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FI20085741A0 - Figure ring arrangement - Google Patents

Figure ring arrangement

Info

Publication number
FI20085741A0
FI20085741A0 FI20085741A FI20085741A FI20085741A0 FI 20085741 A0 FI20085741 A0 FI 20085741A0 FI 20085741 A FI20085741 A FI 20085741A FI 20085741 A FI20085741 A FI 20085741A FI 20085741 A0 FI20085741 A0 FI 20085741A0
Authority
FI
Finland
Prior art keywords
ring arrangement
arrangement
ring
Prior art date
Application number
FI20085741A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20085741A7 (en
FI122448B (en
Inventor
Ate Johannes Korkalainen
Markku Tapani Maentylae
Heimo Ihalainen
Juha Kalevi Parviainen
Toni Kuparinen
Hans Bertel Nystroem
Bo Erik Alexander Sundqvist
Markku Juhani Markkanen
Original Assignee
Lappeenrannan Teknillinen Ylio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lappeenrannan Teknillinen Ylio filed Critical Lappeenrannan Teknillinen Ylio
Priority to FI20085741A priority Critical patent/FI122448B/en
Publication of FI20085741A0 publication Critical patent/FI20085741A0/en
Priority to PCT/FI2009/050569 priority patent/WO2010010229A1/en
Priority to EP09800104A priority patent/EP2313738A1/en
Publication of FI20085741A7 publication Critical patent/FI20085741A7/en
Application granted granted Critical
Publication of FI122448B publication Critical patent/FI122448B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI20085741A 2008-07-23 2008-07-23 An imaging FI122448B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20085741A FI122448B (en) 2008-07-23 2008-07-23 An imaging
PCT/FI2009/050569 WO2010010229A1 (en) 2008-07-23 2009-06-25 Imaging arrangement
EP09800104A EP2313738A1 (en) 2008-07-23 2009-06-25 Imaging arrangement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20085741 2008-07-23
FI20085741A FI122448B (en) 2008-07-23 2008-07-23 An imaging

Publications (3)

Publication Number Publication Date
FI20085741A0 true FI20085741A0 (en) 2008-07-23
FI20085741A7 FI20085741A7 (en) 2010-01-24
FI122448B FI122448B (en) 2012-01-31

Family

ID=39677618

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20085741A FI122448B (en) 2008-07-23 2008-07-23 An imaging

Country Status (3)

Country Link
EP (1) EP2313738A1 (en)
FI (1) FI122448B (en)
WO (1) WO2010010229A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013103831A1 (en) 2012-01-06 2013-07-11 Oyj, Kemira Method of characterizing creped materials
WO2015102644A1 (en) * 2014-01-06 2015-07-09 Hewlett-Packard Development Company, L.P. Paper classification based on three-dimensional characteristics
JP7209610B2 (en) * 2019-10-15 2023-01-20 株式会社アドバンテスト Optical test apparatus and test method for optical measuring instruments

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3752556A (en) * 1971-06-02 1973-08-14 R Kurtz Real time moving scene holographic camera system
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
JPH07286968A (en) * 1994-04-20 1995-10-31 Sumitomo Metal Ind Ltd Surface defect inspection device
US5982493A (en) * 1998-06-02 1999-11-09 Motorola, Inc. Apparatus and method for acquiring multiple images
JP2000131042A (en) * 1998-10-27 2000-05-12 Technical Systems:Kk Camera for inspecting defect of body to be inspected and defect inspection system using the same
SE511985C2 (en) 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topographic determination of a surface illuminated by incident light
US6597006B1 (en) * 2001-10-09 2003-07-22 Kla-Tencor Technologies Corp. Dual beam symmetric height systems and methods
US7777199B2 (en) * 2004-09-17 2010-08-17 Wichita State University System and method for capturing image sequences at ultra-high framing rates

Also Published As

Publication number Publication date
FI20085741A7 (en) 2010-01-24
EP2313738A1 (en) 2011-04-27
FI122448B (en) 2012-01-31
WO2010010229A1 (en) 2010-01-28

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Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: OY LABVISION TECHNOLOGIES LTD

Free format text: OY LABVISION TECHNOLOGIES LTD

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