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GB2114732B - Non-contact radiation thickness gauge - Google Patents

Non-contact radiation thickness gauge

Info

Publication number
GB2114732B
GB2114732B GB08204162A GB8204162A GB2114732B GB 2114732 B GB2114732 B GB 2114732B GB 08204162 A GB08204162 A GB 08204162A GB 8204162 A GB8204162 A GB 8204162A GB 2114732 B GB2114732 B GB 2114732B
Authority
GB
United Kingdom
Prior art keywords
thickness gauge
contact radiation
radiation thickness
contact
gauge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08204162A
Other versions
GB2114732A (en
Inventor
Tatsuo Tsujii
Takaaki Okino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to GB08204162A priority Critical patent/GB2114732B/en
Priority to CA000404628A priority patent/CA1186814A/en
Publication of GB2114732A publication Critical patent/GB2114732A/en
Application granted granted Critical
Publication of GB2114732B publication Critical patent/GB2114732B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
GB08204162A 1982-02-12 1982-02-12 Non-contact radiation thickness gauge Expired GB2114732B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB08204162A GB2114732B (en) 1982-02-12 1982-02-12 Non-contact radiation thickness gauge
CA000404628A CA1186814A (en) 1982-02-12 1982-06-07 Non-contact radiation thickness gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08204162A GB2114732B (en) 1982-02-12 1982-02-12 Non-contact radiation thickness gauge

Publications (2)

Publication Number Publication Date
GB2114732A GB2114732A (en) 1983-08-24
GB2114732B true GB2114732B (en) 1985-10-02

Family

ID=10528296

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08204162A Expired GB2114732B (en) 1982-02-12 1982-02-12 Non-contact radiation thickness gauge

Country Status (2)

Country Link
CA (1) CA1186814A (en)
GB (1) GB2114732B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105032953A (en) * 2015-08-19 2015-11-11 山西太钢不锈钢股份有限公司 Fast sample plate calibration method of gamma-ray thickness gauge

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4574387A (en) * 1981-09-18 1986-03-04 Data Measurement Corporation Apparatus and method for measuring thickness
US5020356A (en) * 1989-08-25 1991-06-04 Process Automation Business, Inc. Method and apparatus for measuring characteristics of a multilayer product
GB9105639D0 (en) * 1991-03-18 1991-05-01 Data Measurement Corp Dynamic alloy correction gauge
CN102478395B (en) * 2010-11-26 2013-05-29 宝山钢铁股份有限公司 Method for on-line detection of thickness of non-chromium coating of strip steel surface
FR3058213B1 (en) * 2016-10-27 2020-05-08 Renault S.A.S DEVICE FOR INSTALLING X-RAY TOMOGRAPHY MEASUREMENTS.
CN119845215A (en) * 2025-01-08 2025-04-18 中国铁道科学研究院集团有限公司金属及化学研究所 Steel rail welded joint flatness measuring equipment and self-calibration method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105032953A (en) * 2015-08-19 2015-11-11 山西太钢不锈钢股份有限公司 Fast sample plate calibration method of gamma-ray thickness gauge

Also Published As

Publication number Publication date
CA1186814A (en) 1985-05-07
GB2114732A (en) 1983-08-24

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19990212