提供電力,第二電源部向上述第二型天線結構體提供電力,而第三電源部向上述第三型天線結構體提供電力。According to an embodiment of the present invention, the power supply unit that supplies power to the antenna structure (Tmn) is electrically connected to the first antenna structure, the second antenna structure, and the third Antenna structure. In one embodiment of the present invention, the method further includes a plurality of power supply units that supply power to the antenna structure (Tmn), wherein the first power supply unit supplies power to the first antenna structure, and the second power supply unit to the second type The antenna structure supplies power, and the third power supply unit supplies power to the third type antenna structure.

在本發明一實施例中,上述第一電源部的第一驅動頻率、上述第二電源部的第二驅動頻率及上述第三電源部的第三驅動頻率中的至少一個互相不同。In an embodiment of the invention, at least one of the first driving frequency of the first power supply unit, the second driving frequency of the second power supply unit, and the third driving frequency of the third power supply unit are different from each other.

在本發明一實施例中,上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體中的至少一個具有不同的結構。In an embodiment of the invention, at least one of the first antenna structure, the second antenna structure, and the third antenna structure has a different structure.

根據本發明一實施例的等離子發生裝置,按幾何位置對天線結構體進行分類,從而可不同的位置提供電力。因此,上述等離子發生裝置可形成均勻的大面積等離子。According to the plasma generating apparatus of one embodiment of the present invention, the antenna structures are classified according to geometric positions, so that electric power can be supplied at different positions. Therefore, the above plasma generating apparatus can form a uniform large-area plasma.

下面,結合附圖對本發明較佳實施例進行詳細說明。但是,本發明不限於在此說明的實施例,而可具有其他的實現方式。這裏所提供的實施例旨在幫助對本發明的理解並向本領域技術人員充分傳遞本發明的思想。在附圖中,層(或膜)及區域的厚度,為說明的方便誇張表示。另外,若提到層(或膜)位於其他層(或膜)或基板“上),則意味著直接形成於其他層(或膜)或基板上,或者在這些中間設置有第三層(或膜)。在整個說明書中,由相同符號表示的部分意味著相同的結構。Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the invention is not limited to the embodiments described herein, but may have other implementations. The embodiments provided herein are intended to assist the understanding of the invention and to fully convey the inventive concept. In the drawings, the thickness of layers (or films) and regions are exaggerated for convenience of description. In addition, it is meant that the layer (or film) is located on the other layer (or film) or the substrate "on", meaning that it is formed directly on the other layer (or film) or substrate, or a third layer is disposed between them (or Membrane. Throughout the specification, the parts denoted by the same symbols mean the same structure.

圖1為本發明一實施例等離子發生裝置示意圖。如圖1所示,上述等離子發生裝置,包括:絕緣板(Smn)130,沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板110,包括可設置上述絕緣板130且具有四角形形狀的貫通孔(Hmn);天線結構體(Tmn)140,設置於上述各絕緣板130上。上述天線結構體(Tmn)140,在上述金屬上板110的下部形成等離子。上述m、n可為正整數。上述m可為上述第一方向的孔(hole)數。上述n可為上述第二方向的孔(hole)數。1 is a schematic view of a plasma generating apparatus according to an embodiment of the present invention. As shown in FIG. 1, the plasma generating device includes: an insulating plate (Smn) 130 arranged in a matrix along a first direction and a second direction across the first direction; and a metal upper plate 110 including the insulating plate 130 and a through hole (Hmn) having a quadrangular shape; an antenna structure (Tmn) 140 is provided on each of the insulating plates 130. The antenna structure (Tmn) 140 forms a plasma on a lower portion of the metal upper plate 110. The above m and n may be positive integers. The above m may be the number of holes in the first direction. The above n may be the number of holes in the second direction.

真空容器100可為四角形腔室。上述真空容器100可包括排氣部(未圖示)、氣體供應部(未圖示)、基板(未圖示)及基板固定器(未圖示)。上述真空容器100可執行等離子處理工藝。上述等離子處理工藝,八廓蝕刻、沉積、離子注入及表面處理中的至少一種。上述基板及上述基板固定器可為四角形。上述基板可為有機發光元件基板、太陽能電池基板、液晶顯示基板或半導體基板。The vacuum vessel 100 can be a quadrangular chamber. The vacuum container 100 may include an exhaust unit (not shown), a gas supply unit (not shown), a substrate (not shown), and a substrate holder (not shown). The vacuum container 100 described above can perform a plasma processing process. The above plasma treatment process, at least one of octagonal etching, deposition, ion implantation, and surface treatment. The substrate and the substrate holder may have a square shape. The substrate may be an organic light emitting element substrate, a solar cell substrate, a liquid crystal display substrate, or a semiconductor substrate.

上述金屬上板110可為平板。上述金屬上板110可為上述真空容器100的蓋子。上述金屬上板110可呈四角形。上述金屬上板110可包括鋁、鐵、鎳中的至少一種。上述金屬上板110的表面可由表面絕緣膜塗覆。上述表面絕緣膜可包括鋁氧化膜。上述金屬上板110可包括多個貫通孔(Hmn)。上述多個貫通孔(Hmn)可為四角形。上述貫通孔(Hmn)可沿上述第一方向及上述第二方向以矩陣形式排列。上述第一方向的孔的數(m)為3。上述第二方向的孔的數(n)為3。上述貫通孔可具有孔突起(122)。上述孔突起(122)可為與上述絕緣板的密封而包括密封部(未圖示)。上述密封部可包括O環(O-ring)槽。The above metal upper plate 110 may be a flat plate. The metal upper plate 110 may be a cover of the vacuum container 100 described above. The above metal upper plate 110 may have a quadrangular shape. The above metal upper plate 110 may include at least one of aluminum, iron, and nickel. The surface of the above metal upper plate 110 may be coated with a surface insulating film. The above surface insulating film may include an aluminum oxide film. The above metal upper plate 110 may include a plurality of through holes (Hmn). The plurality of through holes (Hmn) may have a square shape. The through holes (Hmn) may be arranged in a matrix form along the first direction and the second direction. The number (m) of the holes in the first direction described above is three. The number (n) of the holes in the second direction is three. The through hole may have a hole protrusion (122). The hole protrusion (122) may include a sealing portion (not shown) in sealing with the insulating plate. The above sealing portion may include an O-ring groove.

上述絕緣板(Smn)130可插入設置于上述貫通孔(Hmn)。上述絕緣板(130)可設置于上述孔突起(122)上。上述金屬上板(130)可包括石英(quartz)、鋁氧化物及陶瓷中的至少一種。為了便於說明,只顯示上述絕緣板(Smn)130中的S31。上述絕緣板(Smn)130的不同位置可具有均勻的厚度。根據本發明的變形實施例,上述絕緣板(Smn)130可根據不同的位置具有不同的厚度。The insulating plate (Smn) 130 may be inserted into the through hole (Hmn). The insulating plate (130) may be disposed on the hole protrusion (122). The above metal upper plate (130) may include at least one of quartz, aluminum oxide, and ceramic. For the convenience of explanation, only S31 in the above-described insulating plate (Smn) 130 is shown. The different positions of the above insulating sheets (Smn) 130 may have a uniform thickness. According to a variant embodiment of the invention, the insulating plate (Smn) 130 described above may have different thicknesses depending on different locations.

隨著上述等離子發生裝置的面積變大,上述絕緣板(130)的加工或製作可能變難。因此,較佳地,上述絕緣板(130)以適當的大小被加工或製作為宜。在包括上述真空容器100的大面積等離子發生裝置中,若以上述真空容器100的上板形成電介質上板(未圖示),則上述電介質上板可能對壓力及設置於上述電介質上板上的天線所產生的熱衝擊等相對較脆弱。因此,為使上述電介質上板克服上述壓力及熱衝擊,有必要增加上述電介質上板的厚度。但是,若增加上述電介質上板的厚度,可能會減少感應耦合等離子發生效率。因此,較佳地,上述電介質上板以適合的厚度及大小分離。As the area of the plasma generating apparatus becomes larger, processing or fabrication of the insulating sheet (130) may become difficult. Therefore, preferably, the insulating plate (130) is preferably processed or fabricated in an appropriate size. In the large-area plasma generating apparatus including the vacuum container 100, when a dielectric upper plate (not shown) is formed on the upper plate of the vacuum container 100, the dielectric upper plate may be pressed against the dielectric upper plate. The thermal shock generated by the antenna is relatively weak. Therefore, in order to overcome the above-mentioned pressure and thermal shock of the dielectric upper plate, it is necessary to increase the thickness of the dielectric upper plate. However, if the thickness of the upper dielectric plate is increased, the efficiency of inductively coupled plasma generation may be reduced. Therefore, preferably, the dielectric upper plate is separated by a suitable thickness and size.

上述天線結構體(Tmn)140可在上述絕緣板(Smn)130沿上述第一方向及上述第二方向以矩陣型式排列。上述天線結構體(Tmn)140可在上述絕緣板(Smn)130的下部生成感應耦合等離子(inductively coupled plasma)。為了便於說明,上述天線結構體(Tmn)140中只表示T31。上述天線結構體(140)可具有相同的物理性狀或結構。上述天線結構體(Tmn)140可形成於印刷電路基板。上述印刷電路基板可具有雙層結構。形成於上述印刷電路基板的天線結構體可維持相同的結構。上述天線結構體因容易製作及設計,可提高其生產性。上述印刷電路基板可具有耐熱性。The antenna structure (Tmn) 140 may be arranged in a matrix form in the first direction and the second direction in the insulating plate (Smn) 130. The antenna structure (Tmn) 140 may generate an inductively coupled plasma on a lower portion of the insulating plate (Smn) 130. For convenience of explanation, only T31 is shown in the above antenna structure (Tmn) 140. The antenna structure (140) described above may have the same physical properties or structure. The antenna structure (Tmn) 140 described above may be formed on a printed circuit board. The above printed circuit board may have a two-layer structure. The antenna structure formed on the above printed circuit board can maintain the same structure. The antenna structure described above can be improved in productivity because it is easy to manufacture and design. The above printed circuit board can have heat resistance.

根據本發明的變形實施例,上述天線結構體(Tmn)140可彎曲導線或導管所形成。According to a variant embodiment of the invention, the antenna structure (Tmn) 140 described above can be formed by a bendable wire or conduit.

圖2為本發明一實施例等離子發生裝置示意圖。圖2為圖1的平面圖。2 is a schematic view of a plasma generating apparatus according to an embodiment of the present invention. Figure 2 is a plan view of Figure 1.

如圖2及圖1所示,上述等離子發生裝置,包括:絕緣板(Smn),沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板110,包括可設置上述絕緣板130且具有四角形形狀的貫通孔(Hmn);天線結構體(Tmn),設置於上述各絕緣板(Smn)上上述天線結構體(Tmn)可在上述上板下部110形成等離子。上述天線結構體(Tmn)可形成3*3矩陣。根據本發明的變形實施例,m及/或n可為3以上。As shown in FIG. 2 and FIG. 1 , the plasma generating device includes: an insulating plate (Smn) arranged in a matrix along a first direction and a second direction spanning the first direction; and a metal upper plate 110 including the above The insulating plate 130 has a rectangular through hole (Hmn), and an antenna structure (Tmn) is provided on each of the insulating plates (Smn). The antenna structure (Tmn) can form a plasma in the upper plate lower portion 110. The above antenna structure (Tmn) can form a 3*3 matrix. According to a variant embodiment of the invention, m and/or n may be 3 or more.

上述天線結構體(Tmn),包括:第一型天線結構體A,接近於金屬上板110的邊緣而設置;第二型天線結構體B,接近於金屬上板110的邊而設置;及第三天線結構體C,由上述第二型天線結構體B及第一型天線結構體A圍繞而成。上述第一型天線結構體A可包括T31、T33、T13及T11。上述第二型天線結構體B可包括T32、T23、T12及T21。上述第三天線結構體C可包括T22。上述第一型天線結構體A的各天線結構體可比上述第二型天線結構體B的各天線結構體消耗更多電力。上述第二型天線結構體B的各天線結構體可比上述第三型天線結構體C消耗更多電力。The antenna structure (Tmn) includes: a first antenna structure A disposed close to an edge of the metal upper plate 110; and a second antenna structure B disposed close to an edge of the metal upper plate 110; The three-antenna structure C is surrounded by the second antenna structure B and the first antenna structure A. The first antenna structure A described above may include T31, T33, T13, and T11. The second type antenna structure B described above may include T32, T23, T12, and T21. The third antenna structure C described above may include T22. Each of the antenna structures of the first antenna structure A can consume more power than each of the antenna structures of the second antenna structure B. Each of the antenna structures of the second antenna structure B described above can consume more power than the third antenna structure C described above.

上述第一型天線結構體A的各天線結構體、上述第二型天線結構體B的各天線結構體及上述第三型天線結構體各天線結構體可具有相同結構。通過真空容器的壁損失的等離子,上述第一型天線結構體A所形成等離子比上述第二型天線結構體B所形成的等離子多。因此,為使上述金屬上板110下部的等離子密度變得均勻,上述第一型天線結構體A的消耗電力可大於上述第二型天線結構體B的消耗電力。通過真空容器的壁損失的等離子,上述第二型天線結構體B所形成等離子比上述第三型天線結構體C所形成的等離子多。上述第二型天線結構體B的消耗電力可大於上述第三型天線結構體C的消耗電力。因此,可通過向上述天線結構體(Tmn)提供空間上不均勻的電力形成均勻等離子。Each of the antenna structures of the first antenna structure A, the antenna structures of the second antenna structure B, and the antenna structures of the third antenna structure may have the same configuration. The plasma formed by the wall of the vacuum container has a plasma formed by the first antenna structure A more than that of the second antenna structure B. Therefore, in order to make the plasma density of the lower portion of the metal upper plate 110 uniform, the power consumption of the first antenna structure A can be larger than the power consumption of the second antenna structure B. The plasma formed by the wall of the vacuum container has a plasma formed by the second antenna structure B more than that of the third antenna structure C. The power consumption of the second antenna structure B may be larger than the power consumption of the third antenna structure C. Therefore, uniform plasma can be formed by supplying spatially uneven power to the above-described antenna structure (Tmn).

圖3為本發明一實施例等離子發生裝置剖面圖。圖3為圖1的沿I-I'線切開的剖面圖。Figure 3 is a cross-sectional view showing a plasma generating apparatus in accordance with an embodiment of the present invention. Figure 3 is a cross-sectional view taken along line II' of Figure 1.

如圖1至圖3所示,上述第一型天線結構體T31、T33、T13、T11;A所形成的第一型等離子PA,在上述真空容器100的兩邊比其他方向損失更多。上述第二型天線結構體T32、T23、T12、T21;B所形成的第二型等離子PB,在上述真空容器的一邊的方向比其他方向損失更多。上述第三型天線結構體T22;C所形成的第三型等離子PC,可向四周均勻損失。上述第一型等離子PA可包括P31、P33、P13及P11。上述P31、P33、P13及P11可各設置於T31、T33、T13及T11的下部,且可各通過上述T31、T33、T13及T11形成。上述第二型等離子PB可包括P32、P23、P12及P21。上述P32、P23、P12及P21可各設置於T32、T23、T12及T21的下部。上述P32、P23、P12及P21可各通過上述T32、T23、T12及T21形成。上述第三型等離子PC可包括P22。上述P22可通過T22形成。等離子可通過重新結合於上述真空容器100的壁而被消滅。越接近於上述真空容器100的壁,因等離子密度差所造成的擴散損失(diffusion loss)更多。上述第一型天線結構體A、第二型天線結構體B及上述第三型天線結構體C的天線結構體可具有相同的物理性狀。若上述第一型天線結構體A的天線結構體各消耗電力與上述第二型天線結構體B的天線結構體的消耗電力相同,則上述第一型等離子PA的平均等離子密度可小於上述第二型等離子PB的平均等離子密度。另外,若上述第二型天線結構體B的天線結構體各消耗電力和上述第三型天線結構體C的天線的各消耗電力相同,則上述第二型等離子PB的平均等離子密度可小於上述第三型等離子PA的平均等離子密度。這種等離子密度在空間上的不均勻可對等離子處理產生負面影響。因此,為消除等離子密度在空間上的不均勻,有必要維持上述第一至第三型等離子PA、PB、PC的等離子密度的均勻性。上述第一型天線結構體A的天線結構體的消耗電力、第二型天線結構體B的天線結構體的消耗電力及上述第三型天線結構體C的天線結構體的消耗電力,有必要各不相同。As shown in FIGS. 1 to 3, the first type plasma PA formed by the first antenna structures T31, T33, T13, and T11; A is more lost on both sides of the vacuum container 100 than in other directions. The second type plasma PB formed by the second antenna structures T32, T23, T12, and T21; B is more lost in the direction of one side of the vacuum container than in the other direction. The third type plasma PC formed by the third antenna structure T22; C described above can be uniformly lost to the periphery. The first type plasma PA described above may include P31, P33, P13, and P11. The above P31, P33, P13, and P11 may be disposed at the lower portions of T31, T33, T13, and T11, respectively, and may be formed by the above-described T31, T33, T13, and T11. The second type plasma PB described above may include P32, P23, P12, and P21. The above P32, P23, P12, and P21 may be disposed at the lower portions of T32, T23, T12, and T21. The above P32, P23, P12 and P21 may each be formed by the above T32, T23, T12 and T21. The third type plasma PC described above may include P22. The above P22 can be formed by T22. The plasma can be eliminated by recombining the wall of the vacuum vessel 100 described above. The closer to the wall of the vacuum vessel 100 described above, the greater the diffusion loss due to the difference in plasma density. The antenna structures of the first antenna structure A, the second antenna structure B, and the third antenna structure C described above may have the same physical properties. When the power consumption of each of the antenna structures of the first antenna structure A is the same as the power consumption of the antenna structure of the second antenna structure B, the average plasma density of the first type plasma PA may be smaller than the second The average plasma density of the plasma PB. Further, when the power consumption of each of the antenna structures of the second antenna structure B is the same as the power consumption of the antenna of the third antenna structure C, the average plasma density of the second type plasma PB may be smaller than the above. The average plasma density of the Type III plasma PA. This spatial heterogeneity of the plasma density can have a negative impact on plasma processing. Therefore, in order to eliminate the spatial unevenness of the plasma density, it is necessary to maintain the uniformity of the plasma density of the first to third types of plasmas PA, PB, and PC. The power consumption of the antenna structure of the first antenna structure A, the power consumption of the antenna structure of the second antenna structure B, and the power consumption of the antenna structure of the third antenna structure C are necessary. Not the same.

圖4至圖5為本發明一實施例天線結構體示意圖。4 to 5 are schematic views of an antenna structure according to an embodiment of the present invention.

如圖4所示,上述等離子發生裝置,包括:絕緣板(Smn),沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板110,包括可設置上述絕緣板130且具有四角形形狀的貫通孔(Hmn);天線結構體(Tmn),設置於上述各絕緣板上上述天線結構體(Tmn),在上述金屬上板110的下部形成等離子。上述天線結構體(Tmn)可形成4*4矩陣。As shown in FIG. 4, the plasma generating device includes: an insulating plate (Smn) arranged in a matrix along a first direction and a second direction across the first direction; and a metal upper plate 110 including the insulating plate 130. Further, a through hole (Hmn) having a quadrangular shape; an antenna structure (Tmn) is provided on the antenna structure (Tmn) on each of the insulating plates, and a plasma is formed on a lower portion of the metal upper plate 110. The above antenna structure (Tmn) can form a 4*4 matrix.

上述天線結構體(Tmn),可分離為第一型天線結構體A,接近於金屬上板110的兩側面而設置;第二型天線結構體B,接近於金屬上板一側面而設置;及第三型天線結構體C,設置於上述第二型天線結構體之間。上述金屬上板(110)可呈四角形。上述第一型天線結構體A可接近於上述金屬上板110的邊緣而設置。上述第二型天線結構體B可接近於上述金屬上板110的邊而設置。上述第三型天線結構體C可設置於上述金屬上板110的中心。上述第一型天線結構體A可包括T11、T41、T44及T14。上述第二型天線結構體B可包括T21、T31、T42、T43、T34、T24、T13、T12。上述第三天線結構體C可包括T22、T32、T33、T23。The antenna structure (Tmn) can be separated into a first antenna structure A, which is disposed close to both sides of the metal upper plate 110; and the second antenna structure B is disposed close to a side of the metal upper plate; The third antenna structure C is disposed between the second antenna structures. The above metal upper plate (110) may have a quadrangular shape. The first antenna structure A described above can be disposed close to the edge of the metal upper plate 110. The second antenna structure B described above can be disposed close to the side of the metal upper plate 110. The third antenna structure C described above may be disposed at the center of the metal upper plate 110. The first type antenna structure A described above may include T11, T41, T44, and T14. The second antenna structure B described above may include T21, T31, T42, T43, T34, T24, T13, and T12. The third antenna structure C described above may include T22, T32, T33, and T23.

如圖5所示,上述等離子發生裝置,包括:絕緣板(Smn),沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板,包括可設置上述絕緣板130且具有四角形形狀的貫通孔(Hmn);天線結構體(Tmn),設置於上述各絕緣板上上述天線結構體(Tmn)在上述上板下部形成等離子。上述天線結構體可形成2*3矩陣。As shown in FIG. 5, the plasma generating device includes: an insulating plate (Smn) arranged in a matrix along a first direction and a second direction across the first direction; and a metal upper plate including the insulating plate 130 A through hole (Hmn) having a quadrangular shape; an antenna structure (Tmn) provided on each of the insulating plates, wherein the antenna structure (Tmn) forms a plasma on a lower portion of the upper plate. The above antenna structure can form a 2*3 matrix.

上述天線結構體(Tmn),可分離為第一型天線結構體A,接近於金屬上板110的兩側面而設置;第二型天線結構體B,接近於金屬上板一側面而設置。上述金屬上板110可呈四角形。上述第一型天線結構體A可接近於上述金屬上板110的邊緣而設置。上述第二型天線結構體B可接近於上述金屬上板110的邊而設置。上述第一型天線結構體A可包括T11、T31、T32及T12。上述第二型天線結構體B可包括T21、T12。The antenna structure (Tmn) can be separated into a first antenna structure A, which is disposed close to both side faces of the metal upper plate 110. The second antenna structure B is disposed close to a side surface of the metal upper plate. The above metal upper plate 110 may have a quadrangular shape. The first antenna structure A described above can be disposed close to the edge of the metal upper plate 110. The second antenna structure B described above can be disposed close to the side of the metal upper plate 110. The first type antenna structure A described above may include T11, T31, T32, and T12. The second antenna structure B described above may include T21 and T12.

圖6為本發明一實施例等離子發生裝置電路圖。Fig. 6 is a circuit diagram of a plasma generating apparatus according to an embodiment of the present invention.

圖7為本發明一實施例等離子發生裝置不同區域特性示意圖。Fig. 7 is a schematic view showing the characteristics of different regions of a plasma generating apparatus according to an embodiment of the present invention.

如圖6、圖7及圖2所示,電源部170可與天線結構體(Tmn)電連接。在上述電源部170和上述天線結構體(Tmn)之間,可設置用於匹配(matching)阻抗的匹配電路部160。上述電源部170可為AC、RF電源。上述電源部170的輸出阻抗可為50歐姆(Ohm)。上述電源部170可以連續模式或場模式運行。上述匹配電路部160可為向包括上述天線結構體(Tmn)在內的負載(Load),最大限度地傳遞上述電源部170電力的手段。As shown in FIGS. 6, 7, and 2, the power supply unit 170 can be electrically connected to the antenna structure (Tmn). A matching circuit portion 160 for matching impedance may be provided between the power supply unit 170 and the antenna structure (Tmn). The power supply unit 170 may be an AC or RF power supply. The output impedance of the power supply unit 170 described above may be 50 ohms (Ohm). The power supply unit 170 described above can operate in a continuous mode or a field mode. The matching circuit unit 160 may be a means for maximally transmitting power to the power supply unit 170 to a load including the antenna structure (Tmn).

上述電源部170可向上述天線結構體(Tmn)提供電力。上述天線結構體(Tmn)可包括第一型天線結構體240a、第二型天線結構體240b及第三型天線結構體240c。上述電源部170可並聯於上述第一型天線結構體240a、上述第二型天線結構體240b及上述第三型天線結構體240c。上述第一型天線結構體240a可設置於A區域。上述第二型天線結構體240b可設置於B區域。上述第三型天線結構體240c可設置於C區域。上述第一型天線結構體240a可與第一電抗元件150a電串聯。上述第二型天線結構體240b可與第二電抗元件150b電串聯。上述第三型天線結構體240c可與第三電抗元件150c電串聯。根據上述第一型至第三型天線結構體,上述第一至第三電抗元件150a、150b、150c可為分配不同電力的手段。上述電抗元件150a、150b、150c可包括可變電抗元件。上述可變電抗元件可為可變電容器或可變感應器。The power supply unit 170 can supply electric power to the antenna structure (Tmn). The antenna structure (Tmn) may include a first antenna structure 240a, a second antenna structure 240b, and a third antenna structure 240c. The power supply unit 170 may be connected in parallel to the first antenna structure 240a, the second antenna structure 240b, and the third antenna structure 240c. The first antenna structure 240a described above may be disposed in the A region. The second antenna structure 240b described above may be disposed in the B region. The third antenna structure 240c described above may be disposed in the C region. The first type antenna structure 240a described above may be electrically connected in series with the first reactance element 150a. The second antenna structure 240b described above may be electrically connected in series with the second reactance element 150b. The third antenna structure 240c described above may be electrically connected in series with the third reactance element 150c. According to the above-described first to third type antenna structures, the first to third reactance elements 150a, 150b, 150c may be means for distributing different electric power. The above reactive elements 150a, 150b, 150c may include variable reactance elements. The variable reactance element described above may be a variable capacitor or a variable inductor.

根據本發明的變形實施例,可只利用上述第二及第三可變元件150b、150c,向上述第一至第三天線結構體提供不同電力。According to a variant embodiment of the invention, different power can be supplied to the first to third antenna structures using only the second and third variable elements 150b, 150c.

上述第一型天線結構體240a可包括4個天線結構體T31、T33、T13、T11。上述第一型天線結構體240a的天線結構體T31、T33、T13、T11可相互電並聯。Z(T31)、Z(T33)、Z(T13)及Z(T11)可為各包括T31、T33、T13及T11的等價阻抗。The first antenna structure 240a may include four antenna structures T31, T33, T13, and T11. The antenna structures T31, T33, T13, and T11 of the first antenna structure 240a described above may be electrically connected in parallel with each other. Z (T31), Z (T33), Z (T13), and Z (T11) may be equivalent impedances each including T31, T33, T13, and T11.

上述第二型天線結構體240b可包括4個天線結構體T32、T23、T12、T21。上述第二型天線結構體240b的天線結構體T32、T23、T12及T21可相互電並聯。Z(T32)、Z(T23)、Z(T12)及Z(T21)可為包括T32、T23、T12及T21的等價阻抗。The second antenna structure 240b may include four antenna structures T32, T23, T12, and T21. The antenna structures T32, T23, T12, and T21 of the second antenna structure 240b described above may be electrically connected in parallel with each other. Z(T32), Z(T23), Z(T12), and Z(T21) may be equivalent impedances including T32, T23, T12, and T21.

上述第三型天線結構體240c可包括1個天線結構體T22。Z(T22)可為包括上述第三型天線結構體C、240c的等價阻抗。上述第一型天線結構體240a的總阻抗可等於上述第二型天線結構體240b的總阻抗。為了向上述第一型天線結構體240a的天線結構體提供更多電力,上述第一電抗元件150a的阻抗可小於上述第二電抗元件150b的阻抗。另外,上述第二型天線結構體240b的總阻抗可小於上述第三型天線結構體240c的總阻抗。為了向上述第二型天線結構體240b提供更多電力,上述第二電抗元件150b的阻抗可小於上述第三電抗元件150c的阻抗。因此,可確保等離子密度的均勻性。The third antenna structure 240c described above may include one antenna structure T22. Z (T22) may be an equivalent impedance including the above-described third type antenna structures C, 240c. The total impedance of the first type antenna structure 240a may be equal to the total impedance of the second type antenna structure 240b. In order to supply more power to the antenna structure of the first type antenna structure 240a, the impedance of the first reactance element 150a may be smaller than the impedance of the second reactance element 150b. In addition, the total impedance of the second antenna structure 240b may be smaller than the total impedance of the third antenna structure 240c. In order to supply more power to the second type antenna structure 240b, the impedance of the second reactance element 150b may be smaller than the impedance of the third reactance element 150c. Therefore, the uniformity of the plasma density can be ensured.

上述第一天線結構體240a的各天線結構體所消耗的電力PA,可大於上述第二天線結構體240b的各天線結構體所消耗的電力PB。上述第二天線結構體240b的各天線結構體所消耗的電力PB,可大於上述第三天線結構體240c的各天線結構體所消耗的電力PC。因此,可確保上述第一天線結構體A下部的等離子密度NpA、上述第二天線結構體B下部的等離子密度NpB及上述第三天線結構體C下部的等離子密度NpC的均勻性。The power PA consumed by each antenna structure of the first antenna structure 240a may be larger than the power PB consumed by each antenna structure of the second antenna structure 240b. The electric power PB consumed by each of the antenna structures of the second antenna structure 240b may be larger than the electric power PC consumed by each of the antenna structures of the third antenna structure 240c. Therefore, the uniformity of the plasma density NpA in the lower portion of the first antenna structure A, the plasma density NpB in the lower portion of the second antenna structure B, and the plasma density NpC in the lower portion of the third antenna structure C can be ensured.

流經上述第一型天線結構體A的各天線結構體的第一電流IA,可大於流經上述第二型天線結構體B的各天線結構體的第二電流IB。流經上述第二型天線結構體B的各天線結構體的第二電流IB,可大於流經上述第三型天線結構體C的各天線結構體的第三電流IC。因此,可確保上述第一天線結構體A下部的等離子密度NpA、上述第二天線結構體B下部的等離子密度NpB及上述第三天線結構體C下部的等離子密度NpC的均勻性。The first current IA flowing through each of the antenna structures of the first antenna structure A may be greater than the second current IB flowing through each of the antenna structures of the second antenna structure B. The second current IB flowing through each of the antenna structures of the second antenna structure B may be larger than the third current IC flowing through each of the antenna structures of the third antenna structure C. Therefore, the uniformity of the plasma density NpA in the lower portion of the first antenna structure A, the plasma density NpB in the lower portion of the second antenna structure B, and the plasma density NpC in the lower portion of the third antenna structure C can be ensured.

