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JPS60131495A - Diagnostic device for abnormality of detector - Google Patents

Diagnostic device for abnormality of detector

Info

Publication number
JPS60131495A
JPS60131495A JP58240502A JP24050283A JPS60131495A JP S60131495 A JPS60131495 A JP S60131495A JP 58240502 A JP58240502 A JP 58240502A JP 24050283 A JP24050283 A JP 24050283A JP S60131495 A JPS60131495 A JP S60131495A
Authority
JP
Japan
Prior art keywords
value
sensor
diagnosed
function
abnormality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58240502A
Other languages
Japanese (ja)
Inventor
岡町 正雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP58240502A priority Critical patent/JPS60131495A/en
Publication of JPS60131495A publication Critical patent/JPS60131495A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/30Nuclear fission reactors

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  • Monitoring And Testing Of Nuclear Reactors (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は検出器異常診断装置に係シ、特に原子力発電プ
ラント等に適用し得る検出器異常診断装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a detector abnormality diagnosing device, and more particularly to a detector abnormality diagnosing device applicable to nuclear power plants and the like.

例えば原子カッランシトの制御・保護系はブラ、ントの
安全性・信頼性・制御性等を向上させるためになくては
ならないものである。従って上記系の入力となるセンサ
は特に重要な要素であシ、冗長性を持たせることによっ
て万一のセンサ峙性の異常に対処している。そのため同
一のプロセス計測に同種セ、ンサを2〜4個用いて冗長
性を持たせその中で相対的な評価を行うようになされて
いる。例えば4個のセンサの場合の例を第1図について
説明する。普ず1ooで冗長センサの各館を採取する。
For example, a control/protection system for atomic capillaries is essential for improving the safety, reliability, controllability, etc. of batteries. Therefore, the sensor that serves as the input to the above system is a particularly important element, and by providing redundancy, it is possible to cope with an unexpected abnormality in sensor sensitivity. For this reason, two to four sensors of the same type are used for the same process measurement to provide redundancy and perform relative evaluation among them. For example, an example in the case of four sensors will be explained with reference to FIG. Collect data from each redundant sensor using 1oo.

次に101で相異なるセンサ間の偏差をとシ、1o2で
は次の(1)式で与える評価を行□う。
Next, in step 101, the deviation between different sensors is determined, and in step 1o2, an evaluation given by the following equation (1) is performed.

1Vi−Vj’l<ε1 ・曲・曲面・ (1)ただし
、V:センサ出力値、i’=j i=1〜4、i=x〜
4、ε1 :しきい値。
1Vi−Vj'l<ε1 ・Curve/Curved surface・ (1) However, V: sensor output value, i'=j i=1~4, i=x~
4, ε1: Threshold.

(1)式が全ケース(センサ4個でトーζル6ケースあ
る)で成立すれば全センサを正常104で判断し、同一
センサが2ケ一ス以上で(1)式が未成立ならそのセン
サを異常103で判断する。
If formula (1) holds true in all cases (there are 6 cases of total ζ with 4 sensors), all sensors are judged as normal 104, and if formula (1) does not hold true in 2 or more cases of the same sensor, then The sensor is determined to be abnormal 103.

実プラントではこうして決まった異常センサを除いた残
シのセンサから1つのセンサを選択する。この方法はい
ろいろあり、例えば正常センサの値の平均値を計算し、
その値に最も近い値を持つセンサを選定する場合がある
。このセンサの出力が制御・保詠系で使用されることに
なるO 従来のセンサ静特性異常診断の根本思想は第1図に示し
た様に冗長センサ間の相対評価であって絶対評価ではな
い。従って正しいセンサが同数以下(4センサの場合2
個以下)になった場合には選択不能又は誤選択をして重
大なる事故につながる恐れがある。現在は4つのうち2
つ以上は同時に異常となる確率が低いとみなしているだ
けであるが、この異常が生起しないという保証は何もな
い。また冗長性を有しないプロセスのセンサは#断のし
ょうがないという欠点があった。
In an actual plant, one sensor is selected from the remaining sensors excluding the abnormal sensor determined in this way. There are various methods for this, for example, calculating the average value of normal sensor values,
The sensor with the value closest to that value may be selected. The output of this sensor will be used in the control/maintenance system.The basic idea of conventional sensor static characteristic abnormality diagnosis is relative evaluation between redundant sensors, not absolute evaluation, as shown in Figure 1. . Therefore, the number of correct sensors is the same or less (in the case of 4 sensors, 2
(less than 1), it may be impossible to select or make the wrong selection, which may lead to a serious accident. Currently 2 out of 4
Although it is assumed that the probability that two or more abnormalities will occur at the same time is low, there is no guarantee that such abnormalities will not occur. Additionally, sensors in processes that do not have redundancy have the disadvantage of being unavoidable.

本発明は上記の事情に鑑みて提案されたもので、その目
的とするところは、原子力発電プラントの信頼性及び安
全性向上のため、運転操作の要である制御・保掻系統の
信号源すなわち検゛出器(センサ)の応答性異常を早期
に診断し得る検出器異常餘断装置を提供するにある。
The present invention was proposed in view of the above circumstances, and its purpose is to improve the reliability and safety of nuclear power plants by An object of the present invention is to provide a detector abnormality detection device capable of early diagnosing abnormality in response of a detector (sensor).

本発明による検出器異常診断装置は診断対象プロセスを
規定する他の独立したプロセスを見出す手段と、独立し
たプロセスの関数として診断対象プロセスを規定する関
数型を設定する手段と、プラントが整定した状態におい
て独立したプロセスセンサの値から計算される関数値を
Xiとする手段と、診断対象プロセスセンサの値の真値
からの偏差を計算し1.この偏差を真値で除算しブと値
が別に規定したしきい値よりも大きい場合をセンサ異常
と診断する手段とを具備してなることを特徴とし、同一
プロセスを計測する冗長度を持ったセンサ又は冗長度の
ないセンサの静的特性の異常を診断する時、冗長度間の
相対評価でなく、診断するプロセスのセンサとは独立し
た別のプロセスを利用して作成した設定信号を用いるこ
とによって絶対評価でセンサの静的応答性異常を診断す
るようにして従来の欠点を解消し得るようにしたもので
ある。
The detector abnormality diagnosis device according to the present invention includes a means for finding another independent process that defines the process to be diagnosed, a means for setting a function type that defines the process to be diagnosed as a function of the independent process, and a state in which the plant has settled. 1. means for setting the function value calculated from the values of the independent process sensors to Xi; and calculating the deviation of the value of the process sensor to be diagnosed from the true value; It is characterized by comprising a means for dividing this deviation by the true value and diagnosing a sensor abnormality when the value is larger than a separately specified threshold value, and having redundancy for measuring the same process. When diagnosing an abnormality in the static characteristics of a sensor or a sensor without redundancy, use a setting signal created using a separate process independent of the sensor in the process being diagnosed, rather than a relative evaluation between redundancies. According to the present invention, abnormalities in the static response of the sensor can be diagnosed using absolute evaluation, thereby overcoming the drawbacks of the conventional method.

本発明の一実施例を添付図面を参照して詳細に説明する
〇 ti142図は本発明の一実施例の構成を説明するため
の70−チャート図である。
An embodiment of the present invention will be explained in detail with reference to the accompanying drawings. Figure 142 is a 70-chart diagram for explaining the configuration of an embodiment of the present invention.

第2図において、ノはセンサであシ、これと3のA/D
変換器との間はアナログ信号伝送路2である。4,5.
6はディジタル形式のデータ入力であシミ気的に入力値
は保存される。7はA/D変換器3を制御して動作させ
てアナログ値をディジタル値に変換させ、8において電
気的に保存する09は7と8の〈)返しを判断する。1
0.11はデータの転送回路であシ12.13は演算回
路である。J4はJ3の結果の判断をし、15は時間の
おくれを発生させる回路であるoleでは判断を行い1
7と18は16の判断結果にもとすき入力したデータの
状態を診断する回路である。なお以上の4〜J8は電気
的ディジタル処理回路よ多構成される〇 上記本発明の一実施例の作用について説明する0 第2図において関数データ人力4では診断対象プロセス
毎に異なる・関数データを入力する。
In Fig. 2, No is the sensor, this and 3 A/D.
An analog signal transmission line 2 is connected to the converter. 4,5.
6 is data input in digital format, and input values are stored in a timely manner. 7 controls and operates the A/D converter 3 to convert the analog value into a digital value, and 09 electrically stores it at 8 to determine the return of 7 and 8. 1
0.11 is a data transfer circuit, and 12.13 is an arithmetic circuit. J4 judges the result of J3, 15 is a circuit that generates a time delay, and ole judges the result of 1.
7 and 18 are circuits for diagnosing the state of the input data based on the judgment result of 16. Note that 4 to J8 described above are composed of multiple electrical digital processing circuits. The operation of the embodiment of the present invention described above will be explained below. In FIG. input.

また5では診断対象とするプロセスのセンサを指定する
06では上記プロセスを診断する上にンサの値及びその
プロセスを診断する上に必要なプロセスのセンサの値を
適切なサンプリング時間Tによ、j9 A/D変換器3
を介して7の制御の下でサンプリングする。サンブリン
グ値はそのプロセスの物理系に応じた次元に変換でれ8
で格納される。J3の演算に必要なデータ数になるまで
7〜8をくり返す。ノ0では入力した多くの関数データ
の内、診断対象プロセスに対応した関数をとシ出す。6
で指定したプロセスのセンサの値を11においてと)出
す。10でとヤ出した関数を使い、11でとシ出した値
を用いてJ2において関数値全計算する、8で格納した
対象プロセス値をと9出し、この値と12の関数値より
13でその微係数全計算し、14ではJ3の2つの微係
数の各絶対値をしきい仙と比較する。2つのうちどちら
かがしきい値以上であれば15のむだ時間を介して7に
もどる02つともし−きい値以下になると16へ進み、
12の関数値を1.0とした診断対象プロセスのセンサ
値の変化割合をめてしきい値と比較する。しきい値以下
なら17でセンサは正常と診断され、しきい値以上なら
センサは異常であシその変化割合を18で%表示で診断
する。この後再び5にもどυ他センサの診断をくり返す
In addition, in 5, the sensor of the process to be diagnosed is specified. In 06, the value of the sensor for diagnosing the above process and the value of the sensor of the process necessary for diagnosing the process are specified by j9 at an appropriate sampling time T. A/D converter 3
sampled under the control of 7 via. The sampling value can be converted into dimensions according to the physical system of the process8.
It is stored in . Repeat steps 7 and 8 until the number of data required for the calculation of J3 is reached. At No. 0, a function corresponding to the process to be diagnosed is selected from among the many input function data. 6
Outputs the sensor value of the process specified in (11). Using the function determined in step 10, calculate all the function values in J2 using the value determined in step 11, output the target process value stored in step 8 as and 9, and use this value and the function value in step 12 to calculate the function value in step 13. All the differential coefficients are calculated, and in step 14, the absolute values of the two differential coefficients of J3 are compared with the threshold value. If either of the two is above the threshold, it returns to 7 via the dead time of 15.If both of them are below the threshold, it goes to 16,
The rate of change in the sensor value of the process to be diagnosed, with the function value of No. 12 being 1.0, is determined and compared with a threshold value. If it is below the threshold value, the sensor is diagnosed as normal at 17, and if it is above the threshold value, the sensor is abnormal.The rate of change is diagnosed as a percentage at 18. After this, go back to step 5 and repeat the diagnosis of other sensors.

次に本発明による検出器異常診断装置を例えばPWRプ
ラントに適用した場合の具体例について説明する。
Next, a specific example in which the detector abnormality diagnosis apparatus according to the present invention is applied to, for example, a PWR plant will be described.

例えば診断対象プロセスセンサを加圧器水位のセンサと
すると、このプロセスの設定像部)プラントの整定状態
において加圧器水位センサの示すべ色値は一次冷却材の
高温、低温の2つの冷却材温度の平均値の関数として与
えられる。
For example, if the process sensor to be diagnosed is a pressurizer water level sensor, the color value indicated by the pressurizer water level sensor in the settled state of the plant will be the two coolant temperatures of the primary coolant, high and low. It is given as a function of the average value.

つまシこの関数値となる様加圧器水位は制御される。故
に餘断上必要なプロセスセンサとは冷却材温度センサ2
個であり、関数データとしては平均温度と加圧器水位値
となる。この様に第2図の4では診断対象プロセス毎に
異なる関数データを診断プロセス数だけ最初に与えてお
く。
The water level of the pressurizer is controlled so as to maintain this function value. Therefore, the process sensor that is necessary for making decisions is the coolant temperature sensor 2.
The function data is the average temperature and the water level value of the pressurizer. In this manner, in step 4 of FIG. 2, different function data is initially given for each process to be diagnosed, equal to the number of processes to be diagnosed.

(勿論このプロセスの場合は同じ関数がプラントI11
にもあるのでこの田力を直接プラントよシ取シ込むこと
もできる。この時第2図の10〜J2は不要となシ、1
2の関数値が2でサンプルされることとなる)0 他のプロセスの例として蒸気発生器水位の場合、タービ
ン初段圧力の関数として水位設定値が与えられる。サン
プルされた診断対象プロセスセンサの値及び診断に必要
なプロセスセンサの値をそれぞれE、ENl・・・EN
iと表わすを、診断対象プロセスセンサの設定値Ere
fは次式で与えられる。
(Of course, in this process, the same function is
It is also possible to directly import this rice power into the plant. At this time, 10 to J2 in Figure 2 are unnecessary.
The function value of 2 will be sampled at 2) 0 As an example of another process, in the case of steam generator water level, the water level set point is given as a function of the turbine first stage pressure. The sampled value of the process sensor to be diagnosed and the value of the process sensor required for diagnosis are respectively E, ENl...EN
Let i denote the setting value Ere of the process sensor to be diagnosed.
f is given by the following equation.

Eref = fun (ENl、 E、 、−・−E
N、 )・−(2)fun :入力した関数 i:必要なプロセスセンサ数 プラントが整定していなければ設定値とプロセスの示す
蝕どは過渡的に大きな偏差となることがあり、13にお
いて整定状態の1M詔のため微係数をとる。
Eref = fun (ENl, E, , -・-E
N, )・−(2) fun: Input function i: Required number of process sensors If the plant is not stabilized, there may be a transient large deviation between the set value and the erosion indicated by the process, Take the differential coefficient for the 1M edict of the state.

(3)式と(4)式が共に下記の条件を#だせば整定状
態とみなす。
If both equations (3) and (4) satisfy the following conditions, it is considered to be a stable state.

A〈ε。A〈ε.

かつ ) ・・・・・・・・・・・・ (5)B〈ε2 ε、ニジきい値 (5)式を満たきなければプラントが未整定とみなし少
し時間を置いて7〜13を〈シ返す。グラントノか整定
状態にある時、診断対象プロセスセンサの値Eがその設
定値E refになっていると考えられるため、EのE
refからの偏差割合によってセンサの正常、異常を判
断する0但し、ε3:しきい値 (6)式が成立するとセンサは正常、未成立では異常と
判断し、その正常からのゲイン誤差はVX100% ・
・・・・・・・・・・・(7)で与えられる0 以上の如く本発明によれば、従来冗長センサ間の相対評
価のみでセンサ静特性の正常異常を判断していたが、本
発明により絶対評価を行うことによって、センサ静特性
異常の誤診断及びこれにつながるプラント安全性低下を
防止することができるとともに、また冗長度を持たなG
1プロセスセンサについてもその静特性異常を診断する
ことができる等の優れた効果が奏せられるものである。
and ) ・・・・・・・・・・・・ (5) B〈ε2 ε, Niji threshold If the formula (5) is not satisfied, the plant is considered to be unsettled, and after a while, steps 7 to 13 are carried out. I'll return it. When the granometer is in a stable state, the value E of the process sensor to be diagnosed is considered to be its set value Eref.
Determine whether the sensor is normal or abnormal based on the deviation ratio from ref.0 However, ε3: Threshold If equation (6) holds, the sensor is judged to be normal; if not, the sensor is judged to be abnormal, and the gain error from normality is VX100%.・
......0 given by (7) As described above, according to the present invention, the normality and abnormality of sensor static characteristics were conventionally judged only by relative evaluation between redundant sensors, but this invention By performing absolute evaluation according to the present invention, it is possible to prevent erroneous diagnosis of sensor static characteristic abnormality and the deterioration of plant safety that leads to this, and it is also possible to prevent redundant G
Excellent effects such as being able to diagnose abnormalities in static characteristics of single-process sensors can also be achieved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来例を説明するためのフローチャート図、第
2図は未発明の一実施例の構成を説明するためのフロー
チャート図である。 l・・・センサ、2・・・アナログ信号伝送路、3・・
・A/D変換器、4〜6・・・データー入力、ノ2゜1
3・・・演算回路、17.18・・・診断回路。 出町人復代理人 弁理士 鈴 江 武 彦第1図
FIG. 1 is a flowchart for explaining a conventional example, and FIG. 2 is a flowchart for explaining the configuration of an embodiment of the invention. l...sensor, 2...analog signal transmission line, 3...
・A/D converter, 4 to 6...Data input, ノ2゜1
3...Arithmetic circuit, 17.18...Diagnostic circuit. Takehiko Suzue, Patent Attorney, Representative of Demachijin Figure 1

Claims (1)

【特許請求の範囲】[Claims] 診断対象プロセスを規定する他の独立したプロセスを見
出す手段と、独立したプロセスの関数として診断対象プ
ロセスを規定する関数型を設定する手段と、プラントが
整定した状態において独立したプロセスセンサの値から
計算でれる関数値を真値とする手段と、診断対象プロセ
スセンサの値の真値からの偏差を計算し、この偏差をX
値で除算した値が別に規定したしきい佃よりも大きい場
合をセンサ異常と診断する手段とを具備してなることを
特徴とする検出器異常診断装置。
means for finding other independent processes that define the process to be diagnosed; means for setting a function type that defines the process to be diagnosed as a function of the independent processes; and calculation from the values of independent process sensors when the plant is in a stable state. A means for determining the true value of the function value obtained by calculating the deviation from the true value of the value of the process sensor to be diagnosed, and converting this deviation into
1. A detector abnormality diagnosing device comprising means for diagnosing a sensor abnormality when a value divided by a value is larger than a separately defined threshold.
JP58240502A 1983-12-20 1983-12-20 Diagnostic device for abnormality of detector Pending JPS60131495A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58240502A JPS60131495A (en) 1983-12-20 1983-12-20 Diagnostic device for abnormality of detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58240502A JPS60131495A (en) 1983-12-20 1983-12-20 Diagnostic device for abnormality of detector

Publications (1)

Publication Number Publication Date
JPS60131495A true JPS60131495A (en) 1985-07-13

Family

ID=17060466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58240502A Pending JPS60131495A (en) 1983-12-20 1983-12-20 Diagnostic device for abnormality of detector

Country Status (1)

Country Link
JP (1) JPS60131495A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6859755B2 (en) 2001-05-14 2005-02-22 Rosemount Inc. Diagnostics for industrial process control and measurement systems
US6920799B1 (en) 2004-04-15 2005-07-26 Rosemount Inc. Magnetic flow meter with reference electrode
US7018800B2 (en) 2003-08-07 2006-03-28 Rosemount Inc. Process device with quiescent current diagnostics
US7046180B2 (en) 2004-04-21 2006-05-16 Rosemount Inc. Analog-to-digital converter with range error detection
US9052240B2 (en) 2012-06-29 2015-06-09 Rosemount Inc. Industrial process temperature transmitter with sensor stress diagnostics
US9207129B2 (en) 2012-09-27 2015-12-08 Rosemount Inc. Process variable transmitter with EMF detection and correction

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6859755B2 (en) 2001-05-14 2005-02-22 Rosemount Inc. Diagnostics for industrial process control and measurement systems
US7018800B2 (en) 2003-08-07 2006-03-28 Rosemount Inc. Process device with quiescent current diagnostics
US6920799B1 (en) 2004-04-15 2005-07-26 Rosemount Inc. Magnetic flow meter with reference electrode
US7046180B2 (en) 2004-04-21 2006-05-16 Rosemount Inc. Analog-to-digital converter with range error detection
US9052240B2 (en) 2012-06-29 2015-06-09 Rosemount Inc. Industrial process temperature transmitter with sensor stress diagnostics
US9207129B2 (en) 2012-09-27 2015-12-08 Rosemount Inc. Process variable transmitter with EMF detection and correction

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