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TW200801859A - Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method - Google Patents

Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method

Info

Publication number
TW200801859A
TW200801859A TW096115612A TW96115612A TW200801859A TW 200801859 A TW200801859 A TW 200801859A TW 096115612 A TW096115612 A TW 096115612A TW 96115612 A TW96115612 A TW 96115612A TW 200801859 A TW200801859 A TW 200801859A
Authority
TW
Taiwan
Prior art keywords
displacement measurement
displacement
lithographic apparatus
device manufacturing
measurement system
Prior art date
Application number
TW096115612A
Other languages
English (en)
Other versions
TWI328720B (en
Inventor
Bernardus Antonius Johannes Luttikhuis
Henrikus Herman Marie Cox
Erik Roelof Loopstra
Der Pasch Engelbertus Antonius Fransiscus Van
Der Schoot Harmen Klaas Van
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of TW200801859A publication Critical patent/TW200801859A/zh
Application granted granted Critical
Publication of TWI328720B publication Critical patent/TWI328720B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B27/00—Photographic printing apparatus
    • G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
    • G03B27/52—Details
    • G03B27/53—Automatic registration or positioning of originals with respect to each other or the photosensitive layer
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
    • H10P76/2041—

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
TW096115612A 2006-05-09 2007-05-02 Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method TWI328720B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/430,196 US7483120B2 (en) 2006-05-09 2006-05-09 Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method

Publications (2)

Publication Number Publication Date
TW200801859A true TW200801859A (en) 2008-01-01
TWI328720B TWI328720B (en) 2010-08-11

Family

ID=38684790

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096115612A TWI328720B (en) 2006-05-09 2007-05-02 Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method

Country Status (5)

Country Link
US (1) US7483120B2 (zh)
JP (1) JP4660503B2 (zh)
KR (1) KR100901476B1 (zh)
CN (1) CN101071276B (zh)
TW (1) TWI328720B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
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TWI633273B (zh) * 2013-10-07 2018-08-21 強那斯海登翰博士有限公司 將工具相對於工件而定位的系統

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TWI633273B (zh) * 2013-10-07 2018-08-21 強那斯海登翰博士有限公司 將工具相對於工件而定位的系統

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KR20070109871A (ko) 2007-11-15
US7483120B2 (en) 2009-01-27
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JP4660503B2 (ja) 2011-03-30
TWI328720B (en) 2010-08-11

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