NO883758L - Datamaskintilkoplet sonde for maaling paa trenivaakretser. - Google Patents
Datamaskintilkoplet sonde for maaling paa trenivaakretser.Info
- Publication number
- NO883758L NO883758L NO883758A NO883758A NO883758L NO 883758 L NO883758 L NO 883758L NO 883758 A NO883758 A NO 883758A NO 883758 A NO883758 A NO 883758A NO 883758 L NO883758 L NO 883758L
- Authority
- NO
- Norway
- Prior art keywords
- level
- signal
- circuit
- detector
- probe
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title description 8
- 239000000523 sample Substances 0.000 claims description 35
- 238000012360 testing method Methods 0.000 claims description 21
- 230000004044 response Effects 0.000 claims description 5
- 238000010276 construction Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 5
- 239000000872 buffer Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000009977 dual effect Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000011835 investigation Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000013208 measuring procedure Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000008672 reprogramming Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000013024 troubleshooting Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/945,636 US4779042A (en) | 1986-12-23 | 1986-12-23 | Computer-aided probe with tri-state circuitry test capability |
| PCT/US1987/003344 WO1988004781A1 (fr) | 1986-12-23 | 1987-12-17 | Sonde assistee par ordinateur avec capacite de test par circuit a trois etats |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NO883758L true NO883758L (no) | 1988-08-22 |
| NO883758D0 NO883758D0 (no) | 1988-08-22 |
Family
ID=25483366
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO883758A NO883758D0 (no) | 1986-12-23 | 1988-08-22 | Datamaskintilkoplet sonde for maaling paa trenivaakretser. |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US4779042A (fr) |
| EP (1) | EP0294449A4 (fr) |
| JP (1) | JPH01501968A (fr) |
| CN (1) | CN87108371A (fr) |
| AU (1) | AU1085688A (fr) |
| GR (1) | GR871998B (fr) |
| IL (1) | IL84898A0 (fr) |
| NO (1) | NO883758D0 (fr) |
| WO (1) | WO1988004781A1 (fr) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4743842A (en) * | 1987-03-11 | 1988-05-10 | Grumman Aerospace Corporation | Tri-state circuit tester |
| JPS63291134A (ja) * | 1987-05-22 | 1988-11-29 | Toshiba Corp | 論理集積回路 |
| US4977530A (en) * | 1988-05-02 | 1990-12-11 | Mitel Corporation | Voltage monitor for in-circuit testing |
| US5066909A (en) * | 1990-01-30 | 1991-11-19 | Hewlett-Packard Company | Apparatus for testing an electronic circuit having an arbitrary output waveform |
| DE69106713T2 (de) * | 1991-11-11 | 1995-05-11 | Hewlett Packard Gmbh | Detektorschaltung. |
| US7439751B2 (en) * | 2006-09-27 | 2008-10-21 | Taiwan Semiconductor Manufacturing Co, Ltd. | Apparatus and method for testing conductive bumps |
| KR101808480B1 (ko) | 2017-02-07 | 2017-12-14 | 연세대학교 산학협력단 | 반도체 테스트를 지원하는 보스트 모듈 장치 및 그 동작 방법 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3513400A (en) * | 1966-11-25 | 1970-05-19 | Whittaker Corp | Analog to pulse width conversion system including amplitude comparators |
| US3683284A (en) * | 1968-06-25 | 1972-08-08 | Picker Corp | Pulse height analyzer |
| US3525939A (en) * | 1968-08-01 | 1970-08-25 | Kurz Kasch Inc | Hand held instrument having a pair of indicator lamps for indicating voltage levels in electrical circuits |
| US3543154A (en) * | 1968-11-01 | 1970-11-24 | Hewlett Packard Co | Logic probe |
| US3628141A (en) * | 1969-11-17 | 1971-12-14 | Advanced Digital Research Corp | Self-contained probe for delineating characteristics of logic circuit signals |
| GB1316319A (en) * | 1970-02-06 | 1973-05-09 | Siemens Ag | Ecl gating circuits |
| US3633100A (en) * | 1970-05-12 | 1972-01-04 | Ibm | Testing of nonlinear circuits by comparison with a reference simulation with means to eliminate errors caused by critical race conditions |
| US3742351A (en) * | 1970-07-17 | 1973-06-26 | Nu Concept Computer Co | Digital test probe with signal latches and conditionable gating |
| US3750015A (en) * | 1970-11-12 | 1973-07-31 | Comtec Ind Inc | Digital logic test probe for indicating both signal levels as well as a count of changes in signal levels |
| US3944921A (en) * | 1970-12-11 | 1976-03-16 | Canon Kabushiki Kaisha | Logic level test probe with grated oscillator |
| US3662193A (en) * | 1971-05-24 | 1972-05-09 | Itt | Tri-stable circuit |
| US3903471A (en) * | 1972-03-10 | 1975-09-02 | Canon Kk | Electronic circuit test equipment including a cathode ray tube detachably connected thereto using a plurality of information signals |
| US3845328A (en) * | 1972-10-09 | 1974-10-29 | Rca Corp | Tri-state logic circuit |
| US3838339A (en) * | 1973-08-17 | 1974-09-24 | Gte Automatic Electric Lab Inc | Logic test probe and indicator circuit |
| JPS5719436B2 (fr) * | 1973-09-14 | 1982-04-22 | ||
| US4016492A (en) * | 1975-06-09 | 1977-04-05 | Hewlett-Packard Company | Pulse discriminator and misprobe detector for digital logic tester probe |
| US4038598A (en) * | 1976-03-16 | 1977-07-26 | The United States Of America As Represented By The Secretary Of The Air Force | Probe contact and junction detector |
| US4145651A (en) * | 1977-06-23 | 1979-03-20 | Ripingill Jr Allen E | Hand-held logic circuit probe |
| US4189673A (en) * | 1978-05-01 | 1980-02-19 | Burroughs Corporation | Pen-shaped precision multi-level current mode logic test probe |
| US4291356A (en) * | 1979-08-02 | 1981-09-22 | H.O.P. Consulab Inc. | Apparatus for analyzing a physical quantity |
| US4418314A (en) * | 1980-10-20 | 1983-11-29 | The United States Of America As Represented By The Secretary Of The Army | High impedance fast voltage probe |
| JPS57115022A (en) * | 1981-01-08 | 1982-07-17 | Fuji Xerox Co Ltd | Detecting circuit for zero cross point |
| JPS57119524A (en) * | 1981-01-19 | 1982-07-26 | Oki Electric Ind Co Ltd | Tristate input circuit |
| US4403183A (en) * | 1981-04-10 | 1983-09-06 | Tektronix, Inc. | Active voltage probe |
-
1986
- 1986-12-23 US US06/945,636 patent/US4779042A/en not_active Expired - Fee Related
-
1987
- 1987-12-02 CN CN198787108371A patent/CN87108371A/zh active Pending
- 1987-12-17 AU AU10856/88A patent/AU1085688A/en not_active Abandoned
- 1987-12-17 JP JP88501200A patent/JPH01501968A/ja active Pending
- 1987-12-17 WO PCT/US1987/003344 patent/WO1988004781A1/fr not_active Ceased
- 1987-12-17 EP EP19880900527 patent/EP0294449A4/fr not_active Withdrawn
- 1987-12-21 IL IL84898A patent/IL84898A0/xx unknown
- 1987-12-22 GR GR871998A patent/GR871998B/el unknown
-
1988
- 1988-08-22 NO NO883758A patent/NO883758D0/no unknown
Also Published As
| Publication number | Publication date |
|---|---|
| IL84898A0 (en) | 1988-06-30 |
| AU1085688A (en) | 1988-07-15 |
| EP0294449A4 (fr) | 1989-03-29 |
| NO883758D0 (no) | 1988-08-22 |
| US4779042A (en) | 1988-10-18 |
| GR871998B (en) | 1988-04-26 |
| EP0294449A1 (fr) | 1988-12-14 |
| WO1988004781A1 (fr) | 1988-06-30 |
| CN87108371A (zh) | 1988-07-06 |
| JPH01501968A (ja) | 1989-07-06 |
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