圖8為本發明另一實施例等離子發生裝置電路圖。Figure 8 is a circuit diagram of a plasma generating apparatus according to another embodiment of the present invention.

如圖2及圖8所示,電源部170可與天線結構體(Tmn)電連接。上述電源部170可為多個。上述電源部170可包括第一電源部170a、第二電源部170b及第三電源部170c。上述第一電源部170a、第二電源部170b及第三電源部170c的驅動頻率可相同。As shown in FIGS. 2 and 8, the power supply unit 170 can be electrically connected to the antenna structure (Tmn). The plurality of power supply units 170 may be plural. The power supply unit 170 may include a first power supply unit 170a, a second power supply unit 170b, and a third power supply unit 170c. The driving frequencies of the first power supply unit 170a, the second power supply unit 170b, and the third power supply unit 170c may be the same.

上述電源部170可向上述天線結構體(Tmn)提供電力。上述天線結構體(Tmn)可分離為上述第一型天線結構體A、上述第二型天線結構體B及上述第三型天線結構體C。The power supply unit 170 can supply electric power to the antenna structure (Tmn). The antenna structure (Tmn) can be separated into the first antenna structure A, the second antenna structure B, and the third antenna structure C.

在上述第一電源部170a和上述第一型天線結構體240a之間,可設置用於匹配(matching)阻抗的第一匹配電路部160a。上述第二電源部170b和上述第二型天線結構體240b之間,可設置用於匹配(matching)阻抗的第二匹配電路部160b。在上述第三電源部170c和上述第三型天線結構體240c之間,可設置用於匹配(matching)阻抗的第三匹配電路部160c。上述電源部170a、170b、170c可為AC、RF電源。上述電源部170a、170b、170c的輸出阻抗可為50歐姆(Ohm)。A first matching circuit portion 160a for matching impedance may be provided between the first power supply portion 170a and the first antenna structure 240a. A second matching circuit portion 160b for matching impedance may be provided between the second power supply unit 170b and the second antenna structure 240b. A third matching circuit portion 160c for matching impedance may be provided between the third power supply unit 170c and the third antenna structure 240c. The power supply units 170a, 170b, and 170c may be AC or RF power sources. The output impedance of the power supply units 170a, 170b, and 170c may be 50 ohms (Ohm).

上述第一電源部170a可電連接至第一型天線結構體240a。上述第一型天線結構體240a可包括4個天線結構體T31、T33、T13、T11。Z(T31)、Z(T33)、Z(T13)及Z(T11)可為各包括T31、T33、T13及T11的等價阻抗。T31、T33、T13及T11可並聯。The first power supply unit 170a may be electrically connected to the first type antenna structure 240a. The first antenna structure 240a may include four antenna structures T31, T33, T13, and T11. Z (T31), Z (T33), Z (T13), and Z (T11) may be equivalent impedances each including T31, T33, T13, and T11. T31, T33, T13 and T11 can be connected in parallel.

上述第二電源部170b可電連接至上述第二型天線結構體240b。上述第二型天線結構體240b可包括4個天線結構體T32、T23、T12、T21。Z(T32)、Z(T23)、Z(T12)及Z(T21)可為包括T32、T23、T12及T21的等價阻抗。T32、T23,T12及T21可並聯。The second power supply unit 170b is electrically connectable to the second antenna structure 240b. The second antenna structure 240b may include four antenna structures T32, T23, T12, and T21. Z(T32), Z(T23), Z(T12), and Z(T21) may be equivalent impedances including T32, T23, T12, and T21. T32, T23, T12 and T21 can be connected in parallel.

上述第三電源部170c可電連接至上述第三型天線結構體240c。上述第三型天線結構體C可包括一個天線結構體T22。Z(T22)為包括T33的等價阻抗。The third power supply unit 170c is electrically connectable to the third type antenna structure 240c. The third type antenna structure C described above may include one antenna structure T22. Z(T22) is an equivalent impedance including T33.

上述第一天線結構體240a的各天線結構體所消耗的電力,可大於上述第二天線結構體240b的各天線結構體所消耗的電力。上述第二天線結構體240b的各天線結構體所消耗的電力,可大於上述第三天線結構體240c的各天線結構體所消耗的電力。The power consumed by each of the antenna structures of the first antenna structure 240a may be larger than the power consumed by each of the antenna structures of the second antenna structure 240b. The power consumed by each of the antenna structures of the second antenna structure 240b may be larger than the power consumed by each of the antenna structures of the third antenna structure 240c.

流經上述第一型天線結構體240a的各天線結構體的第一電流IA,可大於流經上述第二型天線結構體240b的各天線結構體的第二電流IB。流經上述第二型天線結構體240b的各天線結構體的第二電流IB,可大於流經上述第三型天線結構體240c的各天線結構體的第三電流IC。The first current IA flowing through each of the antenna structures of the first antenna structure 240a may be greater than the second current IB flowing through each of the antenna structures of the second antenna structure 240b. The second current IB flowing through each of the antenna structures of the second antenna structure 240b may be larger than the third current IC flowing through each of the antenna structures of the third antenna structure 240c.

根據本發明的變形實施例,上述第一電源部170a、第二電源部170b及第三電源部170c的驅動頻率可各不相同。圖9為本發明另一實施例等離子發生裝置示意圖。圖9為圖1的沿II-II'線剖面圖。According to a modified embodiment of the present invention, the driving frequencies of the first power supply unit 170a, the second power supply unit 170b, and the third power supply unit 170c may be different. Figure 9 is a schematic view of a plasma generating apparatus according to another embodiment of the present invention. Figure 9 is a cross-sectional view taken along line II-II' of Figure 1.

如圖1、圖3及圖9所示,上述等離子發生裝置,包括:絕緣板(Smn)130,沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板(Hmn)120,包括其上設置絕緣板130並具有四角形形狀的貫通孔(Hmn)120;天線結構體(Tmn)140,設置於各絕緣板(Smn)130上。上述天線結構體(Tmn)140,在上述絕緣體板下部下部形成等離子。As shown in FIG. 1, FIG. 3 and FIG. 9, the plasma generating apparatus includes: an insulating plate (Smn) 130 arranged in a matrix in a first direction and a second direction across the first direction; a metal upper plate (Hmn 120 includes a through hole (Hmn) 120 having an insulating plate 130 and having a quadrangular shape; an antenna structure (Tmn) 140 is provided on each of the insulating plates (Smn) 130. The antenna structure (Tmn) 140 has a plasma formed on a lower portion of the lower portion of the insulator plate.

真空容器100可為四角形腔室。上述真空容器100可包括排氣部(未圖示)、氣體供應部(未圖示)、基板202及基板固定器204。上述真空容器10)可執行等離子處理工藝。上述等離子處理工藝可包括蝕刻、沉積、離子注入及表面處理中的至少一種。上述基板202及上述基板固定器204可為四角形。上述基板202可為有機發光元件基板、太陽能電池基板、液晶顯示基板或半導體基板。上述基板固定器可包括溫度調解部(未圖示)、靜電夾頭(electrostatic chuck)、電源施加部中的至少一種。上述溫度調解部可調節上述基板的溫度。上述靜電夾頭可為裝卸上述基板的手段。上述電源施加部可為向上述基板施加RF bias電壓的手段。The vacuum vessel 100 can be a quadrangular chamber. The vacuum container 100 may include an exhaust unit (not shown), a gas supply unit (not shown), a substrate 202, and a substrate holder 204. The above vacuum vessel 10) can perform a plasma treatment process. The above plasma treatment process may include at least one of etching, deposition, ion implantation, and surface treatment. The substrate 202 and the substrate holder 204 may have a square shape. The substrate 202 may be an organic light emitting element substrate, a solar cell substrate, a liquid crystal display substrate, or a semiconductor substrate. The substrate holder may include at least one of a temperature adjustment unit (not shown), an electrostatic chuck, and a power application unit. The temperature adjustment unit can adjust the temperature of the substrate. The electrostatic chuck may be a means for attaching and detaching the substrate. The power application unit may be a means for applying an RF bias voltage to the substrate.

上述天線結構體(Tmn)140可分離為上述第一型天線結構體A、上述第二型天線結構體B及上述第三型天線結構體C。T21可在絕緣板S21下部形成等離子P21。T23可在絕緣板S23下部形成等離子P23。T22可在絕緣板S22下部形成等離子P22。The antenna structure (Tmn) 140 can be separated into the first antenna structure A, the second antenna structure B, and the third antenna structure C. T21 can form a plasma P21 in the lower portion of the insulating plate S21. T23 can form a plasma P23 in the lower portion of the insulating plate S23. T22 may form a plasma P22 under the insulating plate S22.

上述第一型天線結構體A相互並聯,且串聯於第一電抗元件(未圖示)。上述第二型天線結構體B相互並聯,且串聯於第二電抗元件電抗元件150b。上述第三型天線結構體C可串聯於第三電抗元件150c。上述第一至第三電抗元件可電達接於匹配電路部160。上述匹配電路部160可電連接於電源部170。The first antenna structures A are connected in parallel to each other and in series to a first reactance element (not shown). The second antenna structures B described above are connected in parallel to each other and in series to the second reactance element reactance element 150b. The third antenna structure C described above may be connected in series to the third reactance element 150c. The first to third reactance elements described above may be electrically connected to the matching circuit portion 160. The matching circuit unit 160 can be electrically connected to the power supply unit 170.

圖10至圖12為本發明一實施例天線結構體示意圖。10 to 12 are schematic views of an antenna structure according to an embodiment of the present invention.

如圖10所示,天線結構體540可包括第一至第四輔助天線540a、540b、540c、540d。上述天線結構體540可為四角形。上述天線結構體540可包括上層及下層的雙層結構。上述天線結構體540可形成於印刷電路基板559。上述天線結構體的厚度可為數毫米至數釐米。上述天線結構體540可在平面圖上為四角形。沿第一方向的上述天線結構體的長度為數十釐米至數米。沿跨過上述第一方向的第二方向的上述天線結構體的長度為數十釐米至數米。上述輔助天線可通過連接線(未圖示)相並聯並形成一個天線結構體。電力端P1、P2、P3、P4可通過上述連接線連接於電源部。另外,接地端G1、G2、G3、G4可通過上述連接線接地。上述連接線可形成於印刷電路基板。流經上述各第一至第四輔助天線540a、540b、540c、540d的電流,可在上面及/或下面實際上形成閉環(closed loop)。As shown in FIG. 10, the antenna structure 540 may include first to fourth auxiliary antennas 540a, 540b, 540c, 540d. The antenna structure 540 described above may have a quadrangular shape. The antenna structure 540 described above may include a two-layer structure of an upper layer and a lower layer. The antenna structure 540 described above may be formed on the printed circuit board 559. The above antenna structure may have a thickness of several millimeters to several centimeters. The antenna structure 540 described above may have a quadrangular shape in plan view. The length of the above-mentioned antenna structure in the first direction is several tens of centimeters to several meters. The length of the antenna structure in the second direction across the first direction is tens of centimeters to several meters. The auxiliary antennas described above may be connected in parallel by a connecting line (not shown) to form an antenna structure. The power terminals P1, P2, P3, and P4 can be connected to the power supply unit through the above connecting wires. In addition, the ground terminals G1, G2, G3, and G4 can be grounded through the above connecting wires. The above connecting wires may be formed on a printed circuit board. The current flowing through each of the first to fourth auxiliary antennas 540a, 540b, 540c, 540d described above may actually form a closed loop above and/or below.

上述第一輔助天線540a可包括第一電力部541、第一延長部543、平面移動部547、第二延長部545及第一接地部549。上述第一電力部541、第一延長部543、平面移動部547、第二延長部(546)及第一接地部549可相互連續電連接。The first auxiliary antenna 540a may include a first power portion 541, a first extension portion 543, a plane moving portion 547, a second extension portion 545, and a first ground portion 549. The first power portion 541, the first extension portion 543, the plane moving portion 547, the second extension portion (546), and the first ground portion 549 may be continuously and electrically connected to each other.

上述第一電力部541可包括平行設置於上層的內線541a及外線541b。上述內線541a的兩端呈直角彎曲以與上述外線541b連接。上述第一電力部541的一端P1提供電力,而上述第一電力部541的另一端可為上述外線541b的延長部。The first power unit 541 may include an inner line 541a and an outer line 541b that are disposed in parallel to the upper layer. Both ends of the inner wire 541a are bent at right angles to be connected to the outer wire 541b. One end P1 of the first power unit 541 is supplied with electric power, and the other end of the first electric power unit 541 may be an extended portion of the outer line 541b.

上述第一延長部543可包括平行設置於上層的543a及外線543b。上述內線543a的兩端呈直角彎曲以與上述外線543b連接。上述外線543b的一端可延長形成。上述第一電力部541的上述外線541b的另一端和上述第一延長部543的上述外線543b的一端可相互呈直角交叉接觸。上述第一延長部543和上述第一電力部541的接觸部可設置於四角形的邊緣。The first extension portion 543 may include 543a and an outer line 543b that are disposed in parallel on the upper layer. Both ends of the inner wire 543a are bent at right angles to be connected to the outer wire 543b. One end of the outer line 543b described above may be formed to be elongated. The other end of the outer wire 541b of the first power portion 541 and one end of the outer wire 543b of the first extension portion 543 may be in cross-angle contact with each other at right angles. The contact portion between the first extension portion 543 and the first power portion 541 may be provided on the edge of the quadrangle.

上述第二延長部545可具有與上述第一延長部相同的形式。The second extension portion 545 may have the same form as the first extension portion described above.

上述第一接地部549可具有與上述電力部相同的形式。上述第二延長部545和上述第一接地部549可設置於沿順時針方向旋轉90度的其他邊緣。上述第一電力部541和上述第一延長部543可設置於上層,而上述第二延長部545及上述第一接地部549可設置於下層。The first ground portion 549 may have the same form as the power portion described above. The second extension portion 545 and the first ground portion 549 may be disposed at other edges that are rotated by 90 degrees in the clockwise direction. The first power portion 541 and the first extension portion 543 may be disposed on the upper layer, and the second extension portion 545 and the first ground portion 549 may be disposed on the lower layer.

上述第一延長部543的上述內線543a的另一端和上述外線543b的另一端,可各連接于上述第二延長部545的內線545a的另一端和外線545b的另一端。上述平面移動部可在貫通上述印刷電路基板的貫通孔中填充導電物質而形成。The other end of the inner wire 543a and the other end of the outer wire 543b of the first extension portion 543 may be connected to the other end of the inner wire 545a of the second extension portion 545 and the other end of the outer wire 545b. The planar moving portion can be formed by filling a through hole penetrating through the printed circuit board with a conductive material.

上述第二至第四輔助天線540b、540c、540c及540d與上述第一輔助天線一樣,可沿順時針方向旋轉對稱排列。The second to fourth auxiliary antennas 540b, 540c, 540c, and 540d may be rotationally symmetrically arranged in the clockwise direction like the first auxiliary antenna.

如圖11所示,天線結構體1140可包括第一及第二輔助天線1140a、1140b。上述天線結構體1140可形成於印刷電路基板1149。電力端P1、P2可連接於電源部。另外,接地端G1、G2可接地。上述天線結構體1140可由上、下兩層構成。上述天線結構體1140可為四角形。上述第一輔助天線1140a可包括第一電力部1141、第一延長部1142、第二延長部1143、平面移動部1144、第三延長部1145、第四延長部1146及第一接地部1147。As shown in FIG. 11, the antenna structure 1140 may include first and second auxiliary antennas 1140a, 1140b. The antenna structure 1140 described above can be formed on the printed circuit board 1149. The power terminals P1 and P2 can be connected to the power supply unit. In addition, the ground terminals G1, G2 can be grounded. The antenna structure 1140 described above may be composed of two layers, upper and lower. The antenna structure 1140 described above may have a quadrangular shape. The first auxiliary antenna 1140a may include a first power portion 1141, a first extension portion 1142, a second extension portion 1143, a plane moving portion 1144, a third extension portion 1145, a fourth extension portion 1146, and a first ground portion 1147.

第一電力部1141、第一延長部1142、第二延長部1143、平面移動部1144、第三延長部1145、第四延長部1146及第一接地部1147可相互連續電連接。上述第一電力部1141可設置於上面的第一邊。上述第一延長部1142可設置於上面的第二邊。上述第二延長部1143可設置於上面的第三邊。上述第三延長部1145可設置於下面的第三邊。上述第四延長部1146可設置於下面的第四邊。上述第一接地部1147可設置於下面的第一邊。第一電力部1141、第二延長部1143、第三延長部1145及第一接地部1147可具有相同的長度。上述第一延長部1142及上述第四延長部1146的長度可相同。上述第一延長部1142的長度可為上述第一電力部的長度的兩倍。上述第一電力部1141可具有與上述第一接地部1147相同的形狀。上述第二延長部1143和上述第三延長部1145可具有相同的形狀。上述第一延長部1142和上述第四延長部1146可具有相同的形狀。The first power unit 1141, the first extension portion 1142, the second extension portion 1143, the plane movement portion 1144, the third extension portion 1145, the fourth extension portion 1146, and the first ground portion 1147 may be continuously electrically connected to each other. The first power unit 1141 described above may be disposed on the first side of the upper surface. The first extension 1142 described above may be disposed on the second side of the upper surface. The second extension portion 1143 may be disposed on the third side of the upper surface. The third extension portion 1145 may be disposed on the third side below. The fourth extension portion 1146 may be disposed on the fourth side below. The first grounding portion 1147 may be disposed on the first side below. The first power portion 1141, the second extension portion 1143, the third extension portion 1145, and the first ground portion 1147 may have the same length. The lengths of the first extension portion 1142 and the fourth extension portion 1146 may be the same. The length of the first extension portion 1142 may be twice the length of the first power portion. The first power unit 1141 may have the same shape as the first ground portion 1147 described above. The second extension portion 1143 and the third extension portion 1145 described above may have the same shape. The first extension portion 1142 and the fourth extension portion 1146 may have the same shape.

上述第一電力部1141可包括平行設置於上層的內線1141a及外線1141b,且上述內線1141a的兩端呈直角彎曲以連接至上述外線1141b。上述第一電力部1141的一端P1可提供電力,而上述第一電力部1141的另一端可為上述外線1141的延長部分。The first power unit 1141 may include an inner line 1141a and an outer line 1141b disposed in parallel on the upper layer, and both ends of the inner line 1141a are bent at a right angle to be connected to the outer line 1141b. One end P1 of the first power unit 1141 may provide power, and the other end of the first power unit 1141 may be an extension of the outer line 1141.

上述第一延長部1142可包括平行設置於上層的1142a及外線1142b。上述內線的兩端可彎曲以與外線連接。上述內線1142a可呈直角彎曲以連接至上述外線1142b。上述第一延長部1142的上述外線1142b兩端可延長形成。上述第一電力部1141的上述外線1141b的另一端和上述第一延長部1142的上述外線1142b的一端可呈直角交叉接觸。The first extension portion 1142 may include a 1142a and an outer line 1142b that are disposed in parallel on the upper layer. Both ends of the above inner wire may be bent to be connected to the outer wire. The inner wire 1142a may be bent at a right angle to be connected to the outer wire 1142b. Both ends of the outer line 1142b of the first extension portion 1142 can be formed to be elongated. The other end of the outer wire 1141b of the first power portion 1141 and one end of the outer wire 1142b of the first extension portion 1142 may be in perpendicular contact with each other.

上述第二延長部1143可包括平行設置於上層的1143a及外線1143b。上述內線1143a的一端可彎曲以與上述外線1143b連接。上述第二延長部1143的上述外線1143b的兩端可延長形成。上述第一延長部1142的上述外線1142b的另一端和上述第二延長部1143的上述外線1143b的一端可呈直角交叉接觸。The second extension portion 1143 may include a 1143a and an outer line 1143b that are disposed in parallel on the upper layer. One end of the inner wire 1143a is bendable to be connected to the outer wire 1143b. Both ends of the outer line 1143b of the second extension portion 1143 may be formed to be elongated. The other end of the outer line 1142b of the first extension portion 1142 and one end of the outer line 1143b of the second extension portion 1143 may be in perpendicular contact with each other.

上述第三延長部1145可具有與上述第二延長部1143相同的形式。The third extension portion 1145 may have the same form as the second extension portion 1143 described above.

上述平面移動部1144相互連接上述第二延長部1143和上述第三延長部1145且從上層向下層延長形成。The plane moving portion 1144 is connected to the second extension portion 1143 and the third extension portion 1145, and is formed to extend from the upper layer to the lower layer.

上述第四延長部可具有與上述第一延長部相同的形式。上述第三延長部1145可與上述第四延長部1146呈直角連接。The fourth extension portion may have the same form as the first extension portion described above. The third extension portion 1145 can be connected to the fourth extension portion 1146 at a right angle.

上述第一接地部1147可具有與上述第一電力部1141相同的形式。上述第四延長部1146可呈直角連接於上述第一接地部1141。The first ground portion 1147 may have the same form as the first power portion 1141 described above. The fourth extension portion 1146 may be connected to the first ground portion 1141 at a right angle.

上述第二輔助天線1140b可與上述第一輔助天線1140a一樣,沿順時針方向旋轉180度對稱排列。The second auxiliary antenna 1140b may be symmetrically arranged in a clockwise direction by 180 degrees like the first auxiliary antenna 1140a.

如圖12所示,天線結構體2140可包括第一及第二輔助天線2140a、2140b。上述天線結構體2140可形成於印刷電路基板2249。電力端P1、P2可連接於電源部。另外,接地端G1、G2可接地。上述天線結構體2140可為雙層結構。As shown in FIG. 12, the antenna structure 2140 may include first and second auxiliary antennas 2140a, 2140b. The antenna structure 2140 described above may be formed on the printed circuit board 2249. The power terminals P1 and P2 can be connected to the power supply unit. In addition, the ground terminals G1, G2 can be grounded. The antenna structure 2140 described above may have a two-layer structure.

上述第一輔助天線2140a可包括第一電力部2141、第一延長部2142、第二延長部2143、平面移動部2144、第三延長部2145、第四延長部2146及第一接地部2147。上述第一電力部2141、第一延長部2142、第二延長部2143、平面移動部2144、第三延長部2145、第四延長部2146及第一接地部2147可相互連續電連接。The first auxiliary antenna 2140a may include a first power unit 2141, a first extension portion 2142, a second extension portion 2143, a plane moving portion 2144, a third extension portion 2145, a fourth extension portion 2146, and a first ground portion 2147. The first power unit 2141, the first extension portion 2142, the second extension portion 2143, the plane moving portion 2144, the third extension portion 2145, the fourth extension portion 2146, and the first ground portion 2147 may be continuously electrically connected to each other.

上述第一電力部2141可設置於上層的第一邊。上述第一延長部2142可設置於上面的第二邊。上述第二延長部2143可設置於上面的第三邊。上述第三延長部2145可設置於下面的第三邊。上述第四延長部2146可設置於下面的第四邊。上述第一接地部2147可設置於下面的第一邊。上述電力部2141、第二延長部2143、第三延長部2145及第一接地部2147的長度可相同。上述第一延長部2142及第四延長部2146的長度可相同。The first power unit 2141 may be disposed on the first side of the upper layer. The first extension 2142 may be disposed on the second side of the upper surface. The second extension 2143 may be disposed on the third side of the upper surface. The third extension 2145 may be disposed on the third side below. The fourth extension 2146 may be disposed on the fourth side below. The first grounding portion 2147 may be disposed on the first side below. The lengths of the power unit 2141, the second extension 2143, the third extension 2145, and the first ground portion 2147 may be the same. The lengths of the first extension portion 2142 and the fourth extension portion 2146 may be the same.

上述第一電力部2141、第二延長部2143、第三延長部2145及第一接地部2147可具有相同形狀。上述第一延長部2142及第四延長部2146可具有相同形狀。上述平面移動部2144可與上面的第二延長部2143一起連接至第三延長部2145。The first power unit 2141, the second extension 2143, the third extension 2145, and the first ground portion 2147 may have the same shape. The first extension portion 2142 and the fourth extension portion 2146 may have the same shape. The plane moving portion 2144 may be coupled to the third extension portion 2145 together with the upper second extension portion 2143.

上述第二輔助天線2140b可具有與上述第一輔助天線相同的形狀,且可沿順指針方向旋轉180度對稱排列。The second auxiliary antenna 2140b may have the same shape as the first auxiliary antenna described above, and may be arranged symmetrically by 180 degrees in the forward direction.

上述天線結構體2140可形成於雙面印刷電路基板2249。上述天線結構體2140可通過對上述印刷電路基板2249構成圖案(patterning)而形成。上述天線結構體可包括銅、金、銀、鋁、錫中的至少一種。The antenna structure 2140 described above can be formed on the double-sided printed circuit board 2249. The antenna structure 2140 can be formed by patterning the printed circuit board 2249. The antenna structure described above may include at least one of copper, gold, silver, aluminum, and tin.

圖13為本發明另一實施例等離子發生裝置示意圖。如圖13所示,上述等離子發生裝置包括沿第一方向及跨過上述第一方向的第二方向以矩陣形式排列並呈四角形形狀的天線結構體(Tmn)3140a、3140b、3140c。沿第一方向及跨過上述第一方向的第二方向以矩陣形式排列的絕緣板(Smn)130設置於上述天線結構體下方。金屬上板110包括設置於上述絕緣板130並呈四角形形狀的貫通孔(Hmn)120。上述天線結構體(Tmn),在上述金屬上板110的下部形成等離子。上述天線結構體(Tmn),包括:第一型天線結構體3140a,設置於上述四角形邊緣;第二型天線結構體3140b,接近於上述四角形的邊而設置;及第三型天線結構體3140c,由上述第二型天線結構體3140b及第一型天線結構體3140a圍繞而成。上述第一型天線結構體3140a可設置於A區域,而上述第二天線結構體3140b可設置於B區域。上述第三型天線結構體3140c可設置於C區域。Figure 13 is a schematic view of a plasma generating apparatus according to another embodiment of the present invention. As shown in FIG. 13, the plasma generating apparatus includes antenna structures (Tmn) 3140a, 3140b, and 3140c which are arranged in a matrix form in a first direction and a second direction across the first direction and have a quadrangular shape. An insulating plate (Smn) 130 arranged in a matrix in a first direction and a second direction across the first direction is disposed under the antenna structure. The metal upper plate 110 includes a through hole (Hmn) 120 which is provided in the insulating plate 130 and has a quadrangular shape. In the antenna structure (Tmn), plasma is formed in a lower portion of the metal upper plate 110. The antenna structure (Tmn) includes: a first antenna structure 3140a disposed on the quadrangular edge; a second antenna structure 3140b disposed adjacent to the quadrilateral side; and a third antenna structure 3140c, The second antenna structure 3140b and the first antenna structure 3140a are surrounded by the second antenna structure. The first antenna structure 3140a may be disposed in the A region, and the second antenna structure 3140b may be disposed in the B region. The third antenna structure 3140c described above may be disposed in the C region.

上述金屬上板110可呈四角形形狀。上述第一型天線結構體3140a可接近於上述金屬上板110的邊緣而設置。上述第二型天線結構體3140b可接近於上述金屬上板110的邊而設置。上述第三型天線結構體3140c可設置於上述金屬上板110的中心。The above metal upper plate 110 may have a quadrangular shape. The first antenna structure 3140a described above can be disposed close to the edge of the metal upper plate 110. The second antenna structure 3140b is provided close to the side of the metal upper plate 110. The third type antenna structure 3140c may be disposed at the center of the metal upper plate 110.

如圖10至12所示,上述第一型天線結構體3140a、上述第二型天線結構體3140b及上述第三型天線結構體3140c可具有不同的物理結構。上述第一型天線結構體3140a、上述第二型天線結構體3140b及上述第三型天線結構體3140c可具有各不相同的阻抗。As shown in FIGS. 10 to 12, the first antenna structure 3140a, the second antenna structure 3140b, and the third antenna structure 3140c may have different physical structures. The first antenna structure 3140a, the second antenna structure 3140b, and the third antenna structure 3140c may have different impedances.

通過上述第一型天線結構體3140a、上述第二型天線結構體3140b及上述第三型天線結構體3140c形成於上述金屬上板110下部的等離子可具有均勻性。上述第一型天線結構體3140a可相互並聯。上述第二型天線結構體3140b可相互並聯。電源部(未圖示)可電並聯於上述第一型天線結構體3140a、第二型天線結構體3140b及上述第三型天線3140c。The plasma formed in the lower portion of the metal upper plate 110 by the first antenna structure 3140a, the second antenna structure 3140b, and the third antenna structure 3140c may have uniformity. The first antenna structures 3140a described above may be connected in parallel with each other. The second antenna structures 3140b described above may be connected in parallel with each other. A power supply unit (not shown) may be electrically connected in parallel to the first antenna structure 3140a, the second antenna structure 3140b, and the third antenna 3140c.

