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TW344819B - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
TW344819B
TW344819B TW086110180A TW86110180A TW344819B TW 344819 B TW344819 B TW 344819B TW 086110180 A TW086110180 A TW 086110180A TW 86110180 A TW86110180 A TW 86110180A TW 344819 B TW344819 B TW 344819B
Authority
TW
Taiwan
Prior art keywords
power supply
internal power
bit line
column select
supply voltage
Prior art date
Application number
TW086110180A
Other languages
English (en)
Inventor
Yasuhiro Matumoto
Mikio Asakura
Kouji Tanaka
Kyoji Yamasaki
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of TW344819B publication Critical patent/TW344819B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Databases & Information Systems (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
TW086110180A 1997-04-04 1997-07-17 Semiconductor memory device TW344819B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9086250A JPH10283776A (ja) 1997-04-04 1997-04-04 半導体記憶装置

Publications (1)

Publication Number Publication Date
TW344819B true TW344819B (en) 1998-11-11

Family

ID=13881581

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086110180A TW344819B (en) 1997-04-04 1997-07-17 Semiconductor memory device

Country Status (6)

Country Link
US (1) US5859799A (zh)
JP (1) JPH10283776A (zh)
KR (1) KR100272070B1 (zh)
CN (1) CN1140903C (zh)
DE (1) DE19753495C2 (zh)
TW (1) TW344819B (zh)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3274306B2 (ja) 1995-01-20 2002-04-15 株式会社東芝 半導体集積回路装置
US6292424B1 (en) 1995-01-20 2001-09-18 Kabushiki Kaisha Toshiba DRAM having a power supply voltage lowering circuit
JP3399787B2 (ja) * 1997-06-27 2003-04-21 富士通株式会社 半導体記憶装置
KR100333684B1 (ko) * 1998-12-30 2002-06-20 박종섭 타이밍마진을확보할수있는신호발생장치
TW439293B (en) * 1999-03-18 2001-06-07 Toshiba Corp Nonvolatile semiconductor memory
JP4748828B2 (ja) * 1999-06-22 2011-08-17 ルネサスエレクトロニクス株式会社 半導体記憶装置
JP4543349B2 (ja) * 1999-09-03 2010-09-15 エルピーダメモリ株式会社 半導体記憶装置
DE19963502B4 (de) * 1999-12-28 2008-01-03 Infineon Technologies Ag Schaltungsanordnung für einen integrierten Halbleiterspeicher mit Spaltenzugriff
JP2003007059A (ja) * 2001-06-22 2003-01-10 Mitsubishi Electric Corp 半導体記憶装置
JP2003109390A (ja) * 2001-09-27 2003-04-11 Toshiba Corp 半導体記憶装置
JP4132795B2 (ja) * 2001-11-28 2008-08-13 富士通株式会社 半導体集積回路
KR100482766B1 (ko) * 2002-07-16 2005-04-14 주식회사 하이닉스반도체 메모리 소자의 컬럼 선택 제어 신호 발생 회로
JP4219663B2 (ja) * 2002-11-29 2009-02-04 株式会社ルネサステクノロジ 半導体記憶装置及び半導体集積回路
US8086884B2 (en) * 2002-12-16 2011-12-27 Hewlett-Packard Development Company, L.P. System and method for implementing an integrated circuit having dynamically variable power limit
JP2004199813A (ja) * 2002-12-19 2004-07-15 Matsushita Electric Ind Co Ltd 半導体記憶装置
JP3920827B2 (ja) * 2003-09-08 2007-05-30 三洋電機株式会社 半導体記憶装置
KR100609039B1 (ko) * 2004-06-30 2006-08-10 주식회사 하이닉스반도체 입출력 라인 회로
US20060077729A1 (en) * 2004-10-07 2006-04-13 Winbond Electronics Corp. Low current consumption at low power DRAM operation
KR100621554B1 (ko) 2005-08-01 2006-09-11 삼성전자주식회사 반도체 메모리 장치
US7158432B1 (en) * 2005-09-01 2007-01-02 Freescale Semiconductor, Inc. Memory with robust data sensing and method for sensing data
JP4769548B2 (ja) 2005-11-04 2011-09-07 インターナショナル・ビジネス・マシーンズ・コーポレーション 半導体記憶装置
JP2009064512A (ja) * 2007-09-06 2009-03-26 Panasonic Corp 半導体記憶装置
JP2012212493A (ja) * 2011-03-31 2012-11-01 Elpida Memory Inc 半導体装置
US9124276B2 (en) * 2012-12-20 2015-09-01 Qualcomm Incorporated Sense amplifier including a level shifter
KR102190868B1 (ko) * 2014-09-17 2020-12-15 삼성전자주식회사 비트라인 연결 배선 저항 차를 보상하는 반도체 메모리 장치
JP6050804B2 (ja) * 2014-11-28 2016-12-21 力晶科技股▲ふん▼有限公司 内部電源電圧補助回路、半導体記憶装置及び半導体装置
CN121075386A (zh) * 2024-06-04 2025-12-05 长鑫科技集团股份有限公司 存储器电路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3155879B2 (ja) * 1994-02-25 2001-04-16 株式会社東芝 半導体集積回路装置
US5710741A (en) * 1994-03-11 1998-01-20 Micron Technology, Inc. Power up intialization circuit responding to an input signal
JPH08298722A (ja) * 1995-04-26 1996-11-12 Mitsubishi Electric Corp 半導体装置および半導体装置の内部電源電位の調整方法
JPH08315570A (ja) * 1995-05-15 1996-11-29 Mitsubishi Electric Corp 半導体記憶装置

Also Published As

Publication number Publication date
DE19753495A1 (de) 1998-10-08
KR19980079406A (ko) 1998-11-25
CN1195862A (zh) 1998-10-14
US5859799A (en) 1999-01-12
CN1140903C (zh) 2004-03-03
DE19753495C2 (de) 1999-12-23
JPH10283776A (ja) 1998-10-23
KR100272070B1 (ko) 2000-11-15

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees