TW200813266A - Plating process - Google Patents
Plating process Download PDFInfo
- Publication number
- TW200813266A TW200813266A TW096120048A TW96120048A TW200813266A TW 200813266 A TW200813266 A TW 200813266A TW 096120048 A TW096120048 A TW 096120048A TW 96120048 A TW96120048 A TW 96120048A TW 200813266 A TW200813266 A TW 200813266A
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- metal
- bath
- silver
- acid
- Prior art date
Links
- 238000007747 plating Methods 0.000 title claims abstract description 53
- 238000000034 method Methods 0.000 title claims abstract description 33
- 230000008569 process Effects 0.000 title description 9
- 229910052751 metal Inorganic materials 0.000 claims description 74
- 239000002184 metal Substances 0.000 claims description 74
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 45
- 229910052709 silver Inorganic materials 0.000 claims description 45
- 239000004332 silver Substances 0.000 claims description 45
- 238000009713 electroplating Methods 0.000 claims description 31
- 239000000463 material Substances 0.000 claims description 23
- 229940088594 vitamin Drugs 0.000 claims description 22
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- 239000011782 vitamin Substances 0.000 claims description 22
- 239000002253 acid Substances 0.000 claims description 21
- 150000001875 compounds Chemical class 0.000 claims description 18
- 239000000203 mixture Substances 0.000 claims description 18
- 150000001413 amino acids Chemical class 0.000 claims description 10
- 238000000576 coating method Methods 0.000 claims description 9
- 239000004094 surface-active agent Substances 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010949 copper Substances 0.000 claims description 5
- 230000000694 effects Effects 0.000 claims description 4
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 claims description 3
- 239000004575 stone Substances 0.000 claims description 3
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- 230000001747 exhibiting effect Effects 0.000 claims 1
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- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 7
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Classifications
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
- C25D7/126—Semiconductors first coated with a seed layer or a conductive layer for solar cells
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1605—Process or apparatus coating on selected surface areas by masking
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1607—Process or apparatus coating on selected surface areas by direct patterning
- C23C18/1608—Process or apparatus coating on selected surface areas by direct patterning from pretreatment step, i.e. selective pre-treatment
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1614—Process or apparatus coating on selected surface areas plating on one side
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1635—Composition of the substrate
- C23C18/1639—Substrates other than metallic, e.g. inorganic or organic or non-conductive
- C23C18/1642—Substrates other than metallic, e.g. inorganic or organic or non-conductive semiconductor
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1646—Characteristics of the product obtained
- C23C18/165—Multilayered product
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/38—Coating with copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/011—Electroplating using electromagnetic wave irradiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1655—Process features
- C23C18/1664—Process features with additional means during the plating process
- C23C18/1667—Radiant energy, e.g. laser
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/42—Coating with noble metals
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Description
200813266 .九、發明說明: 【發明所屬之技術領域】 本發明大體而言係關於金屬電鍍領域。詳言之,本發 明係關於光伏裝置(photovoltaic device)之金屬電鍍領域。 【先前技術】 光伏裝置,如:太陽能電池,通常包含半導體晶圓, 該半導體晶圓形成單一的大PN接面。當電磁輻射(如:陽 光)入射其中時’接面在裝置中產生電載子並產生電流’該 ⑩電流必須經匯集且傳輸至外部電路。所產生之電流大致上 與入射的輻射成比例。金屬圖案(metallic pattern)與PN接 面之兩側呈歐姆接觸以匯集電流。此等金屬圖案需提供低 電阻路徑以使所產生之電流的電阻損失減至最低。該金屬 圖案必須在其實體範圍(physical extent)做限制,尤其是在 裝置的正面,以便於將該阻擋入射輻射能量(亦即,以電流 產生為目的而流失之能量)的表面積減至最小。典型地,該 φ正面金屬圖案包含非常高導電性材料的狹窄長條。 在平板矽太陽能電池的製造中,令人滿意的金屬圖案 可藉由下述方式獲得:施加歐姆接觸之薄型圖案化層及阻 障層材料,以及於隨後再進行金屬化。一種金屬化方法是 使用銀膠(silver paste)進行網版印刷(screen-print),該銀膠 提供具有足夠低電阻的厚導體以供許多應用。然而^該銀 膠本身並不具有足夠低的電阻以提供最理想的太陽能電池 性能。因此需要更能導電的材料,如鍍銀或鍍銅,以將該 會降低太陽能電池效率的電阻損失減至最低。銀以電解方 5 93983 200813266 "式沉積於光伏裝置上,其中係透贿射能的使用而於裝置 中產生電流。在此等電解銀電鍍製程中,當於該裝置的一 表面施加電壓’同時以輻射能照射該襞置的相對表面時, 則達到銀層的均勻沉積。 用於此等光辅助型電鍍⑽ht assisted咖㈣)的習知 鍍 η :夕1慮’如.刼作、廢料處理以及環境的 ίΓ卿㈣用於光伏裝置之光輔助型電 C。 此寺電鍍洽並不含氰化物。美國專利第 调綱Η。此議η)揭露—種由結晶石夕所製成J = :池:;鑛製程。此專利使用含氰化物的銀電鑛浴作為實b 二:::㈣實提及可使用不含氛化物的銀電錢浴: 乂―不含氛化物的一 ^ 浴仍:二ΓΓ,對於合適的不含氛化物之金屬電鑛 射能昭射制其疋銀電鑛浴,該銀電鍍浴可用於以輕 夠的安定性Γ”又衣程,且此等電鐘浴在使用條件下具有足 【發明内容】 本發明彌補了 &、+、^ ^ u 伏效應的光敏裝置(‘々η,,供用於電缠位在展現光 含··提供具有至少方法,包 有光伏接面形成於其中欠體晶圓,該晶圓具 中-者曝露於光時❿〗^日日81的主要表面之其 負电何係匯集於該主要表面之第一者 93983 6 200813266 以及正電荷係匯集於該主_而々μ 一 含氰化物之金屬電获、、欠之弟二者,·使該晶圓與不 € ^ B ID el ^ 、·又办接觸;施加電位於該電鍍浴;以 使》亥日日0曝露於光,以在 ± Φ主二 中該電鍍洛為水溶液且包I:二要表面沉積金屬層,其 確基化合物、至少—種尺^屬離子、至少一種水溶性含 物、以及至少f自:劑、至少—㈣胺基化合 混合物之成分。水溶性胺基酸、水溶性磺酸、及其 接二具主=晶圓t不含氰化物之金屬電鑛浴 φ 、 、面上&供金屬塗饰物。該具體例 中,係每生金屬遷移,該 辞—士 遷移至電鑛洛中,接著異―拉以弟一主要表面的塗佈物 主要表面。 者再攸讀浴遷移至帶負電荷的第- 助型2明所使用之不含氛化物的金屬電鑛浴在用於光輔 、。之光伏裝置上提供金屬沉積物。 【實施方式】 本說明書全文所採用之術語,,電鑛,,意指金屬層的沉 貝如文中所|曰,係藉由例如電鍍或無電電鍵進行沉積。” 二積及”電鍍”在本說明書全文中可交換使用。該不定冠 詞”一 ”(”a”及”an,,)係意欲同時包含單數及複數。除非文^ 另外清楚指示,否則下列縮寫具有下列涵義:攝氏度 數;g=克;mL=毫升;卜升;A=安培;/心分米,· 微米;以及mn=奈米。除非文中另外指示,否則所有百分 比及比率皆以重量表示。所有範圍皆包含上下限值且可: 93983 7 200813266 •任何順序組合使用,^非此等數值範圍顯然受到總和至多 10 0 %之限制外。 大範圍種類的光伏裳置均可使甩於本發明,例如,舉 例而言,太陽能電池。此等光伏裝置典型地係使用半導體 基材,造’例如半導體晶圓。於一具體例中,太陽能電池 係由單晶或多晶或非晶系石夕晶圓組成。於另一具體例中, 太陽能電池係由多晶石夕晶圓組成。雖然下文之敛述係有關 石夕晶圓,但所屬技術領域中具有通常知識者應察知其它適 、合的半導體晶圓,例如錁4化物、石夕·錯、及鍺,亦可適 宜地與本發明併用。當使时晶圓時,該等梦㈣典型地 具有P型基極摻雜(p_type base d〇ping)。 晶圓可為圓形、方形或矩形,或可為任何適合的形狀。 此等晶圓可具有廣泛的尺寸變化。例如··圓形晶圓可呈有 i5〇nm、200nm、300nm、400nm 或更大的直徑。-匕晶圓的背面係經金屬化。該背面可完全經金屬塗佈或 k月面可^刀Μ金屬塗佈,以形成例如栅極(扭句。此 面之金屬化可由各種技術提供,且可在晶圓正面之金屬化 :别施行或是與晶圓正面之金屬化同時施行。於一具體例 中’金屬㈣㈣轉轉形式施加於#面,該導電 =含銀膠、含銘膠或含銀與銘谬。此等導電谬典型地包 S嵌埋於玻璃基質及有機黏結劑中之導電性顆粒 :經由多種技術施加至晶圓,例如網版印刷。施加導恭膠 ^ ’係進行烘烤(fire)以移除該有機黏結劑。當所使用:導 電谬含有!呂時,錯係部分地擴散入該晶圓背面,或如果所 93983 8 200813266 • 使用之導電膠亦含有銀時,則鋁可與銀形成合金。使用此 等含鋁膠可改善電阻接觸(resistive contact)並提供”P+”摻 雜區。亦可藉由先施加鋁或硼,再於隨後進行交互擴散 (interdiffusion),以產生重摻雜”P+”型區。於一具體例中, 可在施加背面金屬塗佈物之前,將含鋁膠施加至背面並烘 烤。來自經烘烤之含鋁膠的殘餘物可視需要在背面金屬塗 佈物施加之前移除。於另一具體例中,可將晶種層(seed layer)沉積於晶圓背面並且可藉由無電電鍍或電解電鍍將 ⑩金屬塗佈物沉積於該晶種層上。藉由使用本發明,位於晶 圓背面之晶種層上的此等金屬沉積可與晶圓正面的金屬沉 積同時施行。 為了提供晶圓正面經改良之光射入幾何以降低反射, 該表面可視需要進行結晶定向組織餘刻(crystal-oriented texture etching)。為了產生半導體接面,係於晶圓正面進 行磷的擴散或離子植入以產生η型摻雜區以及提供具有 赢ΡΝ接面之晶圓。
V 可視需要將介電層加至該晶圓正面。此等介電層可同 時作為鈍化層及抗反射層。合適的介電層包含,但不限於: 氧化矽層,如SiOx ;氮化矽層,如Si3N4 ;氧化矽層及氮 化矽層的組合;以及氧化矽層及/或氮化矽層與氧化鈦層 如:TiOx的組合。前述式中,X為氧原子的數目。此等介 電層可藉由數種技術沉積,例如各種氣相沉積方法。 晶圓正面典型地含有金屬化之圖案。例如,晶圓正面 可由電流匯集線與電流匯流排組成。相對於電流匯流排, 9 93983 200813266 電流匯集線典型地為橫向 (亦即,尺寸)。 且典型地具有相當精細 的結構 〜日曰0正面可使用導電膠進 化,該導電膠可鱼用於曰 b 至荀 /、用於日日51月面的任何導電膠相同或不 同。用於將晶圓正面泰屬/μ AA、音 口止面孟屬化的導電膠典型地不含鋁。 晶圓背面及正面之任你塞带河 、 囬〈任冑¥電膠的烘烤可於 於個別操作中進行。除了別的ra本从 素外,用於烘烤導電膠的 皿摩將取決於所使用之特定導電膠、所使用之任何介電層 (或抗反射層)的厚度。此箄 且古、此寺,皿度之砥擇係所屬技術領域中 ^通⑦知識者能力之内所能完成者。此外,所屬技術領 F =有通常知識者應察知該烘烤製程可於含氧氛圍、惰 ,圍、還原氛圍或此等之任何組合下進行。例如,該供 I在含有少許氧之氛圍中以第—温度進行,接著再於惰 性氛圍或還原氛圍下以第—、、w 一 ^ '月 ㈣卜以弟叫皿度進订,其中該第二溫度比 該弟一溫度更高。 馨於烘烤製程之後,該晶圓可視需要與緩衝之酸溶液接 例如缓衝之氫氟酸溶液,以移除於烘烤程序期間所產 =任何氧化物。此等接觸可藉由錢該溶液至該晶圓上 二日由’又'貝該日日圓至此等溶液中或藉由其它適當的方式進 、於另一具體例中,該晶圓正面係塗佈有視需要之抗反 射層,如氮化矽。之後再將溝槽圖案界定於該晶圓的正面 十。該溝槽圖案延伸穿越該抗反射(或介電)層並進入該晶 圓之半導體主體。該等溝槽可延伸丨至25度至該 93983 10 200813266 日日0之+導體主體内。較深及較溝产 各種方法均可用爽荐才曰冰度均可使用。 =、機械方法及微影製程,所有該等方法皆心 心。此類機械方法包含錯切及劃痕。旦 包含將可成像材料配置 厂左的先心衣私 j形成溝槽,將溝槽圖案轉移至該晶1],把金屬声沉 【案以及移除可成像材料。於-具體例中,係在 i “ Α積於溝槽圖案的步驟之前將該可成像材料移 =。於另—具體例中,係在使金屬層沉積於溝槽圖案的步 之後將材成像材料移除。#該可成像材料存在於金屬 沉積步驟期叫’此等可成像材料應避免任何會吸收金屬 >儿積步驟期間所使用之輕射波長之染料,如對比染料。存 在於電鍍步驟期間的可成像材料應含有對電鍍步驟期間所 使用之輻射波長呈可穿透之染料。 曰忒可成像材料為液體時,此等材料可藉由任何適當 _的技術配置於該晶圓表面,例如,但不限於:旋轉塗佈、 =刀成形、簾幕塗佈及滾筒塗佈。當該可成像材料為乾膜 守此等材料可藉由層合(lamination)方式配置於該晶圓表 面。 該可成像材料的圖案化係藉由將該可成像材料透過遮 罩曝路於光化輪射而完成。光化輻射的選擇將視所選用之 特定可成像材料而定。適合的光化輻射波長包含,但不限 於· 500nm 至低於 2〇〇nm,例如 430nm、405nm、365nm、 248nm及193nm,與極紫外光(EUV)及電子束。雷射亦可 93983 11 200813266 - 用於將該可成像材料圖案化。 接下來將可成像材料之圖案轉移至該晶圓基材。圖案 轉移可使用濕式化學I虫刻技術或使用乾式I虫刻技術進行。 適合的乾式蝕刻技術包含,但不限於:電漿蝕刻,例如反 應性離子蝕刻。該溝槽圖案典型地係由相對狹小的橫截面 尺寸之線條(該等線條為電流匯集線)以及相對粗的橫截面 尺寸之線條(該等線條為匯流排)所組成。該匯流排相對於 電流匯集線呈橫向。 # 該可成像材料可利用適當的聚合物去除劑移除,例如 彼等由 Rohm and Haas Electronic Materials (Marlborough, Massachusetts)所販售者。此等去除劑可為驗性、酸性或實 質上中性。 無論該用於形成溝槽圖案的技術為何,此等溝槽可視 需要與酸(如:氫氟酸)或驗接觸以建構(texture)或粗糙化該 溝槽表面構造。視需要地,可使用η型摻雜劑進行另一擴 馨散製程,而於溝槽區產生,,η++”摻雜。 導電膠典型地係沉積於該晶圓正面的溝槽中。晶圓背 面可於該正面之前、該正面之後、或與該正面同時金屬化。 當該背面使用導電膠予以金屬化時,該正面與背面係典型 地於單一步驟烘烤。 在該晶圓之正面圖案與背面使用導電膠予以金屬化之 後,接著將金屬層沉積於該正面導電性圖案上。此等金屬 層可為任何適當的導電性金屬,例如金、銀或銅,而典型 為銀。於一具體例中,該經沉積之金屬層係由該導電膠中 12 93983 200813266 -所使用之相同金屬所組成。例如,於含銀導電膠上沉積银 層。 相較於僅由經烘烤之導電膠所組成之圖案,該位於經 烘烤之導電膠上含有經沉積之金屬層(尤其是電沉積金屬 層)的圖案係具有增進之效能。此外,於經烘烤之導電膠上 使用經沉積之金屬層將使該電流匯集線及匯流排的寬度得 以減少’該電流匯集線及匯流排之寬度的減少將提供更多 可曝露於入射光的太陽能電池表面,因此有更多的電流產 生。較小的金屬線意謂著有較少的金屬在表面阻擋入射光。 第1圖說明本發明之代表性光伏裝置5,例如太陽能 電池。裝置5具有含PN接面及背面U以及正面12之半 導體晶圓。背面11係經金屬化,例如使用銀予以金屬化。 正面12含有由匯流排14及電流匯集線15所組成之金屬圖 案(如:銀圖案)。該金屬圖案是由在含銀導電膠上之經沉 %之銀層所組成。該金屬圖案與正面12呈歐姆接觸。典型 地’正面12係以抗反射塗佈物覆蓋(未圖示),例如氮化矽 或其它介電材料。 該晶圓現在準備在該正面圖案上以及該經金屬化之^ 面上電鍍金屬層。本發明中,係使用不含氰化物之電似 同時使該晶圓接受入射光而將金屬層,尤其是銀層,沉着 Z經供烤之導電膠上。用於本發明之電錢浴為水溶液』 匕3金屬離子、至少—種水溶性切基化合物、至少一 界面活性劑、至少一種醯胺基化合物、以及至少一種里I 水溶性絲酸、水雜磺酸、^其混合物之成份。^ 93983 13 200813266 -本發明之銀電鍍浴可為由 Rohm and Haas Electronic Materials,Marlborough,Massachusetts.購得之 ENLIGHTtm silver plate 600 ° 本發明電鍍浴的金屬離子可經由使用任何適當的可溶 . 於溶液的金屬化合物提供,典型地為金屬鹽。此等金屬化 合物包含,但不限於:金屬鹵化物;金屬硝酸鹽;金屬羧 酸鹽,如醋酸鹽、金屬曱酸鹽及金屬葡萄糖酸鹽;金屬-胺基酸複合物(complex),如:金屬-半胱胺酸複合物;金 鲁屬烧基續酸鹽,如金屬曱烧續酸鹽及金屬乙烧績酸鹽;金 屬羥烷基(alkylol)磺酸鹽;金屬甲苯基磺酸鹽;以及金屬 驗石黃酸鹽。例示之金屬化合物包含銅化合物、金化合物及 銀化合物。於一具體例中,該金屬化合物為銀化合物。詳 言之,合適的金屬化合物包含硝酸銀、銀-半胱胺酸複合 物、曱烧績酸銀、乙烧磺酸銀、丙烧磺酸銀、紛續酸銀、 以及醋酸銀。所屬技術領域具有通常知識者應察知,當該 0金屬為銀時,該金屬鹽典型地不為鹵化銀,因為此等鹽的 溶解度有限。金屬化合物之混合物可用於本發明之電鍍 浴。此等混合物可為具有相同金屬但為不同化合物之金屬 化合物,如硝酸銀與銀-半胱胺酸複合物之混合物;或是具 有不同金屬之金屬化合物,如銀-半胱胺酸複合物與葡萄糖 酸銅的混合物。當使用具有不同金屬之不同金屬化合物的 摻混物時,本發明之金屬電鍍浴將沉積不同金屬的合金。 該金屬化合物係以充分的量加至該電鍍浴,以於電鍍 浴中提供0.1至60g/L,更典型地自0、5至50g/L,又更典 14 93983 200813266 ^ 型地自1至50g/L的金屬離子濃度。當該金屬離子為銀離 子時,該電鍍浴中的銀雜子濃度典型地量為2至40g/L。 此等金屬化合物一般可由多種來源購得,如:Aldrich chemical company,Milwaukee,Wisconsin 〇 本發明之金屬鍍浴為電鍍浴且含有電解質。任何廣泛 的電解質種類皆可用於本發明金屬電鍍浴,包含酸及驗。 例示性電解質包+,但不限於:烷磺酸類,如甲烷磺酸、 乙烷磺酸及丙烷磺酸;羥烷基磺酸類;芳基磺酸類’如曱 •苯磺酸、苯基磺酸及酚磺酸;含胺基的磺酸類,如醯胺基 磺酸;磺胺酸;礦酸類;羧酸類,如曱酸及鹵乙酸類;氳 鹵酸類(hydrogen halide acid);及焦鱗酸鹽。所屬技術領域 中具有通常知識者應察知酸及鹼之鹽類可使用作為電解 質。再者,該電解質可含有酸之混合物、鹼之混合物、或 一種或多種酸與一種或多種驗之混合物。此等電解質一般 可由多種來源購得,如:Aldrich chemical company。 φ 雖不欲受理論所侷限,但咸信該含硝基化合物於本發 明電鑛浴中具有安定及複合(complex)該電鑛浴之作用。任 何廣泛種類的水溶性含硝基化合物皆可使用。此等含硝基 化合物包含,但不限於:含硝基之羧酸類及其鹽類,以及 含石肖基之續酸類及其鹽類。此等含ί肖基化合物可含有^ 一個 或多個硝基。該水溶性之含硝基化合物典迨地具有至少一 個雜環基。於再一具體例中,該含硝基化合物是芳族雜環 化合物。例示性之含硝基化合物包含,但不限於:2-硝基 鄰苯二曱酸、3_硝基鄰苯二曱酸、4-硝基鄰苯二曱酸及/或 15 93983 200813266 -間石肖基苯石黃酸。典型地,該含石肖基化合物在該電鑛浴中的 使用量為(U至200g/L,且更典型地為〇 5至17够,又 ^典型地為!至15Gg/L。此等含石肖基化合物—般可種 來源購得,如 ★廣泛的界面活性劑種類皆可使用於本發明中。任何的 陰離子性、_子性、兩性料性及非料性界面活性劑 ㈣使用。例示性之非離子性界面活性劑包含號轴酸之醋 ,於4體例中’該界面活性劑係選自陽離子性及兩性 T子性界面活性劑。例示性之陽離子性界面活性劑包含, ,不限於:自Degussa所購得之商標名為teg〇tainTa^々 乳化j,3·二癸基_2_甲基味唾鑌。於另一具體例中,該界面 2劑為兩性離子性,例如自Degussa所購得之商標名為 〇TAINTM㈣基甜菜驗。亦可使用界面活性劑的混合 物。此等界面活性劑典型地係以G. 1至5g/L的量存在於電 錢浴中。 視需要地,維生素可包含於本發明之電鍍浴中。它們 可為脂溶性或水溶性。典型地,可使用水溶性維生素。適 ,溶性維生素包含A、Di、D2、D3、Ki、KjE4 虽的水溶性維生素包含c、Bi、B2、B3UU# =之維生素包含,但不限於:視網醇(維生素A)、固醇類、 >角_化固醇(維生素〇2)、膽转化固醇(維生素⑹、葉綠 酉昆(維生素1)、多異戊烯甲萘醌(維生素〖2)、^生育紛(維 生素、E)、万-生育酚(維生素E)、抗壞血酸(維生素〇、抗 、申、二人素(維生素Βι)、菸鹼酸、核黃素(維生素B2)、泛酸、 93983 16 200813266 -生物素、抗皮膚炎素(維生素BO、葉酸及氰鈷銨素(維生素 Bi2)。特別合適的維生素包含:抗壞血酸(維生素C)、抗神 經炎素(維生素B!)、菸鹼酸、核黃素(維生素b2)、泛酸、 生物素、抗皮膚炎素(維生素B6)及葉酸。如本文採用,該 術語”維生素”意欲包含維生素的鹽氣。 一般說來,當添加維生素至該電鍍浴時,存在於該電 鍍浴中的維生素含量為〇·〇1至150g/L,典型地自〇.5至 l〇〇g/L以及更典型地自丨至i〇〇g/L。維生素一般可由多種 •來源購得,如:Aldrich chemical company。 廣泛種類的醯胺基化合物皆可使用於本發明電鍍浴 中。合適的含胺基化合物包含,但不限於:續酸聽胺類, 如琥珀酸磺醯胺;以及羧酸醯胺類,如琥珀酸醯胺(succinic acid amide)(琥珀醯胺酸)。 一般說來’存在於本發明電鍍浴中的醯胺基化合物含 量為0.01至150g/L,典型地自〇·5至1〇〇g/L以及更典型 ⑩地自1至1 〇〇g/L。醯胺基化合物一般可由多種來源購得, 如Aldrich chemical company。此外,醯胺基化合物可於原 位自醯亞胺產生,例如自琥珀醯亞胺產生。雖不意欲受理 論所限,但在浴溫下添加至鹼性浴的醯亞胺係轉換為其相 對應的醯胺基化合物。咸信此係藉由羥基離子(〇H_)在醯亞 胺的碳-氮(C-N)鍵進行親核性攻擊而發生。 任何胺基酸皆可適當地用於本發明電鍍浴,包含胺基 酸之衍生物以及胺基酸之鹽類。本發明胺基酸除了可含有 一個或多個胺基外,亦可含有一個或多個巯基。例示之適 93983 17 200813266 -合的胺基酸包含,但不限於:甘胺酸、丙胺酸、半胱胺酸、 甲硫胺酸及4-胺基-菸鹼酸。若於本發明電鍍浴中使用胺基 酸時,胺基酸之用量為0.1至150g/L,典型地自〇 5至 150g/L,以及更典型地自0.5至125g/L。胺基酸之混合物 亦可使用。此等金屬化合物—般可由多種來源購得,如:
Aldrich chemical C〇mpany。當該金屬為銀時,所存在之水 /谷性胺基酸化合物典型地係超過銀之化學計量。 廣泛種類之水溶性磺酸均可用於本發明電鍍浴。例示 籲性之姐包含前述㈣電解f之任何賴。#使料酸作 為電解質時,則不再需要石黃酸。典型地,該確酸之含量為 〇·1 至 200g/L〇 視需要地,本發明雷赛、、欠I^ ^ a包緞冷可含有一種或多種額外居 份。此等額外成份包含,但不限於:光亮劑、晶粒細化劑 延展性增進劑、抗舰劑(anti_taniishagent)及抗束劑。令 :化合物可使用作為光亮劑。詳言之,適當的含砜化合私 ^風基上含有-個或二個芳族環。此等芳族環可視需要經 取代。ή 基及金屬之取代基 曰^田存細,該含軌合物典型地在_ 置為0·001至5g/L 〇 之用 、尹、泛種類的抗鏽钱劑皆可視需要用於本發明詩 。適當的抗鏽#劑包含,但不限^:三唾類 二 類、四哇類、畔4 _ #、, 、本开— ' ’、力、、本开咪唑類及吲唑類。特別適用 ^ 16)烷基咪唑類及芳基咪唑類。例示 之抗鏽钱劑包含,但不限於:甲基咪唾、乙基咪哇、丙 93983 18 200813266 。米哇、己基口米哇、癸其 一 4 , 、土水圭、十一基咪唑、1-苯基咪唑、 二 基苯并三唾、胺基苯并三唾、2__唾甲盤、 本开三哇羧酸、2-胍基苯并.米唾、2_ 唑、羥乙基苯并r唑、鉍7 k 風本开二 一 踁乙基味唑、羥基苯并咪唑及1 24- ^心抗鏽_混合物可有利地用於本發明電鑛浴中’。’一 般祝來,當使用抗職劑時,其含量為自UN至。 在另一具體例中,該金屬電鍍浴可視需要含有緩衝 背。列不性之緩衝劑包含,但不限於:删酸鹽緩衝液(如· 碟酸鹽緩衝液、獰檬酸鹽緩衝液及碳酸鹽緩衝液。 ^緩衝液^用置係足以將電鐘浴的PH值維持在所欲之程 又’此等量為所屬技術領域中具有通常知識者所熟知。 在又/、體例中,可視需要將合金金屬加至該電鍍浴 二任何適當的合金金屬都可使用。此等合金金屬為所屬 技術領域中具有通常知識者所熟知。 ,本發明電鍍浴典型地具有pH值範圍為7至14,更典 >型地自7至12’且又更典型地自9至12。本發明電鍵浴= /皿度範圍典型地為1G至3G〇c。當該電鍍浴為銀電鐘 办%,該挺作溫度範圍典型地為1〇至2〇它,且更典型地 自15至20。〇。冷凍器典型地係用來將該電鍍浴的溫 持在低於室溫。 本發明所使用不含氰化物之金屬電鑛浴於光辅助型電 鍍所使用之照射條件下具有足夠的安定性,以於符合所欲 規才°之光伏I置上提供金屬沉積物。此外,由於本發明電 鍍浴不含氰化物,因此本發明金屬電鍍浴比習知的光誘導 93983 19 200813266 *^鑛浴更具生態優點。本發明更進—步的優點是在該經全 屬電鍍之光伏裝置上亦可能有高度電流輪出,以致於可 低在該金屬電鑛步驟期間的能源使用量,因而降低操作士 Ϊ二更進一步的優點是本發明電鍍浴在容許其使用之光誘 導電鍍條件下係足夠安定的。 ϋ 現在準備在經圖案化之晶圓5上沉積厚的金屬層 的衣置。如上述所製備之該經圖案化之晶圓5係浸入 :2〇二電鍍浴21中。經圖案化之晶圓5於電鍍槽中“ 才^亥电㈣21係如上所述。配置光源25而藉由廣泛地 ^數字27指示之輕射能照射晶® 5。電源、24之正極端盘 二=22接觸而負極端與晶圓5的背部或是p侧接觸: 如石化之晶圓5為矽太陽能電池,則光源25可為例 央鹵素燈泡以提供類似於太陽能光譜之能量,該 =電:也對太陽能光譜為光伏敏感者。其它各種絲都可 丨使用,例如,但不限於,白熾燈泡如25〇細燈泡,以及 2燈泡。該光能27可為連續式或脈衝式。脈衝式照射可 猎由例如以機械式遮光器遮斷該光而達成。 的材ί=Γ必岐由無法與該電錢浴21產生化學反應 4斤衣成且亦必須為光能27可穿透性。者, :可:平地放置在電鍍槽20中並自該電鍍浴之上二曰: 二’:此情況下的電鍍槽20不需要具有可穿透性。如所 :二了晶圓5上電鍍銀’石英燒杯為適當之電 、又才曰20。銀%極22,例如銀片,係溶解於該電錢浴中並且 、 93983 20 200813266 -於電鍍進行時以銀維持該電鍍浴的飽和。 以光此27照射晶圓5正面並自電源供應器24施加電 位至該電鍍槽,以同時於晶圓5的正面及背面進行電鍍。 所轭加之電位可為連續式或脈衝式。該照射之光能在太陽 月匕书池中產生電流。由於所產生之電流與該入射光強度成 比例’因it匕晶圓5正面的電鍍速率是該晶圓輻射入射強度 的函數。該正面與背面的電鍍速度係分別藉由調整該光強 度與該外部電流密度而獨立地控制。聚光型太陽能電池一 i所I之銀層厚度為〗至25#m,而精確的厚度則取決於 ^種因素’例如取決於應用方面、電池尺寸、圖案幾何學 於本务明所使用之該經施加之電位可具有一範圍之 /现山度典型的電流密度為自〇.lA/dm2至10 A/dm2,以 - 5L也自〇. 1 A/dm2至5 A/dm2。該特定的電流需求係 立、於所使用之晶圓之特定尺寸。若照射該晶圓正面並將 二?:降低至約5〇毫安培或更低’則電鍍會持續正常地; = 面進行’但電鑛並不發生於晶圓背面。正面心 土文^該後面電鑛的均勻性並且克服了所有與由^ 領域呈右、甬〜 姆屋降相關的難題。所屬技肩 J二;、有心知識者應察知該本發明電_程可視需要乂 程。口或夕個反向電鍍步驟,例如脈衝週期式反向電鑛| 土述製程係特财照銀層的電鍍進行㈣。但 。、匕材料,例如銅、全 Μ技 J孟或者錫與鎳之混合物亦同樣 93983 21 200813266 。有良好操作。錫與鎳之混合物可由包括氯化亞錫、氯化鎳、 氫氧化銨及氟化銨之水浴來進行電鍍。已發現該錫鎳混合 物係使用作為覆蓋於其他金屬層上之環境性惰性罩 (environmentally inert cap) 〇 上述具體例之敘述係舆用在太陽能電池之矽晶圓有 關,但本發明不應被理解成受限於此等甩法。由除了矽之 外的其它材料所製造之光伏裝置亦可使用,且可視需要進 行適當變化,例如改變所使用之光能來源。然而,若缺乏 絲響應裝置(phGt〇VGltaieally respGnsive deviee)時,該製 程則無法實行。例如,當含有經烘烤之銀膠圖案的石夕晶= 與本發明電鍍浴接觸並在無輻射光的情況下接受0 5伏特 的,屢時,則觀察到無電駐非f小的電鑛作用。此外了 在第2圖的儀器中放置不具有PN接面的無摻雜石夕晶圓, 則在該經照射之表面上並不會導致電鍍作用。當含有經烘 烤之銀膠圖案㈣晶圓與本發明钱浴接觸並在I施加電 壓的情況下接受光化輻射時’則觀察到無電鍍至;;常小的 電鍍作用H當含有經烘烤之轉圖案_晶圓與本 發明電鍍浴接觸並接受0.5伏特的電壓以及接受光化輅射 時,則立即發生金屬電鍍作用。田' 意欲以下列實施例說明本發明的各式態樣。 實施例1 銀電鍍浴係藉由結合下列成份並添加入足 (“DI”)水來製備以製成丨升的溶液。 ' 93983 22 200813266 8g/L銀葡萄糖酸銀 2g/L間石肖基苯石黃酸 10g/L曱烷磺酸溶液(70%,以 氫氧化鉀溶液中和) 25g/L琥珀酸醯胺 4g/L甲硫胺酸 lmL/L TEGOTAIN 485(1%水 溶液) 20g/L硼砂 O.lmL/L砜衍生物(1%水溶 液) 20g/L琥珀酸磺醯胺 該電鍍浴之pH值係維持在9至12的範圍。該電鍍浴溫度 係維持在25至35°C。 實施例2 銀電鍍浴係藉由結合下列成份並添加足量的DI水來 製備以製成1升的溶液。 9g/L銀,呈甲烷磺酸銀形式 4g/L 4-硝基鄰苯二曱酸 15g/L曱烷磺酸溶液(70%,以 氫氧化鉀溶液中和) 15 g/L终驗酸醯胺 10g/L甘胺酸 5mL/L TEGOTAIN 485 (1% 水溶液) 25g/L硼砂 ®該電鍍浴之pH值係維持在9.5至10.5的範圍内。該電鍍 浴溫度係維持在25至35°C。 實施例3 銀電鍍浴係藉由結合該下列成份並加入足量的DI水 來製備以製成1升的溶液。 23 93983 200813266 1 Og/L銀,呈甲烷磺酸銀形式 2g/L 2-硝基鄰苯二甲酸 5g/L甲烷磺酸溶液(7〇〇/〇,以 氫氧化卸溶液中和) 25g/L菸鹼酸醯胺 5g/L半脫胺酸 3mL/L TEGOTAIN 485(1%水 溶液) 20g/L·硼砂 O.lmL/L颯衍生物(1%水溶 液) 該電鍍浴之pH值係維持在9.5至10.5的範圍。該電鍍浴 溫度係維持在25至35。(:。 拳實施例4 重複實施例1的程序,惟將甲硫胺酸以烧氧化胺基酸 (胺基酸衍生物)置換。 實施例5 將該具有由經洪烤之銀谬所形成的電流匯集線及匯流 排圖案之如第1圖所示之晶圓與25體積%的甲烷磺酸水溶 液接觸,接著以DI水潤洗。 $ 提供含有娘電鐘浴(ENLIGHTtm silver plate 600)且裝 配有250Watt燈及銀陽極的電鍍槽。將經圖案化之晶圓浸 入該電鍍浴。藉由照射而施加1至5A/dm2的電流密度。 持續電鍍30分鐘,30分鐘後,將該晶圓自該電鍍浴移除, 以DI水潤洗1分鐘,接著乾燥。在該經烘烤之銀膠上得 到具有厚度為2至3 // m的銀沉積層。 該電鍍浴使用長達4至5個月的時間以電鍍若干晶 圓。該電鍍浴接受例行性的保養,例如補充減少的成份、 置換陽極等。於此使用期間並未觀察到電鍍浴的安定性減 24 93983 200813266 ^ 低0 【圖式簡單說明】 第1圖說明本發明之光伏裝置。 第2圖為根據本發明於光伏裝置上提供金屬塗佈物之 示意圖。 【主要元件符號說明】 5 光伏裝置 10 半導體晶圓 11 背面 12 正面 ⑩14 匯流排 15 電流匯集線 20 電鍍槽 21 電鍍浴 22 陽極 24 電源 25 光源 27 光能 25 93983
Claims (2)
- 200813266 "十、申請專利範圍: 1. -種用於電㈣在展現光伏效應之光敏裝置上的電氣 接二之方去,係包括:提供具有至少二個主要表面之半 導:晶圓’該晶圓具有光伏接面形成於其中,以致於當 之該主要表面中之一者曝露於光時’負電荷係; :而'主要表面之第一者以及正電荷係匯集於該主要 舖、^二者;使該晶圓與不含減物之金屬電鑛浴接 加電位至該電鑛浴;以及使該晶圓曝露於光以在 表面上沉積金屬層,其中,該電鑛浴為水溶 1 一=括ι屬離子、至少—種水溶性含料化合物、至 — 界面活性劑、至少—種醯胺基化合物、以及至少 :種選自水溶性胺基酸、水溶性賴、及其混合物之成
- 2. Lt::L利,第1項之方法,復包括在該晶圓與不含 括^ | % μ μ電鍍祕狀前,使該晶圓與包 括%酸之溶液接觸之步驟。 ^ 該石黃酸為甲烧石: 該光為連續式g 該晶圓具有抗万 如申請專利範圍第2項之方法,盆 4.如酸申請專利範圍第丨項之方法,:中 脈衝式。 A 5·如申請專·圍第丨項之方法, 6 :塗f物覆於該第-主要表面上: .申請專利範圍第5項之方法,其中 93983 26 200813266 - 層與氮化矽層之組合。 7 .如申请專利範圍第1 p 、 之方法,其中,該電鍍浴復包括 、、羡衝減制,以及其中兮命 Q L 士 T 4书鍍浴具有pH值為7至14 〇 8·如申請專利範圍第夕 '^ 昂1項之方法,其中,該金屬係選自銀、 金及銅。 9·如申請專利範圍第!項之、 包括複數個接點。貞之方法’其中’該第-主要表面 10·如申請專利範圍第丨頊 • 含氛化物> 入严 、 法,復包括在該晶圓與該不 ’ U化物之金屬電鍍洛接觸之該第 提供金屬塗佈物。 主要表面上 11.如申請專利範圍第工項 一種或多種維生素。、法,其中,該钱浴復包括 93983 27
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- 2006-10-27 US US11/588,520 patent/US20080035489A1/en not_active Abandoned
-
2007
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- 2007-06-04 JP JP2007148193A patent/JP5301115B2/ja not_active Expired - Fee Related
- 2007-06-05 KR KR1020070055036A patent/KR101370885B1/ko not_active Expired - Fee Related
- 2007-06-05 TW TW096120048A patent/TWI359213B/zh not_active IP Right Cessation
- 2007-06-05 NO NO20072850A patent/NO20072850L/no not_active Application Discontinuation
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI469366B (zh) * | 2011-05-16 | 2015-01-11 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008057035A (ja) | 2008-03-13 |
| EP1865563A3 (en) | 2012-08-08 |
| JP5301115B2 (ja) | 2013-09-25 |
| EP1865563A2 (en) | 2007-12-12 |
| TWI359213B (en) | 2012-03-01 |
| KR101370885B1 (ko) | 2014-03-07 |
| KR20070116564A (ko) | 2007-12-10 |
| US20080035489A1 (en) | 2008-02-14 |
| NO20072850L (no) | 2007-12-06 |
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