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VLSI-SoC: Design for Reliability, Security, and Low Power

23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

  • Conference proceedings
  • © 2016

Overview

Part of the book series: IFIP Advances in Information and Communication Technology (IFIPAICT, volume 483)

Included in the following conference series:

Conference proceedings info: VLSI-SoC 2015.

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About this book

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

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Table of contents (10 papers)

Other volumes

  1. VLSI-SoC: Design for Reliability, Security, and Low Power

Editors and Affiliations

  • KAIST, Daejeon, Korea (Republic of)

    Youngsoo Shin

  • Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong

    Chi Ying Tsui

  • POSTECH , Pohang, Korea (Republic of)

    Jae-Joon Kim

  • Seoul National University , Seoul, Korea (Republic of)

    Kiyoung Choi

  • Federal University of Rio Grande do Sul , Porto Alegre, Brazil

    Ricardo Reis

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