Smn...絕緣板Smn. . . Insulation board

Hmn...貫通孔Hmn. . . Through hole

Tmn...天線結構體Tmn. . . Antenna structure

A...第一型天線結構體A. . . First antenna structure

B...第二型天線結構體B. . . Second antenna structure

C...第三型天線結構體C. . . Third antenna structure

PA...第一型等離子PA. . . Type 1 plasma

PB...第二型等離子PB. . . Second type plasma

PC...第三型等離子PC. . . Type III plasma

PA,PB,PC...電力PA, PB, PC. . . electric power

NpA,NpB,NpC...等離子密度NpA, NpB, NpC. . . Plasma density

P1...一端P1. . . One end

IA...第一電流IA. . . First current

IB...第二電流IB. . . Second current

IC...第三電流IC. . . Third current

P1、P2、P3、P4...電力端P1, P2, P3, P4. . . Power side

G1、G2、G3、G4...接地端G1, G2, G3, G4. . . Ground terminal

100...真空容器100. . . Vacuum container

110...金屬上板110. . . Metal plate

130...絕緣板130. . . Insulation board

140...天線結構體140. . . Antenna structure

150a...第一電抗元件150a. . . First reactance element

150b...第二電抗元件150b. . . Second reactance element

150c...第三電抗元件150c. . . Third reactance element

160...匹配電路部160. . . Matching circuit

160a...第一匹配電路部160a. . . First matching circuit unit

160b...第二匹配電路部160b. . . Second matching circuit unit

160c...第三匹配電路部160c. . . Third matching circuit unit

170...電源部170. . . Power supply department

170a...第一電源部170a. . . First power supply unit

170b...第二電源部170b. . . Second power supply unit

170c...第三電源部170c. . . Third power supply unit

240a...第一型天線結構體240a. . . First antenna structure

240b...第二型天線結構體240b. . . Second antenna structure

240c...第三型天線結構體240c. . . Third antenna structure

540...天線結構體540. . . Antenna structure

540a...第一輔助天線540a. . . First auxiliary antenna

540b...第二輔助天線540b. . . Second auxiliary antenna

540c...第三輔助天線540c. . . Third auxiliary antenna

540d...第四輔助天線540d. . . Fourth auxiliary antenna

541...第一電力部541. . . First power department

541a,543a...內線541a, 543a. . . Inside line

541b,543b,545b...外線541b, 543b, 545b. . . Outside line

543...第一延長部543. . . First extension

545...第二延長部545. . . Second extension

547...平面移動部547. . . Plane moving part

549...第一接地部549. . . First grounding

1140...天線結構體1140. . . Antenna structure

1140a...第一輔助天線1140a. . . First auxiliary antenna

1140b...第二輔助天線1140b. . . Second auxiliary antenna

1141...第一電力部1141. . . First power department

1142...第一延長部1142. . . First extension

1142b,1141b,1143b...外線1142b, 1141b, 1143b. . . Outside line

1142a,1143a...內線1142a, 1143a. . . Inside line

1143...第二延長部1143. . . Second extension

1144...平面移動部1144. . . Plane moving part

1145...第三延長部1145. . . Third extension

1146...第四延長部1146. . . Fourth extension

1147...第一接地部1147. . . First grounding

1149...印刷電路基板1149. . . Printed circuit board

2140...天線結構體2140. . . Antenna structure

2140a...第一輔助天線2140a. . . First auxiliary antenna

2140b...第二輔助天線2140b. . . Second auxiliary antenna

2141...第一電力部2141. . . First power department

2142...第一延長部2142. . . First extension

2143...第二延長部2143. . . Second extension

2144...平面移動部2144. . . Plane moving part

2145...第三延長部2145. . . Third extension

2146...第四延長部2146. . . Fourth extension

2147...第一接地部2147. . . First grounding

2249...印刷電路基板2249. . . Printed circuit board

3140a、3140b、3140c...天線結構體3140a, 3140b, 3140c. . . Antenna structure

3140a...第一型天線結構體3140a. . . First antenna structure

3140b...第二型天線結構體3140b. . . Second antenna structure

3140c...第三型天線結構體3140c. . . Third antenna structure

圖1為本發明一實施例等離子發生裝置示意圖;1 is a schematic view of a plasma generating apparatus according to an embodiment of the present invention;

圖2為本發明一實施例等離子發生裝置平面圖;Figure 2 is a plan view showing a plasma generating apparatus according to an embodiment of the present invention;

圖3為本發明一實施例等離子發生裝置剖面圖;Figure 3 is a cross-sectional view showing a plasma generating apparatus according to an embodiment of the present invention;

圖4至圖5為本發明另一實施例等離子發生裝置平面圖;4 to FIG. 5 are plan views of a plasma generating apparatus according to another embodiment of the present invention;

圖6為本發明一實施例等離子發生裝置電路圖;Figure 6 is a circuit diagram of a plasma generating apparatus according to an embodiment of the present invention;

圖7為本發明一實施例等離子發生裝置不同區域特性示意圖;FIG. 7 is a schematic diagram showing characteristics of different regions of a plasma generating apparatus according to an embodiment of the present invention; FIG.

圖8為本發明另一實施例等離子發生裝置電路圖;Figure 8 is a circuit diagram of a plasma generating apparatus according to another embodiment of the present invention;

圖9為本發明另一實施例等離子發生裝置示意圖;FIG. 9 is a schematic diagram of a plasma generating apparatus according to another embodiment of the present invention; FIG.

圖10至圖12為本發明一實施例天線結構體示意圖;10 to FIG. 12 are schematic diagrams showing an antenna structure according to an embodiment of the present invention;

圖13為本發明另一實施例等離子發生裝置示意圖。Figure 13 is a schematic view of a plasma generating apparatus according to another embodiment of the present invention.

S31‧‧‧絕緣板S31‧‧‧Insulation board

H11、H12、H13‧‧‧貫通孔H11, H12, H13‧‧‧ through holes

H21、H22、H23‧‧‧貫通孔H21, H22, H23‧‧‧ through holes

H31、H32、H33‧‧‧貫通孔H31, H32, H33‧‧‧ through holes

T31‧‧‧天線結構體T31‧‧‧Antenna structure

100‧‧‧真空容器100‧‧‧vacuum container

110‧‧‧金屬上板110‧‧‧Metal upper plate

122‧‧‧孔突起122‧‧‧ hole protrusion

130‧‧‧絕緣板130‧‧‧Insulation board

140‧‧‧天線結構體140‧‧‧Antenna structure

Claims (29)

一種等離子發生裝置,包括:絕緣板(Smn),沿第一方向及跨過第一方向的第二方向以矩陣形式排列;金屬上板,包括其上設置絕緣板並具有四角形形狀的貫通孔(Hmn);及天線結構體(Tmn),設置於各絕緣板上;其特徵在於:上述天線結構體,包括:第一型天線結構體,接近於金屬上板的邊緣而設置;第二型天線結構體,接近於金屬上板的邊而設置;其中,第一型天線結構體比第二型天線結構體消耗更多的電力,從而可形成均勻等離子。A plasma generating apparatus comprising: an insulating plate (Smn) arranged in a matrix form along a first direction and a second direction across the first direction; a metal upper plate including a through hole having an insulating plate and having a quadrangular shape And an antenna structure (Tmn) disposed on each of the insulating plates; wherein the antenna structure comprises: a first antenna structure, disposed close to an edge of the metal upper plate; and a second antenna The structure is disposed close to the edge of the metal upper plate; wherein the first type antenna structure consumes more power than the second type antenna structure, thereby forming a uniform plasma. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述天線結構體還包括由上述第二型天線結構體及上述第一型天線結構體圍繞而成的第三型天線結構體。A plasma generating apparatus according to claim 1, wherein the antenna structure further includes a third antenna structure surrounded by the second antenna structure and the first antenna structure. 根據請求項2所述的一種等離子發生裝置,其特徵在於:上述第二型天線結構體比上述第三型天線結構體消耗更多電力。A plasma generating apparatus according to claim 2, wherein the second antenna structure consumes more power than the third antenna structure. 根據請求項2所述的一種等離子發生裝置,其特徵在於:沿上述第一方向排列的絕緣板的數(m)為3以上,而沿上述第二方向排列的絕緣板的數(n)為3以上。A plasma generating apparatus according to claim 2, wherein the number (m) of the insulating plates arranged in the first direction is 3 or more, and the number (n) of the insulating plates arranged in the second direction is 3 or more. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述第一型天線結構體相互電串聯,而上述第二型天線結構體相互電並聯。A plasma generating apparatus according to claim 1, wherein the first antenna structures are electrically connected in series to each other, and the second antenna structures are electrically connected in parallel with each other. 根據請求項2所述的一種等離子發生裝置,其特徵在於:上述第三型天線結構體相互電並聯。A plasma generating apparatus according to claim 2, wherein the third antenna structures are electrically connected in parallel with each other. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述天線結構體形成於印刷電路板或由導線彎曲形成。A plasma generating apparatus according to claim 1, wherein the antenna structure is formed on a printed circuit board or formed by bending a wire. 根據請求項7所述的一種等離子發生裝置,其特徵在於:上述印刷電路板為雙面基板,而上述天線結構體包括金、銀、銅、鎳、錫中的至少一種。A plasma generating apparatus according to claim 7, wherein the printed circuit board is a double-sided board, and the antenna structure comprises at least one of gold, silver, copper, nickel, and tin. 根據請求項1或2所述的一種等離子發生裝置,其特徵在於:上述天線結構體可具有相同形狀。A plasma generating apparatus according to claim 1 or 2, wherein the antenna structure has the same shape. 根據請求項1所述的一種等離子發生裝置,其特徵在於:還包括與上述第一型天線結構體電串聯的第一電抗元件,及與上述第二型天線結構體電串聯的第二電抗元件中的至少一個。A plasma generating apparatus according to claim 1, further comprising: a first reactance element electrically connected in series with said first antenna structure; and a second reactance element electrically connected in series with said second antenna structure At least one of them. 根據請求項2所述的一種等離子發生裝置,其特徵在於:還包括與上述第一型天線結構體電串聯的第一電抗元件、與上述第二型天線結構體電串聯的第二電抗元件、及上述第三型天線結構體電串聯的第三電抗元件中的至少一個。A plasma generating apparatus according to claim 2, further comprising: a first reactance element electrically connected in series with the first type antenna structure; and a second reactance element electrically connected in series with the second type antenna structure; And at least one of the third reactance elements electrically connected in series with the third type antenna structure. 根據請求項11所述的一種等離子發生裝置,其特徵在於:上述第一電抗元件、第二電抗元件及第三電抗元件,包括可變電抗元件。A plasma generating apparatus according to claim 11, wherein the first reactance element, the second reactance element, and the third reactance element include a variable reactance element. 根據請求項11所述的一種等離子發生裝置,其特徵在於:流經上述第一型天線結構體各天線結構體的第一電流大於流經上述第二型天線結構體各天線結構體的第二電流,而流經上述第二型天線結構體各天線結構體的第二電流大於流經上述第三型天線結構體各天線結構體的第三電流。A plasma generating apparatus according to claim 11, wherein the first current flowing through each of the antenna structures of the first antenna structure is larger than the second current flowing through each of the antenna structures of the second antenna structure The second current flowing through each of the antenna structures of the second antenna structure is greater than the third current flowing through each of the antenna structures of the third antenna structure. 根據請求項2所述的一種等離子發生裝置,其特徵在於:還包括向上述天線結構體(Tmn)提供電力的電源部,而上述電源部電串聯於上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體。A plasma generating apparatus according to claim 2, further comprising: a power supply unit that supplies power to the antenna structure (Tmn), wherein the power supply unit is electrically connected in series to the first antenna structure and the second The antenna structure and the third antenna structure described above. 根據請求項2所述的一種等離子發生裝置,其特徵在於:還包括向上述天線結構體(Tmn)提供電力的多個電源部,其中,第一電源部向上述第一型天線結構體提供電力,第二電源部向上述第二型天線結構體提供電力,而第三電源部向上述第三型天線結構體提供電力。A plasma generating apparatus according to claim 2, further comprising: a plurality of power supply units that supply power to said antenna structure (Tmn), wherein said first power supply unit supplies power to said first type antenna structure The second power supply unit supplies power to the second antenna structure, and the third power supply unit supplies power to the third antenna structure. 根據請求項15所述的一種等離子發生裝置,其特徵在於:上述第一電源部的第一驅動頻率、上述第二電源部的第二驅動頻率及上述第三電源部的第三驅動頻率中的至少一個互相不同。A plasma generating apparatus according to claim 15, wherein the first driving frequency of the first power supply unit, the second driving frequency of the second power supply unit, and the third driving frequency of the third power supply unit are At least one is different from each other. 根據請求項2所述的一種等離子發生裝置,其特徵在於:上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體中的至少一個具有不同的結構。A plasma generating apparatus according to claim 2, wherein at least one of the first antenna structure, the second antenna structure, and the third antenna structure has a different configuration. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述第一型天線結構體及上述第二型天線結構體中的至少一個具有不同的結構。A plasma generating apparatus according to claim 1, wherein at least one of the first antenna structure and the second antenna structure has a different structure. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述天線結構體(Tmn)各具有四角形形狀及雙層結構。A plasma generating apparatus according to claim 1, wherein the antenna structures (Tmn) each have a quadrangular shape and a two-layer structure. 根據請求項1所述的一種等離子發生裝置,其特徵在於:上述天線結構體(Tmn)各由多個輔助天線構成,且設置成在相同平面形成閉環(closed loop)。A plasma generating apparatus according to claim 1, wherein the antenna structures (Tmn) are each composed of a plurality of auxiliary antennas, and are arranged to form a closed loop on the same plane. 一種等離子處理裝置,包括:真空容器,對基板進行等離子處理;基板固定器,設置於上述真空容器內部;金屬上板,設置於上述真空容器上部面且包括多個貫通孔;及天線結構體(Tmn),設置於上述金屬上板上,沿第一方向及跨過第一方向的第二方向以矩陣形式排列,從而形成四角形;其特徵在於:上述天線結構體(Tmn),包括:第一型天線結構體,設置於上述四角形邊緣;第二型天線結構體,接近於四角形的邊而設置;及第三型天線結構體,由上述第二型天線結構體及第一型天線結構體圍繞而成;其中,第一型天線結構體各消耗電力大於上述第二型天線結構體各消耗電力,而上述第二型天線結構體各消耗電力大於上述第三型天線結構體各消耗電力。A plasma processing apparatus comprising: a vacuum container for plasma processing a substrate; a substrate holder disposed inside the vacuum container; a metal upper plate disposed on an upper surface of the vacuum container and including a plurality of through holes; and an antenna structure ( Tmn), disposed on the metal upper plate, arranged in a matrix form along a first direction and a second direction across the first direction to form a quadrangle; wherein the antenna structure (Tmn) includes: first The antenna structure is disposed on the quadrangular edge; the second antenna structure is disposed close to the quadrangular edge; and the third antenna structure is surrounded by the second antenna structure and the first antenna structure The power consumption of each of the first antenna structures is greater than the power consumption of the second antenna structure, and the power consumption of each of the second antenna structures is greater than the power consumption of the third antenna structure. 根據請求項21所述的一種等離子處理裝置,其特徵在於:沿上述第一方向排列的絕緣板的數(m)為3以上,而沿上述第二方向排列的絕緣板的數(n)為3以上。A plasma processing apparatus according to claim 21, wherein the number (m) of the insulating plates arranged in the first direction is 3 or more, and the number (n) of the insulating plates arranged in the second direction is 3 or more. 根據請求項21所述的一種等離子處理裝置,其特徵在於:上述第一型天線結構體相互電並聯,上述第二型天線結構體相互電並聯,而上述第三型天線結構體相互電並聯。A plasma processing apparatus according to claim 21, wherein said first antenna structures are electrically connected in parallel, said second antenna structures are electrically connected in parallel, and said third antenna structures are electrically connected in parallel with each other. 根據請求項21所述的一種等離子處理裝置,其特徵在於:還包括與上述第一型天線結構體電串聯的第一電抗元件、與上述第二型天線結構體電串聯的第二電抗元件、及上述第三型天線結構體電串聯的第三電抗元件中的至少一個。A plasma processing apparatus according to claim 21, further comprising: a first reactance element electrically connected in series with the first type antenna structure; and a second reactance element electrically connected in series with the second type antenna structure; And at least one of the third reactance elements electrically connected in series with the third type antenna structure. 根據請求項24所述的一種等離子處理裝置,其特徵在於:流經上述第一型天線結構體各天線結構體的第一電流大於流經上述第二型天線結構體各天線結構體的第二電流,而流經上述第二型天線結構體各天線結構體的第二電流大於流經上述第三型天線結構體各天線結構體的第三電流。A plasma processing apparatus according to claim 24, wherein the first current flowing through each of the antenna structures of the first antenna structure is larger than the second current flowing through each of the antenna structures of the second antenna structure The second current flowing through each of the antenna structures of the second antenna structure is greater than the third current flowing through each of the antenna structures of the third antenna structure. 根據請求項21所述的一種等離子處理裝置,其特徵在於:還包括向上述天線結構體(Tmn)提供電力的電源部,而上述電源部電並聯於上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體。A plasma processing apparatus according to claim 21, further comprising: a power supply unit that supplies power to the antenna structure (Tmn), wherein the power supply unit is electrically connected in parallel to the first antenna structure and the second The antenna structure and the third antenna structure described above. 根據請求項21所述的一種等離子處理裝置,其特徵在於:還包括向上述天線結構體(Tmn)提供電力的多個電源部,其中,第一電源部向上述第一型天線結構體提供電力,第二電源部向上述第二型天線結構體提供電力,而第三電源部向上述第三型天線結構體提供電力。A plasma processing apparatus according to claim 21, further comprising: a plurality of power supply units that supply power to said antenna structure (Tmn), wherein said first power supply unit supplies power to said first type antenna structure The second power supply unit supplies power to the second antenna structure, and the third power supply unit supplies power to the third antenna structure. 根據請求項21所述的一種等離子處理裝置,其特徵在於:上述第一電源部的第一驅動頻率、上述第二電源部的第二驅動頻率及上述第三電源部的第三驅動頻率中的至少一個互相不同。A plasma processing apparatus according to claim 21, wherein the first driving frequency of the first power supply unit, the second driving frequency of the second power supply unit, and the third driving frequency of the third power supply unit are At least one is different from each other. 根據請求項21所述的一種等離子處理裝置,其特徵在於:上述第一型天線結構體、上述第二型天線結構體及上述第三型天線結構體中的至少一個具有不同的結構。A plasma processing apparatus according to claim 21, wherein at least one of the first antenna structure, the second antenna structure, and the third antenna structure has a different configuration.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807526B (en) * 2021-05-06 2023-07-01 南韓商圓益Ips股份有限公司 Inductively coupled plasma processing apparatus

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101282941B1 (en) * 2010-12-20 2013-07-08 엘아이지에이디피 주식회사 Apparatus for plasma processing
KR101619896B1 (en) * 2014-07-25 2016-05-23 인베니아 주식회사 An plasma process apparatus and an antenna assembly for that
KR101640092B1 (en) * 2014-07-25 2016-07-18 인베니아 주식회사 A plasma generating module and plasma process apparatus comprising the same
CN105430862A (en) * 2014-09-23 2016-03-23 北京北方微电子基地设备工艺研究中心有限责任公司 Surface-wave plasma equipment
CN108735567B (en) * 2017-04-20 2019-11-29 北京北方华创微电子装备有限公司 Surface wave plasma process equipment

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002176038A (en) * 2001-09-25 2002-06-21 Tokyo Electron Ltd Plasma treatment system
TW595272B (en) * 2003-07-18 2004-06-21 Creating Nano Technologies Inc Plasma producing system
US20040244693A1 (en) * 2001-09-27 2004-12-09 Nobuo Ishii Electromagnetic field supply apparatus and plasma processing device
JP2005285564A (en) * 2004-03-30 2005-10-13 Mitsui Eng & Shipbuild Co Ltd Plasma processing equipment
TWI281838B (en) * 2002-05-10 2007-05-21 Tokyo Electron Ltd Method and device for plasma treatment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200253559Y1 (en) * 2001-07-30 2001-11-22 주식회사 플라즈마트 Antenna Structure of Inductively Coupled Plasma Generating Device
JP4482308B2 (en) * 2002-11-26 2010-06-16 東京エレクトロン株式会社 Plasma processing apparatus and plasma processing method
KR100734954B1 (en) * 2005-12-28 2007-07-03 주식회사 플라즈마트 Antenna for Inductively Coupled Plasma Generator

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002176038A (en) * 2001-09-25 2002-06-21 Tokyo Electron Ltd Plasma treatment system
US20040244693A1 (en) * 2001-09-27 2004-12-09 Nobuo Ishii Electromagnetic field supply apparatus and plasma processing device
TWI281838B (en) * 2002-05-10 2007-05-21 Tokyo Electron Ltd Method and device for plasma treatment
TW595272B (en) * 2003-07-18 2004-06-21 Creating Nano Technologies Inc Plasma producing system
JP2005285564A (en) * 2004-03-30 2005-10-13 Mitsui Eng & Shipbuild Co Ltd Plasma processing equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807526B (en) * 2021-05-06 2023-07-01 南韓商圓益Ips股份有限公司 Inductively coupled plasma processing apparatus

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