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TW201129816A - Measurement correcting system and method thereof - Google Patents

Measurement correcting system and method thereof

Info

Publication number
TW201129816A
TW201129816A TW099105321A TW99105321A TW201129816A TW 201129816 A TW201129816 A TW 201129816A TW 099105321 A TW099105321 A TW 099105321A TW 99105321 A TW99105321 A TW 99105321A TW 201129816 A TW201129816 A TW 201129816A
Authority
TW
Taiwan
Prior art keywords
signal
output signal
measurement correcting
correcting system
measured
Prior art date
Application number
TW099105321A
Other languages
English (en)
Other versions
TWI413790B (zh
Inventor
Shih-Chieh Chao
Chih-Wen Huang
Chun-Lin Liao
Original Assignee
Tatung Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tatung Co filed Critical Tatung Co
Priority to TW099105321A priority Critical patent/TWI413790B/zh
Priority to US12/765,857 priority patent/US20110208461A1/en
Publication of TW201129816A publication Critical patent/TW201129816A/zh
Application granted granted Critical
Publication of TWI413790B publication Critical patent/TWI413790B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
TW099105321A 2010-02-24 2010-02-24 量測校正系統及其方法 TWI413790B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW099105321A TWI413790B (zh) 2010-02-24 2010-02-24 量測校正系統及其方法
US12/765,857 US20110208461A1 (en) 2010-02-24 2010-04-22 Measurement correcting system and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW099105321A TWI413790B (zh) 2010-02-24 2010-02-24 量測校正系統及其方法

Publications (2)

Publication Number Publication Date
TW201129816A true TW201129816A (en) 2011-09-01
TWI413790B TWI413790B (zh) 2013-11-01

Family

ID=44477221

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099105321A TWI413790B (zh) 2010-02-24 2010-02-24 量測校正系統及其方法

Country Status (2)

Country Link
US (1) US20110208461A1 (zh)
TW (1) TWI413790B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2632017A1 (de) * 2012-02-24 2013-08-28 Magna E-Car Systems GmbH & Co OG Batteriesteuerungsvorrichtung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3565414B2 (ja) * 1999-06-24 2004-09-15 横河電機株式会社 波形観測装置
JP4828730B2 (ja) * 2001-07-05 2011-11-30 富士通株式会社 伝送装置
WO2005096007A1 (ja) * 2004-03-31 2005-10-13 Nec Corporation 磁界センサ
KR101183932B1 (ko) * 2005-03-03 2012-09-18 가부시키가이샤 어드밴티스트 전위 비교기
US20060267605A1 (en) * 2005-05-27 2006-11-30 Yang Kei-Wean C Differential measurement probe having a ground clip system for the probing tips

Also Published As

Publication number Publication date
US20110208461A1 (en) 2011-08-25
TWI413790B (zh) 2013-11-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees