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TW201129810A - Test apparatus and method for measuring common-mode capacitance - Google Patents

Test apparatus and method for measuring common-mode capacitance

Info

Publication number
TW201129810A
TW201129810A TW099121751A TW99121751A TW201129810A TW 201129810 A TW201129810 A TW 201129810A TW 099121751 A TW099121751 A TW 099121751A TW 99121751 A TW99121751 A TW 99121751A TW 201129810 A TW201129810 A TW 201129810A
Authority
TW
Taiwan
Prior art keywords
test apparatus
mode capacitance
signal
measuring
common
Prior art date
Application number
TW099121751A
Other languages
English (en)
Other versions
TWI409470B (zh
Inventor
Min Zhou
Yi-Cong Xie
Jin-Ping Zhou
Jian-Ping Ying
Original Assignee
Delta Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delta Electronics Inc filed Critical Delta Electronics Inc
Publication of TW201129810A publication Critical patent/TW201129810A/zh
Application granted granted Critical
Publication of TWI409470B publication Critical patent/TWI409470B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
TW099121751A 2009-07-01 2010-07-01 共模電容之量測設備及方法 TWI409470B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22219109P 2009-07-01 2009-07-01

Publications (2)

Publication Number Publication Date
TW201129810A true TW201129810A (en) 2011-09-01
TWI409470B TWI409470B (zh) 2013-09-21

Family

ID=43412277

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099121751A TWI409470B (zh) 2009-07-01 2010-07-01 共模電容之量測設備及方法

Country Status (3)

Country Link
US (1) US8686746B2 (zh)
CN (1) CN101943717B (zh)
TW (1) TWI409470B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI467907B (zh) * 2012-02-24 2015-01-01
TWI826831B (zh) * 2021-09-28 2023-12-21 振海資通股份有限公司 電容預檢測裝置及其預檢測方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102495290B (zh) * 2011-12-28 2014-06-11 上海海事大学 交流电力电子模块端口阻抗特性的获取装置及方法
KR101444602B1 (ko) * 2013-05-21 2014-11-03 삼성전기주식회사 정류회로 및 이를 포함하는 전원공급장치
WO2016128790A1 (en) * 2015-02-10 2016-08-18 Michael Rothschild Systems and methods for enhancing communication device performance during interaction with a voice response system
CN106154064B (zh) * 2016-06-22 2019-07-23 武汉理工大学 一种高频变压器共模噪声测试方法
CN106154055B (zh) * 2016-08-20 2022-12-13 福州大学 一种变压器间共噪声等效电容测量方法及设备
US10374504B2 (en) 2016-12-16 2019-08-06 Delta Electronics (Shanghai) Co., Ltd Power unit and power electronic converting device
CN108566071B (zh) 2016-12-16 2021-04-20 台达电子企业管理（上海）有限公司 模块化电源系统
US10148164B2 (en) * 2017-02-27 2018-12-04 Delta Electronics (Shanghai) Co., Ltd. Topology of composite cascaded high-voltage and low-voltage modules
CN117391019B (zh) * 2023-10-18 2024-03-22 广州市德珑电子器件有限公司 Emi电源滤波器的仿真测试方法、装置、设备以及介质

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GB8620658D0 (en) * 1986-08-26 1986-10-01 Era Patents Ltd Testing electrical equipment
US5546005A (en) * 1995-01-09 1996-08-13 Flowline Inc. Guarded capacitance probe and related measurement circuit
US5898581A (en) * 1997-08-27 1999-04-27 Lucent Technologies Inc. Active snubber for buck-based converters and method of operation thereof
ES2183799T3 (es) * 1999-07-13 2003-04-01 Maximilian Indihar Sensor electrico para la medicion de modificaciones de capacitancia y su conversion en una señal de tension.
US7019996B2 (en) * 2003-10-16 2006-03-28 Ballard Power Systems Corporation Power converter employing a planar transformer
US7343558B2 (en) * 2005-03-31 2008-03-11 Teradyne, Inc. Configurable automatic-test-equipment system
US7324356B2 (en) * 2005-10-21 2008-01-29 National Instruments Corporation Common-mode current cancellation with digital pulses for isolated applications
US7482666B2 (en) * 2006-01-12 2009-01-27 Silicon Laboratories Inc. Apparatus and method for optical isolation
CN100394202C (zh) * 2006-01-24 2008-06-11 东北大学 高压交流激励法微小电容测量电路
US7868724B2 (en) * 2006-01-25 2011-01-11 Delta Electronics, Inc. Method for suppressing common mode noise
US20080265917A1 (en) * 2006-10-18 2008-10-30 Porta Systems Corporation Return loss bridge circuit
CN101034119B (zh) * 2007-02-15 2010-10-06 长沙理工大学 配电网对地电容的测量方法
BRPI0700841A (pt) * 2007-03-20 2008-11-04 Santos Eduardo Pedrosa sistema de monitoração em tempo real do estado de buchas capacitivas de transformadores de potência, reatores de potência, transformadores de corrente, disjuntores e congêneres
US20090125279A1 (en) * 2007-11-14 2009-05-14 Intel Corporation Circuitry and methods for time domain channel de-embedding

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI467907B (zh) * 2012-02-24 2015-01-01
TWI826831B (zh) * 2021-09-28 2023-12-21 振海資通股份有限公司 電容預檢測裝置及其預檢測方法

Also Published As

Publication number Publication date
CN101943717A (zh) 2011-01-12
US20110001495A1 (en) 2011-01-06
CN101943717B (zh) 2013-02-20
TWI409470B (zh) 2013-09-21
US8686746B2 (en) 2014-04-01

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