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TW200624818A - Probe device having micro-pins inserted into interface board - Google Patents

Probe device having micro-pins inserted into interface board

Info

Publication number
TW200624818A
TW200624818A TW095101327A TW95101327A TW200624818A TW 200624818 A TW200624818 A TW 200624818A TW 095101327 A TW095101327 A TW 095101327A TW 95101327 A TW95101327 A TW 95101327A TW 200624818 A TW200624818 A TW 200624818A
Authority
TW
Taiwan
Prior art keywords
micro
pin
interface board
probe device
integrated circuit
Prior art date
Application number
TW095101327A
Other languages
English (en)
Other versions
TWI403725B (zh
Inventor
Chae-Yoon Lee
Original Assignee
Leeno Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leeno Ind Inc filed Critical Leeno Ind Inc
Publication of TW200624818A publication Critical patent/TW200624818A/zh
Application granted granted Critical
Publication of TWI403725B publication Critical patent/TWI403725B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW095101327A 2005-01-13 2006-01-13 具有可嵌入介面板之微引腳之探針裝置 TWI403725B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050003153A KR100643842B1 (ko) 2005-01-13 2005-01-13 마이크로핀이 인터페이스 보드에 삽입되는 프로브 장치

Publications (2)

Publication Number Publication Date
TW200624818A true TW200624818A (en) 2006-07-16
TWI403725B TWI403725B (zh) 2013-08-01

Family

ID=36652646

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095101327A TWI403725B (zh) 2005-01-13 2006-01-13 具有可嵌入介面板之微引腳之探針裝置

Country Status (4)

Country Link
US (1) US20060152240A1 (zh)
JP (1) JP2006194886A (zh)
KR (1) KR100643842B1 (zh)
TW (1) TWI403725B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10598698B2 (en) 2017-10-05 2020-03-24 International Business Machines Corporation Tool for automatically replacing defective pogo pins
TWI847234B (zh) * 2016-12-23 2024-07-01 美商英特爾股份有限公司 積體電路裝置結構和雙面製造技術

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101270960B1 (ko) 2012-10-02 2013-06-11 주식회사 프로이천 수직형 필름 타입 핀 보드
US9880198B2 (en) 2013-02-11 2018-01-30 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. High bandwidth signal probe tip
CN108152335A (zh) * 2018-02-08 2018-06-12 李华玮 Tds测试装置与手机背夹

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
JP2769015B2 (ja) * 1990-03-08 1998-06-25 株式会社神戸製鋼所 電子回路基板検査用プローバーピンヘッド及びその製造方法
JPH0674972A (ja) * 1992-08-27 1994-03-18 Shinko Electric Ind Co Ltd コンタクトプローブ
JP3394620B2 (ja) * 1995-01-20 2003-04-07 株式会社日立製作所 探針組立体および検査装置
US6084421A (en) * 1997-04-15 2000-07-04 Delaware Capital Formation, Inc. Test socket
JPH11242065A (ja) * 1998-02-26 1999-09-07 Mitsui High Tec Inc 配線基板検査装置
JP4668406B2 (ja) * 2000-12-07 2011-04-13 日本発條株式会社 導電性接触子
KR100356823B1 (ko) * 2001-01-04 2002-10-18 주식회사 하이닉스반도체 프로브 카드
JP3443687B2 (ja) * 2001-02-19 2003-09-08 株式会社エンプラス 電気部品用ソケット
KR20040012318A (ko) * 2002-08-02 2004-02-11 (주)티에스이 반도체 디바이스 테스트용 소켓 장치
KR20040067768A (ko) * 2003-01-21 2004-07-30 리노공업주식회사 초고주파 디바이스 검사용 접촉장치와 그를 이용한 검사용인쇄회로 기판 및 검사용 인쇄회로기판 제조방법

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI847234B (zh) * 2016-12-23 2024-07-01 美商英特爾股份有限公司 積體電路裝置結構和雙面製造技術
US10598698B2 (en) 2017-10-05 2020-03-24 International Business Machines Corporation Tool for automatically replacing defective pogo pins
US10605831B2 (en) 2017-10-05 2020-03-31 International Business Machines Corporation Tool for automatically replacing defective pogo pins

Also Published As

Publication number Publication date
US20060152240A1 (en) 2006-07-13
JP2006194886A (ja) 2006-07-27
TWI403725B (zh) 2013-08-01
KR100643842B1 (ko) 2006-11-10
KR20060082594A (ko) 2006-07-19

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